BR9612251A - Máquina para o teste eléctrico de circuitos impressos com posição ajustável das agulhas de som - Google Patents

Máquina para o teste eléctrico de circuitos impressos com posição ajustável das agulhas de som

Info

Publication number
BR9612251A
BR9612251A BR9612251A BR9612251A BR9612251A BR 9612251 A BR9612251 A BR 9612251A BR 9612251 A BR9612251 A BR 9612251A BR 9612251 A BR9612251 A BR 9612251A BR 9612251 A BR9612251 A BR 9612251A
Authority
BR
Brazil
Prior art keywords
machine
pct
printed circuits
electrical testing
adjustable position
Prior art date
Application number
BR9612251A
Other languages
English (en)
Inventor
Jozef Vodopivec
Original Assignee
New System Srl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by New System Srl filed Critical New System Srl
Publication of BR9612251A publication Critical patent/BR9612251A/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Perforating, Stamping-Out Or Severing By Means Other Than Cutting (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
BR9612251A 1995-12-22 1996-08-09 Máquina para o teste eléctrico de circuitos impressos com posição ajustável das agulhas de som BR9612251A (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IT95UD000251A IT1282829B1 (it) 1995-12-22 1995-12-22 Macchina di test elettrico per circuiti stampati con posizione registrabile degli aghi di sonda
PCT/IT1996/000160 WO1997023784A1 (en) 1995-12-22 1996-08-09 Machine for the electric test of printed circuits with adjustable position of the sound needles

Publications (1)

Publication Number Publication Date
BR9612251A true BR9612251A (pt) 1999-07-13

Family

ID=11421986

Family Applications (1)

Application Number Title Priority Date Filing Date
BR9612251A BR9612251A (pt) 1995-12-22 1996-08-09 Máquina para o teste eléctrico de circuitos impressos com posição ajustável das agulhas de som

Country Status (27)

Country Link
US (1) US6124722A (pt)
EP (1) EP0876619B1 (pt)
JP (1) JP2000502791A (pt)
KR (1) KR100526744B1 (pt)
CN (1) CN1175270C (pt)
AT (1) ATE202850T1 (pt)
AU (1) AU718507B2 (pt)
BR (1) BR9612251A (pt)
CA (1) CA2241326C (pt)
CZ (1) CZ298035B6 (pt)
DE (1) DE69613717T2 (pt)
DK (1) DK0876619T3 (pt)
ES (1) ES2160830T3 (pt)
GR (1) GR3036790T3 (pt)
HU (1) HUP9901931A3 (pt)
IT (1) IT1282829B1 (pt)
MX (1) MX9805100A (pt)
NO (1) NO315877B1 (pt)
NZ (1) NZ315085A (pt)
PL (1) PL327496A1 (pt)
PT (1) PT876619E (pt)
RO (1) RO119659B1 (pt)
RU (1) RU2212775C2 (pt)
SI (1) SI9620133B (pt)
TR (1) TR199801178T2 (pt)
UA (1) UA28121C2 (pt)
WO (1) WO1997023784A1 (pt)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1282827B1 (it) 1995-09-22 1998-03-31 New System Srl Macchina per il controllo contrapposto dei circuiti stampati
WO2002008773A2 (en) 2000-07-19 2002-01-31 Orbotech Ltd. Apparatus and method for electrical testing of electrical circuits
CN100357752C (zh) * 2004-03-26 2007-12-26 广辉电子股份有限公司 线路缺陷检测维修设备及方法
WO2005093441A1 (fr) * 2004-03-26 2005-10-06 Quanta Display Inc. Dispositif et procede de reparation et de mise a l'essai d'un defaut de ligne
CN100388001C (zh) * 2004-05-24 2008-05-14 名威科技实业有限公司 具有多个侦测单元的检测芯片
DE102009004555A1 (de) 2009-01-14 2010-09-30 Atg Luther & Maelzer Gmbh Verfahren zum Prüfen von Leiterplatten
WO2020053782A1 (en) * 2018-09-11 2020-03-19 Magicmotorsport Di Bogdan Jan Skutkiewicz Tool and assembly for carrying out tests on electrical and/or electronic circuits
KR102501995B1 (ko) * 2019-12-18 2023-02-20 주식회사 아도반테스토 하나 이상의 피시험 장치를 테스트하기 위한 자동식 테스트 장비 및 자동식 테스트 장비의 작동 방법
JP7217293B2 (ja) 2019-12-18 2023-02-02 株式会社アドバンテスト １または複数の被テストデバイスをテストするための自動テスト装置、および、自動テスト装置を操作するための方法
TWI797552B (zh) * 2020-02-06 2023-04-01 日商愛德萬測試股份有限公司 用於測試一或多個受測裝置之自動測試設備及用於操作自動測試設備的方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU563614A1 (ru) * 1974-04-17 1977-06-30 Московский Ордена Ленина Энергетический Институт Вихретоковый преобразователь
DE2628428C3 (de) * 1976-06-24 1979-02-15 Siemens Ag, 1000 Berlin Und 8000 Muenchen Adapter zum Verbinden von Anschluß- und/oder Prüfpunkten einer Baugruppe mit einer Mefischaltung
EP0256368B1 (de) * 1986-08-07 1992-09-30 Siemens Aktiengesellschaft Prüfeinrichtung für beidseitige, zweistufige Kontaktierung bestückter Leiterplatten
US4841241A (en) * 1986-08-07 1989-06-20 Siemens Aktiengesellschaft Testing device for both-sided contacting of component-equipped printed circuit boards
US4975637A (en) * 1989-12-29 1990-12-04 International Business Machines Corporation Method and apparatus for integrated circuit device testing
US5436567A (en) * 1993-02-08 1995-07-25 Automated Test Engineering, Inc. Double-sided automatic test equipment probe clamshell with vacuum-actuated bottom probe contacts and mechanical-actuated top probe contacts

Also Published As

Publication number Publication date
MX9805100A (es) 1998-10-31
CZ187498A3 (cs) 1998-11-11
NO315877B1 (no) 2003-11-03
DE69613717D1 (de) 2001-08-09
KR19990076663A (ko) 1999-10-15
RU2212775C2 (ru) 2003-09-20
NZ315085A (en) 2007-12-21
CN1205774A (zh) 1999-01-20
AU6668496A (en) 1997-07-17
CZ298035B6 (cs) 2007-05-30
UA28121C2 (uk) 2000-10-16
JP2000502791A (ja) 2000-03-07
DK0876619T3 (da) 2001-10-22
PL327496A1 (en) 1998-12-21
SI9620133B (sl) 2005-10-31
EP0876619A1 (en) 1998-11-11
CA2241326C (en) 2001-11-27
WO1997023784A1 (en) 1997-07-03
KR100526744B1 (ko) 2005-12-21
NO982707D0 (no) 1998-06-12
CN1175270C (zh) 2004-11-10
ATE202850T1 (de) 2001-07-15
GR3036790T3 (en) 2002-01-31
ITUD950251A1 (it) 1997-06-22
HUP9901931A3 (en) 1999-11-29
ES2160830T3 (es) 2001-11-16
IT1282829B1 (it) 1998-03-31
ITUD950251A0 (pt) 1995-12-22
DE69613717T2 (de) 2002-05-16
SI9620133A (sl) 1998-12-31
AU718507B2 (en) 2000-04-13
EP0876619B1 (en) 2001-07-04
NO982707L (no) 1998-07-13
TR199801178T2 (xx) 1998-12-21
US6124722A (en) 2000-09-26
CA2241326A1 (en) 1997-07-03
RO119659B1 (ro) 2005-01-28
PT876619E (pt) 2001-12-28
HUP9901931A2 (hu) 1999-10-28

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Legal Events

Date Code Title Description
FF Decision: intention to grant
FG9A Patent or certificate of addition granted
B24C Patent annual fee: request for for restoration

Free format text: REFERENTE 10A., 11A., 12A., 13A., 14A. E 15A. ANUIDADE(S).

B24H Lapse because of non-payment of annual fees (definitively: art 78 iv lpi)
B24F Patent annual fee: publication cancelled

Free format text: ANULADA A PUBLICACAO CODIGO 24.8 NA RPI NO 2257 DE 08/04/2014 POR TER SIDO INDEVIDA.

B21F Lapse acc. art. 78, item iv - on non-payment of the annual fees in time

Free format text: REFERENTE AS 10A, 11A, 12A, 13A, 14A E 15A ANUIDADES.

B24J Lapse because of non-payment of annual fees (definitively: art 78 iv lpi, resolution 113/2013 art. 12)

Free format text: EM VIRTUDE DA EXTINCAO PUBLICADA NA RPI 2606 DE 15-12-2020 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDA A EXTINCAO DA PATENTE E SEUS CERTIFICADOS, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.