SI9620113B - Machine for the opposite control of printed circuits - Google Patents

Machine for the opposite control of printed circuits Download PDF

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Publication number
SI9620113B
SI9620113B SI9620113A SI9620113A SI9620113B SI 9620113 B SI9620113 B SI 9620113B SI 9620113 A SI9620113 A SI 9620113A SI 9620113 A SI9620113 A SI 9620113A SI 9620113 B SI9620113 B SI 9620113B
Authority
SI
Slovenia
Prior art keywords
needles
point
test
conductive
needle
Prior art date
Application number
SI9620113A
Other languages
English (en)
Other versions
SI9620113A (sl
Inventor
Jozef Vodopivec
Cesare Fumo
Original Assignee
New System Srl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by New System Srl filed Critical New System Srl
Publication of SI9620113A publication Critical patent/SI9620113A/sl
Publication of SI9620113B publication Critical patent/SI9620113B/sl

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G01R1/07335Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards for double-sided contacting or for testing boards with surface-mounted devices (SMD's)
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
  • Selective Calling Equipment (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Time-Division Multiplex Systems (AREA)
  • Exchange Systems With Centralized Control (AREA)
  • Preliminary Treatment Of Fibers (AREA)
  • Knitting Machines (AREA)
  • Detection And Correction Of Errors (AREA)
  • Telephonic Communication Services (AREA)
  • Sewing Machines And Sewing (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
  • Control Of Electric Motors In General (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Video Image Reproduction Devices For Color Tv Systems (AREA)
  • Preparation Of Compounds By Using Micro-Organisms (AREA)
  • Dc-Dc Converters (AREA)
  • Facsimiles In General (AREA)
  • Accessory Devices And Overall Control Thereof (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Claims (1)

  1. 9 Patentni zahtevki 1. Postopek za pregledovanje kartic (2) s tiskanim vezjem, ki uporablja pripravo takšne vrste, ki obsega dve plošči (1, Γ), ki nosita igle, z množico prevodnih igel (10), ki so osno premične in se na svoji drugi strani povežejo s sredstvom (12) za analizo električnih parametrov med dvema iglama (10), ki tvorita par igel, pri katerem se uporabljata dve plošči (1, Γ), ki nosita igle, pri čemer ena leži nasproti druge, in je med njima zaradi preizkusa nameščena kartica (2) s tiskanim vezjem, in ena plošča (1) z iglami se izvede v zadevni ravnini premično glede na nasprotno ploščo (Γ) z iglami, da se izvede preizkušanje med dvema točkama na omenjeni kartici (2) s tiskanim vezjem, priprava za preizkušanje zagotavlja nadzor s pomočjo spiska vezja z medsebojnimi položaji posameznih točk, se preizkus povezave izvaja od točke do točke, tako da je za preizkušanje povezav vezja z n točkami treba izvesti n-1 preizkusov med pari točk, ki so izbrane tako, da se pokrijejo vse povezave, se preizkus na kratek stik med različnimi vezji izvaja z izborom točke iz vsakega para vezij, se naj večje število pri preizkušanju n vezij računa po naslednji formuli: nmax = n * (n-l)/2, pri čemer se največje število zmanjša, s tem da se izberejo le priležna vezja, to se pravi tista, ki so blizu drugo drugemu v vnaprej določeni razdalji, in pri katerem je vsaka plošča (1, Γ) z iglami, v kateri so omenjene osno premične prevodne igle (10) fiksno nameščene, neodvisno nadzorovana in deluje tako, da je naj večji potreben premik opredeljen z razdaljo med eno izmed omenejenih dveh prevodnih igel (10) in najbližjo prevodno iglo (10) iste plošče (1, Γ) z iglami, so položaji, ki jih je treba preizkusiti, razdeljeni v odseke, ki ustrezajo številu prevodnih igel (10) ustrezne premične plošče (1, 1'), tako da se točka, ki jo je treba preizkusiti, lahko doseže z želj enim nameščanjem z ustrezno prevodno iglo (10), omenjeni par igel (10) za preizkušanje hkrati deluje z eno iglo nasproti druge, se preizkus nadaljuje od točke do točke na ponavljajoč se način.
SI9620113A 1995-09-22 1996-05-03 Machine for the opposite control of printed circuits SI9620113B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IT95UD000181A IT1282827B1 (it) 1995-09-22 1995-09-22 Macchina per il controllo contrapposto dei circuiti stampati
PCT/IT1996/000090 WO1997011377A1 (en) 1995-09-22 1996-05-03 Machine for the opposite control of printed circuits

Publications (2)

Publication Number Publication Date
SI9620113A SI9620113A (sl) 1998-08-31
SI9620113B true SI9620113B (en) 2005-08-31

Family

ID=11421917

Family Applications (1)

Application Number Title Priority Date Filing Date
SI9620113A SI9620113B (en) 1995-09-22 1996-05-03 Machine for the opposite control of printed circuits

Country Status (25)

Country Link
US (1) US6218851B1 (sl)
EP (1) EP0852014B1 (sl)
JP (1) JPH11512530A (sl)
KR (1) KR100407068B1 (sl)
CN (1) CN1100268C (sl)
AT (1) ATE233900T1 (sl)
AU (1) AU710084B2 (sl)
BR (1) BR9610589A (sl)
CA (1) CA2231865A1 (sl)
CZ (1) CZ294961B6 (sl)
DE (1) DE69626527T2 (sl)
DK (1) DK0852014T3 (sl)
ES (1) ES2194098T3 (sl)
HU (1) HUP9900003A3 (sl)
IT (1) IT1282827B1 (sl)
MX (1) MX9802287A (sl)
NO (1) NO316412B1 (sl)
NZ (1) NZ306552A (sl)
PL (1) PL190321B1 (sl)
PT (1) PT852014E (sl)
RO (1) RO119658B1 (sl)
RU (1) RU2182748C2 (sl)
SI (1) SI9620113B (sl)
TR (1) TR199800516T1 (sl)
WO (1) WO1997011377A1 (sl)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10219618A1 (de) * 2002-05-02 2003-11-27 Scorpion Technologies Ag Vorrichtung zum Testen von Leiterplatten
KR100835182B1 (ko) * 2007-02-12 2008-06-04 주식회사 백승 인쇄회로기판 검사용 지그
DE102007025458A1 (de) * 2007-05-30 2008-12-04 Siemens Ag Codierung, insbesondere für eine Einschubanordnung eines elektrischen Schaltfeldes
DE102009004555A1 (de) * 2009-01-14 2010-09-30 Atg Luther & Maelzer Gmbh Verfahren zum Prüfen von Leiterplatten
US8269505B2 (en) * 2009-12-15 2012-09-18 International Business Machines Corporation Locating short circuits in printed circuit boards
DE102016114144A1 (de) * 2016-08-01 2018-02-01 Endress+Hauser Flowtec Ag Testsystem zur Prüfung von elektrischen Verbindungen von Bauteilen mit einer Leiterplatte

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4774462A (en) * 1984-06-11 1988-09-27 Black Thomas J Automatic test system
DE3781979D1 (de) * 1986-08-07 1992-11-05 Siemens Ag Pruefeinrichtung fuer beidseitige, zweistufige kontaktierung bestueckter leiterplatten.
US4841241A (en) * 1986-08-07 1989-06-20 Siemens Aktiengesellschaft Testing device for both-sided contacting of component-equipped printed circuit boards
GB8700754D0 (en) * 1987-01-14 1987-02-18 Int Computers Ltd Test apparatus for printed circuit boards
EP0468153B1 (de) * 1990-07-25 1995-10-11 atg test systems GmbH Kontaktierungsvorrichtung für Prüfzwecke
IT1282829B1 (it) 1995-12-22 1998-03-31 New System Srl Macchina di test elettrico per circuiti stampati con posizione registrabile degli aghi di sonda
US5818246A (en) * 1996-05-07 1998-10-06 Zhong; George Guozhen Automatic multi-probe PWB tester

Also Published As

Publication number Publication date
BR9610589A (pt) 1999-07-06
ES2194098T3 (es) 2003-11-16
ATE233900T1 (de) 2003-03-15
NO316412B1 (no) 2004-01-19
JPH11512530A (ja) 1999-10-26
NO981179D0 (no) 1998-03-17
DE69626527T2 (de) 2003-12-24
DE69626527D1 (de) 2003-04-10
ITUD950181A0 (sl) 1995-09-22
EP0852014B1 (en) 2003-03-05
TR199800516T1 (xx) 1998-05-21
HUP9900003A3 (en) 1999-11-29
PT852014E (pt) 2003-07-31
HUP9900003A2 (hu) 1999-04-28
CN1100268C (zh) 2003-01-29
CZ294961B6 (cs) 2005-04-13
NO981179L (no) 1998-04-23
MX9802287A (es) 1998-08-30
KR19990063615A (ko) 1999-07-26
RU2182748C2 (ru) 2002-05-20
PL325827A1 (en) 1998-08-03
WO1997011377A1 (en) 1997-03-27
AU710084B2 (en) 1999-09-16
RO119658B1 (ro) 2005-01-28
ITUD950181A1 (it) 1997-03-22
CN1196794A (zh) 1998-10-21
PL190321B1 (pl) 2005-11-30
AU5513496A (en) 1997-04-09
US6218851B1 (en) 2001-04-17
SI9620113A (sl) 1998-08-31
KR100407068B1 (ko) 2004-01-24
DK0852014T3 (da) 2003-06-23
CZ74598A3 (cs) 1998-07-15
NZ306552A (en) 2000-01-28
IT1282827B1 (it) 1998-03-31
EP0852014A1 (en) 1998-07-08
CA2231865A1 (en) 1997-03-27

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Legal Events

Date Code Title Description
IF Valid on the event date
OU02 Decision according to article 73(2) ipa 1992, publication of decision on partial fulfilment of the invention and change of patent claims

Effective date: 20050608

KO00 Lapse of patent

Effective date: 20060328