TW200921821A - Manufacturing method of semiconductor apparatus and semiconductor apparatus - Google Patents
Manufacturing method of semiconductor apparatus and semiconductor apparatus Download PDFInfo
- Publication number
- TW200921821A TW200921821A TW097143009A TW97143009A TW200921821A TW 200921821 A TW200921821 A TW 200921821A TW 097143009 A TW097143009 A TW 097143009A TW 97143009 A TW97143009 A TW 97143009A TW 200921821 A TW200921821 A TW 200921821A
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- wiring
- semiconductor wafer
- semiconductor device
- semiconductor
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
- H01L23/3121—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation
- H01L23/3128—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation the substrate having spherical bumps for external connection
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/42—Fillings or auxiliary members in containers or encapsulations selected or arranged to facilitate heating or cooling
- H01L23/433—Auxiliary members in containers characterised by their shape, e.g. pistons
- H01L23/4334—Auxiliary members in encapsulations
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49811—Additional leads joined to the metallisation on the insulating substrate, e.g. pins, bumps, wires, flat leads
- H01L23/49816—Spherical bumps on the substrate for external connection, e.g. ball grid arrays [BGA]
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- H01L24/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
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- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07 e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/563—Encapsulation of active face of flip-chip device, e.g. underfilling or underencapsulation of flip-chip, encapsulation preform on chip or mounting substrate
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- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68345—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used as a support during the manufacture of self supporting substrates
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- H01L2224/10—Bump connectors; Manufacturing methods related thereto
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- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
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- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/81001—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector involving a temporary auxiliary member not forming part of the bonding apparatus
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- H01L2224/818—Bonding techniques
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- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/15—Structure, shape, material or disposition of the bump connectors after the connecting process
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- H01L25/04—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/065—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H10D89/00
- H01L25/0655—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H10D89/00 the devices being arranged next to each other
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- H01L2924/102—Material of the semiconductor or solid state bodies
- H01L2924/1025—Semiconducting materials
- H01L2924/10251—Elemental semiconductors, i.e. Group IV
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- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
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- H01L2924/181—Encapsulation
- H01L2924/1815—Shape
- H01L2924/1816—Exposing the passive side of the semiconductor or solid-state body
- H01L2924/18161—Exposing the passive side of the semiconductor or solid-state body of a flip chip
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- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
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- H01L2924/19041—Component type being a capacitor
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- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/3025—Electromagnetic shielding
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Electromagnetism (AREA)
- Toxicology (AREA)
- Manufacturing & Machinery (AREA)
- Wire Bonding (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007292142A JP2009117767A (ja) | 2007-11-09 | 2007-11-09 | 半導体装置の製造方法及びそれにより製造した半導体装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW200921821A true TW200921821A (en) | 2009-05-16 |
Family
ID=40622940
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW097143009A TW200921821A (en) | 2007-11-09 | 2008-11-07 | Manufacturing method of semiconductor apparatus and semiconductor apparatus |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20090121334A1 (enExample) |
| JP (1) | JP2009117767A (enExample) |
| KR (1) | KR20090048362A (enExample) |
| TW (1) | TW200921821A (enExample) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2337068A1 (en) | 2009-12-18 | 2011-06-22 | Nxp B.V. | Pre-soldered leadless package |
| US8298863B2 (en) * | 2010-04-29 | 2012-10-30 | Texas Instruments Incorporated | TCE compensation for package substrates for reduced die warpage assembly |
| US8455991B2 (en) * | 2010-09-24 | 2013-06-04 | Stats Chippac Ltd. | Integrated circuit packaging system with warpage control and method of manufacture thereof |
| US8410604B2 (en) * | 2010-10-26 | 2013-04-02 | Xilinx, Inc. | Lead-free structures in a semiconductor device |
| US8698303B2 (en) | 2010-11-23 | 2014-04-15 | Ibiden Co., Ltd. | Substrate for mounting semiconductor, semiconductor device and method for manufacturing semiconductor device |
| KR101719636B1 (ko) * | 2011-01-28 | 2017-04-05 | 삼성전자 주식회사 | 반도체 장치 및 그 제조 방법 |
| JP2013183002A (ja) * | 2012-03-01 | 2013-09-12 | Ibiden Co Ltd | 電子部品 |
| US9406579B2 (en) * | 2012-05-14 | 2016-08-02 | STATS ChipPAC Pte. Ltd. | Semiconductor device and method of controlling warpage in semiconductor package |
| JP6470095B2 (ja) * | 2014-07-25 | 2019-02-13 | 京セラ株式会社 | 配線基板 |
| TWI632647B (zh) * | 2016-01-18 | 2018-08-11 | 矽品精密工業股份有限公司 | 封裝製程及其所用之封裝基板 |
| US10580710B2 (en) | 2017-08-31 | 2020-03-03 | Micron Technology, Inc. | Semiconductor device with a protection mechanism and associated systems, devices, and methods |
| US10381329B1 (en) | 2018-01-24 | 2019-08-13 | Micron Technology, Inc. | Semiconductor device with a layered protection mechanism and associated systems, devices, and methods |
| US10475771B2 (en) | 2018-01-24 | 2019-11-12 | Micron Technology, Inc. | Semiconductor device with an electrically-coupled protection mechanism and associated systems, devices, and methods |
| JP7189672B2 (ja) * | 2018-04-18 | 2022-12-14 | 新光電気工業株式会社 | 半導体装置及びその製造方法 |
| US12205877B2 (en) * | 2019-02-21 | 2025-01-21 | AT&S(Chongqing) Company Limited | Ultra-thin component carrier having high stiffness and method of manufacturing the same |
| CN115547846A (zh) * | 2019-02-21 | 2022-12-30 | 奥特斯科技(重庆)有限公司 | 部件承载件及其制造方法和电气装置 |
| CN114582731A (zh) * | 2022-05-05 | 2022-06-03 | 华进半导体封装先导技术研发中心有限公司 | 一种层叠封装的下封装体结构及其形成方法 |
| CN118782478A (zh) * | 2024-07-01 | 2024-10-15 | 中科同德微电子科技(大同)有限公司 | Igbt芯片封装方法及igbt芯片封装模块 |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01313969A (ja) * | 1988-06-13 | 1989-12-19 | Hitachi Ltd | 半導体装置 |
| US5783465A (en) * | 1997-04-03 | 1998-07-21 | Lucent Technologies Inc. | Compliant bump technology |
| JP3834426B2 (ja) * | 1997-09-02 | 2006-10-18 | 沖電気工業株式会社 | 半導体装置 |
| US5977626A (en) * | 1998-08-12 | 1999-11-02 | Industrial Technology Research Institute | Thermally and electrically enhanced PBGA package |
| US6191360B1 (en) * | 1999-04-26 | 2001-02-20 | Advanced Semiconductor Engineering, Inc. | Thermally enhanced BGA package |
| TW411037U (en) * | 1999-06-11 | 2000-11-01 | Ind Tech Res Inst | Integrated circuit packaging structure with dual directions of thermal conduction path |
| JP2001267473A (ja) * | 2000-03-17 | 2001-09-28 | Hitachi Ltd | 半導体装置およびその製造方法 |
| US6566748B1 (en) * | 2000-07-13 | 2003-05-20 | Fujitsu Limited | Flip-chip semiconductor device having an improved reliability |
| US6432742B1 (en) * | 2000-08-17 | 2002-08-13 | St Assembly Test Services Pte Ltd. | Methods of forming drop-in heat spreader plastic ball grid array (PBGA) packages |
| US6525420B2 (en) * | 2001-01-30 | 2003-02-25 | Thermal Corp. | Semiconductor package with lid heat spreader |
| US6519154B1 (en) * | 2001-08-17 | 2003-02-11 | Intel Corporation | Thermal bus design to cool a microelectronic die |
| JP2003163459A (ja) * | 2001-11-26 | 2003-06-06 | Sony Corp | 高周波回路ブロック体及びその製造方法、高周波モジュール装置及びその製造方法。 |
| US6775140B2 (en) * | 2002-10-21 | 2004-08-10 | St Assembly Test Services Ltd. | Heat spreaders, heat spreader packages, and fabrication methods for use with flip chip semiconductor devices |
| US6747350B1 (en) * | 2003-06-06 | 2004-06-08 | Silicon Integrated Systems Corp. | Flip chip package structure |
| TWI236118B (en) * | 2003-06-18 | 2005-07-11 | Advanced Semiconductor Eng | Package structure with a heat spreader and manufacturing method thereof |
| US7608789B2 (en) * | 2004-08-12 | 2009-10-27 | Epcos Ag | Component arrangement provided with a carrier substrate |
| US7348663B1 (en) * | 2005-07-15 | 2008-03-25 | Asat Ltd. | Integrated circuit package and method for fabricating same |
| US7787252B2 (en) * | 2008-12-04 | 2010-08-31 | Lsi Corporation | Preferentially cooled electronic device |
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2007
- 2007-11-09 JP JP2007292142A patent/JP2009117767A/ja active Pending
-
2008
- 2008-11-06 US US12/266,075 patent/US20090121334A1/en not_active Abandoned
- 2008-11-07 KR KR1020080110509A patent/KR20090048362A/ko not_active Withdrawn
- 2008-11-07 TW TW097143009A patent/TW200921821A/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| KR20090048362A (ko) | 2009-05-13 |
| JP2009117767A (ja) | 2009-05-28 |
| US20090121334A1 (en) | 2009-05-14 |
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