MX337476B - Inspeccion con rayos x utilizando detectores de escintilacion acoplados con fibras de desplazamiento de longitud de onda. - Google Patents

Inspeccion con rayos x utilizando detectores de escintilacion acoplados con fibras de desplazamiento de longitud de onda.

Info

Publication number
MX337476B
MX337476B MX2014009790A MX2014009790A MX337476B MX 337476 B MX337476 B MX 337476B MX 2014009790 A MX2014009790 A MX 2014009790A MX 2014009790 A MX2014009790 A MX 2014009790A MX 337476 B MX337476 B MX 337476B
Authority
MX
Mexico
Prior art keywords
wavelength
detectors
photo
energy
ray inspection
Prior art date
Application number
MX2014009790A
Other languages
English (en)
Other versions
MX2014009790A (es
Inventor
Lee Grodzins
Peter Rothschild
Dan-Cristian Dinca
Anatoli Arodzero
Joseph Callerame
Rajen Sud
Martin Rommel
Jeffrey Schubert
Original Assignee
American Science & Eng Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Science & Eng Inc filed Critical American Science & Eng Inc
Publication of MX2014009790A publication Critical patent/MX2014009790A/es
Publication of MX337476B publication Critical patent/MX337476B/es

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01V5/22—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2008—Measuring radiation intensity with scintillation detectors using a combination of different types of scintillation detectors, e.g. phoswich
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2006—Measuring radiation intensity with scintillation detectors using a combination of a scintillator and photodetector which measures the means radiation intensity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/201—Measuring radiation intensity with scintillation detectors using scintillating fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20181—Stacked detectors, e.g. for measuring energy and positional information
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20185—Coupling means between the photodiode and the scintillator, e.g. optical couplings using adhesives with wavelength-shifting fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T3/00—Measuring neutron radiation
    • G01T3/06—Measuring neutron radiation with scintillation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T5/00—Recording of movements or tracks of particles; Processing or analysis of such tracks
    • G01T5/08—Scintillation chambers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H01L27/14658—X-ray, gamma-ray or corpuscular radiation imagers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00—Details of radiation-measuring instruments
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers

Abstract

Un detector y métodos para inspeccionar material sobre la base del escintilador acoplado por medio de una fibra óptica de desplazamiento de longitud de onda a uno o más foto-detectores, con una integración temporal de la señal del foto-detector; un volumen no pixelado del medio de escintilación convierte la energía de radiación penetrante incidente en luz de escintilación que se extrae de una región de extracción de luz de escintilación por medio de una pluralidad de guías de onda ópticas; esta geometría proporciona detectores eficientes y compactos que permiten hasta el momento, geometrías no asequibles para la detección de dispersión de retorno y para la discriminación de energía de radiación incidente; se permiten configuraciones de transmisión de resolución de energía adicionales, como son compensación asimétrica y de desajuste.
MX2014009790A 2012-02-14 2013-02-04 Inspeccion con rayos x utilizando detectores de escintilacion acoplados con fibras de desplazamiento de longitud de onda. MX337476B (es)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US201261598521P 2012-02-14 2012-02-14
US201261598576P 2012-02-14 2012-02-14
US201261607066P 2012-03-06 2012-03-06
PCT/US2013/024585 WO2013122763A1 (en) 2012-02-14 2013-02-04 X-ray inspection using wavelength-shifting fiber-coupled scintillation detectors

Publications (2)

Publication Number Publication Date
MX2014009790A MX2014009790A (es) 2014-09-12
MX337476B true MX337476B (es) 2016-03-04

Family

ID=48945537

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2014009790A MX337476B (es) 2012-02-14 2013-02-04 Inspeccion con rayos x utilizando detectores de escintilacion acoplados con fibras de desplazamiento de longitud de onda.

Country Status (18)

Country Link
US (4) US9285488B2 (es)
EP (1) EP2825904B1 (es)
JP (6) JP2015513075A (es)
KR (4) KR20200044997A (es)
CN (3) CN104204854B (es)
BR (1) BR112014019517B1 (es)
CA (2) CA2864354C (es)
CL (1) CL2014002144U1 (es)
DE (2) DE202013012103U1 (es)
ES (4) ES1153640Y (es)
GT (1) GT201400009U (es)
HK (3) HK1202633A1 (es)
IL (3) IL234076B (es)
MX (1) MX337476B (es)
PE (1) PE20150237Z (es)
PL (2) PL125720U1 (es)
RU (1) RU2606698C2 (es)
WO (1) WO2013122763A1 (es)

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