JP5671554B2 - 有機微粒子装填研磨パッド、並びにその製造及び使用方法 - Google Patents
有機微粒子装填研磨パッド、並びにその製造及び使用方法 Download PDFInfo
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Images
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
- B24B37/245—Pads with fixed abrasives
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/22—Lapping pads for working plane surfaces characterised by a multi-layered structure
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
- B24D11/02—Backings, e.g. foils, webs, mesh fabrics
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D7/00—Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting otherwise than only by their periphery, e.g. by the front face; Bushings or mountings therefor
- B24D7/06—Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting otherwise than only by their periphery, e.g. by the front face; Bushings or mountings therefor with inserted abrasive blocks, e.g. segmental
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
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- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Description
本出願は、2009年12月30日に出願された米国特許仮出願第61/291,182号の利益を主張し、その開示内容の全体を参照により本明細書に援用する。
本開示は、研磨パッド、並びに研磨パッドの製造方法、及び研磨プロセス(例えば化学機械的平坦化プロセス)における研磨パッドの使用方法に関する。
本開示の例示的実施形態による研磨パッド2の製造は、以下の手順を使用して達成された。容器内で、14.9gの微紛化合成ワックス、MP−22XF(Micro Powders,Inc.(Tarrytown,NY)から)を92.5gのTDI−ポリエーテルプレポリマー、Airthane(登録商標)PHP−75D(Air Products and Chemicals,Inc.(Allentown,PA)から)と混合し、分散体を形成させた。1パイントの金属容器内で、12.0gのオリゴマーのジアミン、ポリテトラメチレン−オキシド−ジ−p−アミノベンゾエート、VERSALINKP−650(登録商標)OLIGOMERIC DIAMINE(Air Products and Chemicals,Inc.から)及び50.0gの4,4’−メチレン−ビス(3−クロロ−2,6−ジエチルアニリン)、Versalink(登録商標)MCDEA Curative(Air Products and Chemicals,Inc.から)を組み合わせた。ホットプレート上に金属容器を配置することにより、混合物が溶融するようになるような温度に混合物を加温した。次にMP−22XF/Airthane(登録商標)PHP−75D分散体を1パイント容器に添加し、樹脂系スラリを形成させた。得られた樹脂系スラリをあわとり練太郎AR−500シンキーミキサー(株式会社シンキー(日本、東京)から)で、1,000rpmにて25秒にわたって混合し、1分にわたって1,500rpmで脱気した。
本開示の別の例示的研磨パッド2を以下の手順を用いて達成した。容器内で、67.25gの45〜75μmの球形ポリエチレンビーズ(Cospheric,LLC(Santa Barbara,CA)から)を185.00gのTDI−ポリエーテルプレポリマー、Airthane(登録商標)PHP−75D(Air Products and Chemicals,Inc.から)と混合し、均質分散体を形成させた。1パイントの金属容器内で、24.0gのオリゴマーのジアミン、ポリテトラメチレンオキシド−ジ−p−アミノベンゾエート、VERSALINKP−650(登録商標)OLIGOMERIC DIAMINE(Air Products and Chemicals,Inc.から)及び60.0gの4,4’−メチレン−ビス(3−クロロ−2,6−ジエチルアニリン)、Versalink(登録商標)MCDEA Curative(Air Products and Chemicals,Inc.から)を組み合わせた。ホットプレート上に金属容器を配置することにより、混合物が溶融するようになるような温度に混合物を加温した。次にポリエチレンビーズ/Airthane(登録商標)PHP−75D分散体を1パイント容器に添加し、樹脂系スラリを形成させた。得られた樹脂系スラリをあわとり練太郎AR−500シンキーミキサー(株式会社シンキーから)で、1,000rpmにて1分にわたって混合し、30秒にわたって2,000rpmで脱気した。
Claims (4)
- 第一主面と、前記第一主面とは反対側の第二主面と、を有する支持層、及び、
前記支持層の前記第一主面に接着された複数の研磨要素、を含む研磨パッドであって、各研磨要素は露出した研磨表面を有し、かつ、
前記研磨要素は、前記支持層の前記第一主面から前記第一主面に対して実質的に垂直である第一方向に沿って延び、更に前記複数の研磨要素の少なくとも一部は連続ポリマー相の中に有機微粒子充填材を含み、各研磨要素が前記支持層に熱接着される、研磨パッド。 - 前記複数の研磨要素とは反対側の前記第二主面に取り付けられた柔軟性層を更に含む、請求項1に記載の研磨パッド。
- 請求項1に記載の研磨パッドの研磨表面に基材の表面を接触させる工程と、
前記基材の前記表面を摩耗させるために前記研磨パッドを前記基材に対して相対的に移動させる工程と、を含む、研磨パッドの使用方法。 - 連続ポリマー相の中に分散した有機微粒子充填材を含む複数の研磨要素を形成する工程と、
第一主面とは反対側の第二主面を有する支持層の前記第一主面に前記研磨要素を熱接着して研磨パッドを形成する工程と、を含む、請求項1に記載の研磨パッドの製造方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US29118209P | 2009-12-30 | 2009-12-30 | |
US61/291,182 | 2009-12-30 | ||
PCT/US2010/062205 WO2011082156A2 (en) | 2009-12-30 | 2010-12-28 | Organic particulate loaded polishing pads and method of making and using the same |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2013516328A JP2013516328A (ja) | 2013-05-13 |
JP2013516328A5 JP2013516328A5 (ja) | 2014-02-06 |
JP5671554B2 true JP5671554B2 (ja) | 2015-02-18 |
Family
ID=44227136
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012547232A Expired - Fee Related JP5671554B2 (ja) | 2009-12-30 | 2010-12-28 | 有機微粒子装填研磨パッド、並びにその製造及び使用方法 |
Country Status (7)
Country | Link |
---|---|
US (1) | US20130102231A1 (ja) |
JP (1) | JP5671554B2 (ja) |
KR (1) | KR20120112662A (ja) |
CN (1) | CN102686361A (ja) |
SG (1) | SG181889A1 (ja) |
TW (1) | TW201143984A (ja) |
WO (1) | WO2011082156A2 (ja) |
Families Citing this family (53)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102159361B (zh) * | 2008-07-18 | 2014-11-05 | 3M创新有限公司 | 具有浮动单元的抛光垫以及制造和使用该抛光垫的方法 |
JP6196773B2 (ja) * | 2012-12-28 | 2017-09-13 | ニッタ・ハース株式会社 | 研磨パッド |
CN103223643B (zh) * | 2013-05-03 | 2015-10-28 | 鲁启华 | 一种超薄刀片 |
EP2859997B1 (en) | 2013-10-08 | 2015-09-30 | Valentini, Guido | Method for manufacturing a polishing pad and polishing pad |
CN106163740B (zh) * | 2014-04-03 | 2019-07-09 | 3M创新有限公司 | 抛光垫和系统以及制造和使用该抛光垫和系统的方法 |
BR112016006779A2 (pt) * | 2014-05-01 | 2017-08-01 | 3M Innovative Properties Co | artigos abrasivos flexíveis e método de abrasão de uma peça de trabalho |
EP3140852B1 (en) * | 2014-05-07 | 2021-07-28 | CMC Materials, Inc. | Multi-layer polishing pad for cmp |
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2010
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- 2010-12-28 US US13/517,367 patent/US20130102231A1/en not_active Abandoned
- 2010-12-28 JP JP2012547232A patent/JP5671554B2/ja not_active Expired - Fee Related
- 2010-12-28 KR KR1020127019846A patent/KR20120112662A/ko not_active Application Discontinuation
- 2010-12-28 SG SG2012046538A patent/SG181889A1/en unknown
- 2010-12-28 CN CN201080060309XA patent/CN102686361A/zh active Pending
- 2010-12-29 TW TW099146709A patent/TW201143984A/zh unknown
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US20130102231A1 (en) | 2013-04-25 |
SG181889A1 (en) | 2012-07-30 |
WO2011082156A3 (en) | 2011-11-17 |
JP2013516328A (ja) | 2013-05-13 |
CN102686361A (zh) | 2012-09-19 |
WO2011082156A2 (en) | 2011-07-07 |
KR20120112662A (ko) | 2012-10-11 |
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