NL1006624C2 - Chemisch versterkte resistsamenstelling, die silicum bevat. - Google Patents

Chemisch versterkte resistsamenstelling, die silicum bevat. Download PDF

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Publication number
NL1006624C2
NL1006624C2 NL1006624A NL1006624A NL1006624C2 NL 1006624 C2 NL1006624 C2 NL 1006624C2 NL 1006624 A NL1006624 A NL 1006624A NL 1006624 A NL1006624 A NL 1006624A NL 1006624 C2 NL1006624 C2 NL 1006624C2
Authority
NL
Netherlands
Prior art keywords
group
pag
resist composition
methyl
hydrogen
Prior art date
Application number
NL1006624A
Other languages
English (en)
Dutch (nl)
Inventor
Sang-Jun Choi
Chun-Geun Park
Hai-Won Lee
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Application granted granted Critical
Publication of NL1006624C2 publication Critical patent/NL1006624C2/nl

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Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/075—Silicon-containing compounds
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/075—Silicon-containing compounds
    • G03F7/0757—Macromolecular compounds containing Si-O, Si-C or Si-N bonds
    • G03F7/0758—Macromolecular compounds containing Si-O, Si-C or Si-N bonds with silicon- containing groups in the side chains
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
    • Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
    • Y10S430/1055—Radiation sensitive composition or product or process of making
    • Y10S430/106—Binder containing
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
    • Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
    • Y10S430/1055—Radiation sensitive composition or product or process of making
    • Y10S430/106—Binder containing
    • Y10S430/111—Polymer of unsaturated acid or ester

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Materials For Photolithography (AREA)
  • Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
NL1006624A 1997-04-10 1997-07-18 Chemisch versterkte resistsamenstelling, die silicum bevat. NL1006624C2 (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1019970013219A KR100230417B1 (ko) 1997-04-10 1997-04-10 실리콘을 함유하는 화학증폭형 레지스트 조성물
KR19970013219 1997-04-10

Publications (1)

Publication Number Publication Date
NL1006624C2 true NL1006624C2 (nl) 1998-10-14

Family

ID=19502421

Family Applications (1)

Application Number Title Priority Date Filing Date
NL1006624A NL1006624C2 (nl) 1997-04-10 1997-07-18 Chemisch versterkte resistsamenstelling, die silicum bevat.

Country Status (6)

Country Link
US (2) US5981141A (ja)
JP (1) JP3618538B2 (ja)
KR (1) KR100230417B1 (ja)
DE (1) DE19735059A1 (ja)
FR (1) FR2761999B1 (ja)
NL (1) NL1006624C2 (ja)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR19990061090A (ko) * 1997-12-31 1999-07-26 김영환 다층 레지스트 공정용 포토레지스트와 이를 이용한반도체 소자의 미세패턴 제조방법
KR100524893B1 (ko) * 1998-01-05 2005-12-21 삼성전자주식회사 실리콘을 함유하는 감광성 고분자 화합물 및이를 이용한 포토레지스트 조성물
KR100261224B1 (ko) * 1998-05-07 2000-09-01 윤종용 실리콘을 함유하는 폴리머 및 이를 포함하는 화학증폭형 레지스트 조성물
AU4992799A (en) 1998-08-18 2000-03-14 3M Innovative Properties Company Polymers having silicon-containing acetal or ketal functional groups
US6444408B1 (en) * 2000-02-28 2002-09-03 International Business Machines Corporation High silicon content monomers and polymers suitable for 193 nm bilayer resists
JP4253423B2 (ja) 2000-06-14 2009-04-15 富士フイルム株式会社 ポジ型レジスト積層物
JP3838329B2 (ja) * 2000-09-27 2006-10-25 信越化学工業株式会社 高分子化合物、レジスト材料及びパターン形成方法
JP2003207896A (ja) * 2002-01-16 2003-07-25 Fuji Photo Film Co Ltd ポジ型レジスト組成物
KR100539225B1 (ko) * 2002-06-20 2005-12-27 삼성전자주식회사 히드록시기로 치환된 베이스 폴리머와 에폭시 링을포함하는 실리콘 함유 가교제로 이루어지는 네가티브형레지스트 조성물 및 이를 이용한 반도체 소자의 패턴 형성방법
DE10233849B4 (de) * 2002-07-22 2005-07-21 Infineon Technologies Ag Polymerisierbare Zusammensetzung, Polymer, Resist und Lithographieverfahren
KR100989150B1 (ko) 2008-08-18 2010-10-22 한양대학교 산학협력단 광산발생기를 포함하는 레지스트용 공중합체 및 그 제조 방법

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4820607A (en) * 1985-08-19 1989-04-11 Fuji Photo Film Co., Ltd. Photosolubilizable composition
EP0645679A1 (en) * 1993-09-24 1995-03-29 Fujitsu Limited Resist material and pattern forming process

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4780516A (en) * 1985-06-05 1988-10-25 Foley William M Jun Silylmethylene methacrylate contact lens and polymer
DE69019103T2 (de) * 1989-10-31 1995-10-12 Nippon Oils & Fats Co Ltd Kontaktlinse.

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4820607A (en) * 1985-08-19 1989-04-11 Fuji Photo Film Co., Ltd. Photosolubilizable composition
EP0645679A1 (en) * 1993-09-24 1995-03-29 Fujitsu Limited Resist material and pattern forming process

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
YOUNG-JONG KANG ET AL.: "Chemically Amplified Silicon Containing Resist for ArF Excimer Laser Lithography", JOURNAL OF PHOTOPOLYMER SCIENCE AND TECHNOLOGY, vol. 10, no. 4, 24 June 1997 (1997-06-24), HIRATSUKASHI,JP, pages 585 - 588, XP002047269 *

Also Published As

Publication number Publication date
JP3618538B2 (ja) 2005-02-09
US5998557A (en) 1999-12-07
DE19735059A1 (de) 1998-10-15
KR100230417B1 (ko) 1999-11-15
KR19980076497A (ko) 1998-11-16
JPH10282678A (ja) 1998-10-23
FR2761999A1 (fr) 1998-10-16
FR2761999B1 (fr) 1999-07-02
US5981141A (en) 1999-11-09

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