NL193349B - Detectieschakeling voor het detecteren van de toestand van twee smeltstukverbindingen. - Google Patents

Detectieschakeling voor het detecteren van de toestand van twee smeltstukverbindingen.

Info

Publication number
NL193349B
NL193349B NL8802760A NL8802760A NL193349B NL 193349 B NL193349 B NL 193349B NL 8802760 A NL8802760 A NL 8802760A NL 8802760 A NL8802760 A NL 8802760A NL 193349 B NL193349 B NL 193349B
Authority
NL
Netherlands
Prior art keywords
detecting
condition
detection circuit
joint connections
melting joint
Prior art date
Application number
NL8802760A
Other languages
English (en)
Other versions
NL8802760A (nl
NL193349C (nl
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of NL8802760A publication Critical patent/NL8802760A/nl
Publication of NL193349B publication Critical patent/NL193349B/nl
Application granted granted Critical
Publication of NL193349C publication Critical patent/NL193349C/nl

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
    • G11C17/18—Auxiliary circuits, e.g. for writing into memory
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/74—Testing of fuses
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H3/00—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection
    • H02H3/02—Details
    • H02H3/04—Details with warning or supervision in addition to disconnection, e.g. for indicating that protective apparatus has functioned
    • H02H3/046—Signalling the blowing of a fuse

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Semiconductor Memories (AREA)
NL8802760A 1987-11-12 1988-11-09 Detectieschakeling voor het detecteren van de toestand van twee smeltstukverbindingen. NL193349C (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/129,891 US4837520A (en) 1985-03-29 1987-11-12 Fuse status detection circuit
US12989187 1987-11-12

Publications (3)

Publication Number Publication Date
NL8802760A NL8802760A (nl) 1989-06-01
NL193349B true NL193349B (nl) 1999-03-01
NL193349C NL193349C (nl) 1999-07-02

Family

ID=22442077

Family Applications (1)

Application Number Title Priority Date Filing Date
NL8802760A NL193349C (nl) 1987-11-12 1988-11-09 Detectieschakeling voor het detecteren van de toestand van twee smeltstukverbindingen.

Country Status (5)

Country Link
US (1) US4837520A (nl)
JP (1) JP2628359B2 (nl)
KR (1) KR960001304B1 (nl)
DE (1) DE3837800A1 (nl)
NL (1) NL193349C (nl)

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US5208775A (en) * 1990-09-07 1993-05-04 Samsung Electronics Co., Ltd. Dual-port memory device
US5051691A (en) * 1990-09-13 1991-09-24 Samsung Semiconductor, Inc. Zero power dissipation laser fuse signature circuit for redundancy in vlsi design
US5334880A (en) * 1991-04-30 1994-08-02 International Business Machines Corporation Low voltage programmable storage element
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FR2684206B1 (fr) * 1991-11-25 1994-01-07 Sgs Thomson Microelectronics Sa Circuit de lecture de fusible de redondance pour memoire integree.
JP3362873B2 (ja) * 1992-08-21 2003-01-07 株式会社東芝 半導体装置
US5440246A (en) * 1994-03-22 1995-08-08 Mosel Vitelic, Incorporated Programmable circuit with fusible latch
US5974661A (en) * 1994-05-27 1999-11-02 Littelfuse, Inc. Method of manufacturing a surface-mountable device for protection against electrostatic damage to electronic components
US6191928B1 (en) 1994-05-27 2001-02-20 Littelfuse, Inc. Surface-mountable device for protection against electrostatic damage to electronic components
US5790008A (en) * 1994-05-27 1998-08-04 Littlefuse, Inc. Surface-mounted fuse device with conductive terminal pad layers and groove on side surfaces
US5552757A (en) * 1994-05-27 1996-09-03 Littelfuse, Inc. Surface-mounted fuse device
US5789970A (en) * 1995-09-29 1998-08-04 Intel Corporation Static, low current, low voltage sensing circuit for sensing the state of a fuse device
US5731733A (en) * 1995-09-29 1998-03-24 Intel Corporation Static, low current sensing circuit for sensing the state of a fuse device
US5959445A (en) * 1995-09-29 1999-09-28 Intel Corporation Static, high-sensitivity, fuse-based storage cell
US5977860A (en) * 1996-06-07 1999-11-02 Littelfuse, Inc. Surface-mount fuse and the manufacture thereof
US5699032A (en) * 1996-06-07 1997-12-16 Littelfuse, Inc. Surface-mount fuse having a substrate with surfaces and a metal strip attached to the substrate using layer of adhesive material
DE19631130C2 (de) * 1996-08-01 2000-08-17 Siemens Ag Fuse-Refresh-Schaltung
US5731734A (en) * 1996-10-07 1998-03-24 Atmel Corporation Zero power fuse circuit
US5889414A (en) * 1997-04-28 1999-03-30 Mosel Vitelic Corporation Programmable circuits
US5896059A (en) * 1997-05-09 1999-04-20 International Business Machines Corporation Decoupling capacitor fuse system
GB2325527B (en) * 1997-05-23 2002-03-27 Texas Instruments Ltd Detecting the state of an electrical conductor
JPH10332786A (ja) * 1997-05-27 1998-12-18 Nec Kyushu Ltd 半導体装置
KR100425441B1 (ko) * 1997-06-23 2004-05-24 삼성전자주식회사 비 메모리를 위한 퓨징 장치 및 방법
US5999037A (en) * 1997-07-31 1999-12-07 International Business Machines Corporation Circuit for operating a control transistor from a fusible link
US6014052A (en) * 1997-09-29 2000-01-11 Lsi Logic Corporation Implementation of serial fusible links
US5999038A (en) * 1998-09-24 1999-12-07 Atmel Corporation Fuse circuit having zero power draw for partially blown condition
US6163492A (en) * 1998-10-23 2000-12-19 Mosel Vitelic, Inc. Programmable latches that include non-volatile programmable elements
US6084803A (en) * 1998-10-23 2000-07-04 Mosel Vitelic, Inc. Initialization of non-volatile programmable latches in circuits in which an initialization operation is performed
JP2001307480A (ja) * 2000-04-24 2001-11-02 Mitsubishi Electric Corp 半導体集積回路装置
US6671834B1 (en) * 2000-07-18 2003-12-30 Micron Technology, Inc. Memory redundancy with programmable non-volatile control
US7034652B2 (en) * 2001-07-10 2006-04-25 Littlefuse, Inc. Electrostatic discharge multifunction resistor
DE10297040T5 (de) * 2001-07-10 2004-08-05 Littelfuse, Inc., Des Plaines Elektrostatische Entladungsgerät für Netzwerksysteme
FR2836752A1 (fr) * 2002-02-11 2003-09-05 St Microelectronics Sa Cellule memoire a programmation unique
US6878004B2 (en) * 2002-03-04 2005-04-12 Littelfuse, Inc. Multi-element fuse array
US7183891B2 (en) * 2002-04-08 2007-02-27 Littelfuse, Inc. Direct application voltage variable material, devices employing same and methods of manufacturing such devices
WO2003088356A1 (en) * 2002-04-08 2003-10-23 Littelfuse, Inc. Voltage variable material for direct application and devices employing same
US7132922B2 (en) * 2002-04-08 2006-11-07 Littelfuse, Inc. Direct application voltage variable material, components thereof and devices employing same
JP2007512185A (ja) * 2003-11-26 2007-05-17 リッテルフューズ，インコーポレイティド 車両用電気的保護装置、及び車両用電気的保護装置を使用するシステム
US6995601B2 (en) * 2004-01-14 2006-02-07 Taiwan Semiconductor Manufacturing Co., Ltd. Fuse state detection circuit
US8134445B2 (en) * 2004-04-20 2012-03-13 Cooper Technologies Company RFID open fuse indicator, system, and method
US7369029B2 (en) * 2004-04-20 2008-05-06 Cooper Technologies Company Wireless communication fuse state indicator system and method
US8169331B2 (en) * 2004-09-10 2012-05-01 Cooper Technologies Company Circuit protector monitoring assembly
US20070194942A1 (en) * 2004-09-10 2007-08-23 Darr Matthew R Circuit protector monitoring assembly, system and method
TW200635164A (en) * 2004-09-10 2006-10-01 Cooper Technologies Co System and method for circuit protector monitoring and management
JP4584658B2 (ja) * 2004-09-13 2010-11-24 Ｏｋｉセミコンダクタ株式会社 半導体装置
US20060087397A1 (en) * 2004-10-26 2006-04-27 Cooper Technologies Company Fuse state indicating optical circuit and system
US20060232904A1 (en) * 2005-04-13 2006-10-19 Taiwan Semiconductor Manufacturing Co. Supply voltage independent sensing circuit for electrical fuses
US7276955B2 (en) * 2005-04-14 2007-10-02 Micron Technology, Inc. Circuit and method for stable fuse detection
US7983024B2 (en) * 2007-04-24 2011-07-19 Littelfuse, Inc. Fuse card system for automotive circuit protection
US8963590B2 (en) * 2007-06-13 2015-02-24 Honeywell International Inc. Power cycling power on reset circuit for fuse initialization circuitry
JP5458236B2 (ja) * 2007-11-02 2014-04-02 ピーエスフォー ルクスコ エスエイアールエル 電気ヒューズ判定回路及び判定方法
US20090161470A1 (en) * 2007-12-20 2009-06-25 Micron Technology, Inc. Circuit for dynamic readout of fused data in image sensors
DE102008048830B4 (de) * 2008-09-25 2010-11-04 Austriamicrosystems Ag Schaltungsanordnung mit Schmelzsicherung und Verfahren zum Ermitteln eines Zustands einer Schmelzsicherung
TWM424608U (en) * 2011-11-04 2012-03-11 Richtek Technology Corp Fuse circuit for final test trimming of integrated circuit chip
KR20140085245A (ko) * 2012-12-27 2014-07-07 에스케이하이닉스 주식회사 퓨즈 센싱 회로를 갖는 반도체 장치
US9583297B2 (en) * 2014-04-04 2017-02-28 Eaton Corporation Remote fuse operation indicator assemblies and related systems and methods
US10360988B2 (en) 2016-11-02 2019-07-23 Skyworks Solutions, Inc. Apparatus and methods for protection against inadvertent programming of fuse cells
US10255982B2 (en) * 2016-11-02 2019-04-09 Skyworks Solutions, Inc. Accidental fuse programming protection circuits
KR20190086948A (ko) 2018-01-15 2019-07-24 주식회사 카라신 간이침대 고정형 침낭

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DE2230753C2 (de) * 1972-06-23 1983-10-27 Lucien Ferraz & Cie. S.A., 69003 Lyon Schaltung zur Zustandskontrolle einer elektrischen Sicherung
US3872450A (en) * 1973-06-21 1975-03-18 Motorola Inc Fusible link memory cell for a programmable read only memory
GB1553250A (en) * 1976-08-03 1979-09-26 Nat Res Dev Unidirectional signal paths
US4346459A (en) * 1980-06-30 1982-08-24 Inmos Corporation Redundancy scheme for an MOS memory
US4446534A (en) * 1980-12-08 1984-05-01 National Semiconductor Corporation Programmable fuse circuit
US4532607A (en) * 1981-07-22 1985-07-30 Tokyo Shibaura Denki Kabushiki Kaisha Programmable circuit including a latch to store a fuse's state
US4546455A (en) * 1981-12-17 1985-10-08 Tokyo Shibaura Denki Kabushiki Kaisha Semiconductor device
US4417154A (en) * 1982-02-08 1983-11-22 Motorola, Inc. Circuit for applying a high voltage signal to a fusible link
FR2526225B1 (fr) * 1982-04-30 1985-11-08 Radiotechnique Compelec Procede de realisation d'un condensateur integre, et dispositif ainsi obtenu
JPS6015946A (ja) * 1983-07-08 1985-01-26 Hitachi Ltd 集積回路
US4613959A (en) * 1984-01-06 1986-09-23 Thomson Components-Mostek Corportion Zero power CMOS redundancy circuit
US4590388A (en) * 1984-04-23 1986-05-20 At&T Bell Laboratories CMOS spare decoder circuit

Also Published As

Publication number Publication date
JPH021145A (ja) 1990-01-05
JP2628359B2 (ja) 1997-07-09
DE3837800A1 (de) 1989-05-24
KR890008849A (ko) 1989-07-12
US4837520A (en) 1989-06-06
NL8802760A (nl) 1989-06-01
NL193349C (nl) 1999-07-02
KR960001304B1 (ko) 1996-01-25

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Legal Events

Date Code Title Description
BA A request for search or an international-type search has been filed
CNR Transfer of rights (patent application after its laying open for public inspection)

Free format text: SAMSUNG ELECTRONICS CO., LTD.

BB A search report has been drawn up
BC A request for examination has been filed
V4 Discontinued because of reaching the maximum lifetime of a patent

Effective date: 20081109