SG11201807493WA - Ground reference scheme for a memory cell - Google Patents

Ground reference scheme for a memory cell

Info

Publication number
SG11201807493WA
SG11201807493WA SG11201807493WA SG11201807493WA SG11201807493WA SG 11201807493W A SG11201807493W A SG 11201807493WA SG 11201807493W A SG11201807493W A SG 11201807493WA SG 11201807493W A SG11201807493W A SG 11201807493WA SG 11201807493W A SG11201807493W A SG 11201807493WA
Authority
SG
Singapore
Prior art keywords
digit line
boise
memory cell
international
voltage
Prior art date
Application number
SG11201807493WA
Other languages
English (en)
Inventor
Daniele Vimercati
Scott Derner
Vincenzo Umberto Di
Christopher Kawamura
Eric Carman
Original Assignee
Micron Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micron Technology Inc filed Critical Micron Technology Inc
Publication of SG11201807493WA publication Critical patent/SG11201807493WA/en

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • G11C11/225Auxiliary circuits
    • G11C11/2273Reading or sensing circuits or methods
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • G11C11/221Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements using ferroelectric capacitors
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • G11C11/225Auxiliary circuits
    • G11C11/2297Power supply circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • G11C11/225Auxiliary circuits
    • G11C11/2293Timing circuits or methods

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Dram (AREA)
  • Semiconductor Memories (AREA)
  • Medicinal Preparation (AREA)
SG11201807493WA 2016-03-01 2017-03-01 Ground reference scheme for a memory cell SG11201807493WA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15/057,914 US9934837B2 (en) 2016-03-01 2016-03-01 Ground reference scheme for a memory cell
PCT/US2017/020251 WO2017151803A1 (fr) 2016-03-01 2017-03-01 Schéma de référence de masse pour cellule de mémoire

Publications (1)

Publication Number Publication Date
SG11201807493WA true SG11201807493WA (en) 2018-09-27

Family

ID=59724273

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201807493WA SG11201807493WA (en) 2016-03-01 2017-03-01 Ground reference scheme for a memory cell

Country Status (8)

Country Link
US (3) US9934837B2 (fr)
EP (1) EP3424052B1 (fr)
JP (1) JP7022071B2 (fr)
KR (1) KR102248175B1 (fr)
CN (1) CN109074837B (fr)
SG (1) SG11201807493WA (fr)
TW (2) TWI673713B (fr)
WO (1) WO2017151803A1 (fr)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9934837B2 (en) * 2016-03-01 2018-04-03 Micron Technology, Inc. Ground reference scheme for a memory cell
US10056129B1 (en) 2017-08-10 2018-08-21 Micron Technology, Inc. Cell bottom node reset in a memory array
US10725913B2 (en) 2017-10-02 2020-07-28 Micron Technology, Inc. Variable modulation scheme for memory device access or operation
US10446198B2 (en) 2017-10-02 2019-10-15 Micron Technology, Inc. Multiple concurrent modulation schemes in a memory system
US11403241B2 (en) 2017-10-02 2022-08-02 Micron Technology, Inc. Communicating data with stacked memory dies
US10410721B2 (en) * 2017-11-22 2019-09-10 Micron Technology, Inc. Pulsed integrator and memory techniques
US10446214B1 (en) * 2018-08-13 2019-10-15 Micron Technology, Inc. Sense amplifier with split capacitors
US10902935B2 (en) * 2018-08-13 2021-01-26 Micron Technology, Inc. Access schemes for access line faults in a memory device
US11360704B2 (en) 2018-12-21 2022-06-14 Micron Technology, Inc. Multiplexed signal development in a memory device
US10692557B1 (en) * 2019-04-11 2020-06-23 Micron Technology, Inc. Reference voltage management
US11056178B1 (en) * 2020-07-20 2021-07-06 Micron Technology, Inc. Read operations based on a dynamic reference
US11749329B1 (en) * 2022-05-20 2023-09-05 Micron Technology, Inc. Off-state word line voltage control for fixed plate voltage operation

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100256226B1 (ko) 1997-06-26 2000-05-15 김영환 레퍼런스 전압 발생 장치
US20050094457A1 (en) 1999-06-10 2005-05-05 Symetrix Corporation Ferroelectric memory and method of operating same
JP2001319472A (ja) 2000-05-10 2001-11-16 Toshiba Corp 半導体記憶装置
JP4153780B2 (ja) 2002-11-25 2008-09-24 富士通株式会社 システムおよび強誘電体メモリのデータ読み出し方法
WO2004093088A1 (fr) * 2003-04-10 2004-10-28 Fujitsu Limited Memoire ferroelectrique et procede permettant de lire ses donnees
KR100568861B1 (ko) 2003-12-15 2006-04-10 삼성전자주식회사 레퍼런스 전압 발생 회로를 갖는 강유전체 메모리 장치
US7009864B2 (en) * 2003-12-29 2006-03-07 Texas Instruments Incorporated Zero cancellation scheme to reduce plateline voltage in ferroelectric memory
JP4785180B2 (ja) * 2004-09-10 2011-10-05 富士通セミコンダクター株式会社 強誘電体メモリ、多値データ記録方法、および多値データ読出し方法
JP4638193B2 (ja) 2004-09-24 2011-02-23 パトレネラ キャピタル リミテッド, エルエルシー メモリ
US8570812B2 (en) 2011-08-23 2013-10-29 Texas Instruments Incorporated Method of reading a ferroelectric memory cell
US20140029326A1 (en) * 2012-07-26 2014-01-30 Texas Instruments Incorporated Ferroelectric random access memory with a non-destructive read
US9934837B2 (en) * 2016-03-01 2018-04-03 Micron Technology, Inc. Ground reference scheme for a memory cell

Also Published As

Publication number Publication date
EP3424052B1 (fr) 2021-09-15
TW201735038A (zh) 2017-10-01
KR20180110682A (ko) 2018-10-10
US9934837B2 (en) 2018-04-03
TWI673713B (zh) 2019-10-01
CN109074837A (zh) 2018-12-21
EP3424052A1 (fr) 2019-01-09
CN109074837B (zh) 2021-02-09
WO2017151803A1 (fr) 2017-09-08
US20190130955A1 (en) 2019-05-02
US10978126B2 (en) 2021-04-13
KR102248175B1 (ko) 2021-05-06
JP7022071B2 (ja) 2022-02-17
US20170256300A1 (en) 2017-09-07
TWI623935B (zh) 2018-05-11
TW201824280A (zh) 2018-07-01
US20180190337A1 (en) 2018-07-05
EP3424052A4 (fr) 2019-11-06
US10163482B2 (en) 2018-12-25
JP2019513278A (ja) 2019-05-23

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