WO2008132976A1 - 顕微鏡装置 - Google Patents

顕微鏡装置 Download PDF

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Publication number
WO2008132976A1
WO2008132976A1 PCT/JP2008/056883 JP2008056883W WO2008132976A1 WO 2008132976 A1 WO2008132976 A1 WO 2008132976A1 JP 2008056883 W JP2008056883 W JP 2008056883W WO 2008132976 A1 WO2008132976 A1 WO 2008132976A1
Authority
WO
WIPO (PCT)
Prior art keywords
sample
objective lens
passes
diffraction grating
forms
Prior art date
Application number
PCT/JP2008/056883
Other languages
English (en)
French (fr)
Inventor
Yumiko Ouchi
Original Assignee
Nikon Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corporation filed Critical Nikon Corporation
Priority to EP08739986.1A priority Critical patent/EP2136233B1/en
Priority to JP2009511746A priority patent/JP4835750B2/ja
Publication of WO2008132976A1 publication Critical patent/WO2008132976A1/ja
Priority to US12/461,006 priority patent/US7808701B2/en

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Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/16Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/36Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365Control or image processing arrangements for digital or video microscopes
    • G02B21/367Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison

Abstract

 回折格子8により発生した回折光は、第2対物レンズ9を通り、反射ミラー205で偏向されて第1対物レンズ10により、標本11の表面に縞模様の照明光を形成する。これにより、標本11から発生した蛍光は、第1対物レンズ10、反射ミラー205、第2対物レンズ9を通り、回折格子8に、標本11の像を結像する。回折格子8を光学系から取り外し、反射ミラー205の代わりにダイクロイックミラーを配置すれば、標本11からの蛍光は、ダイクロイックミラーを透過して結像レンズ52により、撮像装置53の撮像面に、標本11の像を結像する。これにより、通常の蛍光顕微鏡と切り換えて使用することが可能な、回折光を利用した顕微鏡装置を提供することができる。
PCT/JP2008/056883 2007-04-12 2008-04-07 顕微鏡装置 WO2008132976A1 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
EP08739986.1A EP2136233B1 (en) 2007-04-12 2008-04-07 Microscope device
JP2009511746A JP4835750B2 (ja) 2007-04-12 2008-04-07 顕微鏡装置
US12/461,006 US7808701B2 (en) 2007-04-12 2009-07-29 Microscope apparatus

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007104725 2007-04-12
JP2007-104725 2007-04-12

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/461,006 Continuation US7808701B2 (en) 2007-04-12 2009-07-29 Microscope apparatus

Publications (1)

Publication Number Publication Date
WO2008132976A1 true WO2008132976A1 (ja) 2008-11-06

Family

ID=39925435

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/056883 WO2008132976A1 (ja) 2007-04-12 2008-04-07 顕微鏡装置

Country Status (4)

Country Link
US (1) US7808701B2 (ja)
EP (1) EP2136233B1 (ja)
JP (1) JP4835750B2 (ja)
WO (1) WO2008132976A1 (ja)

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* Cited by examiner, † Cited by third party
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JP2013539074A (ja) * 2010-09-24 2013-10-17 カール・ツァイス・マイクロスコピー・ゲゼルシャフト・ミット・ベシュレンクテル・ハフツング 3d局在顕微鏡法並びに4d局在顕微鏡法及び追跡方法並びに追跡システム
WO2014084007A1 (ja) * 2012-11-29 2014-06-05 シチズンホールディングス株式会社 光変調素子
JP2015064438A (ja) * 2013-09-24 2015-04-09 株式会社ニコン 構造化照明顕微鏡装置
WO2015087960A1 (ja) * 2013-12-12 2015-06-18 株式会社ニコン 構造化照明顕微鏡、構造化照明方法、及びプログラム
JP2017083473A (ja) * 2017-01-11 2017-05-18 アストロデザイン株式会社 光学的分解能向上装置
WO2019053768A1 (ja) * 2017-09-12 2019-03-21 株式会社ニコン 顕微鏡および観察方法
JP2019086562A (ja) * 2017-11-02 2019-06-06 オリンパス株式会社 観察装置

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US9005115B2 (en) 2005-04-04 2015-04-14 Invuity, Inc. Illuminated telescoping cannula
US8488238B2 (en) * 2009-08-10 2013-07-16 Chroma Technology Corporation Microscope cube
EP3667391A1 (de) * 2009-10-28 2020-06-17 Carl Zeiss Microscopy GmbH Mikroskopisches verfahren und mikroskop mit gesteigerter auflösung
TWI436098B (zh) * 2010-12-16 2014-05-01 Ind Tech Res Inst 建構高解析度影像之系統及方法
CA2837226A1 (en) * 2011-05-25 2012-11-29 Huron Technologies International Inc. 3d pathology slide scanner
WO2013001805A1 (ja) * 2011-06-29 2013-01-03 株式会社ニコン 構造化照明光学系および構造化照明顕微鏡装置
WO2013086350A1 (en) * 2011-12-07 2013-06-13 Celloptic, Inc. Apparatus for producing a hologram
DE102012106584B4 (de) 2012-07-20 2021-01-07 Carl Zeiss Ag Verfahren und Vorrichtung zur Bildrekonstruktion
DE102012017920B4 (de) * 2012-09-11 2023-11-30 Carl Zeiss Microscopy Gmbh Optikanordnung und Lichtmikroskop
DE102013001238B4 (de) * 2013-01-25 2020-06-10 Carl Zeiss Microscopy Gmbh Lichtmikroskop und Mikroskopieverfahren
DE102013218231A1 (de) * 2013-09-11 2015-03-12 Sirona Dental Systems Gmbh Optisches System zur Erzeugung eines sich zeitlich ändernden Musters für ein Konfokalmikroskop
WO2015052936A1 (ja) * 2013-10-09 2015-04-16 株式会社ニコン 構造化照明顕微鏡装置
JP6253395B2 (ja) * 2013-12-19 2017-12-27 オリンパス株式会社 画像生成システム
WO2016125281A1 (ja) * 2015-02-05 2016-08-11 株式会社ニコン 構造化照明顕微鏡、観察方法、及び制御プログラム
US10519842B2 (en) * 2016-05-17 2019-12-31 Ford Global Technologies, Llc Exhaust sensor module shield
KR102551430B1 (ko) * 2016-12-01 2023-07-05 버클리 라잇츠, 인크. 미세-객체들을 이미징하기 위한 장치들, 시스템들 및 방법들
US11619586B2 (en) 2021-07-08 2023-04-04 X Development Llc System for imaging and selective illumination of targets within a sample

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US38307A (en) 1863-04-28 Improved washing-machine
JPH11242189A (ja) 1997-12-25 1999-09-07 Olympus Optical Co Ltd 像形成法、像形成装置
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JP2006334211A (ja) 2005-06-03 2006-12-14 Kita Idea:Kk 組み立て式洗髪装置

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DE10393244B4 (de) * 2002-09-09 2017-09-21 Zygo Corp. Interferometrisches Verfahren für ellipsometrische, reflektometrische und streulichtanalytische Messungen, einschließlich der Charakterisierung von Dünnfilmstrukturen
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US10571674B2 (en) 2010-09-24 2020-02-25 Carl Zeiss Microscopy Gmbh 3D localization microscopy and 4D localization microscopy and tracking methods and systems
US10007103B2 (en) 2010-09-24 2018-06-26 Carl Zeiss Microscopy Gmbh 3D localization microscopy and 4D localization microscopy and tracking methods and systems
JP2013539074A (ja) * 2010-09-24 2013-10-17 カール・ツァイス・マイクロスコピー・ゲゼルシャフト・ミット・ベシュレンクテル・ハフツング 3d局在顕微鏡法並びに4d局在顕微鏡法及び追跡方法並びに追跡システム
US9523846B2 (en) 2010-09-24 2016-12-20 Carl Zeiss Microscopy Gmbh 3D localisation microscopy and 4D localisation microscopy and tracking methods and systems
JPWO2014084007A1 (ja) * 2012-11-29 2017-01-05 シチズンホールディングス株式会社 光変調素子
US9772484B2 (en) 2012-11-29 2017-09-26 Citizen Watch Co., Ltd. Light modulating device
WO2014084007A1 (ja) * 2012-11-29 2014-06-05 シチズンホールディングス株式会社 光変調素子
JP2015064438A (ja) * 2013-09-24 2015-04-09 株式会社ニコン 構造化照明顕微鏡装置
WO2015087960A1 (ja) * 2013-12-12 2015-06-18 株式会社ニコン 構造化照明顕微鏡、構造化照明方法、及びプログラム
JPWO2015087960A1 (ja) * 2013-12-12 2017-03-16 株式会社ニコン 構造化照明顕微鏡、構造化照明方法、及びプログラム
US10725276B2 (en) 2013-12-12 2020-07-28 Nikon Corporation Structured illumination microscope, structured illumination method, and program
US11009692B2 (en) 2013-12-12 2021-05-18 Nikon Corporation Structured illumination microscope, structured illumination method, and program
US10302927B2 (en) 2013-12-12 2019-05-28 Nikon Corporation Structured illumination microscope, structured illumination method, and program
JP2017219857A (ja) * 2013-12-12 2017-12-14 株式会社ニコン 構造化照明顕微鏡、構造化照明方法、及びプログラム
JP2019168716A (ja) * 2013-12-12 2019-10-03 株式会社ニコン 構造化照明顕微鏡、構造化照明方法、及びプログラム
JP2017083473A (ja) * 2017-01-11 2017-05-18 アストロデザイン株式会社 光学的分解能向上装置
JPWO2019053768A1 (ja) * 2017-09-12 2020-10-29 株式会社ニコン 顕微鏡および観察方法
WO2019053768A1 (ja) * 2017-09-12 2019-03-21 株式会社ニコン 顕微鏡および観察方法
JP7063337B2 (ja) 2017-09-12 2022-05-09 株式会社ニコン 顕微鏡および観察方法
JP2019086562A (ja) * 2017-11-02 2019-06-06 オリンパス株式会社 観察装置

Also Published As

Publication number Publication date
JPWO2008132976A1 (ja) 2010-07-22
US7808701B2 (en) 2010-10-05
EP2136233B1 (en) 2013-06-12
EP2136233A1 (en) 2009-12-23
JP4835750B2 (ja) 2011-12-14
US20090296205A1 (en) 2009-12-03
EP2136233A4 (en) 2012-03-07

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