DE69626527D1 - Verfahren zur kontrolle von leiterplatten - Google Patents

Verfahren zur kontrolle von leiterplatten

Info

Publication number
DE69626527D1
DE69626527D1 DE69626527T DE69626527T DE69626527D1 DE 69626527 D1 DE69626527 D1 DE 69626527D1 DE 69626527 T DE69626527 T DE 69626527T DE 69626527 T DE69626527 T DE 69626527T DE 69626527 D1 DE69626527 D1 DE 69626527D1
Authority
DE
Germany
Prior art keywords
circuit boards
checking circuit
needles
needle
board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69626527T
Other languages
English (en)
Other versions
DE69626527T2 (de
Inventor
Jozef Vodopivec
Cesare Fumo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
New System SRL
Original Assignee
New System SRL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by New System SRL filed Critical New System SRL
Application granted granted Critical
Publication of DE69626527D1 publication Critical patent/DE69626527D1/de
Publication of DE69626527T2 publication Critical patent/DE69626527T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G01R1/07335—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards for double-sided contacting or for testing boards with surface-mounted devices (SMD's)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Selective Calling Equipment (AREA)
  • Exchange Systems With Centralized Control (AREA)
  • Time-Division Multiplex Systems (AREA)
  • Dc-Dc Converters (AREA)
  • Knitting Machines (AREA)
  • Telephonic Communication Services (AREA)
  • Detection And Correction Of Errors (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Accessory Devices And Overall Control Thereof (AREA)
  • Preliminary Treatment Of Fibers (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Facsimiles In General (AREA)
  • Sewing Machines And Sewing (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
  • Video Image Reproduction Devices For Color Tv Systems (AREA)
  • Control Of Electric Motors In General (AREA)
  • Preparation Of Compounds By Using Micro-Organisms (AREA)
DE69626527T 1995-09-22 1996-05-03 Verfahren zur kontrolle von leiterplatten Expired - Fee Related DE69626527T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IT95UD000181A IT1282827B1 (it) 1995-09-22 1995-09-22 Macchina per il controllo contrapposto dei circuiti stampati
PCT/IT1996/000090 WO1997011377A1 (en) 1995-09-22 1996-05-03 Machine for the opposite control of printed circuits

Publications (2)

Publication Number Publication Date
DE69626527D1 true DE69626527D1 (de) 2003-04-10
DE69626527T2 DE69626527T2 (de) 2003-12-24

Family

ID=11421917

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69626527T Expired - Fee Related DE69626527T2 (de) 1995-09-22 1996-05-03 Verfahren zur kontrolle von leiterplatten

Country Status (25)

Country Link
US (1) US6218851B1 (de)
EP (1) EP0852014B1 (de)
JP (1) JPH11512530A (de)
KR (1) KR100407068B1 (de)
CN (1) CN1100268C (de)
AT (1) ATE233900T1 (de)
AU (1) AU710084B2 (de)
BR (1) BR9610589A (de)
CA (1) CA2231865A1 (de)
CZ (1) CZ294961B6 (de)
DE (1) DE69626527T2 (de)
DK (1) DK0852014T3 (de)
ES (1) ES2194098T3 (de)
HU (1) HUP9900003A3 (de)
IT (1) IT1282827B1 (de)
MX (1) MX9802287A (de)
NO (1) NO316412B1 (de)
NZ (1) NZ306552A (de)
PL (1) PL190321B1 (de)
PT (1) PT852014E (de)
RO (1) RO119658B1 (de)
RU (1) RU2182748C2 (de)
SI (1) SI9620113B (de)
TR (1) TR199800516T1 (de)
WO (1) WO1997011377A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10219618A1 (de) * 2002-05-02 2003-11-27 Scorpion Technologies Ag Vorrichtung zum Testen von Leiterplatten
KR100835182B1 (ko) * 2007-02-12 2008-06-04 주식회사 백승 인쇄회로기판 검사용 지그
DE102007025458A1 (de) * 2007-05-30 2008-12-04 Siemens Ag Codierung, insbesondere für eine Einschubanordnung eines elektrischen Schaltfeldes
DE102009004555A1 (de) * 2009-01-14 2010-09-30 Atg Luther & Maelzer Gmbh Verfahren zum Prüfen von Leiterplatten
US8269505B2 (en) * 2009-12-15 2012-09-18 International Business Machines Corporation Locating short circuits in printed circuit boards
DE102016114144A1 (de) * 2016-08-01 2018-02-01 Endress+Hauser Flowtec Ag Testsystem zur Prüfung von elektrischen Verbindungen von Bauteilen mit einer Leiterplatte

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4774462A (en) * 1984-06-11 1988-09-27 Black Thomas J Automatic test system
US4841241A (en) * 1986-08-07 1989-06-20 Siemens Aktiengesellschaft Testing device for both-sided contacting of component-equipped printed circuit boards
EP0256368B1 (de) * 1986-08-07 1992-09-30 Siemens Aktiengesellschaft Prüfeinrichtung für beidseitige, zweistufige Kontaktierung bestückter Leiterplatten
GB8700754D0 (en) * 1987-01-14 1987-02-18 Int Computers Ltd Test apparatus for printed circuit boards
EP0468153B1 (de) * 1990-07-25 1995-10-11 atg test systems GmbH Kontaktierungsvorrichtung für Prüfzwecke
NZ315085A (en) 1995-12-22 2007-12-21 New System Srl Testing printed circuit boards, two coplanar boards containing test needles movable with respect to each other
US5818246A (en) * 1996-05-07 1998-10-06 Zhong; George Guozhen Automatic multi-probe PWB tester

Also Published As

Publication number Publication date
DK0852014T3 (da) 2003-06-23
SI9620113A (sl) 1998-08-31
SI9620113B (en) 2005-08-31
NZ306552A (en) 2000-01-28
JPH11512530A (ja) 1999-10-26
AU710084B2 (en) 1999-09-16
RU2182748C2 (ru) 2002-05-20
PT852014E (pt) 2003-07-31
ITUD950181A1 (it) 1997-03-22
DE69626527T2 (de) 2003-12-24
MX9802287A (es) 1998-08-30
HUP9900003A2 (hu) 1999-04-28
NO981179L (no) 1998-04-23
RO119658B1 (ro) 2005-01-28
CZ294961B6 (cs) 2005-04-13
IT1282827B1 (it) 1998-03-31
ATE233900T1 (de) 2003-03-15
EP0852014B1 (de) 2003-03-05
PL325827A1 (en) 1998-08-03
BR9610589A (pt) 1999-07-06
AU5513496A (en) 1997-04-09
TR199800516T1 (xx) 1998-05-21
CA2231865A1 (en) 1997-03-27
PL190321B1 (pl) 2005-11-30
CN1100268C (zh) 2003-01-29
KR100407068B1 (ko) 2004-01-24
ES2194098T3 (es) 2003-11-16
EP0852014A1 (de) 1998-07-08
CN1196794A (zh) 1998-10-21
HUP9900003A3 (en) 1999-11-29
US6218851B1 (en) 2001-04-17
WO1997011377A1 (en) 1997-03-27
NO316412B1 (no) 2004-01-19
CZ74598A3 (cs) 1998-07-15
NO981179D0 (no) 1998-03-17
ITUD950181A0 (de) 1995-09-22
KR19990063615A (ko) 1999-07-26

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee