NL1015506A1 - Organische anti-reflecterende deklaagpolymeren en werkwijze ter bereiding hiervan. - Google Patents

Organische anti-reflecterende deklaagpolymeren en werkwijze ter bereiding hiervan.

Info

Publication number
NL1015506A1
NL1015506A1 NL1015506A NL1015506A NL1015506A1 NL 1015506 A1 NL1015506 A1 NL 1015506A1 NL 1015506 A NL1015506 A NL 1015506A NL 1015506 A NL1015506 A NL 1015506A NL 1015506 A1 NL1015506 A1 NL 1015506A1
Authority
NL
Netherlands
Prior art keywords
preparation
reflective coating
organic anti
coating polymers
polymers
Prior art date
Application number
NL1015506A
Other languages
English (en)
Other versions
NL1015506C2 (nl
Inventor
Min-Ho Jung
Sung-Eun Hong
Ki-Ho Baik
Original Assignee
Hyundai Electronics Ind
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hyundai Electronics Ind filed Critical Hyundai Electronics Ind
Publication of NL1015506A1 publication Critical patent/NL1015506A1/nl
Application granted granted Critical
Publication of NL1015506C2 publication Critical patent/NL1015506C2/nl

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G75/00—Macromolecular compounds obtained by reactions forming a linkage containing sulfur with or without nitrogen, oxygen, or carbon in the main chain of the macromolecule
    • C08G75/20—Polysulfones
    • C—CHEMISTRY; METALLURGY
    • C07—ORGANIC CHEMISTRY
    • C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C303/00—Preparation of esters or amides of sulfuric acids; Preparation of sulfonic acids or of their esters, halides, anhydrides or amides
    • C07C303/26—Preparation of esters or amides of sulfuric acids; Preparation of sulfonic acids or of their esters, halides, anhydrides or amides of esters of sulfonic acids
    • C07C303/28—Preparation of esters or amides of sulfuric acids; Preparation of sulfonic acids or of their esters, halides, anhydrides or amides of esters of sulfonic acids by reaction of hydroxy compounds with sulfonic acids or derivatives thereof
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F120/00—Homopolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride, ester, amide, imide or nitrile thereof
    • C08F120/02—Monocarboxylic acids having less than ten carbon atoms; Derivatives thereof
    • C08F120/52—Amides or imides
    • C08F120/54—Amides, e.g. N,N-dimethylacrylamide or N-isopropylacrylamide
    • C08F120/58—Amides, e.g. N,N-dimethylacrylamide or N-isopropylacrylamide containing oxygen in addition to the carbonamido oxygen, e.g. N-methylolacrylamide, N-acryloyl morpholine
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
    • G03F7/091—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers characterised by antireflection means or light filtering or absorbing means, e.g. anti-halation, contrast enhancement
NL1015506A 1999-06-26 2000-06-23 Organische anti-reflecterende deklaagpolymeren en werkwijze ter bereiding hiervan. NL1015506C2 (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-1999-0024470A KR100400243B1 (ko) 1999-06-26 1999-06-26 유기 반사방지 중합체 및 그의 제조방법
KR19990024470 1999-06-26

Publications (2)

Publication Number Publication Date
NL1015506A1 true NL1015506A1 (nl) 2000-12-28
NL1015506C2 NL1015506C2 (nl) 2001-04-09

Family

ID=19595633

Family Applications (1)

Application Number Title Priority Date Filing Date
NL1015506A NL1015506C2 (nl) 1999-06-26 2000-06-23 Organische anti-reflecterende deklaagpolymeren en werkwijze ter bereiding hiervan.

Country Status (10)

Country Link
US (1) US6423797B1 (nl)
JP (1) JP4024456B2 (nl)
KR (1) KR100400243B1 (nl)
CN (1) CN1290713A (nl)
DE (1) DE10028344A1 (nl)
FR (1) FR2795417B1 (nl)
GB (1) GB2351731B (nl)
IT (1) IT1320211B1 (nl)
NL (1) NL1015506C2 (nl)
TW (1) TW552270B (nl)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2398787B (en) * 2000-06-13 2004-10-27 Hyundai Electronics Ind Organic anti-reflective polymer and preparation thereof
KR100470938B1 (ko) * 2002-05-17 2005-02-22 (주)모레이 유기 난반사 방지막 형성용 광흡수성 고분자, 이를포함하는 조성물, 및 이를 이용한 반도체 소자 패턴의형성 방법
JP4798938B2 (ja) * 2003-04-11 2011-10-19 ローム・アンド・ハース・エレクトロニック・マテリアルズ，エル．エル．シー． フォトレジストシステム
DE10349764B4 (de) * 2003-10-24 2006-08-24 Infineon Technologies Ag Hartmaske zur Strukturierung einer Schicht und Verfahren zur Generierung einer Hartmaske für die Strukturierung einer Schicht
KR100570211B1 (ko) * 2003-12-24 2006-04-12 주식회사 하이닉스반도체 유기 반사방지막용 가교제 중합체, 이를 포함하는 유기반사 방지막 조성물 및 이를 이용한 포토레지스트의 패턴형성 방법
JP4509106B2 (ja) * 2004-05-14 2010-07-21 日産化学工業株式会社 ビニルエーテル化合物を含む反射防止膜形成組成物
KR100574496B1 (ko) 2004-12-15 2006-04-27 주식회사 하이닉스반도체 상부반사방지막 중합체, 그 제조방법 및 이를 함유하는상부반사방지막 조성물
US7666575B2 (en) * 2006-10-18 2010-02-23 Az Electronic Materials Usa Corp Antireflective coating compositions
JP5842503B2 (ja) * 2010-09-29 2016-01-13 Jsr株式会社 レジスト下層膜形成用組成物、レジスト下層膜及びその形成方法
WO2023017728A1 (ja) * 2021-08-10 2023-02-16 Jsr株式会社 半導体基板の製造方法及びレジスト下層膜形成用組成物
CN113913075B (zh) * 2021-10-25 2022-09-20 嘉庚创新实验室 一种抗反射涂层组合物及可交联聚合物

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL185727B (nl) * 1953-03-11 Inst Francais Du Petrole Werkwijze voor het stoomkraken van zware koolwaterstofvoedingen.
CS150825B1 (nl) * 1971-02-11 1973-09-17
JPS5736283B2 (nl) * 1973-01-25 1982-08-03
DE3100077A1 (de) 1981-01-03 1982-08-05 Hoechst Ag, 6000 Frankfurt Lichtempfindliches gemisch, das einen naphthochinondiazidsulfonsaeureester enthaelt, und verfahren zur herstellung des naphthochinondiazidsulfonsaeureesters
US4822718A (en) 1982-09-30 1989-04-18 Brewer Science, Inc. Light absorbing coating
US5674648A (en) 1984-08-06 1997-10-07 Brewer Science, Inc. Anti-reflective coating
JP2740837B2 (ja) 1987-01-30 1998-04-15 コニカ株式会社 多色転写画像形成方法
US5476913A (en) * 1992-07-06 1995-12-19 Otsuka Kagaku Kabushiki Kaisha Polymerizable monomer, polymer thereof and process for preparing same
US5652317A (en) * 1996-08-16 1997-07-29 Hoechst Celanese Corporation Antireflective coatings for photoresist compositions
JP3707632B2 (ja) * 1996-10-18 2005-10-19 富士写真フイルム株式会社 反射防止膜用組成物
JP3852868B2 (ja) * 1997-02-06 2006-12-06 富士写真フイルム株式会社 反射防止膜材料組成物及びそれを用いたレジストパターン形成方法
US5981145A (en) * 1997-04-30 1999-11-09 Clariant Finance (Bvi) Limited Light absorbing polymers
JP4053631B2 (ja) * 1997-10-08 2008-02-27 Ａｚエレクトロニックマテリアルズ株式会社 反射防止膜又は光吸収膜用組成物及びこれに用いる重合体
TW457403B (en) 1998-07-03 2001-10-01 Clariant Int Ltd Composition for forming a radiation absorbing coating containing blocked isocyanate compound and anti-reflective coating formed therefrom
KR20000046952A (ko) * 1998-12-31 2000-07-25 김영환 유기 난반사방지 중합체 및 그의 제조방법

Also Published As

Publication number Publication date
CN1290713A (zh) 2001-04-11
FR2795417B1 (fr) 2002-02-15
KR20010003934A (ko) 2001-01-15
ITTO20000613A0 (it) 2000-06-22
KR100400243B1 (ko) 2003-10-01
FR2795417A1 (fr) 2000-12-29
GB2351731A (en) 2001-01-10
IT1320211B1 (it) 2003-11-26
NL1015506C2 (nl) 2001-04-09
GB2351731B (en) 2004-02-11
ITTO20000613A1 (it) 2000-12-27
JP4024456B2 (ja) 2007-12-19
TW552270B (en) 2003-09-11
JP2001048859A (ja) 2001-02-20
US6423797B1 (en) 2002-07-23
DE10028344A1 (de) 2001-01-25
GB0014259D0 (en) 2000-08-02

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RD2N Patents in respect of which a decision has been taken or a report has been made (novelty report)

Effective date: 20010205

PD2B A search report has been drawn up
MM Lapsed because of non-payment of the annual fee

Effective date: 20160701