BR112013016361A2 - dispositivo e método de varredura de formação de imagem por retroespalhamento com um feixe de radiação - Google Patents

dispositivo e método de varredura de formação de imagem por retroespalhamento com um feixe de radiação

Info

Publication number
BR112013016361A2
BR112013016361A2 BR112013016361A BR112013016361A BR112013016361A2 BR 112013016361 A2 BR112013016361 A2 BR 112013016361A2 BR 112013016361 A BR112013016361 A BR 112013016361A BR 112013016361 A BR112013016361 A BR 112013016361A BR 112013016361 A2 BR112013016361 A2 BR 112013016361A2
Authority
BR
Brazil
Prior art keywords
area
radius
fixed
shield plate
scanning device
Prior art date
Application number
BR112013016361A
Other languages
English (en)
Other versions
BR112013016361B1 (pt
Inventor
Tu Chao
Ding Guangwei
Tang Le
Zhang Li
Cao Shuo
Wu Wanlong
Jin Yingkang
Liu Yinong
Li Yuanjing
Chen Zhiqiang
Zhao Ziran
Original Assignee
Nuctech Co Ltd
Univ Tsinghua
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nuctech Co Ltd, Univ Tsinghua filed Critical Nuctech Co Ltd
Publication of BR112013016361A2 publication Critical patent/BR112013016361A2/pt
Publication of BR112013016361B1 publication Critical patent/BR112013016361B1/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/04—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
    • G21K1/043—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers changing time structure of beams by mechanical means, e.g. choppers, spinning filter wheels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3301—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts beam is modified for scan, e.g. moving collimator

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Mechanical Optical Scanning Systems (AREA)
  • Measurement Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Apparatus For Radiation Diagnosis (AREA)

Abstract

dispositivo e método de varredura de formação de imagem por retroesp alhamento com um feixe de radiação é provido um dispositivo para varredura do feixe de raio para formação de imagem por retroespalhamento. o dispositivo de varredura inclui: uma fonte de radiação, uma placa de blindagem fixa e um corpo de blindagem rotativo, que são, ambos, definidos entre a fonte de radiação e um objeto de varredura, em que a placa de blindagem fixa é fixa em relação à fonte de radiação, o corpo de blindagem rotativo pode rotacionar em relação à placa de blindagem fixa. a placa de blindagem fixa inclui área de. passagem de raio através da qual feixe de raio proveniente da fonte de radiação pode passar. uma área de incidência de raio e uma área de emissão de raio são definidas, respectivamente, no corpo de blindagem rotativo. a área de passagem de raio da placa de blindagem fixa faz interseção continuamente com a área de incidência de raio e a área de emissão de raio do corpo rotativo de blindagem para formar um furo de colimação de varredura quando o corpo de blindagem rotativo for rotacionado para varredura. a área de passagem de raio da placa de blindagem fixa é uma abertura linear. o corpo de blindagem rotativo é um cilindro, a área de incidência de raio e a área de emissão de raio são uma série de pequenos furos discretos definidos à maneira de hélice, respectivamente. além do mais, um método para varredura do feixe de raio para formação de imagem por retroespalhamento também é provido.
BR112013016361-5A 2010-12-31 2011-04-28 Dispositivo e método de varredura de formação de imagem por retroespalhamento com um feixe de radiação BR112013016361B1 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CN201010624252.3A CN102565110B (zh) 2010-12-31 2010-12-31 一种背散射成像用射线束的扫描装置和方法
CN201010624252.3 2010-12-31
PCT/CN2011/073474 WO2012088810A1 (zh) 2010-12-31 2011-04-28 一种背散射成像用射线束的扫描装置和方法

Publications (2)

Publication Number Publication Date
BR112013016361A2 true BR112013016361A2 (pt) 2019-01-08
BR112013016361B1 BR112013016361B1 (pt) 2020-03-31

Family

ID=45638240

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112013016361-5A BR112013016361B1 (pt) 2010-12-31 2011-04-28 Dispositivo e método de varredura de formação de imagem por retroespalhamento com um feixe de radiação

Country Status (13)

Country Link
US (1) US8983033B2 (pt)
EP (1) EP2573551B1 (pt)
JP (1) JP5696226B2 (pt)
KR (2) KR20140052932A (pt)
CN (1) CN102565110B (pt)
AU (1) AU2011349928B2 (pt)
BR (1) BR112013016361B1 (pt)
CA (1) CA2823121C (pt)
CL (1) CL2013001524A1 (pt)
HK (1) HK1175238A1 (pt)
RU (1) RU2532495C1 (pt)
UA (1) UA106938C2 (pt)
WO (1) WO2012088810A1 (pt)

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CN103776847B (zh) * 2012-10-24 2016-04-27 清华大学 射线发射装置和成像系统
CN103901487B (zh) * 2012-12-27 2017-11-21 同方威视技术股份有限公司 人体背散射安检系统及其方法
CN103901491B (zh) * 2012-12-27 2017-10-17 同方威视技术股份有限公司 人体背散射安检系统
CN103901494B (zh) 2012-12-27 2017-08-29 同方威视技术股份有限公司 人体背散射安检系统及其方法
CN104345350A (zh) 2013-07-23 2015-02-11 清华大学 人体安全检查方法和人体安全检查系统
CN104898173B (zh) * 2014-03-07 2018-03-23 北京君和信达科技有限公司 一种飞点形成装置及设计方法
BR112016020654B1 (pt) * 2014-03-07 2021-09-28 Powerscan Company Limited Aparelho de formação de ponto voador e método de projeto
CN104764759B (zh) * 2015-04-01 2017-11-21 中国原子能科学研究院 一种用于x射线背散射成像系统的跳线飞点扫描装置
CN105445303B (zh) * 2015-12-29 2019-02-19 清华大学 手持式背散射成像仪及其成像方法
US10714227B2 (en) * 2016-06-06 2020-07-14 Georgetown Rail Equipment Company Rotating radiation shutter collimator
CN108072891B (zh) * 2016-11-15 2024-02-27 台山核电合营有限公司 Ams探测器校验装置
CN106841249A (zh) * 2017-04-12 2017-06-13 北京君和信达科技有限公司 透射式辐射成像系统
CN107068225B (zh) * 2017-04-13 2023-09-22 云南电网有限责任公司电力科学研究院 一种x射线无损移动检测平台射线屏蔽装置
US10748740B2 (en) * 2018-08-21 2020-08-18 Fei Company X-ray and particle shield for improved vacuum conductivity
CN113884520A (zh) * 2021-09-24 2022-01-04 中国原子能科学研究院 一种用于中子散射测试样品的储存测试装置
US11972920B2 (en) 2021-11-23 2024-04-30 Fei Company Vacuum compatible X-ray shield

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Also Published As

Publication number Publication date
US20120170716A1 (en) 2012-07-05
EP2573551A4 (en) 2014-04-23
CA2823121A1 (en) 2012-07-05
US8983033B2 (en) 2015-03-17
EP2573551B1 (en) 2019-11-13
KR20150048916A (ko) 2015-05-07
EP2573551A1 (en) 2013-03-27
CN102565110A (zh) 2012-07-11
CL2013001524A1 (es) 2014-04-11
CA2823121C (en) 2017-08-22
KR101608884B1 (ko) 2016-04-04
JP2014500507A (ja) 2014-01-09
CN102565110B (zh) 2015-04-01
BR112013016361B1 (pt) 2020-03-31
WO2012088810A1 (zh) 2012-07-05
UA106938C2 (uk) 2014-10-27
JP5696226B2 (ja) 2015-04-08
KR20140052932A (ko) 2014-05-07
RU2532495C1 (ru) 2014-11-10
HK1175238A1 (en) 2013-06-28
AU2011349928B2 (en) 2014-09-04

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Legal Events

Date Code Title Description
B06F Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette]
B06U Preliminary requirement: requests with searches performed by other patent offices: procedure suspended [chapter 6.21 patent gazette]
B09A Decision: intention to grant [chapter 9.1 patent gazette]
B16A Patent or certificate of addition of invention granted [chapter 16.1 patent gazette]

Free format text: PRAZO DE VALIDADE: 20 (VINTE) ANOS CONTADOS A PARTIR DE 28/04/2011, OBSERVADAS AS CONDICOES LEGAIS.