WO2008099778A1 - スリット走査共焦点顕微鏡 - Google Patents

スリット走査共焦点顕微鏡 Download PDF

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Publication number
WO2008099778A1
WO2008099778A1 PCT/JP2008/052123 JP2008052123W WO2008099778A1 WO 2008099778 A1 WO2008099778 A1 WO 2008099778A1 JP 2008052123 W JP2008052123 W JP 2008052123W WO 2008099778 A1 WO2008099778 A1 WO 2008099778A1
Authority
WO
WIPO (PCT)
Prior art keywords
slit
light source
confocal microscope
scanning confocal
light
Prior art date
Application number
PCT/JP2008/052123
Other languages
English (en)
French (fr)
Inventor
Tomoko Ujike
Original Assignee
Nikon Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corporation filed Critical Nikon Corporation
Priority to EP08711002A priority Critical patent/EP2124085A4/en
Priority to JP2008558072A priority patent/JPWO2008099778A1/ja
Publication of WO2008099778A1 publication Critical patent/WO2008099778A1/ja
Priority to US12/541,858 priority patent/US20100202043A1/en

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes

Abstract

　スリット走査共焦点顕微鏡は、スリット状の光源１と、光源１の像を試料３の上に結像させる照明光学系２と、試料３からの反射光、透過光又は蛍光を、光源１と光学的に共役な位置に配置された１次元撮像素子５上に結像させる結像光学系４とを有する。スリット状の光源１は、１次元撮像素子５の画素と光学的に共役な大きさの単位光源に分割されている。
PCT/JP2008/052123 2007-02-14 2008-02-08 スリット走査共焦点顕微鏡 WO2008099778A1 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
EP08711002A EP2124085A4 (en) 2007-02-14 2008-02-08 CONFOCAL SLOTTED SCANNING MICROSCOPE
JP2008558072A JPWO2008099778A1 (ja) 2007-02-14 2008-02-08 スリット走査共焦点顕微鏡
US12/541,858 US20100202043A1 (en) 2007-02-14 2009-08-14 Slit-scanning confocal microscope

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007033397 2007-02-14
JP2007-033397 2007-02-14

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/541,858 Continuation US20100202043A1 (en) 2007-02-14 2009-08-14 Slit-scanning confocal microscope

Publications (1)

Publication Number Publication Date
WO2008099778A1 true WO2008099778A1 (ja) 2008-08-21

Family

ID=39690011

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/052123 WO2008099778A1 (ja) 2007-02-14 2008-02-08 スリット走査共焦点顕微鏡

Country Status (4)

Country Link
US (1) US20100202043A1 (ja)
EP (1) EP2124085A4 (ja)
JP (1) JPWO2008099778A1 (ja)
WO (1) WO2008099778A1 (ja)

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TWI414817B (zh) 2010-07-23 2013-11-11 Univ Nat Taipei Technology 線型彩色共焦顯微系統
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CN103210302B (zh) 2010-10-19 2015-05-27 奥林巴斯株式会社 观测单个发光粒子的偏振特性的光分析装置、光分析方法
EP2631631B1 (en) 2010-11-25 2016-01-20 Olympus Corporation Photometric analysis device and photometric analysis method using wavelength characteristic of light emitted from single illuminant particle
WO2012099234A1 (ja) 2011-01-20 2012-07-26 オリンパス株式会社 単一発光粒子からの光の検出を用いた光分析方法及び光分析装置
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JP5904996B2 (ja) 2011-03-29 2016-04-20 オリンパス株式会社 単一発光粒子検出を用いた光分析装置、光分析方法並びに光分析用コンピュータプログラム
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WO2012144528A1 (ja) 2011-04-18 2012-10-26 オリンパス株式会社 標的粒子の定量方法、光分析装置及び光分析用コンピュータプログラム
WO2013021687A1 (ja) 2011-08-11 2013-02-14 オリンパス株式会社 標的粒子の検出方法
JP6013337B2 (ja) 2011-08-15 2016-10-25 オリンパス株式会社 単一発光粒子検出を用いた光分析装置、光分析方法及び光分析用コンピュータプログラム
EP2749868B1 (en) 2011-08-26 2019-02-27 Olympus Corporation Single-particle detector using optical analysis, single-particle detection method using same, and computer program for single-particle detection
EP2749867B1 (en) 2011-08-26 2017-05-10 Olympus Corporation Optical analysing device and method using individual light-emitting particle detection
CN103765194B (zh) 2011-08-30 2016-02-17 奥林巴斯株式会社 目标粒子的检测方法
JP6010035B2 (ja) 2011-08-30 2016-10-19 オリンパス株式会社 単一発光粒子検出を用いた光分析装置、光分析方法及び光分析用コンピュータプログラム
JP5941923B2 (ja) 2011-11-10 2016-06-29 オリンパス株式会社 単一発光粒子検出を用いた光分析装置、光分析方法及び光分析用コンピュータプログラム
CN104115001B (zh) 2012-02-17 2016-08-24 奥林巴斯株式会社 利用单个粒子检测的光分析装置、光分析方法
JP5940644B2 (ja) 2012-02-22 2016-06-29 オリンパス株式会社 標的粒子の検出方法
WO2013140890A1 (ja) 2012-03-21 2013-09-26 オリンパス株式会社 標的核酸分子の検出方法
EP2840381B1 (en) 2012-04-18 2017-08-09 Olympus Corporation Method for detecting target particles
JP6010114B2 (ja) 2012-04-18 2016-10-19 オリンパス株式会社 光分析を用いた単一粒子検出装置、単一粒子検出方法及び単一粒子検出用コンピュータプログラム
FI125408B (fi) 2012-09-17 2015-09-30 Focalspec Oy Menetelmä ja mittalaite pinnan etäisyyden, kohteen paksuuden ja optisten ominaisuuksien mittaamiseksi
EP3029505A4 (en) 2013-07-31 2017-03-15 Olympus Corporation Optical microscope device, microscopy method, and computer program for microscopy using single-light-emitting-particle detection technology
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Title
See also references of EP2124085A4 *
TADAO TSURUTA: "Light Pencil", NEW TECHNOLOGY COMMUNICATIONS, pages: 177 - 205

Also Published As

Publication number Publication date
JPWO2008099778A1 (ja) 2010-05-27
EP2124085A1 (en) 2009-11-25
EP2124085A4 (en) 2010-04-28
US20100202043A1 (en) 2010-08-12

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