BR112012021520A2 - raio-x de alta energia espectroscópica baseado em sistema de inspeção e métodos para determinar o número atômico de materiais - Google Patents

raio-x de alta energia espectroscópica baseado em sistema de inspeção e métodos para determinar o número atômico de materiais

Info

Publication number
BR112012021520A2
BR112012021520A2 BR112012021520A BR112012021520A BR112012021520A2 BR 112012021520 A2 BR112012021520 A2 BR 112012021520A2 BR 112012021520 A BR112012021520 A BR 112012021520A BR 112012021520 A BR112012021520 A BR 112012021520A BR 112012021520 A2 BR112012021520 A2 BR 112012021520A2
Authority
BR
Brazil
Prior art keywords
materials
methods
inspection system
atomic number
ray inspection
Prior art date
Application number
BR112012021520A
Other languages
English (en)
Other versions
BR112012021520B1 (pt
Inventor
Craig Mathew Brown
John David Stevenson
Joseph Bendahan
Tsahi Gozani
Willem Gerhardus Johannes Langeveld
Original Assignee
Rapiscan Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rapiscan Systems Inc filed Critical Rapiscan Systems Inc
Publication of BR112012021520A2 publication Critical patent/BR112012021520A2/pt
Publication of BR112012021520B1 publication Critical patent/BR112012021520B1/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G01N23/087—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/10—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in a luggage X-ray scanners
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation

Landscapes

  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
BR112012021520-5A 2010-02-25 2011-02-23 Sistema de varredura de raios x BR112012021520B1 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US30815210P 2010-02-25 2010-02-25
US61/308,152 2010-02-25
PCT/US2011/025969 WO2011106463A1 (en) 2010-02-25 2011-02-23 A high-energy x-ray spectroscopy-based inspection system and methods to determine the atomic number of materials

Publications (2)

Publication Number Publication Date
BR112012021520A2 true BR112012021520A2 (pt) 2016-07-05
BR112012021520B1 BR112012021520B1 (pt) 2021-06-22

Family

ID=44507197

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112012021520-5A BR112012021520B1 (pt) 2010-02-25 2011-02-23 Sistema de varredura de raios x

Country Status (7)

Country Link
US (2) US8750454B2 (pt)
EP (1) EP2539697A4 (pt)
CN (1) CN102884422B (pt)
BR (1) BR112012021520B1 (pt)
GB (1) GB2490635B (pt)
MX (1) MX2012009921A (pt)
WO (1) WO2011106463A1 (pt)

Families Citing this family (46)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7963695B2 (en) 2002-07-23 2011-06-21 Rapiscan Systems, Inc. Rotatable boom cargo scanning system
US9958569B2 (en) 2002-07-23 2018-05-01 Rapiscan Systems, Inc. Mobile imaging system and method for detection of contraband
US9310323B2 (en) 2009-05-16 2016-04-12 Rapiscan Systems, Inc. Systems and methods for high-Z threat alarm resolution
BR112012021520B1 (pt) * 2010-02-25 2021-06-22 Rapiscan Systems, Inc. Sistema de varredura de raios x
US8848871B2 (en) * 2010-11-04 2014-09-30 Ut-Battelle, Llc X-ray backscatter imaging of nuclear materials
US9224573B2 (en) 2011-06-09 2015-12-29 Rapiscan Systems, Inc. System and method for X-ray source weight reduction
US9218933B2 (en) 2011-06-09 2015-12-22 Rapidscan Systems, Inc. Low-dose radiographic imaging system
KR101973221B1 (ko) 2011-09-07 2019-04-26 라피스캔 시스템스, 인코포레이티드 적하목록 데이터를 이미징/검출 프로세싱에 통합시키는 x-선 검사시스템
US10670740B2 (en) 2012-02-14 2020-06-02 American Science And Engineering, Inc. Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors
ES2685971T3 (es) 2012-02-14 2018-10-15 American Science And Engineering, Inc. Inspección de rayos X usando detectores de centelleo acoplados mediante fibra con desplazamiento de longitud de onda
EP2941775A4 (en) 2013-01-07 2016-08-24 Rapiscan Systems Inc X-RAY SCANNING DEVICE WITH PARTIAL ENERGY DISCRIMINATION DETECTOR ARRAY
US20140222402A1 (en) * 2013-02-06 2014-08-07 Rapiscan Systems, Inc. Systems and Methods for X-Ray Source Weight Reduction
JP5996470B2 (ja) * 2013-03-29 2016-09-21 住友重機械工業株式会社 中性子捕捉療法装置
AU2014293215A1 (en) 2013-07-23 2016-02-25 Rapiscan Systems, Inc. Methods for improving processing speed for object inspection
AU2013402760B2 (en) 2013-10-11 2018-11-08 Mantex IP AB Method and apparatus for estimation of heat value using dual energy X-ray transmission measurements and X-ray fluorescence measurements
US9557427B2 (en) 2014-01-08 2017-01-31 Rapiscan Systems, Inc. Thin gap chamber neutron detectors
CN105277578B (zh) * 2014-06-09 2018-06-12 北京君和信达科技有限公司 一种提高双能辐射系统材料识别能力的方法及系统
CN105203569B (zh) * 2014-06-09 2018-06-12 北京君和信达科技有限公司 双能辐射系统和提高双能辐射系统材料识别能力的方法
US10228487B2 (en) 2014-06-30 2019-03-12 American Science And Engineering, Inc. Rapidly relocatable modular cargo container scanner
MX2017000581A (es) 2014-07-15 2017-11-30 Rapiscan Systems Inc Sistemas y metodos para la deteccion automatica de baterias de litio en carga, equipaje, paquetes y otros contenedores.
AU2014268284A1 (en) * 2014-11-30 2016-06-16 Southern Innovation International Pty Ltd Method and apparatus for material identification
FR3030754B1 (fr) * 2014-12-23 2017-10-13 Commissariat Energie Atomique Procede d'estimation de spectres de rayonnement x d'objets superposes
EP3271709B1 (en) 2015-03-20 2022-09-21 Rapiscan Systems, Inc. Hand-held portable backscatter inspection system
US10345479B2 (en) 2015-09-16 2019-07-09 Rapiscan Systems, Inc. Portable X-ray scanner
CN105181723B (zh) * 2015-09-28 2019-02-12 同方威视技术股份有限公司 双能射线扫描系统、扫描方法以及检查系统
GB2595986A (en) 2016-02-22 2021-12-15 Rapiscan Systems Inc Systems and methods for detecting threats and contraband in cargo
BR112018074796B1 (pt) 2016-05-30 2023-03-28 Southern Innovation International Pty Ltd Sistema e método de caracterização de material
BR112018074802B1 (pt) 2016-05-30 2023-03-28 Southern Innovation International Pty Ltd Sistema e método de caracterização de material
JP6764709B2 (ja) * 2016-06-30 2020-10-07 株式会社日立製作所 Ｘ線自動判定装置、ｘ線自動判定方法
GB2555564B (en) * 2016-07-28 2020-09-09 Smiths Heimann Sas Scatter imaging
CN110199209B (zh) 2016-07-28 2021-07-30 德国史密斯海曼简化股份公司 散射成像
CN110199373B (zh) 2017-01-31 2021-09-28 拉皮斯坎系统股份有限公司 大功率x射线源与操作方法
DE102017003517A1 (de) 2017-04-11 2018-10-11 Universität Hamburg Verfahren und Messvorrichtung zur Röntgenfluoreszenz-Messung
US20190346379A1 (en) * 2018-05-10 2019-11-14 Voti Inc. X-ray screening system and method
EP3811117A4 (en) 2018-06-20 2022-03-16 American Science & Engineering, Inc. SCINTILLATION DETECTORS COUPLED TO WAVELENGTH OFFSET SHEET
US11977037B2 (en) 2018-10-22 2024-05-07 Rapiscan Holdings, Inc. Insert for screening tray
EP3877754A4 (en) * 2018-11-06 2022-06-08 Shenzhen Xpectvision Technology Co., Ltd. X-RAY SYSTEM WITH BACK SCATTER
US11212902B2 (en) 2020-02-25 2021-12-28 Rapiscan Systems, Inc. Multiplexed drive systems and methods for a multi-emitter X-ray source
US11193898B1 (en) 2020-06-01 2021-12-07 American Science And Engineering, Inc. Systems and methods for controlling image contrast in an X-ray system
US11175245B1 (en) 2020-06-15 2021-11-16 American Science And Engineering, Inc. Scatter X-ray imaging with adaptive scanning beam intensity
US11340361B1 (en) 2020-11-23 2022-05-24 American Science And Engineering, Inc. Wireless transmission detector panel for an X-ray scanner
WO2022183191A1 (en) 2021-02-23 2022-09-01 Rapiscan Systems, Inc. Systems and methods for eliminating cross-talk in scanning systems having multiple x-ray sources
CN117295940A (zh) * 2021-05-05 2023-12-26 万睿视影像有限公司 反向散射成像系统
US11885752B2 (en) 2021-06-30 2024-01-30 Rapiscan Holdings, Inc. Calibration method and device therefor
CN114624785B (zh) * 2022-05-16 2022-08-19 天津速通科技有限公司 适用于新型双源混检式通道式安检系统的同光源设置方法
CN115078414B (zh) * 2022-08-18 2022-11-04 湖南苏科智能科技有限公司 基于多能量x射线的液体成分抗干扰智能检测方法

Family Cites Families (63)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB516517A (en) 1937-04-02 1940-01-04 Asea Ab Arrangement for commutating current in rectifiers of the space discharge type
US3808444A (en) * 1973-01-05 1974-04-30 Westinghouse Electric Corp X-ray contrast detection system
US4020346A (en) 1973-03-21 1977-04-26 Dennis Donald A X-ray inspection device and method
FR2421056A1 (fr) 1978-03-29 1979-10-26 Europ Propulsion Texture tridimensionnelle annulaire utilisable notamment comme renfort
US4366382B2 (en) 1980-09-09 1997-10-14 Scanray Corp X-ray line scan system for use in baggage inspection
DE3576931D1 (de) 1984-11-12 1990-05-10 Kuraray Co Mehrschichtstoffe und verfahren zu deren herstellung.
US5046846A (en) 1989-03-22 1991-09-10 The Lubrizol Corporation Method and apparatus for spectroscopic comparison of compositions
US5319547A (en) 1990-08-10 1994-06-07 Vivid Technologies, Inc. Device and method for inspection of baggage and other objects
US5428657A (en) * 1994-03-22 1995-06-27 Georgia Tech Research Corporation X-ray monitoring system
US5600700A (en) * 1995-09-25 1997-02-04 Vivid Technologies, Inc. Detecting explosives or other contraband by employing transmitted and scattered X-rays
US7045787B1 (en) 1995-10-23 2006-05-16 Science Applications International Corporation Density detection using real time discrete photon counting for fast moving targets
US5638420A (en) 1996-07-03 1997-06-10 Advanced Research And Applications Corporation Straddle inspection system
US6118850A (en) * 1997-02-28 2000-09-12 Rutgers, The State University Analysis methods for energy dispersive X-ray diffraction patterns
US6069936A (en) 1997-08-18 2000-05-30 Eg&G Astrophysics Material discrimination using single-energy x-ray imaging system
US6347132B1 (en) 1998-05-26 2002-02-12 Annistech, Inc. High energy X-ray inspection system for detecting nuclear weapons materials
US6442233B1 (en) * 1998-06-18 2002-08-27 American Science And Engineering, Inc. Coherent x-ray scatter inspection system with sidescatter and energy-resolved detection
CA2376277C (en) 1999-06-11 2011-03-15 Telstra New Wave Pty Ltd A method of developing an interactive system
US6567496B1 (en) 1999-10-14 2003-05-20 Sychev Boris S Cargo inspection apparatus and process
CA2348150C (en) 2000-05-25 2007-03-13 Esam M.A. Hussein Non-rotating x-ray system for three-dimensional, three-parameter imaging
US7130484B2 (en) 2001-10-15 2006-10-31 Jonas August Biased curve indicator random field filters for enhancement of contours in images
US7322745B2 (en) 2002-07-23 2008-01-29 Rapiscan Security Products, Inc. Single boom cargo scanning system
US7103137B2 (en) 2002-07-24 2006-09-05 Varian Medical Systems Technology, Inc. Radiation scanning of objects for contraband
US7492682B2 (en) 2002-07-25 2009-02-17 Yamaha Corporation Optical disk recording apparatus controllable by table of multi-pulse patterns
US6785357B2 (en) 2003-01-16 2004-08-31 Bio-Imaging Research, Inc. High energy X-ray mobile cargo inspection system with penumbra collimator
WO2004095060A2 (en) * 2003-04-23 2004-11-04 L-3 Communications Security and Detection Systems Corporation X-ray imaging technique
EP1639546B1 (en) 2003-06-17 2011-05-04 Brown University Method and apparatus for model-based detection of structure in projection data
US6950493B2 (en) * 2003-06-25 2005-09-27 Besson Guy M Dynamic multi-spectral CT imaging
US7366282B2 (en) 2003-09-15 2008-04-29 Rapiscan Security Products, Inc. Methods and systems for rapid detection of concealed objects using fluorescence
EP1522878B1 (de) 2003-10-06 2006-08-09 YXLON International Security GmbH Verfahren zur Bestimmung der Lageänderung eines Gepäckstücks zur Untersuchung einer verdächtigen Region in diesem Gepäckstück
US6987833B2 (en) 2003-10-16 2006-01-17 General Electric Company Methods and apparatus for identification and imaging of specific materials
IL159406A (en) 2003-12-16 2013-10-31 Mark Goldberg A method and system for detecting materials, such as special nuclear materials
US7702068B2 (en) 2004-02-11 2010-04-20 Reveal Imaging Technologies, Inc. Contraband detection systems and methods
CN101019042B (zh) * 2004-03-01 2010-05-12 瓦润医药系统公司 通过双能量辐射扫描和缓发中子探测来检查物体
US7453987B1 (en) 2004-03-04 2008-11-18 Science Applications International Corporation Method and system for high energy, low radiation power X-ray imaging of the contents of a target
US7750294B2 (en) 2004-03-10 2010-07-06 The Research Foundation Of State University Of New York Photonic sensors, xerogel-based sensors and nanosensors
JP5054518B2 (ja) 2004-07-08 2012-10-24 パスポート システムズ， インク． 物質の平均原子番号及び質量を求めるための方法及びシステム
JP4495109B2 (ja) 2006-04-06 2010-06-30 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー Ｘ線ｃｔ装置
US7526064B2 (en) 2006-05-05 2009-04-28 Rapiscan Security Products, Inc. Multiple pass cargo inspection system
EP2023127B1 (en) 2006-05-31 2017-12-20 Olympus Corporation Biological specimen imaging method and biological specimen imaging apparatus
US7483511B2 (en) 2006-06-06 2009-01-27 Ge Homeland Protection, Inc. Inspection system and method
US20070284534A1 (en) * 2006-06-07 2007-12-13 General Electric Company Scintillators for detecting radiation, and related methods and articles
ES2474200T3 (es) 2006-08-11 2014-07-08 American Science & Engineering, Inc. Inspección por rayos X con generación de imágenes de transmisión y retrodispersi�n contemporánea y pr�ximal
CA2690831C (en) 2006-09-18 2012-11-27 Optosecurity Inc. Method and apparatus for assessing characteristics of liquids
US7492862B2 (en) 2007-01-17 2009-02-17 Ge Homeland Protection, Inc. Computed tomography cargo inspection system and method
US7693261B2 (en) * 2007-05-17 2010-04-06 Durham Scientific Crystals Limited Method and apparatus for inspection of materials
US7809103B2 (en) 2007-05-31 2010-10-05 General Electric Company Method for detecting the presence of high atomic number elements
US20080298546A1 (en) 2007-05-31 2008-12-04 General Electric Company Cargo container inspection method
CN101435783B (zh) * 2007-11-15 2011-01-26 同方威视技术股份有限公司 物质识别方法和设备
JP4985352B2 (ja) * 2007-11-28 2012-07-25 株式会社島津製作所 放射線検出器
US7844027B2 (en) 2008-02-22 2010-11-30 Morpho Detection, Inc. XRD-based false alarm resolution in megavoltage computed tomography systems
CA2636306C (en) 2008-03-07 2014-01-14 Norseman Plastics Limited Refuse container
CA2624658C (en) 2008-03-07 2014-02-04 Norseman Plastics Limited Refuse container
CA2624663C (en) 2008-03-07 2014-01-14 Norseman Plastics Limited Refuse container
CN101614683B (zh) * 2008-06-27 2011-10-05 清华大学 物质识别系统中的实时标定设备和方法
CN201266183Y (zh) * 2008-07-16 2009-07-01 清华大学 一种测量物质有效原子序数的装置
US7965816B2 (en) * 2008-08-11 2011-06-21 Control Screening, LLC. Scanning X-ray inspection system using scintillation detection with simultaneous counting and integrating modes
CN101647706B (zh) * 2008-08-13 2012-05-30 清华大学 高能双能ct系统的图象重建方法
GB0823093D0 (en) * 2008-12-19 2009-01-28 Durham Scient Crystals Ltd Apparatus and method for characterisation of materials
PL2430396T3 (pl) 2009-05-16 2020-11-16 Rapiscan Systems, Inc. Systemy i sposoby automatycznego, szybkiego wykrywania materiałów o dużej liczbie atomowej
WO2011017475A1 (en) 2009-08-04 2011-02-10 Rapiscan Laboratories, Inc. Method and system for extracting spectroscopic information from images and waveforms
GB201001738D0 (en) 2010-02-03 2010-03-24 Rapiscan Lab Inc Scanning systems
BR112012021520B1 (pt) 2010-02-25 2021-06-22 Rapiscan Systems, Inc. Sistema de varredura de raios x
US8233586B1 (en) 2011-02-17 2012-07-31 Franz Edward Boas Iterative reduction of artifacts in computed tomography images using forward projection and an edge-preserving blur filter

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MX2012009921A (es) 2012-12-17
GB2490635A (en) 2012-11-07
EP2539697A4 (en) 2017-05-10
BR112012021520B1 (pt) 2021-06-22
US9207195B2 (en) 2015-12-08
WO2011106463A1 (en) 2011-09-01
GB2490635B (en) 2017-01-18
US20140341341A1 (en) 2014-11-20
GB201215364D0 (en) 2012-10-10
US8750454B2 (en) 2014-06-10
CN102884422A (zh) 2013-01-16
CN102884422B (zh) 2016-09-28
EP2539697A1 (en) 2013-01-02

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