RU99124768A - Способ образования кремниевой наноструктуры, решетки кремниевых квантовых проводков и основанных на них устройств - Google Patents
Способ образования кремниевой наноструктуры, решетки кремниевых квантовых проводков и основанных на них устройствInfo
- Publication number
- RU99124768A RU99124768A RU99124768/28A RU99124768A RU99124768A RU 99124768 A RU99124768 A RU 99124768A RU 99124768/28 A RU99124768/28 A RU 99124768/28A RU 99124768 A RU99124768 A RU 99124768A RU 99124768 A RU99124768 A RU 99124768A
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- Prior art keywords
- silicon
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- wave
- ions
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- XUIMIQQOPSSXEZ-UHFFFAOYSA-N silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims 19
- 229910052710 silicon Inorganic materials 0.000 title claims 19
- 239000010703 silicon Substances 0.000 title claims 19
- 239000002086 nanomaterial Substances 0.000 title claims 3
- 150000002500 ions Chemical class 0.000 claims 14
- 238000005507 spraying Methods 0.000 claims 6
- 239000000463 material Substances 0.000 claims 5
- 230000015572 biosynthetic process Effects 0.000 claims 4
- 238000005755 formation reaction Methods 0.000 claims 4
- 239000012212 insulator Substances 0.000 claims 3
- 230000035515 penetration Effects 0.000 claims 3
- 230000000737 periodic Effects 0.000 claims 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims 2
- 238000004544 sputter deposition Methods 0.000 claims 2
- 229910052581 Si3N4 Inorganic materials 0.000 claims 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N Silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims 1
- 238000000137 annealing Methods 0.000 claims 1
- 238000000889 atomisation Methods 0.000 claims 1
- 239000000356 contaminant Substances 0.000 claims 1
- 229910052757 nitrogen Inorganic materials 0.000 claims 1
- 230000005693 optoelectronics Effects 0.000 claims 1
Claims (12)
1. Способ образования кремниевой наноструктуры, содержащий следующие этапы: распыление кремниевой поверхности посредством равномерного потока ионов молекул азота в сверхвысоком вакууме с целью образования периодического волнообразного рельефа, где фронт волны упомянутого рельефа проходит в направлении плоскости падения ионов, дополнительно включает в себя перед распылением следующие этапы: выбор необходимой длины волны периодического волнообразного рельефа в диапазоне от 9 до 120 нм, определение энергии ионов, угла падения ионов к поверхности упомянутого материала, температуры упомянутого кремния, глубины образования упомянутого волнообразного рельефа, высоты упомянутого волнообразного рельефа и диапазона проникновения ионов в кремний, и все это на основе упомянутой выбранной длины волны.
2. Способ по п.1, в котором упомянутая энергия ионов, упомянутый угол падения ионов, упомянутая температура упомянутого кремния, упомянутая глубина образования и упомянутая высота упомянутого волнообразного рельефа определяются на основании предварительно полученных эмпирических данных, связывающих упомянутую энергию ионов, упомянутый угол падения ионов, упомянутую температуру упомянутого кремния, упомянутую глубину образования и упомянутую высоту упомянутого волнообразного рельефа с длиной волны упомянутого периодического волнообразного рельефа, и в котором упомянутый диапазон проникновения ионов определяется из упомянутой энергии ионов.
3. Способ по п. 1, дополнительно включающий в себя перед распылением, этап размещения маски из нитрида кремния, содержащей окно со свисающими кромками на упомянутой кремниевой поверхности над участком распыления, и распыления упомянутой кремниевой поверхности через упомянутое окно.
4. Способ по п. 1, дополнительно включающий в себя перед распылением, этап удаления любых загрязнений с поверхности упомянутого кремниевого слоя, на котором должен быть образован упомянутый волнообразный рельеф.
5. Способ по п.1, дополнительно включающий в себя, после распыления отжиг материала с упомянутым рельефом в инертной окружающей среде.
6. Способ по п.1, в котором материал отжигают при температуре между 1000 и 1200oС в течение, по меньшей мере, одного часа.
7. Способ по любому из предыдущих пунктов, в котором упомянутая кремниевая наноструктура содержит решетку кремниевых квантовых проводков, а упомянутый кремний содержит кремниевый слой из материала "кремний на изоляторе", и дополнительно включает в себя выбор толщины упомянутого кремниевого слоя большего, чем сумма упомянутой глубины образования упомянутого волнообразного рельефа, упомянутой высоты упомянутого волнообразного рельефа и упомянутого диапазона проникновения ионов.
8. Способ по п.7, дополнительно включающий в себя во время распыления обнаружение сигнала вторичной ионной эмиссии из изоляционного слоя упомянутого материала "кремний на изоляторе", и завершение распыления, когда величина обнаруженного сигнала достигает предварительно определенного порогового значения.
9. Способ по п.8, в котором упомянутое пороговое значение упомянутого сигнала вторичной ионной эмиссии является таким значением, при котором сигнал превышает среднее фоновое значение на величину, равную двойной амплитуде шумовой составляющей сигнала.
10. Оптоэлектронное устройство, включающее в себя решетку квантовых проводков, образованную способом по п.7.
11. Электронное устройство, включающее в себя решетку квантовых проводков, образованную способом по п.7.
12. Электронное устройство по п.11, содержащее кремниевые контактные площадки, соединенные упомянутой решеткой кремниевых квантовых проводков, изоляционный слой, размещенный на упомянутой решетке квантовых проводков, и электрод, расположенный на упомянутом изоляторе.
Priority Applications (23)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
RU99124768/28A RU2173003C2 (ru) | 1999-11-25 | 1999-11-25 | Способ образования кремниевой наноструктуры, решетки кремниевых квантовых проводков и основанных на них устройств |
US09/525,722 US6274007B1 (en) | 1999-11-25 | 2000-03-14 | Methods of formation of a silicon nanostructure, a silicon quantum wire array and devices based thereon |
EP00302277A EP1104011A1 (en) | 1999-11-25 | 2000-03-21 | Methods of formation of a silicon nanostructure, a silicon quantum wire array and devices based theron |
JP2000079824A JP2001156050A (ja) | 1999-11-25 | 2000-03-22 | シリコンナノ構造の形成方法、シリコン量子細線配列、及びその上に基礎をおくデバイス |
MXPA02005281A MXPA02005281A (es) | 1999-11-25 | 2000-10-02 | Metodos de formacion de una nanostructura de silicon, una formacion de alambre de silicon quantum y desenos basados en estos. |
SK744-2002A SK7442002A3 (en) | 1999-11-25 | 2000-10-02 | Methods of formation of a silicon nanostructure, a silicon quantum wire array and devices based thereon |
HU0203517A HUP0203517A2 (en) | 1999-11-25 | 2000-10-02 | Methods of formation of a silicon nanostructure, a silicon quantum wire array and devices based thereon |
PCT/IB2000/001397 WO2001039259A1 (en) | 1999-11-25 | 2000-10-02 | Methods of formation of a silicon nanostructure, a silicon quantum wire array and devices based thereon |
CZ20021824A CZ20021824A3 (cs) | 1999-11-25 | 2000-10-02 | Způsob vytváření křemíkové nano@struktury a elektronický prvek vytvořený tímto způsobem |
CN00816289A CN1399791A (zh) | 1999-11-25 | 2000-10-02 | 硅毫微结构,硅量子线阵列的形成方法,以及基于此的设备 |
BR0016095-4A BR0016095A (pt) | 1999-11-25 | 2000-10-02 | Métodos para a moldagem de uma nanoestrutura de silicone, um vetor de fios quânticos de silicone e dispositivos baseados nos mesmos |
KR1020027006725A KR20020069195A (ko) | 1999-11-25 | 2000-10-02 | 실리콘 나노구조, 실리콘 양자세선 어레이 및 그에 기초한소자 형성방법 |
IL14983200A IL149832A0 (en) | 1999-11-25 | 2000-10-02 | Methods of formation of a silicon nanostructure, a silicon quantum wire array and devices based thereon |
EEP200200261A EE200200261A (et) | 1999-11-25 | 2000-10-02 | Meetod räninanostruktuuri, ränikvantviikude massiivi ning sellel baseeruvate komponentide formeerimiseks |
AU75474/00A AU7547400A (en) | 1999-11-25 | 2000-10-02 | Methods of formation of a silicon nanostructure, a silicon quantum wire array and devices based thereon |
PL00355890A PL355890A1 (en) | 1999-11-25 | 2000-10-02 | Methods of formation of a silicon nanostructure, a silicon quantum wire array and devices based thereon |
CA002392307A CA2392307A1 (en) | 1999-11-25 | 2000-10-02 | Methods of formation of a silicon nanostructure, a silicon quantum wire array and devices based thereon |
NO20022427A NO20022427L (no) | 1999-11-25 | 2002-05-22 | Fremgangsmåter for dannelse av en silisium nanostruktur, en silisium kvantetråd i rekke (array) og innretninger på basis derav |
YU38202A YU38202A (sh) | 1999-11-25 | 2002-05-24 | Metode obrazovanja silikonske nanostrukture, snopa silikonskih kvantnih žica i uređaja zasnovanih na njima |
IS6393A IS6393A (is) | 1999-11-25 | 2002-05-24 | Aðferðir til að framleiða kísilörsmið, kísilskammtavírafylki og tæki, sem byggja á þessu |
HR20020459A HRP20020459A2 (en) | 1999-11-25 | 2002-05-24 | Methods of formation of a silicon nanostructure, a silicon quantum wire array and devices based thereon |
BG106739A BG106739A (en) | 1999-11-25 | 2002-05-27 | Method of the formation of a silicon nanostructure, a silicon quantum wire array and devices based thereon |
ZA200204822A ZA200204822B (en) | 1999-11-25 | 2002-06-14 | Methods of formation of silicon nanostructure, a silicon quantum wire arry and devices based thereon. |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
RU99124768/28A RU2173003C2 (ru) | 1999-11-25 | 1999-11-25 | Способ образования кремниевой наноструктуры, решетки кремниевых квантовых проводков и основанных на них устройств |
Publications (2)
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RU99124768A true RU99124768A (ru) | 2001-08-27 |
RU2173003C2 RU2173003C2 (ru) | 2001-08-27 |
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RU99124768/28A RU2173003C2 (ru) | 1999-11-25 | 1999-11-25 | Способ образования кремниевой наноструктуры, решетки кремниевых квантовых проводков и основанных на них устройств |
Country Status (23)
Country | Link |
---|---|
US (1) | US6274007B1 (ru) |
EP (1) | EP1104011A1 (ru) |
JP (1) | JP2001156050A (ru) |
KR (1) | KR20020069195A (ru) |
CN (1) | CN1399791A (ru) |
AU (1) | AU7547400A (ru) |
BG (1) | BG106739A (ru) |
BR (1) | BR0016095A (ru) |
CA (1) | CA2392307A1 (ru) |
CZ (1) | CZ20021824A3 (ru) |
EE (1) | EE200200261A (ru) |
HR (1) | HRP20020459A2 (ru) |
HU (1) | HUP0203517A2 (ru) |
IL (1) | IL149832A0 (ru) |
IS (1) | IS6393A (ru) |
MX (1) | MXPA02005281A (ru) |
NO (1) | NO20022427L (ru) |
PL (1) | PL355890A1 (ru) |
RU (1) | RU2173003C2 (ru) |
SK (1) | SK7442002A3 (ru) |
WO (1) | WO2001039259A1 (ru) |
YU (1) | YU38202A (ru) |
ZA (1) | ZA200204822B (ru) |
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RU2141699C1 (ru) | 1997-09-30 | 1999-11-20 | Закрытое акционерное общество Центр "Анализ Веществ" | Способ формирования твердотельных наноструктур |
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