TW200823472A - Probe device - Google Patents

Probe device Download PDF

Info

Publication number
TW200823472A
TW200823472A TW096143651A TW96143651A TW200823472A TW 200823472 A TW200823472 A TW 200823472A TW 096143651 A TW096143651 A TW 096143651A TW 96143651 A TW96143651 A TW 96143651A TW 200823472 A TW200823472 A TW 200823472A
Authority
TW
Taiwan
Prior art keywords
probe
heating element
support substrate
temperature
semiconductor device
Prior art date
Application number
TW096143651A
Other languages
English (en)
Chinese (zh)
Inventor
Masahiro Sunohara
Mitsutoshi Higashi
Original Assignee
Shinko Electric Ind Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shinko Electric Ind Co filed Critical Shinko Electric Ind Co
Publication of TW200823472A publication Critical patent/TW200823472A/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
    • G01R31/2875—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature related to heating

Landscapes

  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Toxicology (AREA)
  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
TW096143651A 2006-11-21 2007-11-19 Probe device TW200823472A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006314568A JP2008128838A (ja) 2006-11-21 2006-11-21 プローブ装置

Publications (1)

Publication Number Publication Date
TW200823472A true TW200823472A (en) 2008-06-01

Family

ID=39174214

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096143651A TW200823472A (en) 2006-11-21 2007-11-19 Probe device

Country Status (5)

Country Link
US (1) US7667474B2 (enExample)
EP (1) EP1925945A3 (enExample)
JP (1) JP2008128838A (enExample)
KR (1) KR20080046093A (enExample)
TW (1) TW200823472A (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103308845A (zh) * 2012-03-09 2013-09-18 东京毅力科创株式会社 晶片检查用接口装置和晶片检查装置
TWI481882B (zh) * 2013-04-12 2015-04-21 Giga Byte Tech Co Ltd 電路板測試系統及其測試方法
TWI634604B (zh) * 2016-06-21 2018-09-01 Kabushiki Kaisha Nihon Micronics 探針卡、使用該探針卡之檢查裝置及檢查方法
TWI782443B (zh) * 2021-03-10 2022-11-01 陽榮科技股份有限公司 半導體測試之溫度控制裝置

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5074878B2 (ja) * 2007-10-15 2012-11-14 東京エレクトロン株式会社 検査装置
KR100977165B1 (ko) 2008-08-29 2010-08-20 주식회사 코리아 인스트루먼트 프로브 기판 및 이를 구비하는 프로브 카드
JP5199859B2 (ja) * 2008-12-24 2013-05-15 株式会社日本マイクロニクス プローブカード
JP5258547B2 (ja) * 2008-12-26 2013-08-07 株式会社日本マイクロニクス 集積回路の検査方法及び装置
JP5258590B2 (ja) * 2009-01-16 2013-08-07 株式会社日本マイクロニクス 集積回路の試験装置
JP5535492B2 (ja) * 2009-02-12 2014-07-02 ラピスセミコンダクタ株式会社 半導体集積回路の検査装置及び半導体集積回路の検査方法
KR101474951B1 (ko) * 2009-02-17 2014-12-24 삼성전자주식회사 반도체 디바이스 테스트 장치
JP5235163B2 (ja) * 2009-05-18 2013-07-10 株式会社日本マイクロニクス 検査装置
US8400173B2 (en) * 2009-06-26 2013-03-19 Formfactor, Inc. Method and apparatus for thermally conditioning probe cards
US8540422B2 (en) 2010-10-04 2013-09-24 Cameron Health, Inc. Electrical component behavior analysis tools
JP5599341B2 (ja) * 2011-02-21 2014-10-01 株式会社シバソク 試験装置
US8546904B2 (en) * 2011-07-11 2013-10-01 Transcend Information, Inc. Integrated circuit with temperature increasing element and electronic system having the same
TWM436227U (en) * 2012-03-23 2012-08-21 Mpi Corp Heating point testing appliances
JP5861557B2 (ja) * 2012-04-26 2016-02-16 三菱電機株式会社 検査装置
TWI506283B (zh) * 2012-11-12 2015-11-01 Mpi Corp Low power loss probe card structure
KR102077062B1 (ko) 2013-02-25 2020-02-13 삼성전자주식회사 프로브 카드 및 이를 포함하는 프로빙 장치
JP6259590B2 (ja) * 2013-06-12 2018-01-10 株式会社日本マイクロニクス プローブカード及びその製造方法
US10107856B2 (en) * 2014-10-21 2018-10-23 Stmicroelectronics S.R.L. Apparatus for the thermal testing of electronic devices and corresponding method
JP6041175B2 (ja) * 2015-03-30 2016-12-07 株式会社東京精密 プローバ
US11280827B2 (en) * 2016-02-29 2022-03-22 Teradyne, Inc. Thermal control of a probe card assembly
JP7090517B2 (ja) * 2018-09-20 2022-06-24 東京エレクトロン株式会社 検査装置及び検査方法
KR102023742B1 (ko) * 2019-01-31 2019-11-04 (주)래딕스 테스트 핀 조립체
JP7345320B2 (ja) * 2019-04-25 2023-09-15 東京エレクトロン株式会社 検査装置及びプローブカードの温度調整方法
WO2021115169A1 (zh) * 2019-12-13 2021-06-17 山东才聚电子科技有限公司 一种芯片检测装置、芯片检测系统及控制方法
JP2022091378A (ja) * 2020-12-09 2022-06-21 東京エレクトロン株式会社 電源および検査装置
JP2022096153A (ja) * 2020-12-17 2022-06-29 住友電気工業株式会社 電子デバイスの検査装置及び検査方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE1000697A6 (fr) * 1987-10-28 1989-03-14 Irish Transformers Ltd Appareil pour tester des circuits electriques integres.
US4839587A (en) * 1988-03-29 1989-06-13 Digital Equipment Corporation Test fixture for tab circuits and devices
JPH0748946Y2 (ja) * 1989-06-30 1995-11-08 コクヨ株式会社 移動間仕切装置
US5124639A (en) * 1990-11-20 1992-06-23 Motorola, Inc. Probe card apparatus having a heating element and process for using the same
JP3214766B2 (ja) * 1992-08-06 2001-10-02 アジレント・テクノロジーズ・インク 接続検査のための装置
JPH0954116A (ja) * 1995-08-10 1997-02-25 Nippon Denshi Zairyo Kk 高温測定用プローブカード
US6690185B1 (en) * 1997-01-15 2004-02-10 Formfactor, Inc. Large contactor with multiple, aligned contactor units
US6181145B1 (en) * 1997-10-13 2001-01-30 Matsushita Electric Industrial Co., Ltd. Probe card
JP2000138268A (ja) 1998-11-04 2000-05-16 Hitachi Chem Co Ltd 半導体回路の検査方法及び検査装置
JP2000346875A (ja) * 1999-06-07 2000-12-15 Advantest Corp プローブカードおよびこれを用いたｉｃ試験装置
US7071714B2 (en) * 2001-11-02 2006-07-04 Formfactor, Inc. Method and system for compensating for thermally induced motion of probe cards
JP4173306B2 (ja) * 2001-11-30 2008-10-29 東京エレクトロン株式会社 信頼性評価試験装置、信頼性評価試験システム及び信頼性評価試験方法
JP2004150999A (ja) * 2002-10-31 2004-05-27 Advantest Corp プローブカード
JP2006314568A (ja) 2005-05-13 2006-11-24 Daiichi Shokai Co Ltd 遊技機
US7495458B2 (en) * 2006-05-17 2009-02-24 Texas Instruments Incorporated Probe card and temperature stabilizer for testing semiconductor devices

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103308845A (zh) * 2012-03-09 2013-09-18 东京毅力科创株式会社 晶片检查用接口装置和晶片检查装置
CN103308845B (zh) * 2012-03-09 2015-12-02 东京毅力科创株式会社 晶片检查用接口装置和晶片检查装置
US9395405B2 (en) 2012-03-09 2016-07-19 Tokyo Electron Limited Wafer inspection interface and wafer inspection apparatus
TWI567399B (zh) * 2012-03-09 2017-01-21 Tokyo Electron Ltd Wafer inspection interface and wafer inspection device
TWI481882B (zh) * 2013-04-12 2015-04-21 Giga Byte Tech Co Ltd 電路板測試系統及其測試方法
TWI634604B (zh) * 2016-06-21 2018-09-01 Kabushiki Kaisha Nihon Micronics 探針卡、使用該探針卡之檢查裝置及檢查方法
US10295590B2 (en) 2016-06-21 2019-05-21 Kabushiki Kaisha Nihon Micronics Probe card with temperature control function, inspection apparatus using the same, and inspection method
TWI782443B (zh) * 2021-03-10 2022-11-01 陽榮科技股份有限公司 半導體測試之溫度控制裝置

Also Published As

Publication number Publication date
KR20080046093A (ko) 2008-05-26
JP2008128838A (ja) 2008-06-05
EP1925945A2 (en) 2008-05-28
EP1925945A3 (en) 2011-04-27
US20080116925A1 (en) 2008-05-22
US7667474B2 (en) 2010-02-23

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