MX2012009921A - Un sistema de inspeccion basado en espectroscopia de rayos x de alta energia y metodos para determinar el numero atomico de materiales. - Google Patents

Un sistema de inspeccion basado en espectroscopia de rayos x de alta energia y metodos para determinar el numero atomico de materiales.

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Publication number
MX2012009921A
MX2012009921A MX2012009921A MX2012009921A MX2012009921A MX 2012009921 A MX2012009921 A MX 2012009921A MX 2012009921 A MX2012009921 A MX 2012009921A MX 2012009921 A MX2012009921 A MX 2012009921A MX 2012009921 A MX2012009921 A MX 2012009921A
Authority
MX
Mexico
Prior art keywords
energy
ray
methods
atomic number
identifying
Prior art date
Application number
MX2012009921A
Other languages
English (en)
Inventor
Joseph Bendahan
Craig Mathew Brown
Tsahi Gozani
Willem Gerhardus Johannes Langeveld
John David Stevenson
Original Assignee
Rapiscan Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rapiscan Systems Inc filed Critical Rapiscan Systems Inc
Publication of MX2012009921A publication Critical patent/MX2012009921A/es

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/10—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in a luggage X-ray scanners
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G01N23/087—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation

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  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

La solicitud divulga sistemas y métodos para escaneado de rayos X para identificar la composición del material de un objeto que está siendo escaneado. El sistema incluye al menos una fuente de rayos X para proyectar un haz de rayos X sobre el objeto, donde al menos una porción del haz de rayos X proyectado se transmite a través del objeto, y un arreglo de detectores para medir espectros de energía de los rayos X transmitidos. Los espectros de energía medidos se utilizan para determinar el número atómico del objeto para identificar la composición del material del objeto. El sistema de escaneado de rayos X puede también tener un arreglo de detectores de rayos X retrodispersados de alta energía colimados para medir el espectro de energía de rayos X dispersados por el objeto en un ángulo mayor a los 90 grados, donde el espectro de energía medida se utiliza en conjunto con el espectro de energía de transmisión para determinar los números atómicos del objeto para identificar la composición del material del objeto.
MX2012009921A 2010-02-25 2011-02-23 Un sistema de inspeccion basado en espectroscopia de rayos x de alta energia y metodos para determinar el numero atomico de materiales. MX2012009921A (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US30815210P 2010-02-25 2010-02-25
PCT/US2011/025969 WO2011106463A1 (en) 2010-02-25 2011-02-23 A high-energy x-ray spectroscopy-based inspection system and methods to determine the atomic number of materials

Publications (1)

Publication Number Publication Date
MX2012009921A true MX2012009921A (es) 2012-12-17

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
MX2012009921A MX2012009921A (es) 2010-02-25 2011-02-23 Un sistema de inspeccion basado en espectroscopia de rayos x de alta energia y metodos para determinar el numero atomico de materiales.

Country Status (7)

Country Link
US (2) US8750454B2 (es)
EP (1) EP2539697A4 (es)
CN (1) CN102884422B (es)
BR (1) BR112012021520B1 (es)
GB (1) GB2490635B (es)
MX (1) MX2012009921A (es)
WO (1) WO2011106463A1 (es)

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GB2490635B (en) 2017-01-18
US20110235777A1 (en) 2011-09-29
BR112012021520A2 (pt) 2016-07-05
US20140341341A1 (en) 2014-11-20
WO2011106463A1 (en) 2011-09-01
US9207195B2 (en) 2015-12-08
US8750454B2 (en) 2014-06-10
CN102884422B (zh) 2016-09-28
BR112012021520B1 (pt) 2021-06-22
GB201215364D0 (en) 2012-10-10
EP2539697A4 (en) 2017-05-10
GB2490635A (en) 2012-11-07
EP2539697A1 (en) 2013-01-02

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