SG11201400480SA - Polymer and composition including same, and adhesive composition - Google Patents
Polymer and composition including same, and adhesive compositionInfo
- Publication number
- SG11201400480SA SG11201400480SA SG11201400480SA SG11201400480SA SG11201400480SA SG 11201400480S A SG11201400480S A SG 11201400480SA SG 11201400480S A SG11201400480S A SG 11201400480SA SG 11201400480S A SG11201400480S A SG 11201400480SA SG 11201400480S A SG11201400480S A SG 11201400480SA
- Authority
- SG
- Singapore
- Prior art keywords
- composition
- polymer
- including same
- adhesive composition
- composition including
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/20—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the epoxy compounds used
- C08G59/22—Di-epoxy compounds
- C08G59/26—Di-epoxy compounds heterocyclic
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J179/00—Adhesives based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen, with or without oxygen, or carbon only, not provided for in groups C09J161/00 - C09J177/00
- C09J179/04—Polycondensates having nitrogen-containing heterocyclic rings in the main chain; Polyhydrazides; Polyamide acids or similar polyimide precursors
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/20—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the epoxy compounds used
- C08G59/32—Epoxy compounds containing three or more epoxy groups
- C08G59/3236—Heterocylic compounds
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/0622—Polycondensates containing six-membered rings, not condensed with other rings, with nitrogen atoms as the only ring hetero atoms
- C08G73/0633—Polycondensates containing six-membered rings, not condensed with other rings, with nitrogen atoms as the only ring hetero atoms with only two nitrogen atoms in the ring
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/0622—Polycondensates containing six-membered rings, not condensed with other rings, with nitrogen atoms as the only ring hetero atoms
- C08G73/0638—Polycondensates containing six-membered rings, not condensed with other rings, with nitrogen atoms as the only ring hetero atoms with at least three nitrogen atoms in the ring
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/0666—Polycondensates containing five-membered rings, condensed with other rings, with nitrogen atoms as the only ring hetero atoms
- C08G73/0677—Polycondensates containing five-membered rings, condensed with other rings, with nitrogen atoms as the only ring hetero atoms with only two nitrogen atoms in the ring
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/04—Oxygen-containing compounds
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/04—Oxygen-containing compounds
- C08K5/07—Aldehydes; Ketones
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D11/00—Inks
- C09D11/02—Printing inks
- C09D11/10—Printing inks based on artificial resins
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D11/00—Inks
- C09D11/02—Printing inks
- C09D11/10—Printing inks based on artificial resins
- C09D11/102—Printing inks based on artificial resins containing macromolecular compounds obtained by reactions other than those only involving unsaturated carbon-to-carbon bonds
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J11/00—Features of adhesives not provided for in group C09J9/00, e.g. additives
- C09J11/02—Non-macromolecular additives
- C09J11/06—Non-macromolecular additives organic
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J163/00—Adhesives based on epoxy resins; Adhesives based on derivatives of epoxy resins
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/11—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers having cover layers or intermediate layers, e.g. subbing layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02118—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer carbon based polymeric organic or inorganic material, e.g. polyimides, poly cyclobutene or PVC
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02282—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
- H01L23/293—Organic, e.g. plastic
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/094—Multilayer resist systems, e.g. planarising layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Life Sciences & Earth Sciences (AREA)
- Materials Engineering (AREA)
- Wood Science & Technology (AREA)
- Architecture (AREA)
- Structural Engineering (AREA)
- Compositions Of Macromolecular Compounds (AREA)
- Adhesives Or Adhesive Processes (AREA)
- Epoxy Resins (AREA)
- Materials For Photolithography (AREA)
- Paints Or Removers (AREA)
- Inks, Pencil-Leads, Or Crayons (AREA)
- Macromolecular Compounds Obtained By Forming Nitrogen-Containing Linkages In General (AREA)
- Macromonomer-Based Addition Polymer (AREA)
- Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011196318 | 2011-09-08 | ||
JP2011196319 | 2011-09-08 | ||
PCT/JP2012/072747 WO2013035787A1 (ja) | 2011-09-08 | 2012-09-06 | 重合体及びそれを含む組成物並びに接着剤用組成物 |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201400480SA true SG11201400480SA (en) | 2014-06-27 |
Family
ID=47832227
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201400480SA SG11201400480SA (en) | 2011-09-08 | 2012-09-06 | Polymer and composition including same, and adhesive composition |
Country Status (9)
Country | Link |
---|---|
US (2) | US20140228488A1 (ja) |
EP (2) | EP3235853A1 (ja) |
JP (1) | JP6098825B2 (ja) |
KR (1) | KR20140060331A (ja) |
CN (1) | CN103781821B (ja) |
MY (1) | MY168166A (ja) |
SG (1) | SG11201400480SA (ja) |
TW (2) | TWI593719B (ja) |
WO (1) | WO2013035787A1 (ja) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6098825B2 (ja) * | 2011-09-08 | 2017-03-22 | 日産化学工業株式会社 | 重合体及びそれを含む組成物並びに接着剤用組成物 |
WO2016043045A1 (ja) * | 2014-09-17 | 2016-03-24 | 日産化学工業株式会社 | 熱硬化性樹脂を含む膜形成組成物 |
JP6544035B2 (ja) * | 2015-05-13 | 2019-07-17 | Jsr株式会社 | 感光性樹脂組成物およびその用途 |
US10866513B2 (en) | 2015-06-26 | 2020-12-15 | Nissan Chemical Industries, Ltd. | Photocurable resin composition |
US11262656B2 (en) * | 2016-03-31 | 2022-03-01 | Rohm And Haas Electronic Materials Korea Ltd. | Coating compositions for use with an overcoated photoresist |
WO2018043342A1 (ja) * | 2016-08-30 | 2018-03-08 | 日産化学工業株式会社 | 感光性接着剤組成物 |
KR102067081B1 (ko) * | 2017-11-01 | 2020-01-16 | 삼성에스디아이 주식회사 | 레지스트 하층막용 조성물 및 이를 이용한 패턴형성방법 |
JP7116356B2 (ja) * | 2017-11-28 | 2022-08-10 | 日産化学株式会社 | トリアジン-2,4-ジオン誘導体及びその製造方法 |
KR102541615B1 (ko) | 2018-04-13 | 2023-06-09 | 삼성전자주식회사 | 리소그래피용 기판 처리 조성물 및 이를 이용한 반도체 소자의 제조방법 |
KR102171075B1 (ko) * | 2018-07-12 | 2020-10-28 | 삼성에스디아이 주식회사 | 중합체, 하드마스크 조성물 및 패턴 형성 방법 |
US10787590B2 (en) | 2018-12-26 | 2020-09-29 | Industrial Technology Research Institute | Polymer and coating material |
JP7522390B2 (ja) | 2019-03-01 | 2024-07-25 | 日産化学株式会社 | N-(炭化水素)イソシアヌル酸の製造方法 |
WO2021149705A1 (ja) * | 2020-01-21 | 2021-07-29 | 日産化学株式会社 | アルカリガラス用剥離層形成用組成物及び剥離層 |
KR102563287B1 (ko) * | 2020-08-12 | 2023-08-02 | 삼성에스디아이 주식회사 | 레지스트 하층막용 조성물 및 이를 이용한 패턴형성방법 |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS51119798A (en) * | 1975-04-12 | 1976-10-20 | Toshiba Chem Corp | A thermosetting resin composition |
JPS62124124A (ja) * | 1985-11-25 | 1987-06-05 | Toa Nenryo Kogyo Kk | パラバン酸オリゴマ−組成物 |
JP2001172386A (ja) * | 1999-12-16 | 2001-06-26 | Mitsui Chemicals Inc | ノルボルナン骨格を有するイミダゾリジンジオン化合物、ノルボルナン骨格を有するポリパラバン酸及びそれらの製造方法 |
KR100872674B1 (ko) * | 2001-04-10 | 2008-12-10 | 닛산 가가쿠 고교 가부시키 가이샤 | 리소그래피용 반사방지막 형성 조성물 |
AU2003271123A1 (en) | 2002-10-09 | 2004-05-04 | Nissan Chemical Industries, Ltd. | Composition for forming antireflection film for lithography |
EP1757986B1 (en) * | 2004-04-09 | 2014-05-14 | Nissan Chemical Industries, Ltd. | Antireflection film for semiconductor containing condensation type polymer and method for forming photoresist pattern |
EP1813987B1 (en) * | 2004-11-01 | 2011-08-24 | Nissan Chemical Industries, Ltd. | Sulfonic-ester-containing composition for formation of antireflection film for lithography |
US20080038679A1 (en) | 2006-08-08 | 2008-02-14 | Kabushiki Kaisha Toshiba | Developing agent and manufacturing method thereof |
JP2008143954A (ja) * | 2006-12-06 | 2008-06-26 | Jsr Corp | イソシアヌル環含有重合体、その製造法およびそれを含有する組成物 |
WO2008146847A1 (ja) | 2007-05-30 | 2008-12-04 | Nissan Chemical Industries, Ltd. | 薄膜トランジスタ用ゲート絶縁膜形成剤 |
JP5337983B2 (ja) * | 2007-09-19 | 2013-11-06 | 日産化学工業株式会社 | 多環式脂肪族環を有するポリマーを含むリソグラフィー用レジスト下層膜形成組成物 |
KR101372829B1 (ko) * | 2007-12-13 | 2014-03-12 | 닛산 가가쿠 고교 가부시키 가이샤 | 레지스트 하층막 형성 조성물 및 레지스트패턴의 형성방법 |
US8361555B2 (en) * | 2007-12-27 | 2013-01-29 | E I Du Pont De Nemours And Company | Hydroxy alkyl isocyanurates |
WO2009096340A1 (ja) * | 2008-01-30 | 2009-08-06 | Nissan Chemical Industries, Ltd. | 硫黄原子を含有するレジスト下層膜形成用組成物及びレジストパターンの形成方法 |
WO2010061883A1 (ja) * | 2008-11-28 | 2010-06-03 | 日産化学工業株式会社 | 薄膜トランジスタ用ゲート絶縁膜形成剤 |
KR101708256B1 (ko) * | 2009-07-29 | 2017-02-20 | 닛산 가가쿠 고교 가부시키 가이샤 | 나노 임프린트용 레지스트 하층막 형성 조성물 |
US9023588B2 (en) * | 2010-02-19 | 2015-05-05 | Nissan Chemical Industries, Ltd. | Resist underlayer film forming composition containing silicon having nitrogen-containing ring |
CN103221888B (zh) * | 2010-11-17 | 2016-06-29 | 日产化学工业株式会社 | 抗蚀剂下层膜形成用组合物和使用了该组合物的抗蚀剂图案的形成方法 |
JP2012203393A (ja) * | 2011-03-28 | 2012-10-22 | Jsr Corp | レジスト下層膜形成用組成物、レジスト下層膜及びパターン形成方法 |
JP6098825B2 (ja) * | 2011-09-08 | 2017-03-22 | 日産化学工業株式会社 | 重合体及びそれを含む組成物並びに接着剤用組成物 |
-
2012
- 2012-09-06 JP JP2013532639A patent/JP6098825B2/ja active Active
- 2012-09-06 KR KR1020147008564A patent/KR20140060331A/ko not_active Application Discontinuation
- 2012-09-06 SG SG11201400480SA patent/SG11201400480SA/en unknown
- 2012-09-06 US US14/343,923 patent/US20140228488A1/en not_active Abandoned
- 2012-09-06 CN CN201280043274.8A patent/CN103781821B/zh not_active Expired - Fee Related
- 2012-09-06 EP EP17172415.6A patent/EP3235853A1/en not_active Withdrawn
- 2012-09-06 MY MYPI2014700555A patent/MY168166A/en unknown
- 2012-09-06 EP EP12830006.8A patent/EP2754681B1/en not_active Not-in-force
- 2012-09-06 WO PCT/JP2012/072747 patent/WO2013035787A1/ja active Application Filing
- 2012-09-07 TW TW101132742A patent/TWI593719B/zh not_active IP Right Cessation
- 2012-09-07 TW TW105128253A patent/TWI660979B/zh not_active IP Right Cessation
-
2016
- 2016-04-13 US US15/097,399 patent/US10202528B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
MY168166A (en) | 2018-10-11 |
US20140228488A1 (en) | 2014-08-14 |
KR20140060331A (ko) | 2014-05-19 |
EP2754681A1 (en) | 2014-07-16 |
EP3235853A1 (en) | 2017-10-25 |
US10202528B2 (en) | 2019-02-12 |
TW201702286A (zh) | 2017-01-16 |
TWI593719B (zh) | 2017-08-01 |
EP2754681A4 (en) | 2015-01-28 |
US20160222262A1 (en) | 2016-08-04 |
JPWO2013035787A1 (ja) | 2015-03-23 |
EP2754681B1 (en) | 2018-01-03 |
TW201323486A (zh) | 2013-06-16 |
JP6098825B2 (ja) | 2017-03-22 |
TWI660979B (zh) | 2019-06-01 |
CN103781821B (zh) | 2016-09-07 |
WO2013035787A1 (ja) | 2013-03-14 |
CN103781821A (zh) | 2014-05-07 |
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