NL8503515A - Halfgeleiderinrichting. - Google Patents

Halfgeleiderinrichting. Download PDF

Info

Publication number
NL8503515A
NL8503515A NL8503515A NL8503515A NL8503515A NL 8503515 A NL8503515 A NL 8503515A NL 8503515 A NL8503515 A NL 8503515A NL 8503515 A NL8503515 A NL 8503515A NL 8503515 A NL8503515 A NL 8503515A
Authority
NL
Netherlands
Prior art keywords
layer
hemt
gaas
type
gate electrode
Prior art date
Application number
NL8503515A
Other languages
English (en)
Dutch (nl)
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Publication of NL8503515A publication Critical patent/NL8503515A/nl

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/86Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
    • H01L29/92Capacitors having potential barriers
    • H01L29/94Metal-insulator-semiconductors, e.g. MOS
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/778Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface
    • H01L29/7786Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface with direct single heterostructure, i.e. with wide bandgap layer formed on top of active layer, e.g. direct single heterostructure MIS-like HEMT
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/40Electrodes ; Multistep manufacturing processes therefor
    • H01L29/43Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/432Heterojunction gate for field effect devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Junction Field-Effect Transistors (AREA)
NL8503515A 1984-12-21 1985-12-19 Halfgeleiderinrichting. NL8503515A (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP27035084 1984-12-21
JP59270350A JPS61147578A (ja) 1984-12-21 1984-12-21 半導体装置

Publications (1)

Publication Number Publication Date
NL8503515A true NL8503515A (nl) 1986-07-16

Family

ID=17485034

Family Applications (1)

Application Number Title Priority Date Filing Date
NL8503515A NL8503515A (nl) 1984-12-21 1985-12-19 Halfgeleiderinrichting.

Country Status (7)

Country Link
JP (1) JPS61147578A (ko)
KR (1) KR940010557B1 (ko)
CA (1) CA1238122A (ko)
DE (1) DE3545434C2 (ko)
FR (1) FR2582152B1 (ko)
GB (1) GB2168847B (ko)
NL (1) NL8503515A (ko)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2600821B1 (fr) * 1986-06-30 1988-12-30 Thomson Csf Dispositif semi-conducteur a heterojonction et double canal, son application a un transistor a effet de champ, et son application a un dispositif de transductance negative
DE59010851D1 (de) * 1989-04-27 1998-11-12 Max Planck Gesellschaft Halbleiterstruktur mit einer 2D-Ladungsträgerschicht und Herstellungsverfahren
US5385865A (en) * 1990-04-26 1995-01-31 Max-Planck-Gesellschaft Zur Forderung Der Wissenschaften Method of generating active semiconductor structures by means of starting structures which have a 2D charge carrier layer parallel to the surface
CA2774934A1 (en) 2008-09-23 2010-04-01 Aerovironment, Inc. Stator winding heat sink configuraton

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58212182A (ja) * 1982-06-03 1983-12-09 Fujitsu Ltd 半導体装置
JPS61295671A (ja) * 1985-06-21 1986-12-26 ハネウエル・インコ−ポレ−テツド 相補形プレ−ナ・ヘテロ構造icおよびその製造方法

Also Published As

Publication number Publication date
KR940010557B1 (ko) 1994-10-24
GB2168847A (en) 1986-06-25
CA1238122A (en) 1988-06-14
KR860005452A (ko) 1986-07-23
DE3545434C2 (de) 1995-07-20
DE3545434A1 (de) 1986-07-03
GB2168847B (en) 1988-05-25
JPS61147578A (ja) 1986-07-05
FR2582152B1 (fr) 1989-12-08
FR2582152A1 (fr) 1986-11-21
GB8531441D0 (en) 1986-02-05

Similar Documents

Publication Publication Date Title
EP0283278B1 (en) Compound semiconductor device having nonalloyed ohmic contacts
US5614739A (en) HIGFET and method
US6627473B1 (en) Compound semiconductor device with delta doped layer under etching stopper layer for decreasing resistance between active layer and ohmic electrode and process of fabrication thereof
GB2285175A (en) High electron mobility transistor
JP3376078B2 (ja) 高電子移動度トランジスタ
KR900005560B1 (ko) 반도체장치 및 그 제조방법
JPS634955B2 (ko)
US5143856A (en) Method of manufacturing MES FET
US5514891A (en) N-type HIGFET and method
US6258639B1 (en) Sintered gate schottky barrier fet passivated by a degradation-stop layer
NL8503515A (nl) Halfgeleiderinrichting.
EP0317345B1 (en) Field-effect transistor
EP0744773B1 (en) Method of manufacturing semiconductor device having a plasma-processed layer
KR100548047B1 (ko) 전계효과트랜지스터
JP3141935B2 (ja) ヘテロ接合電界効果トランジスタ
US6410946B1 (en) Semiconductor device with source and drain electrodes in ohmic contact with a semiconductor layer
JP2695832B2 (ja) ヘテロ接合型電界効果トランジスタ
KR0160594B1 (ko) 반도체 소자의 게이트 전극 형성방법
JP3064559B2 (ja) 高電子移動度トランジスタの製造方法
Havasy et al. A highly manufacturable 0.2/spl mu/m AlGaAs/InGaAs PHEMT fabricated using the single-layer integrated-metal FET (SLIMFET) process
JPH04343440A (ja) 半導体装置
JPH0810701B2 (ja) 接合型電界効果トランジスタの製造方法
JP3141931B2 (ja) 電界効果トランジスタ
JPH07106525A (ja) 電界効果トランジスタおよび化合物半導体集積回路
JPS6118169A (ja) 半導体装置の製造方法