GT201400009U - Inspección de rayos x utilizando longitud de onda de fibra optica de cambio acoplada con detectores de centelleo - Google Patents
Inspección de rayos x utilizando longitud de onda de fibra optica de cambio acoplada con detectores de centelleoInfo
- Publication number
- GT201400009U GT201400009U GT201400009U GT201400009U GT201400009U GT 201400009 U GT201400009 U GT 201400009U GT 201400009 U GT201400009 U GT 201400009U GT 201400009 U GT201400009 U GT 201400009U GT 201400009 U GT201400009 U GT 201400009U
- Authority
- GT
- Guatemala
- Prior art keywords
- detectors
- centelleo
- wave length
- optical fiber
- ray inspection
- Prior art date
Links
- 239000013307 optical fiber Substances 0.000 title abstract 2
- 239000000835 fiber Substances 0.000 title 1
- 238000007689 inspection Methods 0.000 title 1
- 230000005855 radiation Effects 0.000 abstract 2
- 230000005540 biological transmission Effects 0.000 abstract 1
- 238000001514 detection method Methods 0.000 abstract 1
- 230000010354 integration Effects 0.000 abstract 1
- 239000000463 material Substances 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 230000003287 optical effect Effects 0.000 abstract 1
- 230000000149 penetrating effect Effects 0.000 abstract 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2008—Measuring radiation intensity with scintillation detectors using a combination of different types of scintillation detectors, e.g. phoswich
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2006—Measuring radiation intensity with scintillation detectors using a combination of a scintillator and photodetector which measures the means radiation intensity
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/201—Measuring radiation intensity with scintillation detectors using scintillating fibres
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20181—Stacked detectors, e.g. for measuring energy and positional information
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20185—Coupling means between the photodiode and the scintillator, e.g. optical couplings using adhesives with wavelength-shifting fibres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T3/00—Measuring neutron radiation
- G01T3/06—Measuring neutron radiation with scintillation detectors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T5/00—Recording of movements or tracks of particles; Processing or analysis of such tracks
- G01T5/08—Scintillation chambers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
- H01L27/14658—X-ray, gamma-ray or corpuscular radiation imagers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T7/00—Details of radiation-measuring instruments
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Toxicology (AREA)
- Geophysics (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Immunology (AREA)
- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Measurement Of Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Crystallography & Structural Chemistry (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
UN DETECTOR Y LOS MÉTODOS PARA INSPECCIONAR MATERIAL SOBRE LA BASE DE UN CENTELLOGRAFO ACOPLADO POR FIBRA ÓPTICA DE LONGITUD DE ONDA CAMBIANTE A UNO O MÁS FOTO-DETECTORES, CON UNA INTEGRACIÓN TEMPORAL DE LA SEÑAL DEL FOTO-DETECTOR. UN VOLUMEN NO PIXELAZO DE MEDIO DE CENTELLEO CONVIERTE LA ENERGÍA DE LA RADIACIÓN INCIDENTE Y PENETRANTE EN LUZ DE CENTELLO, LA CUAL SE EXTRAE DE UN ÁREA DE LUZ CENTELLANTE EXTRAÍBLE POR UNA PLURALIDAD DE ONDAS GUÍA ÓPTICAS. ESTA GEOMETRÍA OFRECE DETECTORES EFICIENTES Y COMPACTOS, PERMITIENDO GEOMETRÍAS HASTA AHORA INALCANZABLES PARA UNA DETECCIÓN DE RETRODISPERSIÓN Y PARA UNA DISCRIMINACIÓN DE ENERGÍA DE RADIACIÓN INCIDENTE. ENERGÍA ADICIONAL DE RESOLUCIÓN DE LAS CONFIGURACIONES DE TRANSMISIÓN ESTÁN HABILITADAS COMO LA COMPENSACIÓN DE DESVIACIÓN Y DE DESALINEACIÓN.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201261598521P | 2012-02-14 | 2012-02-14 | |
US201261598576P | 2012-02-14 | 2012-02-14 | |
US201261607066P | 2012-03-06 | 2012-03-06 |
Publications (1)
Publication Number | Publication Date |
---|---|
GT201400009U true GT201400009U (es) | 2015-07-08 |
Family
ID=48945537
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GT201400009U GT201400009U (es) | 2012-02-14 | 2014-08-14 | Inspección de rayos x utilizando longitud de onda de fibra optica de cambio acoplada con detectores de centelleo |
Country Status (18)
Country | Link |
---|---|
US (4) | US9285488B2 (es) |
EP (1) | EP2825904B1 (es) |
JP (6) | JP2015513075A (es) |
KR (4) | KR102266814B1 (es) |
CN (3) | CN107193034A (es) |
BR (1) | BR112014019517B1 (es) |
CA (2) | CA3080221A1 (es) |
CL (1) | CL2014002144U1 (es) |
DE (2) | DE202013012103U1 (es) |
ES (4) | ES1153636Y (es) |
GT (1) | GT201400009U (es) |
HK (3) | HK1202633A1 (es) |
IL (3) | IL234076B (es) |
MX (1) | MX337476B (es) |
PE (1) | PE20150237Z (es) |
PL (2) | PL125720U1 (es) |
RU (1) | RU2606698C2 (es) |
WO (1) | WO2013122763A1 (es) |
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2018
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- 2018-05-07 JP JP2018089172A patent/JP6525477B2/ja active Active
- 2018-05-07 JP JP2018089173A patent/JP2018136343A/ja active Pending
- 2018-05-31 IL IL259737A patent/IL259737B/en unknown
- 2018-05-31 IL IL259730A patent/IL259730A/en unknown
-
2019
- 2019-01-08 US US16/242,163 patent/US20190383953A1/en not_active Abandoned
- 2019-04-12 CN CN201980088326.5A patent/CN113302521B/zh active Active
- 2019-12-26 JP JP2019235372A patent/JP2020060590A/ja active Pending
-
2021
- 2021-07-30 JP JP2021125145A patent/JP7138751B2/ja active Active
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