BR112013011030A8 - Fonte de raios x, sistema de aquisição de imagens por raios x, método para determinar alterações no rendimento de emissões de raios x de um tubo de raios x, elemento de programa de computador para controlar um aparelho e meio legível por computador - Google Patents

Fonte de raios x, sistema de aquisição de imagens por raios x, método para determinar alterações no rendimento de emissões de raios x de um tubo de raios x, elemento de programa de computador para controlar um aparelho e meio legível por computador

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Publication number
BR112013011030A8
BR112013011030A8 BR112013011030A BR112013011030A BR112013011030A8 BR 112013011030 A8 BR112013011030 A8 BR 112013011030A8 BR 112013011030 A BR112013011030 A BR 112013011030A BR 112013011030 A BR112013011030 A BR 112013011030A BR 112013011030 A8 BR112013011030 A8 BR 112013011030A8
Authority
BR
Brazil
Prior art keywords
ray
yield
emissions
image acquisition
readable media
Prior art date
Application number
BR112013011030A
Other languages
English (en)
Other versions
BR112013011030A2 (pt
Inventor
Peter Sprong Hans
Kimutai Duerr Martin
Kiewitt Rainer
Original Assignee
Koninklijke Philips Electronics Nv
Koninklijke Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by Koninklijke Philips Electronics Nv, Koninklijke Philips Nv filed Critical Koninklijke Philips Electronics Nv
Publication of BR112013011030A2 publication Critical patent/BR112013011030A2/pt
Publication of BR112013011030A8 publication Critical patent/BR112013011030A8/pt

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • H05G1/54—Protecting or lifetime prediction
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • H05G1/30—Controlling
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/50—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment specially adapted for specific body parts; specially adapted for specific clinical applications
    • A61B6/507—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment specially adapted for specific body parts; specially adapted for specific clinical applications for determination of haemodynamic parameters, e.g. perfusion CT

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • X-Ray Techniques (AREA)
  • Apparatus For Radiation Diagnosis (AREA)

Abstract

PONTE DE RAIOS X, SISTEMA DE AQUISIÇÃO DE IMAGENS POR RAIOS X, MÉTODO PARA DETERMINAR ALTERAÇÕES NO RENDIMENTO DE EMISSÕES DE RAIOS X DE UM TUBO DE RAIOS X, ELEMENTO DE PROGRAMA DE COMPUTADOR PARA CONTROLAR UM APARELHO E MEIO LEGÍVEL POR COMPUTADOR. A presente invenção refere-se à determinação de alterações no rendimento de emissões de raios X de um tubo de raios X, em particular, à determinação da degradação de dose. Para prover a determinação de tais alterações, uma fonte de raios X (10) é provida compreendendo um cátodo (12), um ânodo (14); e pelo menos um sensor de raios X (16). O cátodo emite elétrons (18) em direção ao ânodo, e o ânodo compreende uma o área de alvo (20) sobre a qual os elétrons colidem, gerando radiação de raios X (22). Uma barreira de raios X (24) é provida com uma abertura (26) para formar um feixe de raios X emitido (28) a partir da radiação de raios X, em que O feixe de raios X emitido possui uma formação de feixe (30) com um eixo central (32). O pelo menos um sensor de raios X é disposto dentro da formação de feixe e mede a intensidade de raios X para uma direção específica da emissão de raios X com um ângulo (34) em relação ao eixo central. O pelo menos um sensor de raios X pode ser posicionado dentro da formação de feixe 30, porém fora do “campo de visão real” conforme determinado por um diafragma 36.
BR112013011030A 2010-11-08 2011-11-02 Fonte de raios x, sistema de aquisição de imagens por raios x, método para determinar alterações no rendimento de emissões de raios x de um tubo de raios x, elemento de programa de computador para controlar um aparelho e meio legível por computador BR112013011030A8 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP10190389 2010-11-08
PCT/IB2011/054871 WO2012069944A1 (en) 2010-11-08 2011-11-02 Determining changes in the x-ray emission yield of an x-ray source

Publications (2)

Publication Number Publication Date
BR112013011030A2 BR112013011030A2 (pt) 2016-09-13
BR112013011030A8 true BR112013011030A8 (pt) 2017-11-07

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
BR112013011030A BR112013011030A8 (pt) 2010-11-08 2011-11-02 Fonte de raios x, sistema de aquisição de imagens por raios x, método para determinar alterações no rendimento de emissões de raios x de um tubo de raios x, elemento de programa de computador para controlar um aparelho e meio legível por computador

Country Status (7)

Country Link
US (1) US9370084B2 (pt)
EP (1) EP2638558B1 (pt)
JP (1) JP5951624B2 (pt)
CN (1) CN103201818B (pt)
BR (1) BR112013011030A8 (pt)
RU (1) RU2013126530A (pt)
WO (1) WO2012069944A1 (pt)

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Also Published As

Publication number Publication date
US9370084B2 (en) 2016-06-14
JP2014503941A (ja) 2014-02-13
US20130223594A1 (en) 2013-08-29
RU2013126530A (ru) 2014-12-20
CN103201818A (zh) 2013-07-10
EP2638558B1 (en) 2018-02-07
EP2638558A1 (en) 2013-09-18
CN103201818B (zh) 2016-10-12
WO2012069944A8 (en) 2013-05-23
WO2012069944A1 (en) 2012-05-31
BR112013011030A2 (pt) 2016-09-13
JP5951624B2 (ja) 2016-07-13

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Legal Events

Date Code Title Description
B25D Requested change of name of applicant approved

Owner name: KONINKLIJKE PHILIPS N.V. (NL)

B25G Requested change of headquarter approved

Owner name: KONINKLIJKE PHILIPS N.V. (NL)

B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE A 7A ANUIDADE.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2486 DE 28-08-2018 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.