SG137865A1 - Peeling device for chip detachment - Google Patents

Peeling device for chip detachment

Info

Publication number
SG137865A1
SG137865A1 SG200718093-8A SG2007180938A SG137865A1 SG 137865 A1 SG137865 A1 SG 137865A1 SG 2007180938 A SG2007180938 A SG 2007180938A SG 137865 A1 SG137865 A1 SG 137865A1
Authority
SG
Singapore
Prior art keywords
chip
peeling device
adhesive tape
contact surface
raised contact
Prior art date
Application number
SG200718093-8A
Other languages
English (en)
Inventor
Cheung Yiu Ming
Chong Chi Ming
Yiu Ching Hong
Original Assignee
Asm Assmebly Automation Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asm Assmebly Automation Ltd filed Critical Asm Assmebly Automation Ltd
Publication of SG137865A1 publication Critical patent/SG137865A1/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67132—Apparatus for placing on an insulating substrate, e.g. tape
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
    • Y10T156/11—Methods of delaminating, per se; i.e., separating at bonding face
    • Y10T156/1168—Gripping and pulling work apart during delaminating
    • Y10T156/1179—Gripping and pulling work apart during delaminating with poking during delaminating [e.g., jabbing, etc.]
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
    • Y10T156/19—Delaminating means
    • Y10T156/1978—Delaminating bending means
    • Y10T156/1983—Poking delaminating means

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Folding Of Thin Sheet-Like Materials, Special Discharging Devices, And Others (AREA)
  • Die Bonding (AREA)
SG200718093-8A 2004-05-28 2005-05-26 Peeling device for chip detachment SG137865A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/857,067 US20050274457A1 (en) 2004-05-28 2004-05-28 Peeling device for chip detachment

Publications (1)

Publication Number Publication Date
SG137865A1 true SG137865A1 (en) 2007-12-28

Family

ID=34938309

Family Applications (2)

Application Number Title Priority Date Filing Date
SG200718093-8A SG137865A1 (en) 2004-05-28 2005-05-26 Peeling device for chip detachment
SG200503329A SG117606A1 (en) 2004-05-28 2005-05-26 Peeling device for chip detachment

Family Applications After (1)

Application Number Title Priority Date Filing Date
SG200503329A SG117606A1 (en) 2004-05-28 2005-05-26 Peeling device for chip detachment

Country Status (7)

Country Link
US (1) US20050274457A1 (zh)
EP (1) EP1601005A3 (zh)
JP (1) JP2005340839A (zh)
KR (1) KR20060046237A (zh)
CN (1) CN100377296C (zh)
SG (2) SG137865A1 (zh)
TW (1) TWI257651B (zh)

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EP1587138B1 (de) * 2004-04-13 2007-05-30 Oerlikon Assembly Equipment AG, Steinhausen Einrichtung für die Montage von Halbleiterchips und Verfahren zum Ablösen eines Halbleiterchips von einer Folie
KR100582056B1 (ko) * 2004-07-05 2006-05-23 삼성전자주식회사 박형 칩 분리 장치 및 그를 이용한 박형 칩 분리 방법
US7276396B2 (en) * 2004-10-06 2007-10-02 Intel Corporation Die handling system
JP4624813B2 (ja) 2005-01-21 2011-02-02 ルネサスエレクトロニクス株式会社 半導体装置の製造方法および半導体製造装置
US7238258B2 (en) * 2005-04-22 2007-07-03 Stats Chippac Ltd. System for peeling semiconductor chips from tape
JP4607748B2 (ja) * 2005-12-02 2011-01-05 東京エレクトロン株式会社 基板のパーティクル除去方法、その装置及び塗布、現像装置
DE102006025361A1 (de) * 2006-05-31 2007-12-06 Siemens Ag Ausstoßeinheit zum Abtrennen von Bauelementen aus einer im Wesentlichen ebenen Anordnung von Bauelementen
KR20070120319A (ko) * 2006-06-19 2007-12-24 삼성전자주식회사 한 쌍의 이젝터들을 구비하는 반도체 칩의 탈착 장치 및이를 이용한 반도체 칩의 탈착 방법
JP4693805B2 (ja) * 2007-03-16 2011-06-01 株式会社東芝 半導体装置の製造装置及び製造方法
JP5356061B2 (ja) * 2009-02-18 2013-12-04 キヤノンマシナリー株式会社 剥離装置及び剥離方法
US8141612B2 (en) * 2009-04-02 2012-03-27 Asm Assembly Automation Ltd Device for thin die detachment and pick-up
CN102044404B (zh) * 2009-10-12 2015-12-09 桑迪士克科技公司 用于使经切分的半导体裸片与裸片贴胶带分离的系统
EP2517237A2 (en) * 2009-12-23 2012-10-31 Süss Microtec Lithography GmbH Automated thermal slide debonder
CN102782829B (zh) * 2011-02-28 2015-04-01 晟碟半导体（上海）有限公司 具有非均匀真空分布的裸芯安装端部
FR2986175A1 (fr) * 2012-01-31 2013-08-02 St Microelectronics Tours Sas Procede et dispositif de decoupe d'une plaquette
JP5687647B2 (ja) * 2012-03-14 2015-03-18 株式会社東芝 半導体装置の製造方法、半導体製造装置
US8916419B2 (en) * 2012-03-29 2014-12-23 Taiwan Semiconductor Manufacturing Company, Ltd. Lid attach process and apparatus for fabrication of semiconductor packages
TWI485786B (zh) * 2012-04-16 2015-05-21 Gallant Micro Machining Co Ltd Grain Stripping Method and Device
TWI497631B (zh) * 2012-12-17 2015-08-21 Hon Soon Internat Technology Co Ltd 晶片分離裝置
WO2014098771A1 (en) * 2012-12-17 2014-06-26 Agency For Science, Technology And Research Wafer dicing apparatus and wafer dicing method
CN104002542A (zh) * 2013-02-22 2014-08-27 深圳富泰宏精密工业有限公司 顶料装置
CN104724336B (zh) * 2013-12-19 2017-01-04 福士瑞精密工业(晋城)有限公司 下料机构
KR102247033B1 (ko) 2014-04-16 2021-05-03 삼성전자주식회사 다이 본딩 장치
DE102016108880A1 (de) * 2016-05-13 2017-11-16 Joachim Jakob Hybridsetter
CN107785298B (zh) * 2016-08-25 2021-02-02 苏州能讯高能半导体有限公司 晶圆临时键合的分离设备及方法
CN107680910A (zh) * 2017-09-14 2018-02-09 江苏长电科技股份有限公司 一种去除毛边的方法及装置
JP6935306B2 (ja) * 2017-11-16 2021-09-15 芝浦メカトロニクス株式会社 成膜装置
US11062923B2 (en) * 2018-09-28 2021-07-13 Rohinni, LLC Apparatus to control transfer parameters during transfer of semiconductor devices
JP7237655B2 (ja) * 2019-03-01 2023-03-13 ファスフォードテクノロジ株式会社 半導体製造装置および半導体装置の製造方法
US11282722B2 (en) * 2019-08-23 2022-03-22 YunJun Tang Chip front surface touchless pick and place tool or flip chip bonder
CN113594079B (zh) * 2020-04-30 2024-01-16 先进科技新加坡有限公司 用于将电子元件从粘性载体分离的顶出器单元

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US4850780A (en) * 1987-09-28 1989-07-25 Kulicke And Soffa Industries Inc. Pre-peel die ejector apparatus
JPH0278244A (ja) * 1988-09-14 1990-03-19 Hitachi Ltd 半導体ペレット取出装置
JPH03161999A (ja) * 1989-11-20 1991-07-11 Sanyo Electric Co Ltd 電子部品の突上げ装置
JPH0837395A (ja) * 1994-07-21 1996-02-06 Matsushita Electric Ind Co Ltd 半導体チップ供給装置および供給方法
JP3079502B2 (ja) * 1995-08-18 2000-08-21 株式会社新川 ダイ突き上げ装置
JP3498877B2 (ja) * 1995-12-05 2004-02-23 株式会社東芝 半導体製造装置および半導体装置の製造方法
JPH10199961A (ja) * 1997-01-14 1998-07-31 Sony Corp チップ剥離装置及びチップ剥離方法
JP2002050670A (ja) * 2000-08-04 2002-02-15 Toshiba Corp ピックアップ装置及びピックアップ方法
JP4021614B2 (ja) * 2000-12-11 2007-12-12 株式会社東芝 半導体素子のピックアップ用治具、半導体素子のピックアップ装置、半導体素子のピックアップ方法、半導体装置の製造方法及び半導体装置の製造装置
JP3976541B2 (ja) * 2001-10-23 2007-09-19 富士通株式会社 半導体チップの剥離方法及び装置
JP3870803B2 (ja) * 2002-01-09 2007-01-24 株式会社村田製作所 チップ部品供給装置
US7238258B2 (en) * 2005-04-22 2007-07-03 Stats Chippac Ltd. System for peeling semiconductor chips from tape

Also Published As

Publication number Publication date
EP1601005A2 (en) 2005-11-30
KR20060046237A (ko) 2006-05-17
TW200539302A (en) 2005-12-01
CN100377296C (zh) 2008-03-26
EP1601005A3 (en) 2008-11-12
US20050274457A1 (en) 2005-12-15
TWI257651B (en) 2006-07-01
JP2005340839A (ja) 2005-12-08
CN1707750A (zh) 2005-12-14
SG117606A1 (en) 2005-12-29

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