SG10201602475TA - Imprint apparatus and article manufacturing method - Google Patents
Imprint apparatus and article manufacturing methodInfo
- Publication number
- SG10201602475TA SG10201602475TA SG10201602475TA SG10201602475TA SG10201602475TA SG 10201602475T A SG10201602475T A SG 10201602475TA SG 10201602475T A SG10201602475T A SG 10201602475TA SG 10201602475T A SG10201602475T A SG 10201602475TA SG 10201602475T A SG10201602475T A SG 10201602475TA
- Authority
- SG
- Singapore
- Prior art keywords
- imprint apparatus
- article manufacturing
- article
- manufacturing
- imprint
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70775—Position control, e.g. interferometers or encoders for determining the stage position
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7003—Alignment type or strategy, e.g. leveling, global alignment
- G03F9/7042—Alignment for lithographic apparatus using patterning methods other than those involving the exposure to radiation, e.g. by stamping or imprinting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/38—Masks having auxiliary features, e.g. special coatings or marks for alignment or testing; Preparation thereof
- G03F1/44—Testing or measuring features, e.g. grid patterns, focus monitors, sawtooth scales or notched scales
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/70591—Testing optical components
- G03F7/706—Aberration measurement
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7003—Alignment type or strategy, e.g. leveling, global alignment
- G03F9/7023—Aligning or positioning in direction perpendicular to substrate surface
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7073—Alignment marks and their environment
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7073—Alignment marks and their environment
- G03F9/7084—Position of mark on substrate, i.e. position in (x, y, z) of mark, e.g. buried or resist covered mark, mark on rearside, at the substrate edge, in the circuit area, latent image mark, marks in plural levels
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7088—Alignment mark detection, e.g. TTR, TTL, off-axis detection, array detector, video detection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
- H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
- H01L21/0274—Photolithographic processes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
- H01L21/682—Mask-wafer alignment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
Landscapes
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Multimedia (AREA)
- Crystallography & Structural Chemistry (AREA)
- Shaping Of Tube Ends By Bending Or Straightening (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015079472A JP6138189B2 (ja) | 2015-04-08 | 2015-04-08 | インプリント装置および物品の製造方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10201602475TA true SG10201602475TA (en) | 2016-11-29 |
Family
ID=57112219
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201602475TA SG10201602475TA (en) | 2015-04-08 | 2016-03-30 | Imprint apparatus and article manufacturing method |
Country Status (6)
Country | Link |
---|---|
US (1) | US10732522B2 (ko) |
JP (1) | JP6138189B2 (ko) |
KR (1) | KR102028235B1 (ko) |
CN (1) | CN106054517B (ko) |
SG (1) | SG10201602475TA (ko) |
TW (2) | TWI634589B (ko) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6120678B2 (ja) * | 2013-05-27 | 2017-04-26 | キヤノン株式会社 | インプリント方法、インプリント装置及びデバイス製造方法 |
JP6401501B2 (ja) * | 2014-06-02 | 2018-10-10 | キヤノン株式会社 | インプリント装置、および物品の製造方法 |
JP6755168B2 (ja) * | 2016-12-09 | 2020-09-16 | キヤノン株式会社 | インプリントシステム、レプリカ製造装置、管理装置、インプリント装置、および物品製造方法 |
JP6971567B2 (ja) * | 2016-12-16 | 2021-11-24 | キヤノン株式会社 | 位置合わせ装置、位置合わせ方法、リソグラフィ装置、および物品製造方法 |
US10998190B2 (en) | 2017-04-17 | 2021-05-04 | Canon Kabushiki Kaisha | Imprint apparatus and method of manufacturing article |
JP6937203B2 (ja) * | 2017-09-14 | 2021-09-22 | キオクシア株式会社 | インプリント装置、インプリント方法および半導体装置の製造方法 |
JP7057094B2 (ja) * | 2017-10-13 | 2022-04-19 | キヤノン株式会社 | 位置検出装置、インプリント装置および、物品製造方法 |
JP6688273B2 (ja) * | 2017-11-13 | 2020-04-28 | キヤノン株式会社 | リソグラフィ装置、リソグラフィ方法、決定方法及び物品の製造方法 |
CN109839799B (zh) * | 2017-11-28 | 2022-07-19 | 上海仪电显示材料有限公司 | 掩膜组件及其曝光方法 |
JP2019102537A (ja) | 2017-11-29 | 2019-06-24 | キヤノン株式会社 | インプリント装置、インプリント方法および物品製造方法 |
JP7060961B2 (ja) * | 2018-01-05 | 2022-04-27 | キヤノン株式会社 | インプリント装置、インプリント方法および物品製造方法 |
US11966157B2 (en) * | 2021-05-20 | 2024-04-23 | Canon Kabushiki Kaisha | Imprint apparatus, imprint method, and article manufacturing method |
CN113314451B (zh) * | 2021-06-10 | 2022-08-02 | 哈尔滨工业大学 | 一种基于莫尔条纹的晶圆键合对准系统及方法 |
Family Cites Families (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2868548B2 (ja) * | 1989-11-09 | 1999-03-10 | キヤノン株式会社 | アライメント装置 |
JP2829649B2 (ja) * | 1989-11-09 | 1998-11-25 | キヤノン株式会社 | アライメント装置 |
JPH09293674A (ja) * | 1996-04-24 | 1997-11-11 | Nikon Corp | 露光装置及び露光方法 |
JP3244633B2 (ja) * | 1996-09-05 | 2002-01-07 | 株式会社日立製作所 | 電子線描画方法及び電子線描画装置 |
JPH1197510A (ja) * | 1997-09-18 | 1999-04-09 | Toshiba Corp | アライメント方法 |
JPH11145039A (ja) * | 1997-11-10 | 1999-05-28 | Sony Corp | 縮小投影露光の位置合わせ方法及び縮小投影露光装置 |
JPH11340133A (ja) * | 1998-05-22 | 1999-12-10 | Sony Corp | 重ね合わせ精度測定方法及び半導体製造装置 |
JP2000294489A (ja) * | 1999-04-06 | 2000-10-20 | Sony Corp | パターン重ね合わせ方法及び露光装置 |
JP2002110518A (ja) * | 2000-09-28 | 2002-04-12 | Toshiba Corp | 重ね合わせ方法 |
JP2006294854A (ja) | 2005-04-11 | 2006-10-26 | Nikon Corp | マーク検出方法、位置合わせ方法、露光方法、プログラム及びマーク計測装置 |
JP4795300B2 (ja) | 2006-04-18 | 2011-10-19 | キヤノン株式会社 | 位置合わせ方法、インプリント方法、位置合わせ装置、インプリント装置、及び位置計測方法 |
JP4789194B2 (ja) * | 2006-05-01 | 2011-10-12 | 国立大学法人東京農工大学 | 露光装置および方法ならびにデバイス製造方法 |
JP2010283157A (ja) | 2009-06-04 | 2010-12-16 | Canon Inc | 露光装置及びデバイス製造方法 |
JP5800456B2 (ja) | 2009-12-16 | 2015-10-28 | キヤノン株式会社 | 検出器、インプリント装置及び物品の製造方法 |
JP5504054B2 (ja) * | 2010-05-27 | 2014-05-28 | 株式会社東芝 | インプリントマスク、その製造方法、及び半導体装置の製造方法 |
KR20120000846A (ko) * | 2010-06-28 | 2012-01-04 | 삼성전자주식회사 | 웨이퍼의 정렬 방법 및 공정 모니터링 방법 |
JP5759195B2 (ja) * | 2011-02-07 | 2015-08-05 | キヤノン株式会社 | 型、インプリント方法及び物品製造方法 |
US20130090877A1 (en) | 2011-10-07 | 2013-04-11 | Kabushiki Kaisha Toshiba | Lithography tool alignment control system |
JP6071221B2 (ja) | 2012-03-14 | 2017-02-01 | キヤノン株式会社 | インプリント装置、モールド、インプリント方法及び物品の製造方法 |
JP6188382B2 (ja) * | 2013-04-03 | 2017-08-30 | キヤノン株式会社 | インプリント装置および物品の製造方法 |
JP6120678B2 (ja) | 2013-05-27 | 2017-04-26 | キヤノン株式会社 | インプリント方法、インプリント装置及びデバイス製造方法 |
JP6271875B2 (ja) | 2013-06-18 | 2018-01-31 | キヤノン株式会社 | インプリント装置、インプリント方法および物品の製造方法 |
JP6401501B2 (ja) * | 2014-06-02 | 2018-10-10 | キヤノン株式会社 | インプリント装置、および物品の製造方法 |
JP6549834B2 (ja) * | 2014-11-14 | 2019-07-24 | キヤノン株式会社 | インプリント装置及び物品の製造方法 |
-
2015
- 2015-04-08 JP JP2015079472A patent/JP6138189B2/ja active Active
-
2016
- 2016-03-28 TW TW106101714A patent/TWI634589B/zh active
- 2016-03-28 TW TW105109722A patent/TW201642315A/zh unknown
- 2016-03-30 SG SG10201602475TA patent/SG10201602475TA/en unknown
- 2016-04-05 CN CN201610204848.5A patent/CN106054517B/zh active Active
- 2016-04-05 US US15/091,096 patent/US10732522B2/en active Active
- 2016-04-07 KR KR1020160042783A patent/KR102028235B1/ko active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
US10732522B2 (en) | 2020-08-04 |
TW201719726A (zh) | 2017-06-01 |
JP2016201423A (ja) | 2016-12-01 |
CN106054517B (zh) | 2020-11-06 |
US20160299444A1 (en) | 2016-10-13 |
KR20160120676A (ko) | 2016-10-18 |
TW201642315A (zh) | 2016-12-01 |
KR102028235B1 (ko) | 2019-10-02 |
TWI634589B (zh) | 2018-09-01 |
CN106054517A (zh) | 2016-10-26 |
JP6138189B2 (ja) | 2017-05-31 |
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