DE69123290D1 - Inspektionsgerät für gedruckte Leiterplatten - Google Patents
Inspektionsgerät für gedruckte LeiterplattenInfo
- Publication number
- DE69123290D1 DE69123290D1 DE69123290T DE69123290T DE69123290D1 DE 69123290 D1 DE69123290 D1 DE 69123290D1 DE 69123290 T DE69123290 T DE 69123290T DE 69123290 T DE69123290 T DE 69123290T DE 69123290 D1 DE69123290 D1 DE 69123290D1
- Authority
- DE
- Germany
- Prior art keywords
- printed circuit
- inspection
- circuit board
- probes
- circuit boards
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07392—Multiple probes manipulating each probe element or tip individually
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Monitoring And Testing Of Exchanges (AREA)
- Maintenance And Management Of Digital Transmission (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2134204A JP2772115B2 (ja) | 1990-05-25 | 1990-05-25 | プリント基板もしくは実装基板用データ処理方法及び装置 |
JP2276371A JPH04152281A (ja) | 1990-10-17 | 1990-10-17 | デュアルプローブヘッド |
JP2314307A JP2769386B2 (ja) | 1990-11-21 | 1990-11-21 | プリント基板検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69123290D1 true DE69123290D1 (de) | 1997-01-09 |
DE69123290T2 DE69123290T2 (de) | 1997-06-26 |
Family
ID=27316846
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69123290T Expired - Fee Related DE69123290T2 (de) | 1990-05-25 | 1991-05-21 | Inspektionsgerät für gedruckte Leiterplatten |
Country Status (5)
Country | Link |
---|---|
US (1) | US5107206A (de) |
EP (1) | EP0458280B1 (de) |
KR (1) | KR0169739B1 (de) |
AT (1) | ATE145729T1 (de) |
DE (1) | DE69123290T2 (de) |
Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6828812B2 (en) * | 1991-06-04 | 2004-12-07 | Micron Technology, Inc. | Test apparatus for testing semiconductor dice including substrate with penetration limiting contacts for making electrical connections |
US5469064A (en) * | 1992-01-14 | 1995-11-21 | Hewlett-Packard Company | Electrical assembly testing using robotic positioning of probes |
TW227644B (de) * | 1992-12-18 | 1994-08-01 | Tesukon Kk | |
US5543726A (en) * | 1994-01-03 | 1996-08-06 | International Business Machines Corporation | Open frame gantry probing system |
DE4414770A1 (de) * | 1994-04-27 | 1995-11-02 | Hubert Driller | Testsystem für bestückte und unbestückte Leiterplatten |
DE4441347C2 (de) * | 1994-11-21 | 1998-10-29 | Peter Fritzsche | Verfahren zum Prüfen von elektronischen Schaltungen auf Leiterplatten und Vorrichtung zum Durchführen des Verfahrens |
DE19503329C2 (de) * | 1995-02-02 | 2000-05-18 | Ita Ingb Testaufgaben Gmbh | Testvorrichtung für elektronische Flachbaugruppen |
US5735173A (en) * | 1995-10-04 | 1998-04-07 | Probot Incorporated | Pivotally linked position control drive system |
KR0176627B1 (ko) * | 1995-12-30 | 1999-05-15 | 김광호 | 인쇄회로기판의 통전검사용 프로브 장치 |
USD383683S (en) * | 1996-04-25 | 1997-09-16 | Tokyo Electron Limited | Wafer prober |
US6259960B1 (en) * | 1996-11-01 | 2001-07-10 | Joel Ltd. | Part-inspecting system |
AU9063298A (en) * | 1997-09-15 | 1999-04-05 | Tellabs Denmark A/S | A method of controlling test probes in a testing apparatus for electronic printed circuit boards, and an apparatus for performing the method |
DE69931552T2 (de) * | 1998-04-15 | 2007-05-16 | Baldwin-Japan Ltd. | Optischer Sensor |
WO2001036985A1 (de) * | 1999-11-16 | 2001-05-25 | Connexion Rosenberger Gmbh | Messstation für integrierte schaltkreise auf wafern oder andere elektronische bauelemente sowie bausatz zum zusammenbau derartiger messstationen |
US6657449B2 (en) * | 2000-12-21 | 2003-12-02 | Hansaem Digitec Co., Ltd. | Test pin unit for PCB test device and feeding device of the same |
WO2002082528A1 (fr) * | 2001-04-04 | 2002-10-17 | Fujitsu Limited | Appareil contacteur pour dispositif semi-conducteur et procede de test dudit dispositif semi-conducteur |
DE10314462B4 (de) * | 2003-03-28 | 2007-02-08 | Ina - Drives & Mechatronics Gmbh & Co. Ohg | Anordnung zum Prüfen von elektrischen Leiterplatten |
US7319335B2 (en) * | 2004-02-12 | 2008-01-15 | Applied Materials, Inc. | Configurable prober for TFT LCD array testing |
US7355418B2 (en) * | 2004-02-12 | 2008-04-08 | Applied Materials, Inc. | Configurable prober for TFT LCD array test |
US7355417B1 (en) * | 2005-09-20 | 2008-04-08 | Emc Corporation | Techniques for obtaining electromagnetic data from a circuit board |
US8860449B2 (en) * | 2011-06-10 | 2014-10-14 | Tektronix, Inc. | Dual probing tip system |
CA2848164C (en) * | 2011-09-05 | 2018-01-23 | Kabushiki Kaisha Nihon Micronics | Evaluation apparatus and evaluation method of sheet type cell |
US9989583B2 (en) * | 2013-03-13 | 2018-06-05 | Xcerra Corporation | Cross-bar unit for a test apparatus for circuit boards, and test apparatus containing the former |
DE102013102564A1 (de) | 2013-03-13 | 2014-09-18 | Dtg International Gmbh | Traverseneinheit für eine Prüfvorrichtung für Leiterplatten, sowie Prüfvorrichtung damit |
TWI586967B (zh) * | 2015-10-27 | 2017-06-11 | Mpi Corp | Probe module |
DE202016102705U1 (de) * | 2016-05-20 | 2016-06-30 | Bobst Mex Sa | Qualitätskontrollstation mit Kamerakalibrierungssystem für Bogenelement-Verarbeitungsmaschine |
DE102017102700A1 (de) | 2017-02-10 | 2018-09-13 | Atg Luther & Maelzer Gmbh | Prüfvorrichtung und Verfahren zum Prüfen von Leiterplatten |
CN110286307B (zh) * | 2018-03-19 | 2022-04-08 | 科磊股份有限公司 | 探针检测系统及用于检测半导体元件的方法 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2628428C3 (de) * | 1976-06-24 | 1979-02-15 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Adapter zum Verbinden von Anschluß- und/oder Prüfpunkten einer Baugruppe mit einer Mefischaltung |
DE2637878C3 (de) * | 1976-08-23 | 1979-09-27 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Anordnung zum Prüfen der Funktionsfähigkeit einer elektrischen Baugruppe |
DE2800775A1 (de) * | 1978-01-09 | 1979-07-12 | Luther & Maelzer Gmbh | Verfahrensanordnung und vorrichtung zur aufnahme und funktionsmessueberpruefung von unbestueckten leiterplatten |
FR2418466A1 (fr) * | 1978-02-24 | 1979-09-21 | Telecommunications Sa | Appareil pour etablir des prises de contact temporaires sur des circuits electriques |
US4251772A (en) * | 1978-12-26 | 1981-02-17 | Pacific Western Systems Inc. | Probe head for an automatic semiconductive wafer prober |
US4362991A (en) * | 1980-12-12 | 1982-12-07 | Burroughs Corporation | Integrated circuit test probe assembly |
JPS5798869A (en) * | 1980-12-12 | 1982-06-19 | Fujitsu Ltd | Checking method for continuity of printed board circuit |
US4574235A (en) * | 1981-06-05 | 1986-03-04 | Micro Component Technology, Inc. | Transmission line connector and contact set assembly for test site |
US4471298A (en) * | 1981-12-11 | 1984-09-11 | Cirdyne, Inc. | Apparatus for automatically electrically testing printed circuit boards |
US4527119A (en) * | 1982-05-17 | 1985-07-02 | Testamatic, Incorporated | High speed, low mass, movable probe and/or instrument positioner, tool and like items suitable for use in a controlled environment chamber |
US4705447A (en) * | 1983-08-11 | 1987-11-10 | Intest Corporation | Electronic test head positioner for test systems |
US4523749A (en) * | 1983-03-02 | 1985-06-18 | W. A. Whitney Corp. | Hole forming machine with adjustable work clamps |
EP0293497B1 (de) * | 1987-05-26 | 1993-03-10 | Ibm Deutschland Gmbh | Kontaktsonden-Anordnung mit Feinpositionier-Vorrichtung |
-
1991
- 1991-05-20 US US07/702,858 patent/US5107206A/en not_active Expired - Fee Related
- 1991-05-21 DE DE69123290T patent/DE69123290T2/de not_active Expired - Fee Related
- 1991-05-21 EP EP91108208A patent/EP0458280B1/de not_active Expired - Lifetime
- 1991-05-21 AT AT91108208T patent/ATE145729T1/de not_active IP Right Cessation
- 1991-05-25 KR KR1019910008688A patent/KR0169739B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
DE69123290T2 (de) | 1997-06-26 |
ATE145729T1 (de) | 1996-12-15 |
EP0458280A2 (de) | 1991-11-27 |
EP0458280B1 (de) | 1996-11-27 |
KR0169739B1 (ko) | 1999-03-20 |
EP0458280A3 (en) | 1993-05-26 |
US5107206A (en) | 1992-04-21 |
KR910020451A (ko) | 1991-12-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |