WO2011082156A3 - Organic particulate loaded polishing pads and method of making and using the same - Google Patents
Organic particulate loaded polishing pads and method of making and using the same Download PDFInfo
- Publication number
- WO2011082156A3 WO2011082156A3 PCT/US2010/062205 US2010062205W WO2011082156A3 WO 2011082156 A3 WO2011082156 A3 WO 2011082156A3 US 2010062205 W US2010062205 W US 2010062205W WO 2011082156 A3 WO2011082156 A3 WO 2011082156A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- polishing
- making
- polishing pads
- same
- pads
- Prior art date
Links
- 238000005498 polishing Methods 0.000 title abstract 7
- 238000004519 manufacturing process Methods 0.000 title 1
- 238000000034 method Methods 0.000 abstract 1
- 238000007517 polishing process Methods 0.000 abstract 1
- 229920000642 polymer Polymers 0.000 abstract 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/22—Lapping pads for working plane surfaces characterised by a multi-layered structure
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
- B24B37/245—Pads with fixed abrasives
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
- B24D11/02—Backings, e.g. foils, webs, mesh fabrics
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D7/00—Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting otherwise than only by their periphery, e.g. by the front face; Bushings or mountings therefor
- B24D7/06—Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting otherwise than only by their periphery, e.g. by the front face; Bushings or mountings therefor with inserted abrasive blocks, e.g. segmental
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Abstract
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201080060309XA CN102686361A (en) | 2009-12-30 | 2010-12-28 | Organic particulate loaded polishing pads and method of making and using the same |
SG2012046538A SG181889A1 (en) | 2009-12-30 | 2010-12-28 | Organic particulate loaded polishing pads and method of making and using the same |
JP2012547232A JP5671554B2 (en) | 2009-12-30 | 2010-12-28 | Organic fine particle loaded polishing pad, and method for producing and using the same |
US13/517,367 US20130102231A1 (en) | 2009-12-30 | 2010-12-28 | Organic particulate loaded polishing pads and method of making and using the same |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US29118209P | 2009-12-30 | 2009-12-30 | |
US61/291,182 | 2009-12-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2011082156A2 WO2011082156A2 (en) | 2011-07-07 |
WO2011082156A3 true WO2011082156A3 (en) | 2011-11-17 |
Family
ID=44227136
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2010/062205 WO2011082156A2 (en) | 2009-12-30 | 2010-12-28 | Organic particulate loaded polishing pads and method of making and using the same |
Country Status (7)
Country | Link |
---|---|
US (1) | US20130102231A1 (en) |
JP (1) | JP5671554B2 (en) |
KR (1) | KR20120112662A (en) |
CN (1) | CN102686361A (en) |
SG (1) | SG181889A1 (en) |
TW (1) | TW201143984A (en) |
WO (1) | WO2011082156A2 (en) |
Families Citing this family (53)
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---|---|---|---|---|
CN102159361B (en) * | 2008-07-18 | 2014-11-05 | 3M创新有限公司 | Polishing pad with floating elements and method of making and using same |
JP6196773B2 (en) * | 2012-12-28 | 2017-09-13 | ニッタ・ハース株式会社 | Polishing pad |
CN103223643B (en) * | 2013-05-03 | 2015-10-28 | 鲁启华 | A kind of Ultrathin blade |
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JP2017514704A (en) * | 2014-05-01 | 2017-06-08 | スリーエム イノベイティブ プロパティズ カンパニー | Flexible abrasive article and method of use thereof |
JP6574244B2 (en) * | 2014-05-07 | 2019-09-11 | キャボット マイクロエレクトロニクス コーポレイション | Multi-layer polishing pad for CMP |
JP6426403B2 (en) * | 2014-08-27 | 2018-11-21 | 株式会社フジミインコーポレーテッド | Polishing method |
US9873180B2 (en) | 2014-10-17 | 2018-01-23 | Applied Materials, Inc. | CMP pad construction with composite material properties using additive manufacturing processes |
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US10391605B2 (en) | 2016-01-19 | 2019-08-27 | Applied Materials, Inc. | Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process |
US10688621B2 (en) * | 2016-08-04 | 2020-06-23 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Low-defect-porous polishing pad |
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KR102679468B1 (en) * | 2021-12-17 | 2024-06-28 | 케이피엑스케미칼 주식회사 | Polishing pad containing uniformly distriputed liquid pores and method for manufacturing the same |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5578098A (en) * | 1990-10-09 | 1996-11-26 | Minnesota Mining And Manufacturing Company | Coated abrasive containing erodible agglomerates |
US20060258276A1 (en) * | 2005-05-16 | 2006-11-16 | Chien-Min Sung | Superhard cutters and associated methods |
US20070128991A1 (en) * | 2005-12-07 | 2007-06-07 | Yoon Il-Young | Fixed abrasive polishing pad, method of preparing the same, and chemical mechanical polishing apparatus including the same |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6099954A (en) * | 1995-04-24 | 2000-08-08 | Rodel Holdings, Inc. | Polishing material and method of polishing a surface |
US6126532A (en) * | 1997-04-18 | 2000-10-03 | Cabot Corporation | Polishing pads for a semiconductor substrate |
US6121143A (en) * | 1997-09-19 | 2000-09-19 | 3M Innovative Properties Company | Abrasive articles comprising a fluorochemical agent for wafer surface modification |
US6117000A (en) * | 1998-07-10 | 2000-09-12 | Cabot Corporation | Polishing pad for a semiconductor substrate |
JP2000301450A (en) * | 1999-04-19 | 2000-10-31 | Rohm Co Ltd | Cmp polishing pad and cmp processing device using it |
JP3615134B2 (en) * | 2000-08-24 | 2005-01-26 | 三共理化学株式会社 | Abrasive |
US6645624B2 (en) * | 2000-11-10 | 2003-11-11 | 3M Innovative Properties Company | Composite abrasive particles and method of manufacture |
US6632129B2 (en) * | 2001-02-15 | 2003-10-14 | 3M Innovative Properties Company | Fixed abrasive article for use in modifying a semiconductor wafer |
JP3762943B2 (en) * | 2001-04-17 | 2006-04-05 | 株式会社ユニバーサルエアー | suspension |
JP2003136397A (en) * | 2001-11-01 | 2003-05-14 | Roki Techno Co Ltd | Polishing pad |
US7160173B2 (en) * | 2002-04-03 | 2007-01-09 | 3M Innovative Properties Company | Abrasive articles and methods for the manufacture and use of same |
KR100465649B1 (en) * | 2002-09-17 | 2005-01-13 | 한국포리올 주식회사 | Integral polishing pad and manufacturing method thereof |
WO2006057714A2 (en) * | 2004-11-29 | 2006-06-01 | Rajeev Bajaj | Method and apparatus for improved chemical mechanical planarization pad with uniform polish performance |
US20080318505A1 (en) * | 2004-11-29 | 2008-12-25 | Rajeev Bajaj | Chemical mechanical planarization pad and method of use thereof |
US7846008B2 (en) * | 2004-11-29 | 2010-12-07 | Semiquest Inc. | Method and apparatus for improved chemical mechanical planarization and CMP pad |
ZA200710367B (en) * | 2005-05-16 | 2009-07-29 | Sung Chien-Min | Superhard cutters and associated methods |
JP2008290197A (en) * | 2007-05-25 | 2008-12-04 | Nihon Micro Coating Co Ltd | Polishing pad and method |
KR20100082770A (en) * | 2007-09-03 | 2010-07-19 | 세미퀘스트, 인코포레이티드 | Polishing pad |
WO2009140622A2 (en) * | 2008-05-15 | 2009-11-19 | 3M Innovative Properties Company | Polishing pad with endpoint window and systems and method using the same |
CN102131618A (en) * | 2008-06-26 | 2011-07-20 | 3M创新有限公司 | Polishing pad with porous elements and method of making and using same |
-
2010
- 2010-12-28 CN CN201080060309XA patent/CN102686361A/en active Pending
- 2010-12-28 WO PCT/US2010/062205 patent/WO2011082156A2/en active Application Filing
- 2010-12-28 SG SG2012046538A patent/SG181889A1/en unknown
- 2010-12-28 KR KR1020127019846A patent/KR20120112662A/en not_active Application Discontinuation
- 2010-12-28 US US13/517,367 patent/US20130102231A1/en not_active Abandoned
- 2010-12-28 JP JP2012547232A patent/JP5671554B2/en not_active Expired - Fee Related
- 2010-12-29 TW TW099146709A patent/TW201143984A/en unknown
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5578098A (en) * | 1990-10-09 | 1996-11-26 | Minnesota Mining And Manufacturing Company | Coated abrasive containing erodible agglomerates |
US20060258276A1 (en) * | 2005-05-16 | 2006-11-16 | Chien-Min Sung | Superhard cutters and associated methods |
US20070128991A1 (en) * | 2005-12-07 | 2007-06-07 | Yoon Il-Young | Fixed abrasive polishing pad, method of preparing the same, and chemical mechanical polishing apparatus including the same |
Also Published As
Publication number | Publication date |
---|---|
JP5671554B2 (en) | 2015-02-18 |
TW201143984A (en) | 2011-12-16 |
JP2013516328A (en) | 2013-05-13 |
US20130102231A1 (en) | 2013-04-25 |
KR20120112662A (en) | 2012-10-11 |
SG181889A1 (en) | 2012-07-30 |
WO2011082156A2 (en) | 2011-07-07 |
CN102686361A (en) | 2012-09-19 |
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