TWI799834B - 測試座以及其製造方法 - Google Patents
測試座以及其製造方法 Download PDFInfo
- Publication number
- TWI799834B TWI799834B TW110113673A TW110113673A TWI799834B TW I799834 B TWI799834 B TW I799834B TW 110113673 A TW110113673 A TW 110113673A TW 110113673 A TW110113673 A TW 110113673A TW I799834 B TWI799834 B TW I799834B
- Authority
- TW
- Taiwan
- Prior art keywords
- fabricating
- same
- test socket
- socket
- test
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/045—Sockets or component fixtures for RF or HF testing
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/14—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06755—Material aspects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Mechanical Engineering (AREA)
- Measuring Leads Or Probes (AREA)
- Connecting Device With Holders (AREA)
- Manufacturing Of Electrical Connectors (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR20200061463 | 2020-05-22 | ||
KR10-2020-0061463 | 2020-05-22 | ||
KR10-2021-0013607 | 2021-01-29 | ||
KR1020210013607A KR102570428B1 (ko) | 2020-05-22 | 2021-01-29 | 검사소켓 및 그의 제조방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW202144784A TW202144784A (zh) | 2021-12-01 |
TWI799834B true TWI799834B (zh) | 2023-04-21 |
Family
ID=78708711
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW110113673A TWI799834B (zh) | 2020-05-22 | 2021-04-16 | 測試座以及其製造方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20220413008A1 (zh) |
JP (1) | JP7430253B2 (zh) |
TW (1) | TWI799834B (zh) |
WO (1) | WO2021235844A1 (zh) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102587516B1 (ko) * | 2023-05-18 | 2023-10-11 | 주식회사 티에스이 | 테스트 소켓 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007178165A (ja) * | 2005-12-27 | 2007-07-12 | Yokowo Co Ltd | 検査ユニット |
TW201118381A (en) * | 2009-11-16 | 2011-06-01 | Pleader Yamaichi Co Ltd | Test device for high-frequency vertical probe card |
US20130271175A1 (en) * | 2012-04-13 | 2013-10-17 | Formfactor, Inc. | Wiring Substrate With Filled Vias To Accommodate Custom Terminals |
KR101534778B1 (ko) * | 2014-01-24 | 2015-07-09 | 리노공업주식회사 | 검사장치 |
US20150233973A1 (en) * | 2013-12-17 | 2015-08-20 | Tim WOODEN | Method of Manufacturing a Test Socket Body of an Impedance-Matched Test Socket |
US20190206750A1 (en) * | 2018-01-04 | 2019-07-04 | Winway Technology Co., Ltd. | Testing method for testing wafer level chip scale packages |
TWI679424B (zh) * | 2019-03-29 | 2019-12-11 | 矽品精密工業股份有限公司 | 檢測裝置及其製法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4438601B2 (ja) | 2004-10-28 | 2010-03-24 | 株式会社ヨコオ | 検査ユニットの製法 |
JP2009129877A (ja) | 2007-11-28 | 2009-06-11 | S Ii R:Kk | 電子部品用ソケット |
JP4921344B2 (ja) | 2007-12-26 | 2012-04-25 | 株式会社ヨコオ | 検査ソケット |
JP6475479B2 (ja) | 2014-11-27 | 2019-02-27 | 株式会社ヨコオ | 検査ユニット |
JP6827029B2 (ja) | 2015-07-03 | 2021-02-10 | オキンス エレクトロニクス カンパニー リミテッド | テストソケット、テストソケットの製造方法、およびテストソケット用治具アセンブリー |
-
2021
- 2021-04-16 TW TW110113673A patent/TWI799834B/zh active
- 2021-05-18 US US17/777,221 patent/US20220413008A1/en active Pending
- 2021-05-18 JP JP2022519731A patent/JP7430253B2/ja active Active
- 2021-05-18 WO PCT/KR2021/006239 patent/WO2021235844A1/en active Application Filing
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007178165A (ja) * | 2005-12-27 | 2007-07-12 | Yokowo Co Ltd | 検査ユニット |
TW201118381A (en) * | 2009-11-16 | 2011-06-01 | Pleader Yamaichi Co Ltd | Test device for high-frequency vertical probe card |
US20130271175A1 (en) * | 2012-04-13 | 2013-10-17 | Formfactor, Inc. | Wiring Substrate With Filled Vias To Accommodate Custom Terminals |
US20150233973A1 (en) * | 2013-12-17 | 2015-08-20 | Tim WOODEN | Method of Manufacturing a Test Socket Body of an Impedance-Matched Test Socket |
KR101534778B1 (ko) * | 2014-01-24 | 2015-07-09 | 리노공업주식회사 | 검사장치 |
US20190206750A1 (en) * | 2018-01-04 | 2019-07-04 | Winway Technology Co., Ltd. | Testing method for testing wafer level chip scale packages |
TWI679424B (zh) * | 2019-03-29 | 2019-12-11 | 矽品精密工業股份有限公司 | 檢測裝置及其製法 |
Also Published As
Publication number | Publication date |
---|---|
TW202144784A (zh) | 2021-12-01 |
US20220413008A1 (en) | 2022-12-29 |
WO2021235844A1 (en) | 2021-11-25 |
JP7430253B2 (ja) | 2024-02-09 |
JP2022550155A (ja) | 2022-11-30 |
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