NO316412B1 - Fremgangsmåte for kontroll av kretskort - Google Patents
Fremgangsmåte for kontroll av kretskort Download PDFInfo
- Publication number
- NO316412B1 NO316412B1 NO19981179A NO981179A NO316412B1 NO 316412 B1 NO316412 B1 NO 316412B1 NO 19981179 A NO19981179 A NO 19981179A NO 981179 A NO981179 A NO 981179A NO 316412 B1 NO316412 B1 NO 316412B1
- Authority
- NO
- Norway
- Prior art keywords
- control
- needles
- needle
- point
- conductive
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims description 8
- 238000012360 testing method Methods 0.000 claims description 29
- 230000003252 repetitive effect Effects 0.000 claims description 2
- 239000000758 substrate Substances 0.000 description 10
- 239000000523 sample Substances 0.000 description 8
- 230000008901 benefit Effects 0.000 description 3
- 230000008672 reprogramming Effects 0.000 description 3
- 230000006978 adaptation Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 230000003213 activating effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000004590 computer program Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000032258 transport Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
- G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
- G01R1/07335—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards for double-sided contacting or for testing boards with surface-mounted devices (SMD's)
Landscapes
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
- Measuring Leads Or Probes (AREA)
- Monitoring And Testing Of Exchanges (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Selective Calling Equipment (AREA)
- Time-Division Multiplex Systems (AREA)
- Exchange Systems With Centralized Control (AREA)
- Detection And Correction Of Errors (AREA)
- Video Image Reproduction Devices For Color Tv Systems (AREA)
- Sewing Machines And Sewing (AREA)
- Knitting Machines (AREA)
- Preparation Of Compounds By Using Micro-Organisms (AREA)
- Control Of Electric Motors In General (AREA)
- Oscillators With Electromechanical Resonators (AREA)
- Preliminary Treatment Of Fibers (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
- Telephonic Communication Services (AREA)
- Accessory Devices And Overall Control Thereof (AREA)
- Facsimiles In General (AREA)
- Dc-Dc Converters (AREA)
- Emergency Protection Circuit Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IT95UD000181A IT1282827B1 (it) | 1995-09-22 | 1995-09-22 | Macchina per il controllo contrapposto dei circuiti stampati |
PCT/IT1996/000090 WO1997011377A1 (en) | 1995-09-22 | 1996-05-03 | Machine for the opposite control of printed circuits |
Publications (3)
Publication Number | Publication Date |
---|---|
NO981179D0 NO981179D0 (no) | 1998-03-17 |
NO981179L NO981179L (no) | 1998-04-23 |
NO316412B1 true NO316412B1 (no) | 2004-01-19 |
Family
ID=11421917
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NO19981179A NO316412B1 (no) | 1995-09-22 | 1998-03-17 | Fremgangsmåte for kontroll av kretskort |
Country Status (25)
Country | Link |
---|---|
US (1) | US6218851B1 (sl) |
EP (1) | EP0852014B1 (sl) |
JP (1) | JPH11512530A (sl) |
KR (1) | KR100407068B1 (sl) |
CN (1) | CN1100268C (sl) |
AT (1) | ATE233900T1 (sl) |
AU (1) | AU710084B2 (sl) |
BR (1) | BR9610589A (sl) |
CA (1) | CA2231865A1 (sl) |
CZ (1) | CZ294961B6 (sl) |
DE (1) | DE69626527T2 (sl) |
DK (1) | DK0852014T3 (sl) |
ES (1) | ES2194098T3 (sl) |
HU (1) | HUP9900003A3 (sl) |
IT (1) | IT1282827B1 (sl) |
MX (1) | MX9802287A (sl) |
NO (1) | NO316412B1 (sl) |
NZ (1) | NZ306552A (sl) |
PL (1) | PL190321B1 (sl) |
PT (1) | PT852014E (sl) |
RO (1) | RO119658B1 (sl) |
RU (1) | RU2182748C2 (sl) |
SI (1) | SI9620113B (sl) |
TR (1) | TR199800516T1 (sl) |
WO (1) | WO1997011377A1 (sl) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10219618A1 (de) * | 2002-05-02 | 2003-11-27 | Scorpion Technologies Ag | Vorrichtung zum Testen von Leiterplatten |
KR100835182B1 (ko) * | 2007-02-12 | 2008-06-04 | 주식회사 백승 | 인쇄회로기판 검사용 지그 |
DE102007025458A1 (de) * | 2007-05-30 | 2008-12-04 | Siemens Ag | Codierung, insbesondere für eine Einschubanordnung eines elektrischen Schaltfeldes |
DE102009004555A1 (de) * | 2009-01-14 | 2010-09-30 | Atg Luther & Maelzer Gmbh | Verfahren zum Prüfen von Leiterplatten |
US8269505B2 (en) * | 2009-12-15 | 2012-09-18 | International Business Machines Corporation | Locating short circuits in printed circuit boards |
DE102016114144A1 (de) * | 2016-08-01 | 2018-02-01 | Endress+Hauser Flowtec Ag | Testsystem zur Prüfung von elektrischen Verbindungen von Bauteilen mit einer Leiterplatte |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4774462A (en) * | 1984-06-11 | 1988-09-27 | Black Thomas J | Automatic test system |
US4841241A (en) * | 1986-08-07 | 1989-06-20 | Siemens Aktiengesellschaft | Testing device for both-sided contacting of component-equipped printed circuit boards |
DE3781979D1 (de) * | 1986-08-07 | 1992-11-05 | Siemens Ag | Pruefeinrichtung fuer beidseitige, zweistufige kontaktierung bestueckter leiterplatten. |
GB8700754D0 (en) * | 1987-01-14 | 1987-02-18 | Int Computers Ltd | Test apparatus for printed circuit boards |
EP0468153B1 (de) * | 1990-07-25 | 1995-10-11 | atg test systems GmbH | Kontaktierungsvorrichtung für Prüfzwecke |
IT1282829B1 (it) | 1995-12-22 | 1998-03-31 | New System Srl | Macchina di test elettrico per circuiti stampati con posizione registrabile degli aghi di sonda |
US5818246A (en) * | 1996-05-07 | 1998-10-06 | Zhong; George Guozhen | Automatic multi-probe PWB tester |
-
1995
- 1995-09-22 IT IT95UD000181A patent/IT1282827B1/it active IP Right Grant
-
1996
- 1996-05-03 SI SI9620113A patent/SI9620113B/sl not_active IP Right Cessation
- 1996-05-03 CA CA002231865A patent/CA2231865A1/en not_active Abandoned
- 1996-05-03 PT PT96912210T patent/PT852014E/pt unknown
- 1996-05-03 HU HU9900003A patent/HUP9900003A3/hu unknown
- 1996-05-03 DE DE69626527T patent/DE69626527T2/de not_active Expired - Fee Related
- 1996-05-03 AT AT96912210T patent/ATE233900T1/de not_active IP Right Cessation
- 1996-05-03 KR KR10-1998-0702060A patent/KR100407068B1/ko not_active IP Right Cessation
- 1996-05-03 DK DK96912210T patent/DK0852014T3/da active
- 1996-05-03 PL PL96325827A patent/PL190321B1/pl not_active IP Right Cessation
- 1996-05-03 WO PCT/IT1996/000090 patent/WO1997011377A1/en active IP Right Grant
- 1996-05-03 RU RU98107136/09A patent/RU2182748C2/ru not_active IP Right Cessation
- 1996-05-03 JP JP9512551A patent/JPH11512530A/ja not_active Ceased
- 1996-05-03 CN CN96197097A patent/CN1100268C/zh not_active Expired - Fee Related
- 1996-05-03 CZ CZ1998745A patent/CZ294961B6/cs not_active IP Right Cessation
- 1996-05-03 TR TR1998/00516T patent/TR199800516T1/xx unknown
- 1996-05-03 NZ NZ306552A patent/NZ306552A/xx unknown
- 1996-05-03 EP EP96912210A patent/EP0852014B1/en not_active Expired - Lifetime
- 1996-05-03 BR BR9610589A patent/BR9610589A/pt not_active IP Right Cessation
- 1996-05-03 ES ES96912210T patent/ES2194098T3/es not_active Expired - Lifetime
- 1996-05-03 RO RO98-00758A patent/RO119658B1/ro unknown
- 1996-05-03 US US09/043,565 patent/US6218851B1/en not_active Expired - Fee Related
- 1996-05-03 AU AU55134/96A patent/AU710084B2/en not_active Ceased
-
1998
- 1998-03-17 NO NO19981179A patent/NO316412B1/no unknown
- 1998-03-23 MX MX9802287A patent/MX9802287A/es not_active IP Right Cessation
Also Published As
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7183783B2 (en) | Method and apparatus for pad aligned multiprobe wafer testing | |
JP3293995B2 (ja) | プロ−ビング装置およびプロ−ビング方法 | |
GB2282230A (en) | P.C.B. test system | |
JPH022547B2 (sl) | ||
NO316412B1 (no) | Fremgangsmåte for kontroll av kretskort | |
AU718507B2 (en) | Machine for the electric test of printed circuits with adjustable position of the sound needles | |
US6163866A (en) | System level IC testing arrangement and method | |
JP2012503189A (ja) | 所定の温度条件下で繰り返しパターンの複数の電子部品を検査する方法 | |
EP0989409A1 (en) | Scan test machine for densely spaced test sites | |
US5659483A (en) | System and method for analyzing conductor formation processes | |
EP1022572A1 (en) | Scan test apparatus for continuity testing of bare printed circuit boards | |
JP2965174B2 (ja) | 半導体素子検査装置 | |
JPS59171131A (ja) | 半導体集積回路の試験方法 | |
WO1999023496A1 (en) | A contacting device | |
JPH05315414A (ja) | プローブカード及びその仕様検査方法 | |
JPH04340484A (ja) | 多軸プローブ位置決め装置 | |
WO2001077697A2 (en) | Electrical and electro-mechanical test method and apparatus | |
JP2007139450A (ja) | デバイス試験装置およびデバイス試験方法 | |
WO1997011378A1 (en) | Machine for the control of printed circuits | |
JP2000031218A (ja) | 集積回路試験装置及び集積回路試験方法 | |
KR20040079543A (ko) | 프로빙장치 및 프로빙방법 | |
JPS63117273A (ja) | 汎用テストフイクスチユア | |
JPH1010189A (ja) | デバイスコンタクトユニット | |
KR20040000760A (ko) | 인덱서 센싱구조가 개선된 반도체 소자 검사장치 | |
KR20070064755A (ko) | 반도체 메모리 장치의 테스트 설비 |