MX337476B - Inspeccion con rayos x utilizando detectores de escintilacion acoplados con fibras de desplazamiento de longitud de onda. - Google Patents

Inspeccion con rayos x utilizando detectores de escintilacion acoplados con fibras de desplazamiento de longitud de onda.

Info

Publication number
MX337476B
MX337476B MX2014009790A MX2014009790A MX337476B MX 337476 B MX337476 B MX 337476B MX 2014009790 A MX2014009790 A MX 2014009790A MX 2014009790 A MX2014009790 A MX 2014009790A MX 337476 B MX337476 B MX 337476B
Authority
MX
Mexico
Prior art keywords
wavelength
detectors
photo
energy
ray inspection
Prior art date
Application number
MX2014009790A
Other languages
English (en)
Other versions
MX2014009790A (es
Inventor
Lee Grodzins
Peter Rothschild
Dan-Cristian Dinca
Anatoli Arodzero
Joseph Callerame
Rajen Sud
Martin Rommel
Jeffrey Schubert
Original Assignee
American Science & Eng Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Science & Eng Inc filed Critical American Science & Eng Inc
Publication of MX2014009790A publication Critical patent/MX2014009790A/es
Publication of MX337476B publication Critical patent/MX337476B/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2008—Measuring radiation intensity with scintillation detectors using a combination of different types of scintillation detectors, e.g. phoswich
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2006—Measuring radiation intensity with scintillation detectors using a combination of a scintillator and photodetector which measures the means radiation intensity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/201—Measuring radiation intensity with scintillation detectors using scintillating fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20181—Stacked detectors, e.g. for measuring energy and positional information
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20185—Coupling means between the photodiode and the scintillator, e.g. optical couplings using adhesives with wavelength-shifting fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T3/00—Measuring neutron radiation
    • G01T3/06—Measuring neutron radiation with scintillation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T5/00—Recording of movements or tracks of particles; Processing or analysis of such tracks
    • G01T5/08—Scintillation chambers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H01L27/14658—X-ray, gamma-ray or corpuscular radiation imagers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00—Details of radiation-measuring instruments
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Molecular Biology (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Toxicology (AREA)
  • Geophysics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

Un detector y métodos para inspeccionar material sobre la base del escintilador acoplado por medio de una fibra óptica de desplazamiento de longitud de onda a uno o más foto-detectores, con una integración temporal de la señal del foto-detector; un volumen no pixelado del medio de escintilación convierte la energía de radiación penetrante incidente en luz de escintilación que se extrae de una región de extracción de luz de escintilación por medio de una pluralidad de guías de onda ópticas; esta geometría proporciona detectores eficientes y compactos que permiten hasta el momento, geometrías no asequibles para la detección de dispersión de retorno y para la discriminación de energía de radiación incidente; se permiten configuraciones de transmisión de resolución de energía adicionales, como son compensación asimétrica y de desajuste.
MX2014009790A 2012-02-14 2013-02-04 Inspeccion con rayos x utilizando detectores de escintilacion acoplados con fibras de desplazamiento de longitud de onda. MX337476B (es)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US201261598521P 2012-02-14 2012-02-14
US201261598576P 2012-02-14 2012-02-14
US201261607066P 2012-03-06 2012-03-06
PCT/US2013/024585 WO2013122763A1 (en) 2012-02-14 2013-02-04 X-ray inspection using wavelength-shifting fiber-coupled scintillation detectors

Publications (2)

Publication Number Publication Date
MX2014009790A MX2014009790A (es) 2014-09-12
MX337476B true MX337476B (es) 2016-03-04

Family

ID=48945537

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2014009790A MX337476B (es) 2012-02-14 2013-02-04 Inspeccion con rayos x utilizando detectores de escintilacion acoplados con fibras de desplazamiento de longitud de onda.

Country Status (18)

Country Link
US (4) US9285488B2 (es)
EP (1) EP2825904B1 (es)
JP (6) JP2015513075A (es)
KR (4) KR20200044997A (es)
CN (4) CN107193034A (es)
BR (1) BR112014019517B1 (es)
CA (2) CA2864354C (es)
CL (1) CL2014002144U1 (es)
DE (2) DE202013012100U1 (es)
ES (4) ES1153640Y (es)
GT (1) GT201400009U (es)
HK (3) HK1202633A1 (es)
IL (3) IL234076B (es)
MX (1) MX337476B (es)
PE (1) PE20150237Z (es)
PL (2) PL125062U1 (es)
RU (1) RU2606698C2 (es)
WO (1) WO2013122763A1 (es)

Families Citing this family (68)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9958569B2 (en) 2002-07-23 2018-05-01 Rapiscan Systems, Inc. Mobile imaging system and method for detection of contraband
US10532228B2 (en) * 2010-04-16 2020-01-14 Maureen Petterson Multi-color charged particle detector apparatus and method of use thereof
US10898732B2 (en) * 2010-04-16 2021-01-26 Maureen Petterson Multi-color charged particle detector apparatus and method of use thereof
WO2011163108A2 (en) * 2010-06-21 2011-12-29 American Science And Engineering, Inc. Detector with active collimators
EP3252506B1 (en) 2011-02-08 2020-11-18 Rapiscan Systems, Inc. Covert surveillance using multi-modality sensing
US10670740B2 (en) 2012-02-14 2020-06-02 American Science And Engineering, Inc. Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors
CN107193034A (zh) * 2012-02-14 2017-09-22 美国科技工程公司 使用波长偏移光纤耦合闪烁检测器进行x 射线检查
WO2020145999A1 (en) 2019-01-08 2020-07-16 American Science And Engineering, Inc. Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors
US9182361B2 (en) 2013-05-28 2015-11-10 Ann Arbor Digital Devices Inc. Digital X-ray imaging system with still and video capture modes
RO130582B1 (ro) * 2014-01-23 2021-12-30 Mb Telecom Ltd. S.R.L. Sistem şi metodă pentru inspecţia completă şi neintruzivă a aeronavelor
US20150241578A1 (en) * 2014-02-27 2015-08-27 Saint-Gobain Ceramics & Plastics, Inc. Scintillator stack, device including the scintillator stack, and method for making the scintillator stack
WO2015131124A1 (en) * 2014-02-27 2015-09-03 Saint-Gobain Ceramics & Plastics, Inc. Scintillator stack, device including the scintillator stack, and method for making the scintillator stack
US11266006B2 (en) 2014-05-16 2022-03-01 American Science And Engineering, Inc. Method and system for timing the injections of electron beams in a multi-energy x-ray cargo inspection system
WO2015175751A1 (en) 2014-05-16 2015-11-19 American Science And Engineering, Inc. Source for intra-pulse multi-energy x-ray cargo inspection
US10459111B2 (en) * 2014-05-23 2019-10-29 Radiabeam Technologies, Llc System and method for adaptive X-ray cargo inspection
CN104035123B (zh) * 2014-06-27 2017-02-15 中国电子科技集团公司第八研究所 一种基于闪烁体与光纤耦合的β表面污染探测装置及方法
US10228487B2 (en) 2014-06-30 2019-03-12 American Science And Engineering, Inc. Rapidly relocatable modular cargo container scanner
CN105425273A (zh) * 2014-09-17 2016-03-23 中国科学技术大学 一种用于测量高通量x射线能谱的吸收体阵列的装置及方法
CN107209282B (zh) 2014-11-20 2019-12-20 爱康公司 X射线扫描系统和方法
WO2016118271A1 (en) * 2015-01-20 2016-07-28 American Science And Engineering , Inc. Dynamically adjustable focal spot
DE102015101764A1 (de) * 2015-02-06 2016-08-11 Thermo Fisher Scientific Messtechnik Gmbh Vorrichtung und Verfahren zur Detektion von radioaktiver Strahlung
GB2553942A (en) 2015-03-04 2018-03-21 Rapiscan Systems Inc Multiple energy detector
CN107615052A (zh) 2015-03-20 2018-01-19 拉皮斯坎系统股份有限公司 手持式便携反向散射检查系统
US9753151B2 (en) 2015-07-31 2017-09-05 General Electric Company Light guide array for pet detector fabrication methods and apparatus
US10656304B2 (en) 2015-09-10 2020-05-19 American Science And Engineering, Inc. Backscatter characterization using interlinearly adaptive electromagnetic X-ray scanning
GB2557067B (en) 2015-09-15 2021-08-18 Halliburton Energy Services Inc Downhole photon radiation detection using scintillating fibers
WO2017083073A1 (en) * 2015-11-09 2017-05-18 American Science And Engineering, Inc. Mobile x-ray scan speed control
CN105807328B (zh) * 2016-04-29 2019-03-08 同方威视技术股份有限公司 基于背散射成像的检测系统和方法
CN109416316A (zh) * 2016-06-21 2019-03-01 深圳源光科技有限公司 生物感测器
GB2552537B (en) * 2016-07-28 2020-05-27 Smiths Heimann Sas Inspection system with source of radiation and method
WO2018036265A1 (zh) * 2016-08-25 2018-03-01 北京华力兴科技发展有限责任公司 一种用于车辆安全检查的成像装置及其方法
CN106290427A (zh) * 2016-10-17 2017-01-04 北京君和信达科技有限公司 背散射成像方法及系统
CN106483153A (zh) * 2016-12-23 2017-03-08 同方威视技术股份有限公司 双能探测器及辐射检查系统
CN106526688A (zh) * 2016-12-28 2017-03-22 同方威视技术股份有限公司 背散射检查车
US10393680B2 (en) * 2017-01-18 2019-08-27 The Boeing Company X-ray sidescatter inspection of laminates
CN110199373B (zh) 2017-01-31 2021-09-28 拉皮斯坎系统股份有限公司 大功率x射线源与操作方法
US10522720B2 (en) 2017-02-25 2019-12-31 Anatoly Glass, Llc Converter plate for producing polychromatic light
US10770195B2 (en) 2017-04-05 2020-09-08 Viken Detection Corporation X-ray chopper wheel assembly
DE102017108535A1 (de) * 2017-04-21 2018-10-25 Grünbeck Wasseraufbereitung GmbH Membranmodul sowie Vorrichtung und Verfahren zur Detektion von Ablagerungen in einem Membranmodul
US20180321418A1 (en) * 2017-05-08 2018-11-08 Saint-Gobain Ceramics & Plastics, Inc. Article including a body including a fluorescent material and a wavelength shifting fiber, a radiation detector including the article, and a method of using the same
JP2018141767A (ja) * 2017-07-13 2018-09-13 三菱電機プラントエンジニアリング株式会社 タイヤハウス汚染検査装置およびタイヤハウス汚染自動検査方法
CN108008458B (zh) * 2017-12-29 2020-09-08 同方威视技术股份有限公司 车载背散射检查系统
CN108227027B (zh) * 2017-12-29 2020-12-01 同方威视技术股份有限公司 车载背散射检查系统
US10114131B1 (en) 2018-01-05 2018-10-30 Consolidated Nuclear Security, LLC Scintillator based fiber optic plate for neutron imaging applications and the like
US10794843B2 (en) * 2018-02-02 2020-10-06 Viken Detection Corporation System and kit for x-ray backscatter imaging with removable detector
WO2019245636A1 (en) 2018-06-20 2019-12-26 American Science And Engineering, Inc. Wavelength-shifting sheet-coupled scintillation detectors
IL260956B (en) * 2018-08-02 2022-01-01 Applied Materials Israel Ltd Electron detection sensor
DE102018220135A1 (de) * 2018-11-23 2020-05-28 Siemens Healthcare Gmbh Röntgendetektor, Bildgebungsvorrichtung und Verfahren zum Betrieb eines Röntgendetektors
CN109444182B (zh) * 2018-12-22 2024-07-23 苏州瑞派宁科技有限公司 一种闪烁晶体测试装置
US11112370B2 (en) * 2019-01-04 2021-09-07 The Boeing Company Reconfigurable backscatter detector
CN109828300B (zh) * 2019-01-31 2023-05-05 兰州空间技术物理研究所 一种小型化全向空间粒子探测器
CN109655874B (zh) * 2019-02-25 2020-04-10 衡阳师范学院 闪烁室测氡装置和方法
US10830714B1 (en) * 2019-07-26 2020-11-10 The Boeing Company Portable X-ray backscattering system
JP2022542383A (ja) * 2019-07-29 2022-10-03 サン－ゴバン セラミックス アンド プラスティクス，インコーポレイティド プラスチック波長シフトファイバおよびその作製方法
WO2021085401A1 (ja) * 2019-10-31 2021-05-06 株式会社クラレ プラスチックシンチレーションファイバ及びその製造方法
CN110988964B (zh) * 2019-12-09 2022-11-22 上海大学 复合型光纤辐射探测器
RU2730392C1 (ru) * 2020-01-14 2020-08-21 Российская Федерация, от имени которой выступает Государственная корпорация по атомной энергии "Росатом" (Госкорпорация "Росатом") Сцинтилляционный детектор нейтронов
US11193898B1 (en) 2020-06-01 2021-12-07 American Science And Engineering, Inc. Systems and methods for controlling image contrast in an X-ray system
CN115698774A (zh) 2020-06-02 2023-02-03 维肯检测公司 X射线成像设备和方法
US11175245B1 (en) 2020-06-15 2021-11-16 American Science And Engineering, Inc. Scatter X-ray imaging with adaptive scanning beam intensity
EP3933881A1 (en) 2020-06-30 2022-01-05 VEC Imaging GmbH & Co. KG X-ray source with multiple grids
JPWO2022059298A1 (es) * 2020-09-16 2022-03-24
CN116324514A (zh) * 2020-10-15 2023-06-23 株式会社可乐丽 塑料闪烁光纤及其制造方法
US11340361B1 (en) 2020-11-23 2022-05-24 American Science And Engineering, Inc. Wireless transmission detector panel for an X-ray scanner
US20220357289A1 (en) * 2021-05-05 2022-11-10 Varex Imaging Corporation Backscatter imaging system
EP4105691A1 (en) 2021-06-16 2022-12-21 Soletanche Freyssinet Gamma and neutron radiation detector
US12019035B2 (en) 2021-07-16 2024-06-25 Rapiscan Holdings, Inc. Material detection in x-ray security screening
CN114180291B (zh) * 2021-11-10 2022-08-05 深圳市日联科技有限公司 叠片电池视觉纠偏装置及纠偏方法

Family Cites Families (152)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4045672A (en) 1975-09-11 1977-08-30 Nihon Denshi Kabushiki Kaisha Apparatus for tomography comprising a pin hole for forming a microbeam of x-rays
US4242583A (en) 1978-04-26 1980-12-30 American Science And Engineering, Inc. X-ray imaging variable resolution
US4259582A (en) * 1979-11-02 1981-03-31 Albert Richard D Plural image signal system for scanning x-ray apparatus
JPS60159675A (ja) * 1984-01-31 1985-08-21 Shimadzu Corp 放射線検出器
US4788436A (en) 1986-12-24 1988-11-29 Walter Koechner Radiation sensitive optical fiber and detector
DE3841136A1 (de) * 1988-12-07 1990-06-13 Hoechst Ag Strahlungsdetektor
US5281820A (en) * 1988-07-12 1994-01-25 Hoechst Aktiengesellschaft Radiation detector
JPH03257391A (ja) * 1990-03-08 1991-11-15 Mitsubishi Atom Power Ind Inc Ｘ線照射分布計測装置
US5784507A (en) * 1991-04-05 1998-07-21 Holm-Kennedy; James W. Integrated optical wavelength discrimination devices and methods for fabricating same
EP0533316B1 (en) 1991-06-21 1995-10-25 Kabushiki Kaisha Toshiba X-ray detector and examination system
JPH0627249A (ja) * 1992-07-13 1994-02-04 Toshiba Corp 放射線検査装置
US5420959A (en) 1992-12-17 1995-05-30 Nanoptics Incorporated High efficiency, high resolution, real-time radiographic imaging system
JP3496958B2 (ja) * 1993-09-01 2004-02-16 富士写真フイルム株式会社 放射線検出器、画像読出処理条件決定方法および照射野認識方法
JPH07211877A (ja) * 1994-01-21 1995-08-11 Hamamatsu Photonics Kk 放射線像検出器及び放射線像検出装置
FR2716012B1 (fr) * 1994-02-09 1996-04-12 Corning Inc Procédé et dispositif d'assemblage d'extrémités de fibres optiques disposées en nappe.
US5600144A (en) 1994-05-10 1997-02-04 Trustees Of Boston University Three dimensional imaging detector employing wavelength-shifting optical fibers
FR2725722B1 (fr) * 1994-10-14 1997-01-03 Atochem Elf Sa Copolymere fluore a tenue thermique amelioree, son procede de preparation et son utilisation comme revetement protecteur de substrats
CN1161103A (zh) * 1995-06-27 1997-10-01 菲利浦电子有限公司 X射线检测器
GB2303938A (en) * 1995-07-31 1997-03-05 Stc Submarine Systems Ltd Optical fibre cable having kingwire bearing extruded thermoplastic elastomer layers
US5764683B1 (en) * 1996-02-12 2000-11-21 American Science & Eng Inc Mobile x-ray inspection system for large objects
JP3813656B2 (ja) * 1996-03-07 2006-08-23 株式会社東芝 光ファイバ型大面積放射線モニタ
DE19610538A1 (de) * 1996-03-18 1997-09-25 Deutsches Krebsforsch Strahlungsermittlungsvorrichtung
JPH10232284A (ja) * 1997-02-19 1998-09-02 Toshiba Corp 波長シフト型放射線センサおよび放射線検出装置
JPH10288671A (ja) * 1997-04-15 1998-10-27 Toshiba Corp 位置検出型放射線検出装置
US6078052A (en) 1997-08-29 2000-06-20 Picker International, Inc. Scintillation detector with wavelength-shifting optical fibers
EP1012586A2 (en) 1997-09-09 2000-06-28 American Science & Engineering, Inc. A tomographic inspection system
US5968425A (en) * 1997-10-28 1999-10-19 The United States Of America As Represented By The United States Department Of Energy Methods for the continuous production of plastic scintillator materials
WO1999039189A2 (en) 1998-01-28 1999-08-05 American Science And Engineering, Inc. Gated transmission and scatter detection for x-ray imaging
JPH11271453A (ja) * 1998-03-25 1999-10-08 Toshiba Corp 放射線弁別測定方法および放射線弁別測定装置
JP2923500B1 (ja) * 1998-06-04 1999-07-26 株式会社東芝 放射線検出器および放射線計測システム、並びに放射線計測プログラムを記録したコンピュータ読み取り可能な記録媒体
US6442233B1 (en) 1998-06-18 2002-08-27 American Science And Engineering, Inc. Coherent x-ray scatter inspection system with sidescatter and energy-resolved detection
US6621888B2 (en) 1998-06-18 2003-09-16 American Science And Engineering, Inc. X-ray inspection by coherent-scattering from variably disposed scatterers identified as suspect objects
WO2000004403A1 (fr) * 1998-07-15 2000-01-27 Keiichi Kuroda Unite d'imagerie a rayonnement numerique
US6453007B2 (en) 1998-11-30 2002-09-17 American Science And Engineering, Inc. X-ray inspection using co-planar pencil and fan beams
US6320933B1 (en) 1998-11-30 2001-11-20 American Science And Engineering, Inc. Multiple scatter system for threat identification
EP1135700B1 (en) 1998-11-30 2005-03-02 American Science & Engineering, Inc. Fan and pencil beams from a common source for x-ray inspection
US6249567B1 (en) * 1998-12-01 2001-06-19 American Science & Engineering, Inc. X-ray back scatter imaging system for undercarriage inspection
US6421420B1 (en) 1998-12-01 2002-07-16 American Science & Engineering, Inc. Method and apparatus for generating sequential beams of penetrating radiation
EP1147406A1 (en) 1998-12-22 2001-10-24 American Science & Engineering, Inc. Unilateral hand-held x-ray inspection apparatus
US6459764B1 (en) * 1999-01-27 2002-10-01 American Science And Engineering, Inc. Drive-through vehicle inspection system
JP2000235078A (ja) * 1999-02-15 2000-08-29 Toshiba Corp 放射線検出用構造体と、それを用いた放射線検出器および放射線検査装置
JP2000304865A (ja) * 1999-04-23 2000-11-02 Hitachi Ltd 光伝送式放射線計測装置及びその計測システム
US6391434B1 (en) * 1999-05-06 2002-05-21 General Electric Company Composite scintillator material and method of manufacture
JP4313895B2 (ja) * 1999-06-04 2009-08-12 株式会社東芝 放射線検出装置
JP2001013254A (ja) 1999-06-29 2001-01-19 Mitsubishi Heavy Ind Ltd 平板状中性子線検出器及びこれを用いた中性子源計測装置
JP2001013250A (ja) 1999-06-30 2001-01-19 Toshiba Corp 汚染検査装置
US6546072B1 (en) 1999-07-30 2003-04-08 American Science And Engineering, Inc. Transmission enhanced scatter imaging
US6459761B1 (en) 2000-02-10 2002-10-01 American Science And Engineering, Inc. Spectrally shaped x-ray inspection system
US7010094B2 (en) * 2000-02-10 2006-03-07 American Science And Engineering, Inc. X-ray inspection using spatially and spectrally tailored beams
JP4351780B2 (ja) * 2000-02-15 2009-10-28 株式会社東芝 放射線検出装置
US6671451B1 (en) 2000-03-10 2003-12-30 Wired Japan Co., Ltd. Optical fiber, optical fiber cable, and radiation detecting system using such
US8325871B2 (en) 2000-03-28 2012-12-04 American Science And Engineering, Inc. Radiation threat detection
US6576907B1 (en) * 2000-06-01 2003-06-10 Elgems Ltd. High count rate gamma camera system
JP2002071816A (ja) * 2000-08-29 2002-03-12 Japan Atom Energy Res Inst ２次元放射線および中性子イメージ検出器
US6907281B2 (en) * 2000-09-07 2005-06-14 Ge Medical Systems Fast mapping of volumetric density data onto a two-dimensional screen
JP4552020B2 (ja) * 2001-01-29 2010-09-29 独立行政法人 日本原子力研究開発機構 放射線および中性子イメージ検出器
EP1428048A2 (en) 2001-05-03 2004-06-16 American Science & Engineering, Inc. Nautical x-ray inspection system
JP4203710B2 (ja) * 2001-12-28 2009-01-07 株式会社日立メディコ Ｘ線画像処理装置
US6542580B1 (en) * 2002-01-15 2003-04-01 Rapiscan Security Products (Usa), Inc. Relocatable X-ray imaging system and method for inspecting vehicles and containers
US7122804B2 (en) * 2002-02-15 2006-10-17 Varian Medical Systems Technologies, Inc. X-ray imaging device
US20040256565A1 (en) * 2002-11-06 2004-12-23 William Adams X-ray backscatter mobile inspection van
US7369643B2 (en) * 2002-07-23 2008-05-06 Rapiscan Security Products, Inc. Single boom cargo scanning system
US8275091B2 (en) 2002-07-23 2012-09-25 Rapiscan Systems, Inc. Compact mobile cargo scanning system
US9958569B2 (en) 2002-07-23 2018-05-01 Rapiscan Systems, Inc. Mobile imaging system and method for detection of contraband
US8503605B2 (en) 2002-07-23 2013-08-06 Rapiscan Systems, Inc. Four sided imaging system and method for detection of contraband
US6853707B2 (en) * 2002-09-05 2005-02-08 Agilent Technologies, Inc. Shielded x-ray detector
US7099434B2 (en) * 2002-11-06 2006-08-29 American Science And Engineering, Inc. X-ray backscatter mobile inspection van
US7505556B2 (en) 2002-11-06 2009-03-17 American Science And Engineering, Inc. X-ray backscatter detection imaging modules
US20090257555A1 (en) 2002-11-06 2009-10-15 American Science And Engineering, Inc. X-Ray Inspection Trailer
US7551715B2 (en) 2005-10-24 2009-06-23 American Science And Engineering, Inc. X-ray inspection based on scatter detection
US6909098B2 (en) * 2002-12-03 2005-06-21 Universities Research Association Inc. Systems and methods for detecting nuclear radiation in the presence of backgrounds
US6927397B2 (en) * 2002-12-03 2005-08-09 Universities Research Association, Inc. Systems and methods for detecting neutrons
US7067079B2 (en) 2002-12-03 2006-06-27 Universities Research Association, Inc. Extruded plastic scintillator including inorganic powders
US7149393B2 (en) * 2002-12-09 2006-12-12 Eastman Kodak Company Apparatus and method for forming a fiber optic faceplate
ES2286480T3 (es) * 2002-12-10 2007-12-01 Commonwealth Scientific And Industrial Research Organisation Equipo radiografico.
US6965662B2 (en) 2002-12-17 2005-11-15 Agilent Technologies, Inc. Nonplanar x-ray target anode for use in a laminography imaging system
US20040140431A1 (en) * 2003-01-21 2004-07-22 Cti Pet Systems, Inc. Multi-application highly reflective grid array
US20050058242A1 (en) 2003-09-15 2005-03-17 Peschmann Kristian R. Methods and systems for the rapid detection of concealed objects
US7054408B2 (en) * 2003-04-30 2006-05-30 General Electric Company CT detector array having non pixelated scintillator array
US7856081B2 (en) 2003-09-15 2010-12-21 Rapiscan Systems, Inc. Methods and systems for rapid detection of concealed objects using fluorescence
US7366282B2 (en) 2003-09-15 2008-04-29 Rapiscan Security Products, Inc. Methods and systems for rapid detection of concealed objects using fluorescence
JP4406699B2 (ja) * 2003-08-29 2010-02-03 独立行政法人 日本原子力研究開発機構 光ファイバを利用した放射線及び中性子検出器
JP2005214869A (ja) 2004-01-30 2005-08-11 Toshiba Corp 当量線量型放射線検出器
US7115875B1 (en) 2004-02-17 2006-10-03 Photodetection Systems, Inc. PET scanner with photodetectors and wavelength shifting fibers
JP4689663B2 (ja) 2004-04-09 2011-05-25 アメリカン サイエンス アンド エンジニアリング，インコーポレイテッド 一度に１つのみの供給源が放射線を発光することを確実にすることによって、複数の供給源を備える門形の後方散乱検査器におけるクロストークを排除すること
WO2005103759A1 (en) 2004-04-20 2005-11-03 Forimtech Sa Large area radiation imaging detector
US7141799B1 (en) * 2005-03-30 2006-11-28 Ut-Battelle, Llc Fiber optic thermal/fast neutron and gamma ray scintillation detector
US7471764B2 (en) 2005-04-15 2008-12-30 Rapiscan Security Products, Inc. X-ray imaging system having improved weather resistance
DE102005017557B4 (de) * 2005-04-16 2010-11-04 Mirion Technologies (Rados) Gmbh Leichtgewichtiger Flächendetektor für Teilchenstrahlung kontaminierter Objekte
US7335891B2 (en) * 2005-06-27 2008-02-26 General Electric Company Gamma and neutron radiation detector
KR100773993B1 (ko) * 2006-03-10 2007-11-08 (주)케이디티 광여기 시트
WO2007109860A1 (en) * 2006-03-29 2007-10-04 Australian Nuclear Science & Technology Organisation Measurement of hydraulic conductivity using a radioactive or activatable tracer
JP2009534669A (ja) 2006-04-21 2009-09-24 アメリカン サイエンス アンド エンジニアリング，インコーポレイテッド 離散供給源のアレイおよび複数の平行ビームを用いた荷物および人間のｘ線画像化
JP4455534B2 (ja) * 2006-05-09 2010-04-21 株式会社東芝 放射線検出器およびその製造方法
US8842808B2 (en) 2006-08-11 2014-09-23 American Science And Engineering, Inc. Scatter attenuation tomography using a monochromatic radiation source
SG165402A1 (en) 2006-08-11 2010-10-28 American Science & Eng Inc X-ray inspection with contemporaneous and proximal transmission and backscatter imaging
US7924979B2 (en) 2006-08-23 2011-04-12 American Science And Engineering, Inc. Scatter attenuation tomography
RU2428680C2 (ru) 2006-08-23 2011-09-10 Эмерикэн Сайэнс Энд Энджиниэринг, Инк. Способ определения характеристик объекта
CA2665872C (en) * 2006-10-24 2013-04-02 Thermo Niton Analyzers Llc Apparatus for inspecting objects using coded beam
GB0626055D0 (en) * 2006-12-29 2007-11-07 Bae Systems Plc Detection of ionising radiation
US7842908B2 (en) * 2007-08-14 2010-11-30 Raytheon Company Sensor for eye-safe and body-fixed semi-active laser guidance
RU2476863C2 (ru) * 2007-11-19 2013-02-27 Эмерикэн Сайэнс Энд Энджиниэринг, Инк. Устройство определения характеристик материала исследуемого объекта и способ досмотра объекта
US8314399B2 (en) * 2008-02-07 2012-11-20 General Electric Company Radiation detector with optical waveguide and neutron scintillating material
GB0803640D0 (en) 2008-02-28 2008-04-02 Rapiscan Security Products Inc Scanning systems
US8598534B2 (en) * 2008-03-13 2013-12-03 Koninklijke Philips N.V. Low-power TDC-ADC and anger logic in radiation detection applications
US20090230925A1 (en) 2008-03-14 2009-09-17 Nathan Nathan Power Saver
US8017906B2 (en) * 2008-04-08 2011-09-13 Robert Sigurd Nelson Slit and slot scan, SAR, and compton devices and systems for radiation imaging
GB0809107D0 (en) 2008-05-20 2008-06-25 Rapiscan Security Products Inc Scannign systems
GB0810638D0 (en) 2008-06-11 2008-07-16 Rapiscan Security Products Inc Photomultiplier and detection systems
US8842809B2 (en) * 2008-07-07 2014-09-23 University Of Florida Research Foundation, Inc. Method and apparatus for X-ray radiographic imaging
JP2008304947A (ja) * 2008-09-11 2008-12-18 Sumitomo Bakelite Co Ltd 光導波路および光導波路構造体
CN101710182A (zh) * 2008-09-19 2010-05-19 圣戈本陶瓷及塑料股份有限公司 形成闪烁设备的方法
US7795650B2 (en) * 2008-12-09 2010-09-14 Teledyne Scientific & Imaging Llc Method and apparatus for backside illuminated image sensors using capacitively coupled readout integrated circuits
WO2010129926A1 (en) 2009-05-07 2010-11-11 The Regents Of The University Of California Novel lanthanide doped barium mixed halide scintillators
US8275092B1 (en) 2009-06-15 2012-09-25 American Science And Engineering, Inc. Three-dimensional mapping based on scattered penetrating radiation
US8824632B2 (en) * 2009-07-29 2014-09-02 American Science And Engineering, Inc. Backscatter X-ray inspection van with top-down imaging
EP2459991B1 (en) 2009-07-29 2019-09-11 American Science & Engineering, Inc. Top-down x-ray inspection trailer
CN102576085A (zh) * 2009-10-07 2012-07-11 圣戈本陶瓷及塑料股份有限公司 检测目标辐射的系统和方法
PL2494340T3 (pl) * 2009-10-29 2020-11-02 Rapiscan Systems, Inc. Mobilny system kontroli statku powietrznego
GB2488079B (en) 2009-12-03 2015-05-27 Rapiscan Systems Inc Time of flight backscatter imaging system
US8199875B2 (en) * 2009-12-11 2012-06-12 General Electric Company System and method of acquiring multi-energy CT imaging data
JP5548892B2 (ja) * 2010-01-08 2014-07-16 独立行政法人日本原子力研究開発機構 ピクセル型二次元イメージ検出器
JP2011158291A (ja) * 2010-01-29 2011-08-18 Hamamatsu Photonics Kk 放射線像変換パネル
CN201754188U (zh) * 2010-02-03 2011-03-02 中国原子能科学研究院 塑料闪烁体探测器光电倍增管固定装置
EP2539697A4 (en) 2010-02-25 2017-05-10 Rapiscan Systems, Inc. A high-energy x-ray spectroscopy-based inspection system and methods to determine the atomic number of materials
BR112012021513A2 (pt) 2010-02-26 2016-07-05 Rapiscan Systems Inc sistema integrado de ponto de inspeção portátil
JP2011227044A (ja) * 2010-03-30 2011-11-10 Fujifilm Corp 放射線撮影装置
JP2010181412A (ja) * 2010-03-15 2010-08-19 Toshiba Corp 放射線弁別測定方法および放射線弁別測定装置
JP5376528B2 (ja) * 2010-05-06 2013-12-25 独立行政法人日本原子力研究開発機構 放射線および中性子イメージ検出器
WO2011159911A2 (en) 2010-06-18 2011-12-22 Saint-Gobain Ceramics & Plastics, Inc. Radiation detection system including a scintillating material and an optical fiber and method of using the same
WO2011163108A2 (en) * 2010-06-21 2011-12-29 American Science And Engineering, Inc. Detector with active collimators
GB2482024A (en) * 2010-07-16 2012-01-18 Symetrica Ltd Radiation Detector
US8592775B2 (en) * 2010-10-27 2013-11-26 Partec, Ltd. Radiation detector having a ribbed scintillator
US8796636B2 (en) * 2010-09-13 2014-08-05 Parttec, Ltd. Neutron detector having enhanced absorption and bifurcated detection elements
US8908831B2 (en) 2011-02-08 2014-12-09 Rapiscan Systems, Inc. Covert surveillance using multi-modality sensing
BR112013019697A2 (pt) 2011-02-08 2018-07-17 American Science And Engineering, Inc. análise de energia de retrodispersão para classificação de materiais com base em não comutatividade posicional
EP3252506B1 (en) 2011-02-08 2020-11-18 Rapiscan Systems, Inc. Covert surveillance using multi-modality sensing
MY182655A (en) 2011-04-15 2021-01-28 American Science & Eng Inc Backscatter system with variable size of detector array
US9146201B2 (en) 2012-02-02 2015-09-29 American Science And Engineering, Inc. Convertible scan panel for x-ray inspection
EP2810296A4 (en) 2012-02-03 2015-12-30 Rapiscan Systems Inc COMBINED MULTIVUE IMAGING SYSTEM FOR DIFFUSION AND TRANSMISSION
CN107193034A (zh) 2012-02-14 2017-09-22 美国科技工程公司 使用波长偏移光纤耦合闪烁检测器进行x 射线检查
JP6114981B2 (ja) 2012-10-17 2017-04-19 株式会社リガク Ｘ線発生装置
KR102167245B1 (ko) 2013-01-31 2020-10-19 라피스캔 시스템스, 인코포레이티드 이동식 보안검사시스템
US9417060B1 (en) 2013-07-25 2016-08-16 American Science And Engineering, Inc. X-ray theodolite
US9535019B1 (en) 2013-10-04 2017-01-03 American Science And Engineering, Inc. Laterally-offset detectors for long-range x-ray backscatter imaging
JP6367969B2 (ja) * 2014-04-17 2018-08-01 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 高いアスペクト比を有することが可能である感光要素を有する放射線検出器
US10228487B2 (en) 2014-06-30 2019-03-12 American Science And Engineering, Inc. Rapidly relocatable modular cargo container scanner
CN104597479A (zh) * 2014-12-30 2015-05-06 中国原子能科学研究院 中子位置探测装置
KR20170127412A (ko) 2015-01-16 2017-11-21 라피스캔 시스템스, 인코포레이티드 관심대상이 되는 물질의 검출을 위한 비침습검사 시스템과 방법
US10656304B2 (en) 2015-09-10 2020-05-19 American Science And Engineering, Inc. Backscatter characterization using interlinearly adaptive electromagnetic X-ray scanning
US10720300B2 (en) 2016-09-30 2020-07-21 American Science And Engineering, Inc. X-ray source for 2D scanning beam imaging
CN207752159U (zh) * 2017-09-27 2018-08-21 清华大学 阵列式大面积总放探测装置

Also Published As

Publication number Publication date
JP7138751B2 (ja) 2022-09-16
BR112014019517A8 (pt) 2017-07-11
KR102105727B1 (ko) 2020-05-29
CL2014002144U1 (es) 2014-12-19
HK1203632A1 (en) 2015-10-30
IL259730A (en) 2018-07-31
RU2014133352A (ru) 2016-04-10
DE202013012103U1 (de) 2015-06-03
GT201400009U (es) 2015-07-08
ES1153640Y (es) 2016-07-08
KR20140123996A (ko) 2014-10-23
DE202013012100U1 (de) 2015-05-06
CA3080221A1 (en) 2013-08-22
CN104204854B (zh) 2017-05-10
CN107193034A (zh) 2017-09-22
ES1153636U (es) 2016-03-31
CN118501923A (zh) 2024-08-16
ES1153636Y (es) 2016-07-08
CN113302521B (zh) 2024-06-18
IL234076A0 (en) 2014-09-30
ES1154460U (es) 2016-04-13
US20170315242A1 (en) 2017-11-02
ES1154460Y (es) 2016-07-08
WO2013122763A1 (en) 2013-08-22
JP2020060590A (ja) 2020-04-16
IL259737B (en) 2021-09-30
JP2015513075A (ja) 2015-04-30
US20190383953A1 (en) 2019-12-19
JP6203367B2 (ja) 2017-09-27
KR20210021117A (ko) 2021-02-24
US9285488B2 (en) 2016-03-15
MX2014009790A (es) 2014-09-12
JP2021167846A (ja) 2021-10-21
CN104204854A (zh) 2014-12-10
IL234076B (en) 2018-06-28
JP6525477B2 (ja) 2019-06-05
ES2685971T3 (es) 2018-10-15
CA2864354A1 (en) 2013-08-22
BR112014019517B1 (pt) 2022-05-10
CA2864354C (en) 2023-02-28
KR102293638B1 (ko) 2021-08-24
US10209372B2 (en) 2019-02-19
PL125720U1 (pl) 2017-10-23
RU2606698C2 (ru) 2017-01-10
KR20200044998A (ko) 2020-04-29
PL125062U1 (pl) 2016-12-19
BR112014019517A2 (pt) 2021-05-04
PE20150237Z (es) 2015-02-12
US9658343B2 (en) 2017-05-23
EP2825904A1 (en) 2015-01-21
JP2018155764A (ja) 2018-10-04
KR102266814B1 (ko) 2021-06-17
JP2017040665A (ja) 2017-02-23
ES1153640U (es) 2016-03-31
EP2825904B1 (en) 2018-07-04
HK1244541A1 (zh) 2018-08-10
JP2018136343A (ja) 2018-08-30
EP2825904A4 (en) 2016-08-03
KR20200044997A (ko) 2020-04-29
US20160170044A1 (en) 2016-06-16
US20130208857A1 (en) 2013-08-15
HK1202633A1 (en) 2015-10-02
CN113302521A (zh) 2021-08-24
IL259737A (en) 2018-07-31

Similar Documents

Publication Publication Date Title
MX337476B (es) Inspeccion con rayos x utilizando detectores de escintilacion acoplados con fibras de desplazamiento de longitud de onda.
WO2013027069A3 (en) Apparatus and method for radiation detection
GB2498303A (en) Ruggedized high temperature compatible radiation detector
GB2535025A (en) Optical fiber sensing with enhanced backscattering
JP2015513075A5 (es)
WO2013026006A3 (en) Passive detectors for imaging systems
WO2012071326A3 (en) Gas sensing system employing raman scattering
WO2012016198A3 (en) Electron detector including an intimately-coupled scintillator-photomultiplier combination, and electron microscope and x-ray detector employing same
WO2013033572A3 (en) Material sorting technology
MY179786A (en) Particle detection system and related methods
MX2013011842A (es) Sistema de retrodispersion con tamaño variable de arreglo de detector.
GB2506060A (en) Apparatuses and methods for detection of radiation including neutrons and gamma rays
EP2402736A3 (en) Multiple wavelength cavity ring down gas sensor
WO2010141125A3 (en) High performance neutron detector with near zero gamma cross talk
GB201213374D0 (en) Gamma-ray spectrometry
WO2011163108A3 (en) Detector with active collimators
GB2481343A (en) Optical leak detector for subsea equipment
WO2012178042A3 (en) Detectors and systems and methods of using them in imaging and dosimetry
WO2012061724A3 (en) Optical sensor and sensing system for oxygen monitoring in fluids using molybdenum cluster phosphorescence
EP2645131A3 (en) Digital photomultiplier detector cell
MX363599B (es) Estabilizacion y calibracion de señales para la deteccion de neutrones.
WO2010017218A3 (en) Method and apparatus to discriminate out interference in radiation dosage measurements
FR2945402B1 (fr) Generateur de neutrons a tube scelle, equipe de detecteurs de particules alpha, et systeme de mesure a particule associee utilisant le generateur
MX2015011447A (es) Conjunto detector de tubo sin vacio de femtowatt.
SA515361274B1 (ar) الكشف عن النبض بالقياس عن بُعد عن معدل البيانات المرتفع باستخدام مقياس التداخل الخاص بسانياك

Legal Events

Date Code Title Description
FG Grant or registration