SI9620133B - Priprava za električno preskušanje tiskanih vezij z nastavljivim položajem sondnih igel - Google Patents
Priprava za električno preskušanje tiskanih vezij z nastavljivim položajem sondnih igel Download PDFInfo
- Publication number
- SI9620133B SI9620133B SI9620133A SI9620133A SI9620133B SI 9620133 B SI9620133 B SI 9620133B SI 9620133 A SI9620133 A SI 9620133A SI 9620133 A SI9620133 A SI 9620133A SI 9620133 B SI9620133 B SI 9620133B
- Authority
- SI
- Slovenia
- Prior art keywords
- needle
- plates
- needles
- card
- needle plate
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
- Perforating, Stamping-Out Or Severing By Means Other Than Cutting (AREA)
- Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
- Supply And Installment Of Electrical Components (AREA)
Description
* V tem dokumentu so objavljeni spremenjeni zahtevki patenta 9620133 A. Zahtevki so bili spremenjeni na podlagi ugotovitvene odločbe, izdane po členu 93(l)(b)
Zakona o industrijski lastnini (Uradni list RS, St. 102/04)
Claims (5)
1. Priprava za električno preskušanje tiskanih vezij na karticah (2), ki jih je treba preskusiti, vključujoča plošče (1SS; 1SD; 1IS; 1ID), ki nosijo množico prevodnih igel (10), ki so priključljive na svoji drugi strani na sredstvo (12) za analiziranje električnih parametrov med dvema želj enima točkama v dotiku z dvema iglama na kartici s tiskanim vezjem, ki jo je treba preskusiti, pri čemer:
se uporablja vsaj en par plošč z iglami, pri čemer ena plošča z iglami leži ob drugi (1SS, 1SD; 1IS, 1ID), igelne plošče so premične druga glede na drugo in ena izmed obeh igel, med katerima se analizirajo parametri, je nameščena na eni igelni plošči in druga igla je nameščena na drugi igelni plošči, je priprava prilagojena, da je zadevna kartica (2), ki jo je treba preskusiti, premična v svoji ravnini neodvisno od omenjenih igelnih plošč in obratno, označena s tem, da:
sta dve igelni plošči (1SS, 1SD; 1IS, 1ID) koplanarni, je vsaka igelna plošča (1SS; 1IS) izvedena premično v svoji ravnini neodvisno od druge (1SD; 1ID) in so omenjene prevodne igle (10) izvedene osno premično neodvisno druga od druge.
2. Priprava za električno preskušanje kartic (2) s tiskanim vezjem po zahtevku 1, označena s tem, da uporablja dve koplanarni bližnji igelni plošči (1).
3. Priprava za električno preskušanje kartic (2) s tiskanim vezjem po zahtevku 1, označena s tem, da uporablja dva para (1SS, 1SD; 1 IS, 1 ID) omenjenih koplanamih igelnih plošč, pri čemer je ena igelna plošča nasproti drugi, tako da en par leži nasproti zgornji površini kartice (2) s tiskanim vezjem in drugi par leži nasproti spodnji površini omenjene kartice (2).
4. Priprava po kateremkoli izmed predhodnih zahtevkov, označena s tem, da se premik omenjenih igel doseže z elektromagnetnimi sredstvi (11).
5. Priprava po kateremkoli izmed predhodnih zahtevkov, označena s tem, daje izvedena tako, da deluje s preskušanjem dveh točk vezja, pri čemer deluje z eno iglo koplaname igelne plošče in z eno iglo druge koplaname igelne plošče iz para in potem ko je bilo izvedeno ustrezno nastavljalno premikanje ene plošče glede na drugo igelno ploščo in/ali obeh glede na tiskano kartico (2), ki jo je treba preskusiti, ali nastavljalno gibanje tiskane kartice (2) glede na obe igelni plošči.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IT95UD000251A IT1282829B1 (it) | 1995-12-22 | 1995-12-22 | Macchina di test elettrico per circuiti stampati con posizione registrabile degli aghi di sonda |
| PCT/IT1996/000160 WO1997023784A1 (en) | 1995-12-22 | 1996-08-09 | Machine for the electric test of printed circuits with adjustable position of the sound needles |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| SI9620133A SI9620133A (sl) | 1998-12-31 |
| SI9620133B true SI9620133B (sl) | 2005-10-31 |
Family
ID=11421986
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SI9620133A SI9620133B (sl) | 1995-12-22 | 1996-08-09 | Priprava za električno preskušanje tiskanih vezij z nastavljivim položajem sondnih igel |
Country Status (27)
| Country | Link |
|---|---|
| US (1) | US6124722A (sl) |
| EP (1) | EP0876619B1 (sl) |
| JP (1) | JP2000502791A (sl) |
| KR (1) | KR100526744B1 (sl) |
| CN (1) | CN1175270C (sl) |
| AT (1) | ATE202850T1 (sl) |
| AU (1) | AU718507B2 (sl) |
| BR (1) | BR9612251A (sl) |
| CA (1) | CA2241326C (sl) |
| CZ (1) | CZ298035B6 (sl) |
| DE (1) | DE69613717T2 (sl) |
| DK (1) | DK0876619T3 (sl) |
| ES (1) | ES2160830T3 (sl) |
| GR (1) | GR3036790T3 (sl) |
| HU (1) | HUP9901931A3 (sl) |
| IT (1) | IT1282829B1 (sl) |
| MX (1) | MX9805100A (sl) |
| NO (1) | NO315877B1 (sl) |
| NZ (1) | NZ315085A (sl) |
| PL (1) | PL327496A1 (sl) |
| PT (1) | PT876619E (sl) |
| RO (1) | RO119659B1 (sl) |
| RU (1) | RU2212775C2 (sl) |
| SI (1) | SI9620133B (sl) |
| TR (1) | TR199801178T2 (sl) |
| UA (1) | UA28121C2 (sl) |
| WO (1) | WO1997023784A1 (sl) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| IT1282827B1 (it) | 1995-09-22 | 1998-03-31 | New System Srl | Macchina per il controllo contrapposto dei circuiti stampati |
| IL152940A0 (en) | 2000-07-19 | 2003-06-24 | Orbotech Ltd | Apparatus and method for electrical testing of electrical circuits |
| WO2005093441A1 (fr) * | 2004-03-26 | 2005-10-06 | Quanta Display Inc. | Dispositif et procede de reparation et de mise a l'essai d'un defaut de ligne |
| CN100357752C (zh) * | 2004-03-26 | 2007-12-26 | 广辉电子股份有限公司 | 线路缺陷检测维修设备及方法 |
| CN100388001C (zh) * | 2004-05-24 | 2008-05-14 | 名威科技实业有限公司 | 具有多个侦测单元的检测芯片 |
| DE102009004555A1 (de) | 2009-01-14 | 2010-09-30 | Atg Luther & Maelzer Gmbh | Verfahren zum Prüfen von Leiterplatten |
| CN108761233A (zh) * | 2018-05-23 | 2018-11-06 | 沈小晴 | 针对ied设备柔性化测试的模块可切换针盘设备及测试方法 |
| CN113039443A (zh) * | 2018-09-11 | 2021-06-25 | 迈吉克汽车运动公司 | 用于在电气和/或电子电路上进行测试的工具和组件 |
| KR102501995B1 (ko) * | 2019-12-18 | 2023-02-20 | 주식회사 아도반테스토 | 하나 이상의 피시험 장치를 테스트하기 위한 자동식 테스트 장비 및 자동식 테스트 장비의 작동 방법 |
| JP7217293B2 (ja) * | 2019-12-18 | 2023-02-02 | 株式会社アドバンテスト | １または複数の被テストデバイスをテストするための自動テスト装置、および、自動テスト装置を操作するための方法 |
| TWI797552B (zh) * | 2020-02-06 | 2023-04-01 | 日商愛德萬測試股份有限公司 | 用於測試一或多個受測裝置之自動測試設備及用於操作自動測試設備的方法 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SU563614A1 (ru) * | 1974-04-17 | 1977-06-30 | Московский Ордена Ленина Энергетический Институт | Вихретоковый преобразователь |
| DE2628428C3 (de) * | 1976-06-24 | 1979-02-15 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Adapter zum Verbinden von Anschluß- und/oder Prüfpunkten einer Baugruppe mit einer Mefischaltung |
| DE3781979D1 (de) * | 1986-08-07 | 1992-11-05 | Siemens Ag | Pruefeinrichtung fuer beidseitige, zweistufige kontaktierung bestueckter leiterplatten. |
| US4841241A (en) * | 1986-08-07 | 1989-06-20 | Siemens Aktiengesellschaft | Testing device for both-sided contacting of component-equipped printed circuit boards |
| US4975637A (en) * | 1989-12-29 | 1990-12-04 | International Business Machines Corporation | Method and apparatus for integrated circuit device testing |
| US5436567A (en) * | 1993-02-08 | 1995-07-25 | Automated Test Engineering, Inc. | Double-sided automatic test equipment probe clamshell with vacuum-actuated bottom probe contacts and mechanical-actuated top probe contacts |
-
1995
- 1995-12-22 IT IT95UD000251A patent/IT1282829B1/it active IP Right Grant
- 1995-12-22 NZ NZ315085A patent/NZ315085A/en unknown
-
1996
- 1996-08-09 JP JP9523485A patent/JP2000502791A/ja not_active Ceased
- 1996-08-09 WO PCT/IT1996/000160 patent/WO1997023784A1/en active IP Right Grant
- 1996-08-09 RO RO98-01087A patent/RO119659B1/ro unknown
- 1996-08-09 US US09/091,677 patent/US6124722A/en not_active Expired - Fee Related
- 1996-08-09 RU RU98113859/09A patent/RU2212775C2/ru not_active IP Right Cessation
- 1996-08-09 CN CNB961992778A patent/CN1175270C/zh not_active Expired - Fee Related
- 1996-08-09 DK DK96926571T patent/DK0876619T3/da active
- 1996-08-09 AU AU66684/96A patent/AU718507B2/en not_active Ceased
- 1996-08-09 AT AT96926571T patent/ATE202850T1/de not_active IP Right Cessation
- 1996-08-09 BR BR9612251A patent/BR9612251A/pt not_active IP Right Cessation
- 1996-08-09 PL PL96327496A patent/PL327496A1/xx unknown
- 1996-08-09 PT PT96926571T patent/PT876619E/pt unknown
- 1996-08-09 CA CA002241326A patent/CA2241326C/en not_active Expired - Fee Related
- 1996-08-09 HU HU9901931A patent/HUP9901931A3/hu unknown
- 1996-08-09 EP EP96926571A patent/EP0876619B1/en not_active Expired - Lifetime
- 1996-08-09 ES ES96926571T patent/ES2160830T3/es not_active Expired - Lifetime
- 1996-08-09 KR KR10-1998-0704775A patent/KR100526744B1/ko not_active IP Right Cessation
- 1996-08-09 DE DE69613717T patent/DE69613717T2/de not_active Expired - Fee Related
- 1996-08-09 SI SI9620133A patent/SI9620133B/sl not_active IP Right Cessation
- 1996-08-09 TR TR1998/01178T patent/TR199801178T2/xx unknown
- 1996-08-09 UA UA98063229A patent/UA28121C2/uk unknown
- 1996-08-09 CZ CZ0187498A patent/CZ298035B6/cs not_active IP Right Cessation
-
1998
- 1998-06-12 NO NO19982707A patent/NO315877B1/no unknown
- 1998-06-22 MX MX9805100A patent/MX9805100A/es not_active IP Right Cessation
-
2001
- 2001-10-03 GR GR20010401652T patent/GR3036790T3/el not_active IP Right Cessation
Also Published As
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| SI9620133B (sl) | Priprava za električno preskušanje tiskanih vezij z nastavljivim položajem sondnih igel | |
| DE59810835D1 (de) | Prüfkopf für Mikrostrukturen mit Schnittstelle | |
| DE20005123U1 (de) | Vorrichtung zum Prüfen von Leiterplatten | |
| EP1122546A3 (en) | Scan test machine for densely spaced test sites | |
| RU98113859A (ru) | Установка для электрической проверки печатных схем с регулируемым положением зондирующих игл | |
| ATE34621T1 (de) | Adapter fuer ein leiterplattenpruefgeraet. | |
| SI9620113B (en) | Machine for the opposite control of printed circuits | |
| CA2141650A1 (en) | Marking system for printed circuit boards | |
| SE9402155D0 (sv) | Adapter för användning vid en apparat för testning av kretskort | |
| JPH0877862A (ja) | 検出スイッチ装置 | |
| SU1746547A1 (ru) | Контактное устройство дл контрол печатных плат | |
| SU1628240A1 (ru) | Устройство дл контрол печатных плат | |
| JPH088462Y2 (ja) | 液晶回路基板用検査装置 | |
| EP0833164A2 (de) | Kontakteinrichtung zum Testen von elektrischen Bauelementen in Bestückautomaten | |
| SE9503902L (sv) | Apparat för testning av med elektriska ledningsmönster försedda kort samt för en sådan apparat avsedd adapter | |
| DE102005054775A1 (de) | Röntgenprüfvorrichtung | |
| EP0802582A3 (de) | Kontaktvorrichtung |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| IF | Valid on the event date | ||
| OU02 | Decision according to article 73(2) ipa 1992, publication of decision on partial fulfilment of the invention and change of patent claims |
Effective date: 20050725 |
|
| KO00 | Lapse of patent |
Effective date: 20070315 |