USD383683S - Wafer prober - Google Patents

Wafer prober Download PDF

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Publication number
USD383683S
USD383683S US29/053,608 US5360896F USD383683S US D383683 S USD383683 S US D383683S US 5360896 F US5360896 F US 5360896F US D383683 S USD383683 S US D383683S
Authority
US
United States
Prior art keywords
wafer prober
prober
wafer
view
ornamental design
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/053,608
Inventor
Osamu Kamata
Masahiko Sugiyama
Munetoshi Nagasaka
Haruhiko Yoshioka
Kazumi Yamagata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Priority to US29/053,608 priority Critical patent/USD383683S/en
Application granted granted Critical
Publication of USD383683S publication Critical patent/USD383683S/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a top/front/left side perspective view of a wafer prober showing our new design;
FIG. 2 is a top/front/left side perspective view thereof with a front cover open;
FIG. 3 is a front view thereof;
FIG. 4 is a top view thereof;
FIG. 5 is a right side view thereof;
FIG. 6 is a back view thereof;
FIG. 7 is a left side view thereof; and,
FIG. 8 is a bottom view thereof.

Claims (1)

  1. The ornamental design for wafer prober, as shown.
US29/053,608 1996-04-25 1996-04-25 Wafer prober Expired - Lifetime USD383683S (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US29/053,608 USD383683S (en) 1996-04-25 1996-04-25 Wafer prober

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29/053,608 USD383683S (en) 1996-04-25 1996-04-25 Wafer prober

Publications (1)

Publication Number Publication Date
USD383683S true USD383683S (en) 1997-09-16

Family

ID=71511035

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/053,608 Expired - Lifetime USD383683S (en) 1996-04-25 1996-04-25 Wafer prober

Country Status (1)

Country Link
US (1) USD383683S (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD264873S (en) * 1980-06-16 1982-06-08 Eastman Kodak Company Chemical analyzer
US5107206A (en) * 1990-05-25 1992-04-21 Tescon Co., Ltd. Printed circuit board inspection apparatus
USD350490S (en) * 1992-10-08 1994-09-13 Tokyo Electron Kabushiki Kaisha Semiconductor wafer testing apparatus
US5506512A (en) * 1993-11-25 1996-04-09 Tokyo Electron Limited Transfer apparatus having an elevator and prober using the same

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD264873S (en) * 1980-06-16 1982-06-08 Eastman Kodak Company Chemical analyzer
US5107206A (en) * 1990-05-25 1992-04-21 Tescon Co., Ltd. Printed circuit board inspection apparatus
USD350490S (en) * 1992-10-08 1994-09-13 Tokyo Electron Kabushiki Kaisha Semiconductor wafer testing apparatus
US5506512A (en) * 1993-11-25 1996-04-09 Tokyo Electron Limited Transfer apparatus having an elevator and prober using the same

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