TW200506520A - Novel photosensitive resin compositions - Google Patents
Novel photosensitive resin compositionsInfo
- Publication number
- TW200506520A TW200506520A TW093116126A TW93116126A TW200506520A TW 200506520 A TW200506520 A TW 200506520A TW 093116126 A TW093116126 A TW 093116126A TW 93116126 A TW93116126 A TW 93116126A TW 200506520 A TW200506520 A TW 200506520A
- Authority
- TW
- Taiwan
- Prior art keywords
- group
- divalent
- integer
- mixtures
- heterocyclic
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
- G03F7/0382—Macromolecular compounds which are rendered insoluble or differentially wettable the macromolecular compound being present in a chemically amplified negative photoresist composition
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/075—Silicon-containing compounds
- G03F7/0751—Silicon-containing compounds used as adhesion-promoting additives or as means to improve adhesion
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/106—Binder containing
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Materials For Photolithography (AREA)
- Macromolecular Compounds Obtained By Forming Nitrogen-Containing Linkages In General (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US47681603P | 2003-06-06 | 2003-06-06 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200506520A true TW200506520A (en) | 2005-02-16 |
TWI354865B TWI354865B (en) | 2011-12-21 |
Family
ID=33551642
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW093116126A TWI354865B (en) | 2003-06-06 | 2004-06-04 | Novel photosensitive resin compositions |
Country Status (6)
Country | Link |
---|---|
US (1) | US7129011B2 (zh) |
EP (1) | EP1636649B1 (zh) |
JP (1) | JP4464396B2 (zh) |
KR (1) | KR101067828B1 (zh) |
TW (1) | TWI354865B (zh) |
WO (1) | WO2004111726A2 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI413863B (zh) * | 2007-02-13 | 2013-11-01 | Toray Industries | 正型感光性樹脂組成物 |
Families Citing this family (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100787352B1 (ko) * | 2005-02-23 | 2007-12-18 | 주식회사 하이닉스반도체 | 하드마스크용 조성물 및 이를 이용한 반도체 소자의 패턴형성 방법 |
JP5099979B2 (ja) * | 2005-04-27 | 2012-12-19 | 日立化成デュポンマイクロシステムズ株式会社 | ネガ型感光性樹脂組成物、パターンの製造方法及び電子部品 |
JP2008546204A (ja) * | 2005-06-03 | 2008-12-18 | フジフィルム・エレクトロニック・マテリアルズ・ユーエスエイ・インコーポレイテッド | 前処理組成物 |
US7803510B2 (en) * | 2005-08-17 | 2010-09-28 | Fujifilm Electronic Materials U.S.A., Inc. | Positive photosensitive polybenzoxazole precursor compositions |
US7419611B2 (en) * | 2005-09-02 | 2008-09-02 | International Business Machines Corporation | Processes and materials for step and flash imprint lithography |
US7488771B2 (en) * | 2005-09-02 | 2009-02-10 | International Business Machines Corporation | Stabilization of vinyl ether materials |
US8871422B2 (en) * | 2005-09-22 | 2014-10-28 | Hitachi Chemical Dupont Microsystems Ltd. | Negative-type photosensitive resin composition, pattern forming method and electronic parts |
JP4923656B2 (ja) * | 2006-03-22 | 2012-04-25 | 日立化成デュポンマイクロシステムズ株式会社 | ネガ型感光性樹脂組成物、パターンの製造方法及び電子部品 |
TWI477906B (zh) * | 2006-06-20 | 2015-03-21 | Hitachi Chem Dupont Microsys | 負片型感光性樹脂組成物、圖案的製造方法以及電子零件 |
KR101025395B1 (ko) * | 2006-06-20 | 2011-03-28 | 히다치 가세이듀퐁 마이쿠로시스데무즈 가부시키가이샤 | 네거티브형 감광성 수지 조성물, 패턴의 제조방법 및 전자부품 |
JP5028059B2 (ja) * | 2006-09-28 | 2012-09-19 | 富士フイルム株式会社 | 感光性樹脂組成物、それを用いた硬化レリーフパターンの製造方法及び半導体装置 |
US20080088983A1 (en) * | 2006-10-11 | 2008-04-17 | Gereon Meyer | Damping control in magnetic nano-elements using ultrathin damping layer |
KR100833706B1 (ko) * | 2007-02-01 | 2008-05-29 | 삼성전자주식회사 | 감광성 폴리이미드 조성물, 폴리이미드 필름 및 이를 이용한 반도체 소자 |
EP2133743B1 (en) * | 2007-03-12 | 2018-01-24 | Hitachi Chemical DuPont Microsystems, Ltd. | Photosensitive resin composition, process for producing patterned hardened film with use thereof and electronic part |
EP1970761B1 (en) * | 2007-03-14 | 2012-02-29 | FUJIFILM Corporation | Photosensitive composition and method of producing a cured relief pattern |
KR101275474B1 (ko) * | 2007-10-29 | 2013-06-14 | 히다치 가세이듀퐁 마이쿠로시스데무즈 가부시키가이샤 | 포지티브형 감광성 수지 조성물, 패턴의 제조방법 및 전자부품 |
KR100932765B1 (ko) * | 2008-02-28 | 2009-12-21 | 한양대학교 산학협력단 | 폴리이미드-폴리벤조옥사졸 공중합체, 이의 제조방법, 및이를 포함하는 기체 분리막 |
CA2640517A1 (en) * | 2008-05-19 | 2009-11-19 | Industry-University Cooperation Foundation, Hanyang University | Polyamic acids dope composition, preparation method of hollow fiber using the same and hollow fiber prepared therefrom |
KR100913058B1 (ko) * | 2008-08-25 | 2009-08-20 | 금호석유화학 주식회사 | 포지티브형 감광성 수지 조성물, 패턴 형성 방법 및 반도체소자 |
US8013103B2 (en) * | 2008-10-10 | 2011-09-06 | Industry-University Cooperation Foundation, Hanyang University | Polymer compounds and a preparation method thereof |
US8487064B2 (en) | 2008-10-10 | 2013-07-16 | Industry-University Cooperation Foundation, Hanyang University | Polymer compounds and a preparation method thereof |
KR101333698B1 (ko) * | 2009-11-10 | 2013-11-27 | 제일모직주식회사 | 포지티브형 감광성 수지 조성물 |
KR101812528B1 (ko) | 2010-01-08 | 2017-12-27 | 후지필름 가부시키가이샤 | 패턴형성방법, 감활성광선성 또는 감방사선성 수지 조성물 및 레지스트 막 |
KR20120066923A (ko) | 2010-12-15 | 2012-06-25 | 제일모직주식회사 | 신규 페놀 화합물 및 이를 포함하는 포지티브형 감광성 수지 조성물 |
KR101423539B1 (ko) | 2010-12-20 | 2014-07-25 | 삼성전자 주식회사 | 포지티브형 감광성 수지 조성물 |
WO2012172793A1 (ja) * | 2011-06-15 | 2012-12-20 | 日立化成デュポンマイクロシステムズ株式会社 | 感光性樹脂組成物、該樹脂組成物を用いたパターン硬化膜の製造方法及び電子部品 |
KR101609631B1 (ko) * | 2012-12-24 | 2016-04-06 | 제일모직 주식회사 | 포지티브형 감광성 수지 조성물, 및 이를 이용한 표시 소자용 유기 절연막 및 표시 소자 |
KR101674989B1 (ko) | 2013-05-21 | 2016-11-22 | 제일모직 주식회사 | 레지스트 하층막용 조성물, 이를 사용한 패턴 형성 방법 및 상기 패턴을 포함하는 반도체 집적회로 디바이스 |
WO2015011893A1 (ja) * | 2013-07-23 | 2015-01-29 | 日立化成デュポンマイクロシステムズ株式会社 | 樹脂組成物、それを用いたパターン形成方法及び電子部品 |
KR102028483B1 (ko) * | 2013-09-17 | 2019-10-07 | 동우 화인켐 주식회사 | 착색 감광성 수지 조성물, 컬러필터 및 이를 구비한 액정표시장치 |
KR101667788B1 (ko) | 2013-12-31 | 2016-10-19 | 제일모직 주식회사 | 하드마스크 조성물 및 이를 사용한 패턴 형성 방법 |
KR102399270B1 (ko) * | 2014-11-27 | 2022-05-19 | 도레이 카부시키가이샤 | 수지 및 감광성 수지 조성물 |
JP6453186B2 (ja) * | 2015-08-19 | 2019-01-16 | 富士フイルム株式会社 | 感光性樹脂組成物、硬化膜の製造方法、硬化膜、液晶表示装置、有機エレクトロルミネッセンス表示装置およびタッチパネル |
JP6838369B2 (ja) * | 2016-11-28 | 2021-03-03 | Hdマイクロシステムズ株式会社 | ネガ型感光性樹脂組成物、硬化パターンの製造方法、硬化物及び電子デバイス |
KR102477633B1 (ko) * | 2020-02-12 | 2022-12-13 | 삼성에스디아이 주식회사 | 알칼리 가용성 수지, 이를 포함하는 감광성 수지 조성물, 감광성 수지막 및 디스플레이 장치 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE59010552D1 (de) * | 1990-03-29 | 1996-12-05 | Siemens Ag | Hochwärmebeständige Negativresists und Verfahren zur Herstellung hochwärmebeständiger Reliefstrukturen |
JPH05341522A (ja) * | 1992-06-09 | 1993-12-24 | Fuji Photo Film Co Ltd | ネガ型フオトレジスト組成物 |
DE59606492D1 (de) * | 1995-08-31 | 2001-04-05 | Infineon Technologies Ag | Herstellung von Poly-o-hydroxyamiden und Poly-o-mercaptoamiden |
JP3477077B2 (ja) * | 1997-07-01 | 2003-12-10 | 株式会社東芝 | ネガ型感光性樹脂組成物、これを用いたパターン形成方法、および電子部品 |
JP3966590B2 (ja) * | 1997-11-20 | 2007-08-29 | 旭化成エレクトロニクス株式会社 | 感光性組成物 |
JP4288796B2 (ja) | 1999-10-29 | 2009-07-01 | 日立化成デュポンマイクロシステムズ株式会社 | ネガ型感光性樹脂組成物、パターンの製造法及び電子部品 |
DE60142844D1 (de) * | 2000-10-31 | 2010-09-30 | Intel Corp | Positive lichtempfindliche harzzusammensetzung, prozess zu ihrer herstellung und halbleiterbauelemente |
JP4211225B2 (ja) | 2001-02-27 | 2009-01-21 | 日本ゼオン株式会社 | 感放射線性樹脂組成物 |
JP2003121998A (ja) | 2001-10-11 | 2003-04-23 | Hitachi Chemical Dupont Microsystems Ltd | 感光性重合体組成物及びパターン製造法及び電子部品 |
JP4317870B2 (ja) * | 2003-03-11 | 2009-08-19 | フジフィルム・エレクトロニック・マテリアルズ・ユーエスエイ・インコーポレイテッド | 新規な感光性樹脂組成物 |
-
2004
- 2004-06-03 KR KR1020057019037A patent/KR101067828B1/ko not_active IP Right Cessation
- 2004-06-03 JP JP2006515124A patent/JP4464396B2/ja not_active Expired - Fee Related
- 2004-06-03 WO PCT/US2004/017486 patent/WO2004111726A2/en active Search and Examination
- 2004-06-03 US US10/860,783 patent/US7129011B2/en not_active Expired - Fee Related
- 2004-06-03 EP EP04754154.5A patent/EP1636649B1/en not_active Not-in-force
- 2004-06-04 TW TW093116126A patent/TWI354865B/zh not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI413863B (zh) * | 2007-02-13 | 2013-11-01 | Toray Industries | 正型感光性樹脂組成物 |
Also Published As
Publication number | Publication date |
---|---|
WO2004111726A3 (en) | 2007-06-28 |
KR101067828B1 (ko) | 2011-09-27 |
JP4464396B2 (ja) | 2010-05-19 |
JP2007526493A (ja) | 2007-09-13 |
KR20060019509A (ko) | 2006-03-03 |
TWI354865B (en) | 2011-12-21 |
WO2004111726A2 (en) | 2004-12-23 |
US7129011B2 (en) | 2006-10-31 |
EP1636649A2 (en) | 2006-03-22 |
US20040253537A1 (en) | 2004-12-16 |
EP1636649B1 (en) | 2014-08-13 |
EP1636649A4 (en) | 2009-09-16 |
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Legal Events
Date | Code | Title | Description |
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MM4A | Annulment or lapse of patent due to non-payment of fees |