SG11201811063QA - Array data bit inversion - Google Patents
Array data bit inversionInfo
- Publication number
- SG11201811063QA SG11201811063QA SG11201811063QA SG11201811063QA SG11201811063QA SG 11201811063Q A SG11201811063Q A SG 11201811063QA SG 11201811063Q A SG11201811063Q A SG 11201811063QA SG 11201811063Q A SG11201811063Q A SG 11201811063QA SG 11201811063Q A SG11201811063Q A SG 11201811063QA
- Authority
- SG
- Singapore
- Prior art keywords
- logic state
- international
- cell
- boise
- transistors
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
- G11C11/225—Auxiliary circuits
- G11C11/2273—Reading or sensing circuits or methods
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
- G11C11/225—Auxiliary circuits
- G11C11/2275—Writing or programming circuits or methods
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
- G11C11/221—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements using ferroelectric capacitors
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1006—Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Semiconductor Memories (AREA)
- Dram (AREA)
- Management, Administration, Business Operations System, And Electronic Commerce (AREA)
Abstract
b-1 425-b-2 r -1- 1 115-b DLREF DL 420-a WL 7110-b 105 -b 420-b 105-c WE 110-ci Cell 240-c 240-d PL 210-b l 400-a \ -210-a 410 430 FIG. 4A (12) INTERNATIONAL APPLICATION PUBLISHED UNDER THE PATENT COOPERATION TREATY (PCT) (19) World Intellectual Property Organization International Bureau (43) International Publication Date 28 December 2017 (28.12.2017) WI P0 I PC T Iiiimmomiolollmolommoolomomolomommovom (10) International Publication Number WO 2017/222775 Al (51) International Patent Classification: Gl1C 11/22 (2006.01) (21) International Application Number: PCT/US2017/035452 (22) International Filing Date: 01 June 2017 (01.06.2017) (25) Filing Language: English (26) Publication Language: English (30) Priority Data: 15/188,890 21 June 2016 (21.06.2016) US (71) Applicant: MICRON TECHNOLOGY, INC. [US/US]; 8000 S. Federal Way, Boise, ID 83716-9632 (US). (72) Inventors: INGALLS, Charles, L.; 8000 S. Federal Way, Boise, ID 83716-9632 (US). DERNER, Scott, J.; 8000 S. Federal Way, Boise, ID 83716-9632 (US). (74) Agent: HARRIS, Philip, W.; Holland & Hart LLP, P.O. Box 11583, Salt Lake City, UT 84147 (US). (81) Designated States (unless otherwise indicated, for every kind of national protection available): AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW. (84) Designated States (unless otherwise indicated, for every kind of regional protection available): ARIPO (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW), Eurasian (AM, AZ, BY, KG, KZ, RU, TJ, TM), European (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR), OAPI (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG). (54) Title: ARRAY DATA BIT INVERSION (57) : Methods, systems, and apparatuses for memory array bit inversion are described. A memory cell (e.g., a ferroelectric memory cell) may be written with a charge associated with a logic state that may be the inverse of the intended logic state of the cell. That is, the actual logic state of one or more memory cells may be inverted, but the intended logic state of the memory cells may remain unchanged. Different sets of transistors may be configured around a sense component of a cell to enable reading and writing of intended and inverted logic states from or to the cell. For instance, a first set of transistors may be used to read the logic state currently stored at a memory cell, while a second set of transistors may be used to read a logic state inverted from the currently stored logic state. [Continued on next page] WO 2017/222775 Al IMEDIMOMMIONOIDEMEEHOHMEMERVOIMIE Declarations under Rule 4.17: as to applicant's entitlement to apply for and be granted a patent (Rule 4.17(H)) as to the applicant's entitlement to claim the priority of the earlier application (Rule 4.17(iii)) Published: — with international search report (Art. 21(3))
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US15/188,890 US9715919B1 (en) | 2016-06-21 | 2016-06-21 | Array data bit inversion |
PCT/US2017/035452 WO2017222775A1 (en) | 2016-06-21 | 2017-06-01 | Array data bit inversion |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201811063QA true SG11201811063QA (en) | 2019-01-30 |
Family
ID=59350206
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201811063QA SG11201811063QA (en) | 2016-06-21 | 2017-06-01 | Array data bit inversion |
SG10202002046PA SG10202002046PA (en) | 2016-06-21 | 2017-06-01 | Array data bit inversion |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10202002046PA SG10202002046PA (en) | 2016-06-21 | 2017-06-01 | Array data bit inversion |
Country Status (8)
Country | Link |
---|---|
US (6) | US9715919B1 (en) |
EP (1) | EP3472837A4 (en) |
JP (2) | JP6705117B2 (en) |
KR (2) | KR102067365B1 (en) |
CN (2) | CN109416921B (en) |
SG (2) | SG11201811063QA (en) |
TW (2) | TWI675370B (en) |
WO (1) | WO2017222775A1 (en) |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9697913B1 (en) * | 2016-06-10 | 2017-07-04 | Micron Technology, Inc. | Ferroelectric memory cell recovery |
US10403389B2 (en) | 2016-06-16 | 2019-09-03 | Micron Technology, Inc. | Array plate short repair |
US9941021B2 (en) | 2016-06-16 | 2018-04-10 | Micron Technology, Inc. | Plate defect mitigation techniques |
US10418084B2 (en) * | 2017-02-07 | 2019-09-17 | Micron Technology, Inc. | Pre-writing memory cells of an array |
US10290341B2 (en) | 2017-02-24 | 2019-05-14 | Micron Technology, Inc. | Self-reference for ferroelectric memory |
US10446502B2 (en) | 2017-08-30 | 2019-10-15 | Micron, Technology, Inc. | Apparatuses and methods for shielded memory architecture |
KR20190053646A (en) * | 2017-11-10 | 2019-05-20 | 에스케이하이닉스 주식회사 | Memory Controller, Semiconductor Memory System Including The Same and Method of Driving the Semiconductor Memory System |
US10431301B2 (en) * | 2017-12-22 | 2019-10-01 | Micron Technology, Inc. | Auto-referenced memory cell read techniques |
US10667621B2 (en) | 2018-04-19 | 2020-06-02 | Micron Technology, Inc. | Multi-stage memory sensing |
US10867653B2 (en) | 2018-04-20 | 2020-12-15 | Micron Technology, Inc. | Access schemes for protecting stored data in a memory device |
US10622050B2 (en) | 2018-05-09 | 2020-04-14 | Micron Technology, Inc. | Ferroelectric memory plate power reduction |
US10636469B2 (en) | 2018-05-09 | 2020-04-28 | Micron Technology, Inc. | Cell voltage accumulation discharge |
US10573372B2 (en) * | 2018-05-31 | 2020-02-25 | Micron Technology, Inc. | Sensing operations in memory by comparing inputs in a sense amplifier |
US10991411B2 (en) | 2018-08-17 | 2021-04-27 | Micron Technology, Inc. | Method and apparatuses for performing a voltage adjustment operation on a section of memory cells based on a quantity of access operations |
US10431281B1 (en) * | 2018-08-17 | 2019-10-01 | Micron Technology, Inc. | Access schemes for section-based data protection in a memory device |
US10802909B2 (en) * | 2018-08-17 | 2020-10-13 | Micron Technology, Inc. | Enhanced bit flipping scheme |
KR102643532B1 (en) * | 2018-08-28 | 2024-03-06 | 에스케이하이닉스 주식회사 | Bitline sense amplifier circuit |
US10916324B2 (en) * | 2018-09-11 | 2021-02-09 | Micron Technology, Inc. | Data state synchronization involving memory cells having an inverted data state written thereto |
US10699783B1 (en) * | 2018-12-26 | 2020-06-30 | Micron Technology | Sensing techniques using a moving reference |
US10896714B1 (en) * | 2019-07-17 | 2021-01-19 | Micron Technology, Inc. | Ferroelectric memory cell with access line disturbance mitigation |
US10998080B2 (en) * | 2019-09-24 | 2021-05-04 | Micron Technology, Inc. | Imprint recovery for memory cells |
US11244739B2 (en) * | 2019-12-23 | 2022-02-08 | Micron Technology, Inc. | Counter-based read in memory device |
TW202236266A (en) | 2019-12-23 | 2022-09-16 | 美商美光科技公司 | Counter-based read in memory device |
US11170837B1 (en) * | 2020-04-28 | 2021-11-09 | Micron Technology | Identifying high impedance faults in a memory device |
US11152049B1 (en) * | 2020-06-08 | 2021-10-19 | Micron Technology, Inc. | Differential sensing for a memory device |
US11521979B2 (en) * | 2020-12-04 | 2022-12-06 | Micron Technology, Inc. | Power gating in a memory device |
Family Cites Families (32)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5525528A (en) * | 1994-02-23 | 1996-06-11 | Ramtron International Corporation | Ferroelectric capacitor renewal method |
US5905672A (en) | 1997-03-27 | 1999-05-18 | Micron Technology, Inc. | Ferroelectric memory using ferroelectric reference cells |
JPH1011977A (en) | 1996-06-26 | 1998-01-16 | Hitachi Ltd | Semiconductor storage device |
JP3003631B2 (en) * | 1997-06-23 | 2000-01-31 | 日本電気株式会社 | Nonvolatile semiconductor memory device |
JP3727451B2 (en) * | 1997-10-27 | 2005-12-14 | ローム株式会社 | Semiconductor memory device and semiconductor memory device access method |
JP3720983B2 (en) * | 1998-06-23 | 2005-11-30 | 株式会社東芝 | Ferroelectric memory |
DE19844101A1 (en) * | 1998-09-25 | 2000-03-30 | Siemens Ag | Circuit arrangement for generating a reference voltage for reading a ferroelectric memory |
JP4350222B2 (en) * | 1999-08-26 | 2009-10-21 | Okiセミコンダクタ株式会社 | Method of operating a ferroelectric memory device |
US6246603B1 (en) * | 2000-06-30 | 2001-06-12 | Stmicroelectronics, Inc. | Circuit and method for substantially preventing imprint effects in a ferroelectric memory device |
US6522570B1 (en) * | 2001-12-13 | 2003-02-18 | Micron Technology, Inc. | System and method for inhibiting imprinting of capacitor structures of a memory |
JP2003255830A (en) * | 2002-03-05 | 2003-09-10 | Rohm Co Ltd | Encrypting and decrypting device, and encrypting and decrypting method |
US6590798B1 (en) * | 2002-05-08 | 2003-07-08 | Texas Instruments Incorporated | Apparatus and methods for imprint reduction for ferroelectric memory cell |
NO320017B1 (en) * | 2003-03-26 | 2005-10-10 | Thin Film Electronics Asa | Detection amplifier systems and matrix addressable memory devices with ± n of these |
US6830938B1 (en) * | 2003-06-24 | 2004-12-14 | Texas Instruments Incorporated | Method for improving retention reliability of ferroelectric RAM |
DE10329369B4 (en) * | 2003-06-30 | 2010-01-28 | Qimonda Ag | Circuit and method for refreshing memory cells of a dynamic memory |
KR100720602B1 (en) * | 2003-09-26 | 2007-05-21 | 니뽄 덴신 덴와 가부시키가이샤 | Tag privacy protection method, tag device, backend apparatus, updater, update solicitor, programs therefor and record medium carrying such programs in storage |
US6950328B2 (en) * | 2003-12-11 | 2005-09-27 | Infineon Technologies Ag | Imprint suppression circuit scheme |
JP4064951B2 (en) * | 2004-07-28 | 2008-03-19 | 株式会社東芝 | Ferroelectric semiconductor memory device |
JP2006085812A (en) | 2004-09-15 | 2006-03-30 | Seiko Epson Corp | Data reading/rewriting circuit for ferroelectric storage device, ferroelectric storage device, and electronic device |
KR100631923B1 (en) * | 2004-10-12 | 2006-10-04 | 삼성전자주식회사 | Apparatus for reference voltage providing for use in semiconductor memory and method for driving the same |
JP4912718B2 (en) * | 2006-03-30 | 2012-04-11 | 富士通セミコンダクター株式会社 | Dynamic semiconductor memory |
JP2008071440A (en) * | 2006-09-14 | 2008-03-27 | Matsushita Electric Ind Co Ltd | Ferroelectric memory device and its control method |
JP4491000B2 (en) * | 2007-08-17 | 2010-06-30 | 株式会社東芝 | Memory system |
US8495438B2 (en) | 2007-12-28 | 2013-07-23 | Texas Instruments Incorporated | Technique for memory imprint reliability improvement |
US9330753B2 (en) * | 2010-11-29 | 2016-05-03 | Seagate Technology Llc | Memory sanitation using bit-inverted data |
KR20130048394A (en) * | 2011-11-02 | 2013-05-10 | 삼성전자주식회사 | Semiconductor memory device and memory system including the same |
KR101926606B1 (en) * | 2012-02-06 | 2019-03-07 | 삼성전자 주식회사 | Image sensor and image processing apparatus using the same |
US9269436B2 (en) * | 2013-03-12 | 2016-02-23 | Intel Corporation | Techniques for determining victim row addresses in a volatile memory |
US9007866B2 (en) * | 2013-04-23 | 2015-04-14 | Tessera Inc. | Retention optimized memory device using predictive data inversion |
US9558803B2 (en) * | 2014-08-04 | 2017-01-31 | Micron Technology, Inc. | Fixed voltage sensing in a memory device |
US9552864B1 (en) * | 2016-03-11 | 2017-01-24 | Micron Technology, Inc. | Offset compensation for ferroelectric memory cell sensing |
US9721638B1 (en) * | 2016-05-10 | 2017-08-01 | Micron Technology, Inc. | Boosting a digit line voltage for a write operation |
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2016
- 2016-06-21 US US15/188,890 patent/US9715919B1/en active Active
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2017
- 2017-06-01 KR KR1020197001967A patent/KR102067365B1/en active IP Right Grant
- 2017-06-01 WO PCT/US2017/035452 patent/WO2017222775A1/en unknown
- 2017-06-01 SG SG11201811063QA patent/SG11201811063QA/en unknown
- 2017-06-01 SG SG10202002046PA patent/SG10202002046PA/en unknown
- 2017-06-01 CN CN201780038714.3A patent/CN109416921B/en active Active
- 2017-06-01 JP JP2018566433A patent/JP6705117B2/en active Active
- 2017-06-01 CN CN202010208447.3A patent/CN111383680B/en active Active
- 2017-06-01 KR KR1020207000572A patent/KR102297894B1/en active IP Right Grant
- 2017-06-01 EP EP17815909.1A patent/EP3472837A4/en not_active Ceased
- 2017-06-21 TW TW107127765A patent/TWI675370B/en active
- 2017-06-21 TW TW106120749A patent/TWI636457B/en active
- 2017-07-03 US US15/641,020 patent/US10043566B2/en active Active
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2018
- 2018-07-13 US US16/035,135 patent/US10431282B2/en active Active
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2019
- 2019-08-19 US US16/544,587 patent/US10748596B2/en active Active
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2020
- 2020-03-06 JP JP2020038814A patent/JP6802401B2/en active Active
- 2020-07-06 US US16/921,868 patent/US11062753B2/en active Active
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2021
- 2021-07-08 US US17/370,515 patent/US11636890B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
JP6705117B2 (en) | 2020-06-03 |
US9715919B1 (en) | 2017-07-25 |
EP3472837A1 (en) | 2019-04-24 |
KR20200006187A (en) | 2020-01-17 |
JP6802401B2 (en) | 2020-12-16 |
SG10202002046PA (en) | 2020-04-29 |
CN109416921A (en) | 2019-03-01 |
US20210398582A1 (en) | 2021-12-23 |
TW201812758A (en) | 2018-04-01 |
JP2020091935A (en) | 2020-06-11 |
JP2019525374A (en) | 2019-09-05 |
US20200388316A1 (en) | 2020-12-10 |
US10431282B2 (en) | 2019-10-01 |
EP3472837A4 (en) | 2020-02-26 |
US10043566B2 (en) | 2018-08-07 |
KR20190019196A (en) | 2019-02-26 |
US20200043541A1 (en) | 2020-02-06 |
CN111383680B (en) | 2022-04-12 |
KR102297894B1 (en) | 2021-09-06 |
CN111383680A (en) | 2020-07-07 |
KR102067365B1 (en) | 2020-01-16 |
WO2017222775A1 (en) | 2017-12-28 |
US20180350420A1 (en) | 2018-12-06 |
US10748596B2 (en) | 2020-08-18 |
TWI675370B (en) | 2019-10-21 |
CN109416921B (en) | 2020-04-14 |
US20170365318A1 (en) | 2017-12-21 |
TW201842501A (en) | 2018-12-01 |
US11636890B2 (en) | 2023-04-25 |
TWI636457B (en) | 2018-09-21 |
US11062753B2 (en) | 2021-07-13 |
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