WO2008152802A1 - 共焦点顕微鏡装置 - Google Patents

共焦点顕微鏡装置 Download PDF

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Publication number
WO2008152802A1
WO2008152802A1 PCT/JP2008/001486 JP2008001486W WO2008152802A1 WO 2008152802 A1 WO2008152802 A1 WO 2008152802A1 JP 2008001486 W JP2008001486 W JP 2008001486W WO 2008152802 A1 WO2008152802 A1 WO 2008152802A1
Authority
WO
WIPO (PCT)
Prior art keywords
light
collecting
adjacent
sample
image
Prior art date
Application number
PCT/JP2008/001486
Other languages
English (en)
French (fr)
Inventor
Hisashi Okugawa
Original Assignee
Nikon Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corporation filed Critical Nikon Corporation
Priority to JP2009519160A priority Critical patent/JP4735758B2/ja
Publication of WO2008152802A1 publication Critical patent/WO2008152802A1/ja
Priority to US12/585,888 priority patent/US8254019B2/en

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers

Abstract

　本発明は、観察視野の全域又は全波長成分を一括して観察するのに適した画像を生成することを目的とする。そのために本発明の共焦点顕微鏡装置は、光源と、前記光源からの光を試料に集光する照明光学系と、前記試料からの光を集光する集光光学系と、前記集光光学系の集光位置に配置され、入射する光を少なくとも前記試料の前記集光点の近傍からの光と、その周辺からの光とに分離し、それぞれ検出する検出手段と、前記検出手段から出力される前記集光点の近傍からの光の信号（Ｉｓ）と、前記周辺からの光の信号（Ｉｍ）とを演算処理して前記試料の画像（Ｉｓ＋αＩｍ）を生成すると共に（Ｓ１５）、前記集光点の近傍からの光の信号と前記周辺からの光の信号との比率αを前記画像の領域毎にそれぞれ設定する画像生成手段（Ｓ１４）とを備える。
PCT/JP2008/001486 2007-06-13 2008-06-11 共焦点顕微鏡装置 WO2008152802A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2009519160A JP4735758B2 (ja) 2007-06-13 2008-06-11 共焦点顕微鏡装置
US12/585,888 US8254019B2 (en) 2007-06-13 2009-09-28 Confocal microscope apparatus

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007156665 2007-06-13
JP2007-156665 2007-06-13

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/585,888 Continuation US8254019B2 (en) 2007-06-13 2009-09-28 Confocal microscope apparatus

Publications (1)

Publication Number Publication Date
WO2008152802A1 true WO2008152802A1 (ja) 2008-12-18

Family

ID=40129416

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/001486 WO2008152802A1 (ja) 2007-06-13 2008-06-11 共焦点顕微鏡装置

Country Status (3)

Country Link
US (1) US8254019B2 (ja)
JP (1) JP4735758B2 (ja)
WO (1) WO2008152802A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015524555A (ja) * 2012-06-26 2015-08-24 ケーエルエー−テンカー コーポレイション 角度分解反射率測定における走査および回折の光計測からのアルゴリズム的除去

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4968337B2 (ja) * 2007-06-15 2012-07-04 株式会社ニコン 共焦点顕微鏡装置
JP2010102196A (ja) * 2008-10-24 2010-05-06 Olympus Corp 顕微鏡画像の自動調整方法、顕微鏡システム
EP2439576B1 (en) * 2009-06-02 2018-05-16 Nikon Corporation Image processing device, program and microscope
JP2023507587A (ja) * 2019-12-18 2023-02-24 ケムイメージ コーポレーション 組織検出の改善のためにイメージングモダリティを組み合わせるシステムおよび方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007010697A1 (ja) * 2005-07-21 2007-01-25 Nikon Corporation 共焦点顕微鏡装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4397993B2 (ja) * 1999-03-24 2010-01-13 オリンパス株式会社 顕微鏡写真撮影装置
US7197193B2 (en) * 2002-05-03 2007-03-27 Creatv Microtech, Inc. Apparatus and method for three dimensional image reconstruction
JP4677728B2 (ja) * 2004-03-22 2011-04-27 株式会社ニコン 共焦点顕微鏡及び共焦点顕微鏡システム
US7190514B2 (en) * 2004-08-12 2007-03-13 Yokogawa Electric Corporation Confocal scanning microscope
US7668342B2 (en) * 2005-09-09 2010-02-23 Carl Zeiss Meditec, Inc. Method of bioimage data processing for revealing more meaningful anatomic features of diseased tissues
JP4968337B2 (ja) * 2007-06-15 2012-07-04 株式会社ニコン 共焦点顕微鏡装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007010697A1 (ja) * 2005-07-21 2007-01-25 Nikon Corporation 共焦点顕微鏡装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015524555A (ja) * 2012-06-26 2015-08-24 ケーエルエー−テンカー コーポレイション 角度分解反射率測定における走査および回折の光計測からのアルゴリズム的除去
US9958385B2 (en) 2012-06-26 2018-05-01 Kla-Tencor Corporation Scanning in angle-resolved reflectometry and algorithmically eliminating diffraction from optical metrology
US10126238B2 (en) 2012-06-26 2018-11-13 Kla-Tencor Corporation Scanning in angle-resolved reflectometry and algorithmically eliminating diffraction from optical metrology
US10533940B2 (en) 2012-06-26 2020-01-14 Kla-Tencor Corporation Scanning in angle-resolved reflectometry and algorithmically eliminating diffraction from optical metrology

Also Published As

Publication number Publication date
US8254019B2 (en) 2012-08-28
JPWO2008152802A1 (ja) 2010-08-26
JP4735758B2 (ja) 2011-07-27
US20100053736A1 (en) 2010-03-04

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