TW200509140A - Semiconductor integrated circuit - Google Patents
Semiconductor integrated circuitInfo
- Publication number
- TW200509140A TW200509140A TW093119081A TW93119081A TW200509140A TW 200509140 A TW200509140 A TW 200509140A TW 093119081 A TW093119081 A TW 093119081A TW 93119081 A TW93119081 A TW 93119081A TW 200509140 A TW200509140 A TW 200509140A
- Authority
- TW
- Taiwan
- Prior art keywords
- test
- address
- self
- section
- test section
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title abstract 2
- 238000012360 testing method Methods 0.000 abstract 12
- 230000015654 memory Effects 0.000 abstract 4
- 230000006870 function Effects 0.000 abstract 2
- 238000000034 method Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
- G11C29/20—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits using counters or linear-feedback shift registers [LFSR]
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/36—Data generation devices, e.g. data inverters
- G11C2029/3602—Pattern generator
Landscapes
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Dram (AREA)
- Tests Of Electronic Circuits (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003304277A JP4381750B2 (ja) | 2003-08-28 | 2003-08-28 | 半導体集積回路 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200509140A true TW200509140A (en) | 2005-03-01 |
Family
ID=34214020
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW093119081A TW200509140A (en) | 2003-08-28 | 2004-06-29 | Semiconductor integrated circuit |
Country Status (5)
Country | Link |
---|---|
US (2) | US7366965B2 (zh) |
JP (1) | JP4381750B2 (zh) |
KR (1) | KR20050021932A (zh) |
CN (1) | CN1591696A (zh) |
TW (1) | TW200509140A (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102567168A (zh) * | 2010-12-27 | 2012-07-11 | 北京国睿中数科技股份有限公司 | 一种针对phy高速接口电路的bist自动测试电路及测试方法 |
Families Citing this family (40)
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KR100598010B1 (ko) * | 2004-08-06 | 2006-07-06 | 삼성전자주식회사 | 클럭 분배기, 클럭 분배기를 포함한 시스템, 클럭 분배방법 및 클럭 분배를 이용한 데이터 읽기 및 쓰기 방법 |
KR100612127B1 (ko) * | 2004-09-22 | 2006-08-11 | 삼성전자주식회사 | 메모리 모듈 테스트 방법 및 이를 위한 메모리 모듈의 허브 |
US7421251B2 (en) * | 2005-03-31 | 2008-09-02 | Silicon Laboratories Inc. | Precise frequency generation for low duty cycle transceivers using a single crystal oscillator |
JP4839714B2 (ja) * | 2005-07-25 | 2011-12-21 | セイコーエプソン株式会社 | シーケンシャルアクセスメモリ |
KR100735751B1 (ko) * | 2005-12-26 | 2007-07-06 | 삼성전자주식회사 | 반도체 메모리 장치 |
JP4561783B2 (ja) * | 2007-06-21 | 2010-10-13 | ソニー株式会社 | 半導体メモリ装置、半導体メモリ装置の動作方法 |
JP5145844B2 (ja) * | 2007-09-26 | 2013-02-20 | 富士通セミコンダクター株式会社 | 半導体装置及びメモリシステム |
TWI336890B (en) * | 2007-12-21 | 2011-02-01 | Nat Univ Tsing Hua | Built-in self-repair method for nand flash memory and system thereof |
JP5629962B2 (ja) * | 2008-01-30 | 2014-11-26 | 富士通セミコンダクター株式会社 | 半導体記憶装置 |
KR100952438B1 (ko) | 2008-02-29 | 2010-04-14 | 주식회사 하이닉스반도체 | 반도체 메모리 장치 |
KR101416320B1 (ko) * | 2008-08-11 | 2014-07-08 | 삼성전자주식회사 | 반도체 테스트 장치 |
KR101046994B1 (ko) * | 2008-12-23 | 2011-07-06 | 주식회사 하이닉스반도체 | 리프레쉬 주기조절회로 |
KR20110002144A (ko) * | 2009-07-01 | 2011-01-07 | 칭화대학교 | 하이브리드 fir 필터링 기법이 적용된 지연 동기 루프 및 이를 포함하는 반도체 메모리 장치 |
JP5487770B2 (ja) * | 2009-07-21 | 2014-05-07 | ソニー株式会社 | 固体撮像装置 |
JP5350949B2 (ja) * | 2009-09-11 | 2013-11-27 | Necエンベデッドプロダクツ株式会社 | 不揮発性メモリの試験方法及びメモリ試験装置 |
US8489943B2 (en) * | 2009-12-15 | 2013-07-16 | Stmicroelectronics International N.V. | Protocol sequence generator |
US8954803B2 (en) * | 2010-02-23 | 2015-02-10 | Mosys, Inc. | Programmable test engine (PCDTE) for emerging memory technologies |
US9395987B2 (en) | 2010-09-23 | 2016-07-19 | Freescale Semiconductor, Inc. | Method and device for detecting a race condition |
KR101212737B1 (ko) * | 2010-12-17 | 2012-12-14 | 에스케이하이닉스 주식회사 | 반도체 메모리 장치 |
KR20120098094A (ko) * | 2011-02-28 | 2012-09-05 | 에스케이하이닉스 주식회사 | 반도체 메모리 장치 |
TWI468946B (zh) * | 2011-04-27 | 2015-01-11 | Silicon Motion Inc | 用來進行主裝置指揮運作之方法以及記憶裝置及控制器 |
JP2012252733A (ja) * | 2011-05-31 | 2012-12-20 | Elpida Memory Inc | 半導体装置 |
CN103177768B (zh) * | 2011-12-26 | 2016-04-13 | 上海华虹宏力半导体制造有限公司 | 一种存储器的bist地址扫描电路及其扫描方法 |
US8842480B2 (en) * | 2012-08-08 | 2014-09-23 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Automated control of opening and closing of synchronous dynamic random access memory rows |
US20140281717A1 (en) * | 2013-03-14 | 2014-09-18 | Nisar Ahmed | Built-in self test (bist) with clock control |
KR102225314B1 (ko) * | 2014-11-17 | 2021-03-10 | 에스케이하이닉스 주식회사 | 반도체 장치 및 동작 방법 |
CN106297897B (zh) * | 2015-05-27 | 2019-07-30 | 华邦电子股份有限公司 | 存储单元及其测试方法 |
KR20170007927A (ko) | 2015-07-13 | 2017-01-23 | 에스케이하이닉스 주식회사 | 반도체장치 및 반도체시스템 |
US9881693B2 (en) | 2016-02-16 | 2018-01-30 | Micron Technology, Inc. | Selectors on interface die for memory device |
KR102522154B1 (ko) | 2016-03-15 | 2023-04-17 | 에스케이하이닉스 주식회사 | 반도체 메모리 장치의 컨트롤러 및 이의 동작 방법 |
US10170174B1 (en) * | 2017-10-27 | 2019-01-01 | Micron Technology, Inc. | Apparatus and methods for refreshing memory |
US10937518B2 (en) | 2018-12-12 | 2021-03-02 | Micron Technology, Inc. | Multiple algorithmic pattern generator testing of a memory device |
CN111292795B (zh) * | 2019-05-23 | 2022-02-01 | 展讯通信(上海)有限公司 | 存储器的内建自测试系统 |
CN110853696B (zh) * | 2019-10-31 | 2022-06-14 | 上海华力集成电路制造有限公司 | 用于静态存储器功能检测的晶圆允收测试模块和方法 |
EP4070312A1 (en) * | 2019-12-03 | 2022-10-12 | Micron Technology, Inc. | Systems and methods for stabilizing cell threshold voltage |
US11544203B2 (en) | 2019-12-30 | 2023-01-03 | Micron Technology, Inc. | Sequencer chaining circuitry |
US20200176072A1 (en) * | 2020-02-04 | 2020-06-04 | Intel Corporation | Dynamic random access memory built-in self-test power fail mitigation |
US11616722B2 (en) * | 2020-10-22 | 2023-03-28 | EMC IP Holding Company LLC | Storage system with adaptive flow control using multiple feedback loops |
CN112614534B (zh) * | 2020-12-17 | 2023-09-05 | 珠海一微半导体股份有限公司 | 一种mbist电路系统 |
US20240071546A1 (en) * | 2022-08-30 | 2024-02-29 | Stmicroelectronics International N.V. | Built-in self test circuit for segmented static random access memory (sram) array input/output |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0548446A (ja) * | 1991-08-09 | 1993-02-26 | Sony Corp | 半導体集積回路 |
JPH10162600A (ja) | 1996-11-26 | 1998-06-19 | Mitsubishi Electric Corp | テスト機能内蔵半導体記憶装置 |
US6014336A (en) * | 1997-04-30 | 2000-01-11 | Texas Instruments Incorporated | Test enable control for built-in self-test |
JPH11329000A (ja) | 1998-05-19 | 1999-11-30 | Mitsubishi Electric Corp | 内蔵メモリテスト方法、およびそれに用いるバスインタフェースユニット、コマンドデコーダ |
US6823485B1 (en) * | 1998-11-05 | 2004-11-23 | Hitachi, Ltd. | Semiconductor storage device and test system |
US6381715B1 (en) * | 1998-12-31 | 2002-04-30 | Unisys Corporation | System and method for performing parallel initialization and testing of multiple memory banks and interfaces in a shared memory module |
US20020194558A1 (en) * | 2001-04-10 | 2002-12-19 | Laung-Terng Wang | Method and system to optimize test cost and disable defects for scan and BIST memories |
US7020815B2 (en) * | 2002-08-29 | 2006-03-28 | Micron Technology, Inc. | Memory technology test apparatus |
US7184915B2 (en) * | 2003-03-20 | 2007-02-27 | Qualcomm, Incorporated | Tiered built-in self-test (BIST) architecture for testing distributed memory modules |
-
2003
- 2003-08-28 JP JP2003304277A patent/JP4381750B2/ja not_active Expired - Fee Related
-
2004
- 2004-06-29 TW TW093119081A patent/TW200509140A/zh unknown
- 2004-07-16 CN CNA2004100716111A patent/CN1591696A/zh active Pending
- 2004-07-16 US US10/892,298 patent/US7366965B2/en not_active Expired - Fee Related
- 2004-08-27 KR KR1020040068051A patent/KR20050021932A/ko not_active Application Discontinuation
-
2008
- 2008-03-11 US US12/073,885 patent/US20090063913A1/en not_active Abandoned
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102567168A (zh) * | 2010-12-27 | 2012-07-11 | 北京国睿中数科技股份有限公司 | 一种针对phy高速接口电路的bist自动测试电路及测试方法 |
Also Published As
Publication number | Publication date |
---|---|
KR20050021932A (ko) | 2005-03-07 |
CN1591696A (zh) | 2005-03-09 |
US20050047260A1 (en) | 2005-03-03 |
JP4381750B2 (ja) | 2009-12-09 |
US7366965B2 (en) | 2008-04-29 |
US20090063913A1 (en) | 2009-03-05 |
JP2005078657A (ja) | 2005-03-24 |
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