ES1153636Y - Dispositivo de inspección por Rayos X para inspeccionar los bajos de un vehículo - Google Patents
Dispositivo de inspección por Rayos X para inspeccionar los bajos de un vehículoInfo
- Publication number
- ES1153636Y ES1153636Y ES201600176U ES201600176U ES1153636Y ES 1153636 Y ES1153636 Y ES 1153636Y ES 201600176 U ES201600176 U ES 201600176U ES 201600176 U ES201600176 U ES 201600176U ES 1153636 Y ES1153636 Y ES 1153636Y
- Authority
- ES
- Spain
- Prior art keywords
- inspect
- underside
- vehicle
- inspection device
- ray inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000007689 inspection Methods 0.000 title 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2008—Measuring radiation intensity with scintillation detectors using a combination of different types of scintillation detectors, e.g. phoswich
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2006—Measuring radiation intensity with scintillation detectors using a combination of a scintillator and photodetector which measures the means radiation intensity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/201—Measuring radiation intensity with scintillation detectors using scintillating fibres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20181—Stacked detectors, e.g. for measuring energy and positional information
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20185—Coupling means between the photodiode and the scintillator, e.g. optical couplings using adhesives with wavelength-shifting fibres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T3/00—Measuring neutron radiation
- G01T3/06—Measuring neutron radiation with scintillation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T5/00—Recording of movements or tracks of particles; Processing or analysis of such tracks
- G01T5/08—Scintillation chambers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
- H01L27/14658—X-ray, gamma-ray or corpuscular radiation imagers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T7/00—Details of radiation-measuring instruments
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Molecular Biology (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Toxicology (AREA)
- Geophysics (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Immunology (AREA)
- Analytical Chemistry (AREA)
- Pathology (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Measurement Of Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201261598576P | 2012-02-14 | 2012-02-14 | |
US201261598521P | 2012-02-14 | 2012-02-14 | |
US61/598521 | 2012-02-14 | ||
US61/598576 | 2012-02-14 | ||
US201261607066P | 2012-03-06 | 2012-03-06 | |
US61/607066 | 2012-03-06 |
Publications (2)
Publication Number | Publication Date |
---|---|
ES1153636U ES1153636U (es) | 2016-03-31 |
ES1153636Y true ES1153636Y (es) | 2016-07-08 |
Family
ID=48945537
Family Applications (4)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES201600176U Expired - Fee Related ES1153636Y (es) | 2012-02-14 | 2013-02-04 | Dispositivo de inspección por Rayos X para inspeccionar los bajos de un vehículo |
ES201600177U Expired - Fee Related ES1153640Y (es) | 2012-02-14 | 2013-02-04 | Aparato para detectar rayos X incidentes en el aparato |
ES201500706U Expired - Fee Related ES1154460Y (es) | 2012-02-14 | 2013-02-04 | Dispositivo de portal de inspección por rayos X |
ES13749372.2T Active ES2685971T3 (es) | 2012-02-14 | 2013-02-04 | Inspección de rayos X usando detectores de centelleo acoplados mediante fibra con desplazamiento de longitud de onda |
Family Applications After (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES201600177U Expired - Fee Related ES1153640Y (es) | 2012-02-14 | 2013-02-04 | Aparato para detectar rayos X incidentes en el aparato |
ES201500706U Expired - Fee Related ES1154460Y (es) | 2012-02-14 | 2013-02-04 | Dispositivo de portal de inspección por rayos X |
ES13749372.2T Active ES2685971T3 (es) | 2012-02-14 | 2013-02-04 | Inspección de rayos X usando detectores de centelleo acoplados mediante fibra con desplazamiento de longitud de onda |
Country Status (18)
Country | Link |
---|---|
US (4) | US9285488B2 (es) |
EP (1) | EP2825904B1 (es) |
JP (6) | JP2015513075A (es) |
KR (4) | KR20200044997A (es) |
CN (4) | CN104204854B (es) |
BR (1) | BR112014019517B1 (es) |
CA (2) | CA2864354C (es) |
CL (1) | CL2014002144U1 (es) |
DE (2) | DE202013012103U1 (es) |
ES (4) | ES1153636Y (es) |
GT (1) | GT201400009U (es) |
HK (3) | HK1202633A1 (es) |
IL (3) | IL234076B (es) |
MX (1) | MX337476B (es) |
PE (1) | PE20150237Z (es) |
PL (2) | PL125720U1 (es) |
RU (1) | RU2606698C2 (es) |
WO (1) | WO2013122763A1 (es) |
Families Citing this family (67)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9958569B2 (en) | 2002-07-23 | 2018-05-01 | Rapiscan Systems, Inc. | Mobile imaging system and method for detection of contraband |
US10898732B2 (en) * | 2010-04-16 | 2021-01-26 | Maureen Petterson | Multi-color charged particle detector apparatus and method of use thereof |
US10532228B2 (en) * | 2010-04-16 | 2020-01-14 | Maureen Petterson | Multi-color charged particle detector apparatus and method of use thereof |
US8884236B2 (en) * | 2010-06-21 | 2014-11-11 | American Science And Engineering, Inc. | Detector with active collimators |
GB2501857B (en) | 2011-02-08 | 2017-06-07 | Rapiscan Systems Inc | Covert surveillance using multi-modality sensing |
US10670740B2 (en) | 2012-02-14 | 2020-06-02 | American Science And Engineering, Inc. | Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors |
CA2864354C (en) * | 2012-02-14 | 2023-02-28 | American Science And Engineering, Inc. | X-ray inspection using wavelength-shifting fiber-coupled scintillation detectors |
US9182361B2 (en) | 2013-05-28 | 2015-11-10 | Ann Arbor Digital Devices Inc. | Digital X-ray imaging system with still and video capture modes |
RO130582B1 (ro) * | 2014-01-23 | 2021-12-30 | Mb Telecom Ltd. S.R.L. | Sistem şi metodă pentru inspecţia completă şi neintruzivă a aeronavelor |
WO2015131105A1 (en) * | 2014-02-27 | 2015-09-03 | Saint-Gobain Ceramics & Plastics, Inc. | Scintillator stack, device including the scintillator stack, and method for making the scintillator stack |
US9707710B2 (en) | 2014-02-27 | 2017-07-18 | Saint-Gobain Ceramics And Plastics, Inc. | Scintillator stack, device including the scintillator stack, and method for making the scintillator stack |
US11266006B2 (en) | 2014-05-16 | 2022-03-01 | American Science And Engineering, Inc. | Method and system for timing the injections of electron beams in a multi-energy x-ray cargo inspection system |
WO2015175751A1 (en) | 2014-05-16 | 2015-11-19 | American Science And Engineering, Inc. | Source for intra-pulse multi-energy x-ray cargo inspection |
US10459111B2 (en) * | 2014-05-23 | 2019-10-29 | Radiabeam Technologies, Llc | System and method for adaptive X-ray cargo inspection |
CN104035123B (zh) * | 2014-06-27 | 2017-02-15 | 中国电子科技集团公司第八研究所 | 一种基于闪烁体与光纤耦合的β表面污染探测装置及方法 |
WO2016003547A1 (en) | 2014-06-30 | 2016-01-07 | American Science And Engineering, Inc. | Rapidly relocatable modular cargo container scanner |
CN105425273A (zh) * | 2014-09-17 | 2016-03-23 | 中国科学技术大学 | 一种用于测量高通量x射线能谱的吸收体阵列的装置及方法 |
US10762998B2 (en) | 2014-11-20 | 2020-09-01 | Viken Detection Corporation | X-ray scanning system |
MX2017009342A (es) * | 2015-01-20 | 2017-11-17 | American Science & Eng Inc | Punto focal dinamicamente ajustable. |
DE102015101764A1 (de) * | 2015-02-06 | 2016-08-11 | Thermo Fisher Scientific Messtechnik Gmbh | Vorrichtung und Verfahren zur Detektion von radioaktiver Strahlung |
MX2017011342A (es) | 2015-03-04 | 2018-05-04 | Rapiscan Systems Inc | Detector de energia multiple. |
PL3271709T3 (pl) * | 2015-03-20 | 2023-02-20 | Rapiscan Systems, Inc. | Ręczny przenośny system kontroli rozpraszania wstecznego |
US9753151B2 (en) | 2015-07-31 | 2017-09-05 | General Electric Company | Light guide array for pet detector fabrication methods and apparatus |
KR20180041763A (ko) * | 2015-09-10 | 2018-04-24 | 아메리칸 사이언스 앤 엔지니어링, 인크. | 선형 적응적 전자기 x-선 스캐닝을 이용한 후방산란 특성화 |
US10067261B2 (en) | 2015-09-15 | 2018-09-04 | Halliburton Energy Services, Inc. | Downhole photon radiation detection using scintillating fibers |
CN108450029B (zh) | 2015-11-09 | 2021-07-20 | 美国科学及工程股份有限公司 | 移动x射线扫描速度控制 |
WO2017219225A1 (en) * | 2016-06-21 | 2017-12-28 | Shenzhen Genorivision Technology Co. Ltd. | Biosensor |
GB2552537B (en) * | 2016-07-28 | 2020-05-27 | Smiths Heimann Sas | Inspection system with source of radiation and method |
WO2018036265A1 (zh) * | 2016-08-25 | 2018-03-01 | 北京华力兴科技发展有限责任公司 | 一种用于车辆安全检查的成像装置及其方法 |
CN106290427A (zh) * | 2016-10-17 | 2017-01-04 | 北京君和信达科技有限公司 | 背散射成像方法及系统 |
CN106483153A (zh) * | 2016-12-23 | 2017-03-08 | 同方威视技术股份有限公司 | 双能探测器及辐射检查系统 |
CN106526688A (zh) * | 2016-12-28 | 2017-03-22 | 同方威视技术股份有限公司 | 背散射检查车 |
US10393680B2 (en) * | 2017-01-18 | 2019-08-27 | The Boeing Company | X-ray sidescatter inspection of laminates |
CN110199373B (zh) | 2017-01-31 | 2021-09-28 | 拉皮斯坎系统股份有限公司 | 大功率x射线源与操作方法 |
WO2018156718A1 (en) * | 2017-02-25 | 2018-08-30 | Anatoly Glass, LLC. | Converter plate for producing polychromatic light |
US10770195B2 (en) | 2017-04-05 | 2020-09-08 | Viken Detection Corporation | X-ray chopper wheel assembly |
DE102017108535A1 (de) * | 2017-04-21 | 2018-10-25 | Grünbeck Wasseraufbereitung GmbH | Membranmodul sowie Vorrichtung und Verfahren zur Detektion von Ablagerungen in einem Membranmodul |
WO2018208559A1 (en) * | 2017-05-08 | 2018-11-15 | Saint-Gobain Ceramics & Plastics, Inc. | Article including a body including a fluorescent material and a wavelength shifting fiber, a radiation detector including the article, and a method of using the same |
JP2018141767A (ja) * | 2017-07-13 | 2018-09-13 | 三菱電機プラントエンジニアリング株式会社 | タイヤハウス汚染検査装置およびタイヤハウス汚染自動検査方法 |
CN108227027B (zh) * | 2017-12-29 | 2020-12-01 | 同方威视技术股份有限公司 | 车载背散射检查系统 |
CN108008458B (zh) * | 2017-12-29 | 2020-09-08 | 同方威视技术股份有限公司 | 车载背散射检查系统 |
US10114131B1 (en) | 2018-01-05 | 2018-10-30 | Consolidated Nuclear Security, LLC | Scintillator based fiber optic plate for neutron imaging applications and the like |
CN111699413A (zh) * | 2018-02-02 | 2020-09-22 | 维肯检测公司 | 用于x射线反向散射成像的具有可移除检测器的系统和套件 |
EP3811117A4 (en) * | 2018-06-20 | 2022-03-16 | American Science & Engineering, Inc. | SCINTILLATION DETECTORS COUPLED TO WAVELENGTH OFFSET SHEET |
IL260956B (en) * | 2018-08-02 | 2022-01-01 | Applied Materials Israel Ltd | Electron detection sensor |
DE102018220135A1 (de) * | 2018-11-23 | 2020-05-28 | Siemens Healthcare Gmbh | Röntgendetektor, Bildgebungsvorrichtung und Verfahren zum Betrieb eines Röntgendetektors |
CN109444182B (zh) * | 2018-12-22 | 2024-07-23 | 苏州瑞派宁科技有限公司 | 一种闪烁晶体测试装置 |
US11112370B2 (en) * | 2019-01-04 | 2021-09-07 | The Boeing Company | Reconfigurable backscatter detector |
GB2595389B (en) * | 2019-01-08 | 2023-04-26 | American Science & Eng Inc | Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors |
CN109828300B (zh) * | 2019-01-31 | 2023-05-05 | 兰州空间技术物理研究所 | 一种小型化全向空间粒子探测器 |
CN109655874B (zh) * | 2019-02-25 | 2020-04-10 | 衡阳师范学院 | 闪烁室测氡装置和方法 |
US10830714B1 (en) * | 2019-07-26 | 2020-11-10 | The Boeing Company | Portable X-ray backscattering system |
WO2021021808A1 (en) * | 2019-07-29 | 2021-02-04 | Saint-Gobain Ceramics & Plastics, Inc. | Plastic wavelength shifting fiber and a method of making the same |
WO2021085401A1 (ja) * | 2019-10-31 | 2021-05-06 | 株式会社クラレ | プラスチックシンチレーションファイバ及びその製造方法 |
CN110988964B (zh) * | 2019-12-09 | 2022-11-22 | 上海大学 | 复合型光纤辐射探测器 |
RU2730392C1 (ru) * | 2020-01-14 | 2020-08-21 | Российская Федерация, от имени которой выступает Государственная корпорация по атомной энергии "Росатом" (Госкорпорация "Росатом") | Сцинтилляционный детектор нейтронов |
US11193898B1 (en) | 2020-06-01 | 2021-12-07 | American Science And Engineering, Inc. | Systems and methods for controlling image contrast in an X-ray system |
US11681068B2 (en) | 2020-06-02 | 2023-06-20 | Viken Detection Corporation | X-ray imaging apparatus and method |
US11175245B1 (en) | 2020-06-15 | 2021-11-16 | American Science And Engineering, Inc. | Scatter X-ray imaging with adaptive scanning beam intensity |
EP3933881A1 (en) | 2020-06-30 | 2022-01-05 | VEC Imaging GmbH & Co. KG | X-ray source with multiple grids |
WO2022059298A1 (ja) * | 2020-09-16 | 2022-03-24 | 株式会社クラレ | プラスチックシンチレーションファイバ及びその製造方法 |
EP4231057A1 (en) * | 2020-10-15 | 2023-08-23 | Kuraray Co., Ltd. | Plastic scintillating fiber and production method therefor |
US11340361B1 (en) | 2020-11-23 | 2022-05-24 | American Science And Engineering, Inc. | Wireless transmission detector panel for an X-ray scanner |
CN117295940A (zh) * | 2021-05-05 | 2023-12-26 | 万睿视影像有限公司 | 反向散射成像系统 |
EP4105691A1 (en) | 2021-06-16 | 2022-12-21 | Soletanche Freyssinet | Gamma and neutron radiation detector |
US12019035B2 (en) | 2021-07-16 | 2024-06-25 | Rapiscan Holdings, Inc. | Material detection in x-ray security screening |
CN114180291B (zh) * | 2021-11-10 | 2022-08-05 | 深圳市日联科技有限公司 | 叠片电池视觉纠偏装置及纠偏方法 |
Family Cites Families (152)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4045672A (en) | 1975-09-11 | 1977-08-30 | Nihon Denshi Kabushiki Kaisha | Apparatus for tomography comprising a pin hole for forming a microbeam of x-rays |
US4242583A (en) | 1978-04-26 | 1980-12-30 | American Science And Engineering, Inc. | X-ray imaging variable resolution |
US4259582A (en) * | 1979-11-02 | 1981-03-31 | Albert Richard D | Plural image signal system for scanning x-ray apparatus |
JPS60159675A (ja) * | 1984-01-31 | 1985-08-21 | Shimadzu Corp | 放射線検出器 |
US4788436A (en) | 1986-12-24 | 1988-11-29 | Walter Koechner | Radiation sensitive optical fiber and detector |
DE3841136A1 (de) * | 1988-12-07 | 1990-06-13 | Hoechst Ag | Strahlungsdetektor |
US5281820A (en) * | 1988-07-12 | 1994-01-25 | Hoechst Aktiengesellschaft | Radiation detector |
JPH03257391A (ja) * | 1990-03-08 | 1991-11-15 | Mitsubishi Atom Power Ind Inc | X線照射分布計測装置 |
US5784507A (en) * | 1991-04-05 | 1998-07-21 | Holm-Kennedy; James W. | Integrated optical wavelength discrimination devices and methods for fabricating same |
EP0533316B1 (en) | 1991-06-21 | 1995-10-25 | Kabushiki Kaisha Toshiba | X-ray detector and examination system |
JPH0627249A (ja) * | 1992-07-13 | 1994-02-04 | Toshiba Corp | 放射線検査装置 |
US5420959A (en) | 1992-12-17 | 1995-05-30 | Nanoptics Incorporated | High efficiency, high resolution, real-time radiographic imaging system |
JP3496958B2 (ja) * | 1993-09-01 | 2004-02-16 | 富士写真フイルム株式会社 | 放射線検出器、画像読出処理条件決定方法および照射野認識方法 |
JPH07211877A (ja) * | 1994-01-21 | 1995-08-11 | Hamamatsu Photonics Kk | 放射線像検出器及び放射線像検出装置 |
FR2716012B1 (fr) * | 1994-02-09 | 1996-04-12 | Corning Inc | Procédé et dispositif d'assemblage d'extrémités de fibres optiques disposées en nappe. |
US5600144A (en) * | 1994-05-10 | 1997-02-04 | Trustees Of Boston University | Three dimensional imaging detector employing wavelength-shifting optical fibers |
FR2725722B1 (fr) * | 1994-10-14 | 1997-01-03 | Atochem Elf Sa | Copolymere fluore a tenue thermique amelioree, son procede de preparation et son utilisation comme revetement protecteur de substrats |
CN1161103A (zh) * | 1995-06-27 | 1997-10-01 | 菲利浦电子有限公司 | X射线检测器 |
GB2303938A (en) * | 1995-07-31 | 1997-03-05 | Stc Submarine Systems Ltd | Optical fibre cable having kingwire bearing extruded thermoplastic elastomer layers |
US5764683B1 (en) | 1996-02-12 | 2000-11-21 | American Science & Eng Inc | Mobile x-ray inspection system for large objects |
JP3813656B2 (ja) * | 1996-03-07 | 2006-08-23 | 株式会社東芝 | 光ファイバ型大面積放射線モニタ |
DE19610538A1 (de) * | 1996-03-18 | 1997-09-25 | Deutsches Krebsforsch | Strahlungsermittlungsvorrichtung |
JPH10232284A (ja) * | 1997-02-19 | 1998-09-02 | Toshiba Corp | 波長シフト型放射線センサおよび放射線検出装置 |
JPH10288671A (ja) * | 1997-04-15 | 1998-10-27 | Toshiba Corp | 位置検出型放射線検出装置 |
US6078052A (en) | 1997-08-29 | 2000-06-20 | Picker International, Inc. | Scintillation detector with wavelength-shifting optical fibers |
EP1012586A2 (en) | 1997-09-09 | 2000-06-28 | American Science & Engineering, Inc. | A tomographic inspection system |
US5968425A (en) * | 1997-10-28 | 1999-10-19 | The United States Of America As Represented By The United States Department Of Energy | Methods for the continuous production of plastic scintillator materials |
WO1999039189A2 (en) | 1998-01-28 | 1999-08-05 | American Science And Engineering, Inc. | Gated transmission and scatter detection for x-ray imaging |
JPH11271453A (ja) * | 1998-03-25 | 1999-10-08 | Toshiba Corp | 放射線弁別測定方法および放射線弁別測定装置 |
JP2923500B1 (ja) * | 1998-06-04 | 1999-07-26 | 株式会社東芝 | 放射線検出器および放射線計測システム、並びに放射線計測プログラムを記録したコンピュータ読み取り可能な記録媒体 |
US6442233B1 (en) | 1998-06-18 | 2002-08-27 | American Science And Engineering, Inc. | Coherent x-ray scatter inspection system with sidescatter and energy-resolved detection |
US6621888B2 (en) | 1998-06-18 | 2003-09-16 | American Science And Engineering, Inc. | X-ray inspection by coherent-scattering from variably disposed scatterers identified as suspect objects |
EP1113291A4 (en) * | 1998-07-15 | 2002-03-06 | Keiichi Kuroda | RADIATION IMAGING DEVICE |
EP1135700B1 (en) | 1998-11-30 | 2005-03-02 | American Science & Engineering, Inc. | Fan and pencil beams from a common source for x-ray inspection |
US6453007B2 (en) | 1998-11-30 | 2002-09-17 | American Science And Engineering, Inc. | X-ray inspection using co-planar pencil and fan beams |
US6320933B1 (en) | 1998-11-30 | 2001-11-20 | American Science And Engineering, Inc. | Multiple scatter system for threat identification |
US6421420B1 (en) | 1998-12-01 | 2002-07-16 | American Science & Engineering, Inc. | Method and apparatus for generating sequential beams of penetrating radiation |
US6249567B1 (en) * | 1998-12-01 | 2001-06-19 | American Science & Engineering, Inc. | X-ray back scatter imaging system for undercarriage inspection |
EP1147406A1 (en) | 1998-12-22 | 2001-10-24 | American Science & Engineering, Inc. | Unilateral hand-held x-ray inspection apparatus |
US6459764B1 (en) * | 1999-01-27 | 2002-10-01 | American Science And Engineering, Inc. | Drive-through vehicle inspection system |
JP2000235078A (ja) * | 1999-02-15 | 2000-08-29 | Toshiba Corp | 放射線検出用構造体と、それを用いた放射線検出器および放射線検査装置 |
JP2000304865A (ja) * | 1999-04-23 | 2000-11-02 | Hitachi Ltd | 光伝送式放射線計測装置及びその計測システム |
US6391434B1 (en) * | 1999-05-06 | 2002-05-21 | General Electric Company | Composite scintillator material and method of manufacture |
JP4313895B2 (ja) * | 1999-06-04 | 2009-08-12 | 株式会社東芝 | 放射線検出装置 |
JP2001013254A (ja) | 1999-06-29 | 2001-01-19 | Mitsubishi Heavy Ind Ltd | 平板状中性子線検出器及びこれを用いた中性子源計測装置 |
JP2001013250A (ja) | 1999-06-30 | 2001-01-19 | Toshiba Corp | 汚染検査装置 |
US6546072B1 (en) | 1999-07-30 | 2003-04-08 | American Science And Engineering, Inc. | Transmission enhanced scatter imaging |
US6459761B1 (en) | 2000-02-10 | 2002-10-01 | American Science And Engineering, Inc. | Spectrally shaped x-ray inspection system |
US7010094B2 (en) * | 2000-02-10 | 2006-03-07 | American Science And Engineering, Inc. | X-ray inspection using spatially and spectrally tailored beams |
JP4351780B2 (ja) * | 2000-02-15 | 2009-10-28 | 株式会社東芝 | 放射線検出装置 |
US6671451B1 (en) | 2000-03-10 | 2003-12-30 | Wired Japan Co., Ltd. | Optical fiber, optical fiber cable, and radiation detecting system using such |
US8325871B2 (en) | 2000-03-28 | 2012-12-04 | American Science And Engineering, Inc. | Radiation threat detection |
US6576907B1 (en) * | 2000-06-01 | 2003-06-10 | Elgems Ltd. | High count rate gamma camera system |
JP2002071816A (ja) * | 2000-08-29 | 2002-03-12 | Japan Atom Energy Res Inst | 2次元放射線および中性子イメージ検出器 |
US6907281B2 (en) * | 2000-09-07 | 2005-06-14 | Ge Medical Systems | Fast mapping of volumetric density data onto a two-dimensional screen |
JP4552020B2 (ja) * | 2001-01-29 | 2010-09-29 | 独立行政法人 日本原子力研究開発機構 | 放射線および中性子イメージ検出器 |
US6658087B2 (en) | 2001-05-03 | 2003-12-02 | American Science And Engineering, Inc. | Nautical X-ray inspection system |
JP4203710B2 (ja) * | 2001-12-28 | 2009-01-07 | 株式会社日立メディコ | X線画像処理装置 |
US6542580B1 (en) * | 2002-01-15 | 2003-04-01 | Rapiscan Security Products (Usa), Inc. | Relocatable X-ray imaging system and method for inspecting vehicles and containers |
US7122804B2 (en) * | 2002-02-15 | 2006-10-17 | Varian Medical Systems Technologies, Inc. | X-ray imaging device |
US20040256565A1 (en) * | 2002-11-06 | 2004-12-23 | William Adams | X-ray backscatter mobile inspection van |
US8275091B2 (en) | 2002-07-23 | 2012-09-25 | Rapiscan Systems, Inc. | Compact mobile cargo scanning system |
US9958569B2 (en) | 2002-07-23 | 2018-05-01 | Rapiscan Systems, Inc. | Mobile imaging system and method for detection of contraband |
US7369643B2 (en) * | 2002-07-23 | 2008-05-06 | Rapiscan Security Products, Inc. | Single boom cargo scanning system |
US8503605B2 (en) | 2002-07-23 | 2013-08-06 | Rapiscan Systems, Inc. | Four sided imaging system and method for detection of contraband |
US6853707B2 (en) * | 2002-09-05 | 2005-02-08 | Agilent Technologies, Inc. | Shielded x-ray detector |
US20090257555A1 (en) | 2002-11-06 | 2009-10-15 | American Science And Engineering, Inc. | X-Ray Inspection Trailer |
US7505556B2 (en) | 2002-11-06 | 2009-03-17 | American Science And Engineering, Inc. | X-ray backscatter detection imaging modules |
US7099434B2 (en) | 2002-11-06 | 2006-08-29 | American Science And Engineering, Inc. | X-ray backscatter mobile inspection van |
US6909098B2 (en) * | 2002-12-03 | 2005-06-21 | Universities Research Association Inc. | Systems and methods for detecting nuclear radiation in the presence of backgrounds |
US7067079B2 (en) | 2002-12-03 | 2006-06-27 | Universities Research Association, Inc. | Extruded plastic scintillator including inorganic powders |
US6927397B2 (en) * | 2002-12-03 | 2005-08-09 | Universities Research Association, Inc. | Systems and methods for detecting neutrons |
US7149393B2 (en) * | 2002-12-09 | 2006-12-12 | Eastman Kodak Company | Apparatus and method for forming a fiber optic faceplate |
CA2508169C (en) * | 2002-12-10 | 2012-07-17 | Brian David Sowerby | Radiographic equipment |
US6965662B2 (en) | 2002-12-17 | 2005-11-15 | Agilent Technologies, Inc. | Nonplanar x-ray target anode for use in a laminography imaging system |
US20040140431A1 (en) * | 2003-01-21 | 2004-07-22 | Cti Pet Systems, Inc. | Multi-application highly reflective grid array |
US20050058242A1 (en) | 2003-09-15 | 2005-03-17 | Peschmann Kristian R. | Methods and systems for the rapid detection of concealed objects |
US7054408B2 (en) * | 2003-04-30 | 2006-05-30 | General Electric Company | CT detector array having non pixelated scintillator array |
US7366282B2 (en) | 2003-09-15 | 2008-04-29 | Rapiscan Security Products, Inc. | Methods and systems for rapid detection of concealed objects using fluorescence |
US7856081B2 (en) | 2003-09-15 | 2010-12-21 | Rapiscan Systems, Inc. | Methods and systems for rapid detection of concealed objects using fluorescence |
JP4406699B2 (ja) | 2003-08-29 | 2010-02-03 | 独立行政法人 日本原子力研究開発機構 | 光ファイバを利用した放射線及び中性子検出器 |
JP2005214869A (ja) | 2004-01-30 | 2005-08-11 | Toshiba Corp | 当量線量型放射線検出器 |
US7115875B1 (en) | 2004-02-17 | 2006-10-03 | Photodetection Systems, Inc. | PET scanner with photodetectors and wavelength shifting fibers |
US7400701B1 (en) | 2004-04-09 | 2008-07-15 | American Science And Engineering, Inc. | Backscatter inspection portal |
WO2005103759A1 (en) | 2004-04-20 | 2005-11-03 | Forimtech Sa | Large area radiation imaging detector |
US7141799B1 (en) * | 2005-03-30 | 2006-11-28 | Ut-Battelle, Llc | Fiber optic thermal/fast neutron and gamma ray scintillation detector |
US7471764B2 (en) | 2005-04-15 | 2008-12-30 | Rapiscan Security Products, Inc. | X-ray imaging system having improved weather resistance |
DE102005017557B4 (de) * | 2005-04-16 | 2010-11-04 | Mirion Technologies (Rados) Gmbh | Leichtgewichtiger Flächendetektor für Teilchenstrahlung kontaminierter Objekte |
US7335891B2 (en) * | 2005-06-27 | 2008-02-26 | General Electric Company | Gamma and neutron radiation detector |
EP1949139A2 (en) | 2005-10-24 | 2008-07-30 | American Science & Engineering, Inc. | X-ray inspection based on scatter detection |
KR100773993B1 (ko) * | 2006-03-10 | 2007-11-08 | (주)케이디티 | 광여기 시트 |
US20090230295A1 (en) * | 2006-03-29 | 2009-09-17 | Australian Nuclear Science & Technology Organisation | Measurement of hydraulic conductivity using a radioactive or activatable tracer |
EP2010943A2 (en) | 2006-04-21 | 2009-01-07 | American Science & Engineering, Inc. | X-ray imaging of baggage and personnel using arrays of discrete sources and multiple collimated beams |
JP4455534B2 (ja) * | 2006-05-09 | 2010-04-21 | 株式会社東芝 | 放射線検出器およびその製造方法 |
US8842808B2 (en) | 2006-08-11 | 2014-09-23 | American Science And Engineering, Inc. | Scatter attenuation tomography using a monochromatic radiation source |
MY142674A (en) | 2006-08-11 | 2010-12-15 | American Science & Eng Inc | X-ray inspection with contemporaneous and proximal transmission and backscatter imaging |
WO2008024825A2 (en) | 2006-08-23 | 2008-02-28 | American Science And Engineering, Inc. | Scatter attenuation tomography |
US7924979B2 (en) | 2006-08-23 | 2011-04-12 | American Science And Engineering, Inc. | Scatter attenuation tomography |
CN101568855A (zh) * | 2006-10-24 | 2009-10-28 | 塞莫尼根分析技术有限责任公司 | 利用编码光束检查目标的设备 |
GB0626055D0 (en) * | 2006-12-29 | 2007-11-07 | Bae Systems Plc | Detection of ionising radiation |
US7842908B2 (en) * | 2007-08-14 | 2010-11-30 | Raytheon Company | Sensor for eye-safe and body-fixed semi-active laser guidance |
CN101960333B (zh) * | 2007-11-19 | 2016-01-20 | 美国科技工程公司 | 用于人员筛查的多重图像的收集和合成 |
US8314399B2 (en) * | 2008-02-07 | 2012-11-20 | General Electric Company | Radiation detector with optical waveguide and neutron scintillating material |
GB0803640D0 (en) | 2008-02-28 | 2008-04-02 | Rapiscan Security Products Inc | Scanning systems |
CN101971054B (zh) * | 2008-03-13 | 2013-08-21 | 皇家飞利浦电子股份有限公司 | 辐射检测应用中的低功率TDC-ADC和Anger逻辑 |
US20090230925A1 (en) | 2008-03-14 | 2009-09-17 | Nathan Nathan | Power Saver |
US8017906B2 (en) * | 2008-04-08 | 2011-09-13 | Robert Sigurd Nelson | Slit and slot scan, SAR, and compton devices and systems for radiation imaging |
GB0809107D0 (en) | 2008-05-20 | 2008-06-25 | Rapiscan Security Products Inc | Scannign systems |
GB0810638D0 (en) | 2008-06-11 | 2008-07-16 | Rapiscan Security Products Inc | Photomultiplier and detection systems |
WO2010005977A2 (en) * | 2008-07-07 | 2010-01-14 | University Of Florida Research Foundation, Inc. | Method and apparatus for x-ray radiographic imaging |
JP2008304947A (ja) * | 2008-09-11 | 2008-12-18 | Sumitomo Bakelite Co Ltd | 光導波路および光導波路構造体 |
CN101710182A (zh) * | 2008-09-19 | 2010-05-19 | 圣戈本陶瓷及塑料股份有限公司 | 形成闪烁设备的方法 |
US7795650B2 (en) * | 2008-12-09 | 2010-09-14 | Teledyne Scientific & Imaging Llc | Method and apparatus for backside illuminated image sensors using capacitively coupled readout integrated circuits |
WO2010129926A1 (en) | 2009-05-07 | 2010-11-11 | The Regents Of The University Of California | Novel lanthanide doped barium mixed halide scintillators |
US8275092B1 (en) | 2009-06-15 | 2012-09-25 | American Science And Engineering, Inc. | Three-dimensional mapping based on scattered penetrating radiation |
US8824632B2 (en) * | 2009-07-29 | 2014-09-02 | American Science And Engineering, Inc. | Backscatter X-ray inspection van with top-down imaging |
MY154268A (en) | 2009-07-29 | 2015-05-29 | American Science & Eng Inc | Top-down x-ray inspection trailer |
US8698088B2 (en) | 2009-10-07 | 2014-04-15 | Saint-Gobain Ceramics & Plastics, Inc. | System and method to detect target radiation |
US8483356B2 (en) * | 2009-10-29 | 2013-07-09 | Rapiscan Systems, Inc. | Mobile aircraft inspection system |
EP3686902A1 (en) | 2009-12-03 | 2020-07-29 | Rapiscan Systems, Inc. | Time of flight backscatter imaging system |
US8199875B2 (en) * | 2009-12-11 | 2012-06-12 | General Electric Company | System and method of acquiring multi-energy CT imaging data |
JP5548892B2 (ja) * | 2010-01-08 | 2014-07-16 | 独立行政法人日本原子力研究開発機構 | ピクセル型二次元イメージ検出器 |
JP2011158291A (ja) * | 2010-01-29 | 2011-08-18 | Hamamatsu Photonics Kk | 放射線像変換パネル |
CN201754188U (zh) * | 2010-02-03 | 2011-03-02 | 中国原子能科学研究院 | 塑料闪烁体探测器光电倍增管固定装置 |
CN102884422B (zh) | 2010-02-25 | 2016-09-28 | 拉皮斯坎系统股份有限公司 | 用以确定物质的原子序数的、高能量x射线的基于光谱学的检查系统和方法 |
WO2011106745A1 (en) | 2010-02-26 | 2011-09-01 | Rapiscan Systems, Inc. | Integrated portable checkpoint system |
JP2011227044A (ja) * | 2010-03-30 | 2011-11-10 | Fujifilm Corp | 放射線撮影装置 |
JP2010181412A (ja) * | 2010-03-15 | 2010-08-19 | Toshiba Corp | 放射線弁別測定方法および放射線弁別測定装置 |
JP5376528B2 (ja) * | 2010-05-06 | 2013-12-25 | 独立行政法人日本原子力研究開発機構 | 放射線および中性子イメージ検出器 |
US8637826B2 (en) | 2010-06-18 | 2014-01-28 | Saint-Gobain Ceramics & Plastics, Inc. | Radiation detection system including a scintillating material and an optical fiber and method of using the same |
US8884236B2 (en) | 2010-06-21 | 2014-11-11 | American Science And Engineering, Inc. | Detector with active collimators |
GB2482024A (en) * | 2010-07-16 | 2012-01-18 | Symetrica Ltd | Radiation Detector |
US8796636B2 (en) * | 2010-09-13 | 2014-08-05 | Parttec, Ltd. | Neutron detector having enhanced absorption and bifurcated detection elements |
US8592775B2 (en) * | 2010-10-27 | 2013-11-26 | Partec, Ltd. | Radiation detector having a ribbed scintillator |
US8908831B2 (en) | 2011-02-08 | 2014-12-09 | Rapiscan Systems, Inc. | Covert surveillance using multi-modality sensing |
GB2501857B (en) | 2011-02-08 | 2017-06-07 | Rapiscan Systems Inc | Covert surveillance using multi-modality sensing |
US8442186B2 (en) | 2011-02-08 | 2013-05-14 | American Science And Engineering, Inc. | Backscatter energy analysis for classification of materials based on positional non-commutativity |
EP2697631A2 (en) | 2011-04-15 | 2014-02-19 | American Science & Engineering, Inc. | Backscatter system with variable size of detector array |
US9146201B2 (en) | 2012-02-02 | 2015-09-29 | American Science And Engineering, Inc. | Convertible scan panel for x-ray inspection |
AU2013215064B2 (en) | 2012-02-03 | 2015-10-22 | Rapiscan Systems, Inc. | Combined scatter and transmission multi-view imaging system |
CA2864354C (en) * | 2012-02-14 | 2023-02-28 | American Science And Engineering, Inc. | X-ray inspection using wavelength-shifting fiber-coupled scintillation detectors |
JP6114981B2 (ja) | 2012-10-17 | 2017-04-19 | 株式会社リガク | X線発生装置 |
AU2014212158B2 (en) | 2013-01-31 | 2017-04-20 | Rapiscan Systems, Inc. | Portable security inspection system |
US9417060B1 (en) | 2013-07-25 | 2016-08-16 | American Science And Engineering, Inc. | X-ray theodolite |
US9535019B1 (en) | 2013-10-04 | 2017-01-03 | American Science And Engineering, Inc. | Laterally-offset detectors for long-range x-ray backscatter imaging |
JP6367969B2 (ja) * | 2014-04-17 | 2018-08-01 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | 高いアスペクト比を有することが可能である感光要素を有する放射線検出器 |
WO2016003547A1 (en) | 2014-06-30 | 2016-01-07 | American Science And Engineering, Inc. | Rapidly relocatable modular cargo container scanner |
CN104597479A (zh) * | 2014-12-30 | 2015-05-06 | 中国原子能科学研究院 | 中子位置探测装置 |
CN107407622A (zh) | 2015-01-16 | 2017-11-28 | 拉皮斯坎系统股份有限公司 | 用于检测感兴趣材料的非侵入检查系统和方法 |
KR20180041763A (ko) | 2015-09-10 | 2018-04-24 | 아메리칸 사이언스 앤 엔지니어링, 인크. | 선형 적응적 전자기 x-선 스캐닝을 이용한 후방산란 특성화 |
GB2572700A (en) | 2016-09-30 | 2019-10-09 | American Science & Eng Inc | X-Ray source for 2D scanning beam imaging |
CN207752159U (zh) * | 2017-09-27 | 2018-08-21 | 清华大学 | 阵列式大面积总放探测装置 |
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- 2019-04-12 CN CN201980088326.5A patent/CN113302521B/zh active Active
- 2019-12-26 JP JP2019235372A patent/JP2020060590A/ja active Pending
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2021
- 2021-07-30 JP JP2021125145A patent/JP7138751B2/ja active Active
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