TW200624839A - Method of manufacturing inspection unit - Google Patents

Method of manufacturing inspection unit

Info

Publication number
TW200624839A
TW200624839A TW094137772A TW94137772A TW200624839A TW 200624839 A TW200624839 A TW 200624839A TW 094137772 A TW094137772 A TW 094137772A TW 94137772 A TW94137772 A TW 94137772A TW 200624839 A TW200624839 A TW 200624839A
Authority
TW
Taiwan
Prior art keywords
hole
face
prepared
diameter
tubular body
Prior art date
Application number
TW094137772A
Other languages
English (en)
Inventor
Takuto Yoshida
Original Assignee
Yokowo Seisakusho Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokowo Seisakusho Kk filed Critical Yokowo Seisakusho Kk
Publication of TW200624839A publication Critical patent/TW200624839A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/045—Sockets or component fixtures for RF or HF testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measuring Leads Or Probes (AREA)
  • Manufacturing Of Electrical Connectors (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW094137772A 2004-10-28 2005-10-28 Method of manufacturing inspection unit TW200624839A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004314229A JP4438601B2 (ja) 2004-10-28 2004-10-28 検査ユニットの製法

Publications (1)

Publication Number Publication Date
TW200624839A true TW200624839A (en) 2006-07-16

Family

ID=36262520

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094137772A TW200624839A (en) 2004-10-28 2005-10-28 Method of manufacturing inspection unit

Country Status (5)

Country Link
US (1) US7282378B2 (zh)
JP (1) JP4438601B2 (zh)
KR (1) KR20060052285A (zh)
MY (1) MY139125A (zh)
TW (1) TW200624839A (zh)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI514687B (zh) * 2011-07-15 2015-12-21 Hon Hai Prec Ind Co Ltd 電連接器及其連接器端子
TWI626450B (zh) * 2015-09-10 2018-06-11 李諾工業股份有限公司 探針插座
TWI710774B (zh) * 2016-07-21 2020-11-21 永焯 梁 用於半導體晶圓測試的系統、切線探針卡及其探頭組件

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JP4438601B2 (ja) * 2004-10-28 2010-03-24 株式会社ヨコオ 検査ユニットの製法
CN201000930Y (zh) * 2006-08-02 2008-01-02 富士康(昆山)电脑接插件有限公司 电连接器
WO2008072699A1 (ja) * 2006-12-15 2008-06-19 Nhk Spring Co., Ltd. 導電性接触子ホルダ、導電性接触子ユニット、および導電性接触子ホルダの製造方法
CN101350464B (zh) * 2007-07-20 2011-05-04 深圳富泰宏精密工业有限公司 导电柱及具有该导电柱的电子装置
JP4937882B2 (ja) * 2007-11-01 2012-05-23 株式会社日本マイクロニクス 検査ソケット
GB2477358A (en) * 2010-02-02 2011-08-03 Thales Holdings Uk Plc RF testing an integrated circuit assembly during manufacture using a interposed adaptor layer which is removed after test to attach the IC to a BGA
US9689897B2 (en) * 2010-06-03 2017-06-27 Hsio Technologies, Llc Performance enhanced semiconductor socket
US8808010B2 (en) * 2011-06-06 2014-08-19 Interconnect Devices, Inc. Insulated metal socket
SG11201401212TA (en) * 2011-10-07 2014-09-26 Nhk Spring Co Ltd Probe unit
US8758066B2 (en) * 2012-02-03 2014-06-24 Interconnect Devices, Inc. Electrical connector with insulation member
JP5658718B2 (ja) * 2012-08-20 2015-01-28 オルガン針株式会社 充放電用プローブの先端形状
US8994393B2 (en) * 2012-09-06 2015-03-31 International Business Machines Corporation High-frequency cobra probe
KR101576668B1 (ko) * 2014-08-18 2015-12-22 한전케이피에스 주식회사 블록형 프로브 장치
JP6480798B2 (ja) * 2015-04-23 2019-03-13 株式会社ヨコオ ソケット
US9876307B2 (en) * 2015-09-03 2018-01-23 Apple Inc. Surface connector with silicone spring member
US9899757B2 (en) * 2015-09-03 2018-02-20 Apple Inc. Surface connector with silicone spring member
JP6601138B2 (ja) * 2015-10-16 2019-11-06 山一電機株式会社 Ｉｃソケット
KR101920822B1 (ko) * 2017-04-21 2019-02-13 리노공업주식회사 프로브 소켓
JP2020521986A (ja) * 2017-05-26 2020-07-27 スミスズ インターコネクト アメリカズ インコーポレイテッドＳｍｉｔｈｓ Ｉｎｔｅｒｃｏｎｎｅｃｔ Ａｍｅｒｉｃａｓ， Ｉｎｃ． インピーダンス制御テストソケット
KR101975836B1 (ko) 2017-08-11 2019-08-28 리노공업주식회사 검사장치
KR101954086B1 (ko) * 2017-11-07 2019-03-06 리노공업주식회사 검사 프로브 조립체 및 검사 소켓
KR102015788B1 (ko) * 2017-11-30 2019-08-29 리노공업주식회사 검사장치
JP7169989B2 (ja) * 2017-11-30 2022-11-11 株式会社エンプラス 電気接続用ソケット
TWI799834B (zh) * 2020-05-22 2023-04-21 南韓商李諾工業股份有限公司 測試座以及其製造方法
KR102321126B1 (ko) * 2020-05-22 2021-11-04 리노공업주식회사 검사소켓의 제조방법
KR102321112B1 (ko) * 2020-05-22 2021-11-04 리노공업주식회사 검사소켓의 제조방법
KR102413287B1 (ko) * 2020-10-21 2022-06-27 주식회사 오킨스전자 테스트 소켓
CN113109600B (zh) * 2021-03-30 2022-12-13 渭南木王智能科技股份有限公司 一种半导体测试探针用磨斜面夹紧定位装置
KR102315536B1 (ko) * 2021-08-31 2021-10-21 하병호 검사소켓 및 그 제조방법
US12052830B2 (en) * 2021-12-06 2024-07-30 Advantest America, Inc. Method and process for creating high-performance coax sockets
JP2023174031A (ja) * 2022-05-27 2023-12-07 株式会社ヨコオ 検査装置
KR102547242B1 (ko) * 2022-12-28 2023-07-12 한전케이피에스 주식회사 프로브 장치 및 조절 가능한 확장식 프로브 장치 거치대
KR102715065B1 (ko) * 2023-07-20 2024-10-14 주식회사 비이링크 전자 소자의 회로 검사용 소켓 장치

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US4791248A (en) * 1987-01-22 1988-12-13 The Boeing Company Printed wire circuit board and its method of manufacture
JPH1123615A (ja) * 1997-05-09 1999-01-29 Hitachi Ltd 接続装置および検査システム
US6037787A (en) * 1998-03-24 2000-03-14 Teradyne, Inc. High performance probe interface for automatic test equipment
JP3784976B2 (ja) * 1998-12-22 2006-06-14 ローム株式会社 半導体装置
US6102709A (en) * 1999-03-31 2000-08-15 Raytheon Company Threaded double sided compressed wire bundle connector
JP2001099889A (ja) 1999-09-29 2001-04-13 Yokowo Co Ltd 高周波回路の検査装置
US20050001637A1 (en) * 2001-06-28 2005-01-06 Toshio Kazama Support member assembly for conductive contactor
KR100745104B1 (ko) * 2000-06-16 2007-08-01 니혼 하츠쵸 가부시키가이샤 컨택터 프로브, 전기 프로브 유닛, 컨택터 프로브를 위한 프로브 어셈블리와 절연체의 조합체 및 컨택터 프로브를 위한 탄성의 도전성 프로브 어셈블리
JP4251855B2 (ja) * 2002-11-19 2009-04-08 株式会社ヨコオ 高周波・高速用デバイスの検査治具の製法
JP4242199B2 (ja) * 2003-04-25 2009-03-18 株式会社ヨコオ Ｉｃソケット
JP2004325306A (ja) * 2003-04-25 2004-11-18 Yokowo Co Ltd 検査用同軸プローブおよびそれを用いた検査ユニット
JP4535828B2 (ja) * 2004-09-30 2010-09-01 株式会社ヨコオ 検査ユニットの製法
JP4405358B2 (ja) * 2004-09-30 2010-01-27 株式会社ヨコオ 検査ユニット
JP4438601B2 (ja) * 2004-10-28 2010-03-24 株式会社ヨコオ 検査ユニットの製法
JP2006322918A (ja) * 2005-04-22 2006-11-30 Agilent Technol Inc インターフェース、及びそれを用いた半導体テスト装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI514687B (zh) * 2011-07-15 2015-12-21 Hon Hai Prec Ind Co Ltd 電連接器及其連接器端子
TWI626450B (zh) * 2015-09-10 2018-06-11 李諾工業股份有限公司 探針插座
US10884047B2 (en) 2015-09-10 2021-01-05 Leeno Industrial Inc. Probe socket
TWI710774B (zh) * 2016-07-21 2020-11-21 永焯 梁 用於半導體晶圓測試的系統、切線探針卡及其探頭組件

Also Published As

Publication number Publication date
MY139125A (en) 2009-08-28
US7282378B2 (en) 2007-10-16
JP4438601B2 (ja) 2010-03-24
JP2006125988A (ja) 2006-05-18
US20060094134A1 (en) 2006-05-04
KR20060052285A (ko) 2006-05-19

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