CA1238122A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- CA1238122A CA1238122A CA000497744A CA497744A CA1238122A CA 1238122 A CA1238122 A CA 1238122A CA 000497744 A CA000497744 A CA 000497744A CA 497744 A CA497744 A CA 497744A CA 1238122 A CA1238122 A CA 1238122A
- Authority
- CA
- Canada
- Prior art keywords
- layer
- gays
- semiconductor device
- gaas
- type
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 14
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 13
- 239000010703 silicon Substances 0.000 claims abstract description 13
- 229910000980 Aluminium gallium arsenide Inorganic materials 0.000 claims abstract description 11
- 239000012535 impurity Substances 0.000 claims abstract description 9
- 239000000758 substrate Substances 0.000 claims abstract description 9
- 150000001875 compounds Chemical class 0.000 claims abstract description 4
- 239000002184 metal Substances 0.000 claims abstract description 4
- 229910001218 Gallium arsenide Inorganic materials 0.000 claims abstract 12
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 14
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 9
- 238000000034 method Methods 0.000 description 8
- 229920002120 photoresistant polymer Polymers 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 5
- 229910045601 alloy Inorganic materials 0.000 description 3
- 239000000956 alloy Substances 0.000 description 3
- 230000005669 field effect Effects 0.000 description 3
- CBQYNPHHHJTCJS-UHFFFAOYSA-N Alline Chemical compound C1=CC=C2C3(O)CCN(C)C3NC2=C1 CBQYNPHHHJTCJS-UHFFFAOYSA-N 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 230000005533 two-dimensional electron gas Effects 0.000 description 2
- 206010037660 Pyrexia Diseases 0.000 description 1
- 238000010420 art technique Methods 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 208000018459 dissociative disease Diseases 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 229910000765 intermetallic Inorganic materials 0.000 description 1
- 238000002488 metal-organic chemical vapour deposition Methods 0.000 description 1
- 238000001393 microlithography Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/86—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
- H01L29/92—Capacitors having potential barriers
- H01L29/94—Metal-insulator-semiconductors, e.g. MOS
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/778—Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface
- H01L29/7786—Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface with direct single heterostructure, i.e. with wide bandgap layer formed on top of active layer, e.g. direct single heterostructure MIS-like HEMT
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/432—Heterojunction gate for field effect devices
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Junction Field-Effect Transistors (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP270350/84 | 1984-12-21 | ||
JP59270350A JPS61147578A (ja) | 1984-12-21 | 1984-12-21 | 半導体装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
CA1238122A true CA1238122A (en) | 1988-06-14 |
Family
ID=17485034
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA000497744A Expired CA1238122A (en) | 1984-12-21 | 1985-12-16 | Semiconductor device |
Country Status (7)
Country | Link |
---|---|
JP (1) | JPS61147578A (ko) |
KR (1) | KR940010557B1 (ko) |
CA (1) | CA1238122A (ko) |
DE (1) | DE3545434C2 (ko) |
FR (1) | FR2582152B1 (ko) |
GB (1) | GB2168847B (ko) |
NL (1) | NL8503515A (ko) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2600821B1 (fr) * | 1986-06-30 | 1988-12-30 | Thomson Csf | Dispositif semi-conducteur a heterojonction et double canal, son application a un transistor a effet de champ, et son application a un dispositif de transductance negative |
DE59010851D1 (de) * | 1989-04-27 | 1998-11-12 | Max Planck Gesellschaft | Halbleiterstruktur mit einer 2D-Ladungsträgerschicht und Herstellungsverfahren |
US5385865A (en) * | 1990-04-26 | 1995-01-31 | Max-Planck-Gesellschaft Zur Forderung Der Wissenschaften | Method of generating active semiconductor structures by means of starting structures which have a 2D charge carrier layer parallel to the surface |
CA2774934A1 (en) | 2008-09-23 | 2010-04-01 | Aerovironment, Inc. | Stator winding heat sink configuraton |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58212182A (ja) * | 1982-06-03 | 1983-12-09 | Fujitsu Ltd | 半導体装置 |
JPS61295671A (ja) * | 1985-06-21 | 1986-12-26 | ハネウエル・インコ−ポレ−テツド | 相補形プレ−ナ・ヘテロ構造icおよびその製造方法 |
-
1984
- 1984-12-21 JP JP59270350A patent/JPS61147578A/ja active Pending
-
1985
- 1985-12-13 KR KR1019850009394A patent/KR940010557B1/ko not_active IP Right Cessation
- 1985-12-16 CA CA000497744A patent/CA1238122A/en not_active Expired
- 1985-12-19 NL NL8503515A patent/NL8503515A/nl unknown
- 1985-12-20 GB GB08531441A patent/GB2168847B/en not_active Expired
- 1985-12-20 DE DE3545434A patent/DE3545434C2/de not_active Expired - Fee Related
- 1985-12-20 FR FR858518969A patent/FR2582152B1/fr not_active Expired
Also Published As
Publication number | Publication date |
---|---|
KR940010557B1 (ko) | 1994-10-24 |
GB2168847A (en) | 1986-06-25 |
KR860005452A (ko) | 1986-07-23 |
DE3545434C2 (de) | 1995-07-20 |
DE3545434A1 (de) | 1986-07-03 |
GB2168847B (en) | 1988-05-25 |
JPS61147578A (ja) | 1986-07-05 |
FR2582152B1 (fr) | 1989-12-08 |
FR2582152A1 (fr) | 1986-11-21 |
NL8503515A (nl) | 1986-07-16 |
GB8531441D0 (en) | 1986-02-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7015518B2 (en) | HEMT device with a mesa isolating multilayer film | |
US20020187623A1 (en) | Compound semiconductor device with delta doped layer under etching stopper layer for decreasing resistance between active layer and ohmic electrode and process of fabrication thereof | |
EP0233725A2 (en) | Opto-Electronic Device and Method for its Manufacture | |
US5811843A (en) | Field effect transistor | |
US5610410A (en) | III-V compound semiconductor device with Schottky electrode of increased barrier height | |
US5319223A (en) | High electron mobility transistor | |
EP0194197A1 (en) | Heterojunction bipolar transistor and process for fabricating same | |
EP0244840B1 (en) | Method of manufacturing mes fet | |
US4929985A (en) | Compound semiconductor device | |
CA1238122A (en) | Semiconductor device | |
GB2252874A (en) | Field effect transistor and manufacturing method therefor | |
US5231040A (en) | Method of making a field effect transistor | |
US4805005A (en) | Semiconductor device and manufacturing method of the same | |
US4784967A (en) | Method for fabricating a field-effect transistor with a self-aligned gate | |
US5837570A (en) | Heterostructure semiconductor device and method of fabricating same | |
US6242765B1 (en) | Field effect transistor and its manufacturing method | |
US5389807A (en) | Field effect transistor | |
JPH0846182A (ja) | 半導体装置の製造方法 | |
KR940006690B1 (ko) | 반도체장치 | |
US5539248A (en) | Semiconductor device with improved insulating/passivating layer of indium gallium fluoride (InGaF) | |
EP4290582A1 (en) | Method for manufacturing high-electron-mobility transistor | |
JPH0574813A (ja) | 化合物半導体装置 | |
KR100220870B1 (ko) | 화합물 반도체 장치의 제조 방법 | |
JP2804252B2 (ja) | 電界効果型トランジスタおよびその製造方法 | |
JP2668418B2 (ja) | 半導体装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MKEX | Expiry |