SE0801550L - Ett för spektralanalys anpassat arrangemang - Google Patents

Ett för spektralanalys anpassat arrangemang

Info

Publication number
SE0801550L
SE0801550L SE0801550A SE0801550A SE0801550L SE 0801550 L SE0801550 L SE 0801550L SE 0801550 A SE0801550 A SE 0801550A SE 0801550 A SE0801550 A SE 0801550A SE 0801550 L SE0801550 L SE 0801550L
Authority
SE
Sweden
Prior art keywords
spectral analysis
light transmitting
wavelength component
pass
transmitting means
Prior art date
Application number
SE0801550A
Other languages
English (en)
Other versions
SE532551C2 (sv
Inventor
Hans Goeran Evald Martin
Original Assignee
Senseair Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Senseair Ab filed Critical Senseair Ab
Priority to SE0801550A priority Critical patent/SE532551C2/sv
Priority to CA2729459A priority patent/CA2729459A1/en
Priority to EP09773841A priority patent/EP2300806A1/en
Priority to US13/001,885 priority patent/US20110109905A1/en
Priority to KR1020107029807A priority patent/KR20110043549A/ko
Priority to PCT/SE2009/050705 priority patent/WO2010002326A1/en
Priority to CN2009801332317A priority patent/CN102132144B/zh
Priority to JP2011516220A priority patent/JP2011527006A/ja
Priority to AU2009266458A priority patent/AU2009266458A1/en
Publication of SE0801550L publication Critical patent/SE0801550L/sv
Publication of SE532551C2 publication Critical patent/SE532551C2/sv

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/021Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/42Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G01J3/427Dual wavelengths spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12Generating the spectrum; Monochromators
    • G01J2003/1226Interference filters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12Generating the spectrum; Monochromators
    • G01J2003/1226Interference filters
    • G01J2003/1243Pivoting IF or other position variation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12Generating the spectrum; Monochromators
    • G01J3/26Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
SE0801550A 2008-06-30 2008-06-30 Ett för spektralanalys anpassat arrangemang SE532551C2 (sv)

Priority Applications (9)

Application Number Priority Date Filing Date Title
SE0801550A SE532551C2 (sv) 2008-06-30 2008-06-30 Ett för spektralanalys anpassat arrangemang
CA2729459A CA2729459A1 (en) 2008-06-30 2009-06-10 Arrangement adapted for spectral analysis
EP09773841A EP2300806A1 (en) 2008-06-30 2009-06-10 Arrangement adapted for spectral analysis
US13/001,885 US20110109905A1 (en) 2008-06-30 2009-06-10 Arrangement adapted for spectral analysis
KR1020107029807A KR20110043549A (ko) 2008-06-30 2009-06-10 스펙트럼 분석용 장치
PCT/SE2009/050705 WO2010002326A1 (en) 2008-06-30 2009-06-10 Arrangement adapted for spectral analysis
CN2009801332317A CN102132144B (zh) 2008-06-30 2009-06-10 适配于光谱分析的装置
JP2011516220A JP2011527006A (ja) 2008-06-30 2009-06-10 スペクトル分析に適合する配置
AU2009266458A AU2009266458A1 (en) 2008-06-30 2009-06-10 Arrangement adapted for spectral analysis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0801550A SE532551C2 (sv) 2008-06-30 2008-06-30 Ett för spektralanalys anpassat arrangemang

Publications (2)

Publication Number Publication Date
SE0801550L true SE0801550L (sv) 2009-12-31
SE532551C2 SE532551C2 (sv) 2010-02-16

Family

ID=41466195

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0801550A SE532551C2 (sv) 2008-06-30 2008-06-30 Ett för spektralanalys anpassat arrangemang

Country Status (9)

Country Link
US (1) US20110109905A1 (sv)
EP (1) EP2300806A1 (sv)
JP (1) JP2011527006A (sv)
KR (1) KR20110043549A (sv)
CN (1) CN102132144B (sv)
AU (1) AU2009266458A1 (sv)
CA (1) CA2729459A1 (sv)
SE (1) SE532551C2 (sv)
WO (1) WO2010002326A1 (sv)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE533411C2 (sv) * 2008-08-28 2010-09-21 Senseair Ab Ett för en spektralanalys av en komprimerad gas, såsom en gas vid små gaskoncentrationer vid atmosfärstryck, anpassat arrangemang
KR101746872B1 (ko) 2009-05-22 2017-06-14 제노시아 바이오사이언스, 인크. 단순 포진 바이러스 유형 2에 대한 백신: 면역 반응을 유도하는 조성물 및 방법
EP2782597B1 (en) 2011-11-23 2022-04-13 Genocea Biosciences, Inc. Nucleic acid vaccines against herpes simplex virus type 2: compositions and methods for eliciting an immune response
CN103257120A (zh) * 2013-05-20 2013-08-21 昆山市佰奥自动化设备科技有限公司 碳平衡法汽车燃料消耗量测试仪用含碳气体成分分析模块
WO2015010709A1 (en) * 2013-07-22 2015-01-29 Sentec Ag Sensor for detection of gas and method for detection of gas
FI125907B (sv) 2013-09-24 2016-03-31 Vaisala Oyj Förfarande och anordning för mätning av koncentrationen av gaser upplösta i vätskor
CN104698105A (zh) * 2014-04-15 2015-06-10 安徽中烟工业有限责任公司 基于可控等值比法模拟卷烟燃吸的分析装置
JPWO2017061094A1 (ja) * 2015-10-07 2018-08-02 パナソニックIpマネジメント株式会社 センサ
UA125139C2 (uk) * 2016-09-19 2022-01-19 Сорек'Ю Нукліар Ресьорч Сентер Система управління роботою системи рентгенівської флуоресценції для виявлення матеріалу, система рентгенівської флуоресценції для виявлення матеріалу та спосіб вимірювання на зразку для ідентифікації матеріалу з використанням рентгенівської флуоресценції
JP2019537555A (ja) 2016-09-28 2019-12-26 ジェノセア バイオサイエンシーズ, インコーポレイテッド ヘルペスを処置するための方法および組成物
DE102016012971B4 (de) 2016-10-28 2023-02-09 Drägerwerk AG & Co. KGaA Vorrichtung zur Konzentrationsbestimmung mindestens einer Gaskomponente in einem Atemgasgemisch
CN110462299B (zh) * 2017-04-06 2022-08-09 开利公司 中至低全球变暖潜能值制冷剂泄漏检测器及其操作方法
DE102017213865A1 (de) * 2017-08-09 2019-02-14 Robert Bosch Gmbh Spektrometrische Messvorrichtung und Verfahren zur Analyse eines Mediums unter Verwendung einer spektrometrischen Messvorrichtung
US11092727B2 (en) * 2018-06-29 2021-08-17 Viavi Solutions Inc. High-resolution single photodiode spectrometer using a narrowband optical filter
EP3864396B1 (en) * 2018-10-12 2023-12-06 Amphenol Thermometrics, Inc. Ndir sensor, sampling method and system for breath analysis
CN114424039B (zh) * 2019-09-20 2024-09-20 英福康有限公司 确定压力的方法和压力传感器
CN111190216B (zh) * 2020-01-23 2023-03-24 中国工程物理研究院激光聚变研究中心 一种辐射流探测器阵列

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE531709A (sv) * 1954-05-19
US3756726A (en) * 1971-03-29 1973-09-04 Barnes Eng Co Spectral analysis utilizing a beam-switching optical system
IL45788A (en) * 1974-10-04 1977-11-30 Yeda Res & Dev Thermoelectric detector
DE3830906A1 (de) * 1988-09-10 1990-03-15 Draegerwerk Ag Spiegelanordnung fuer einen strahlengang in einer vielfach-reflexionsmesszelle
FI91021C (sv) * 1988-11-04 1994-04-25 Instrumentarium Oy Anordning för identifiering av gaser och mätning av halten samt förfarande för identifiering av gaser
US5268782A (en) * 1992-01-16 1993-12-07 Minnesota Mining And Manufacturing Company Micro-ridged, polymeric liquid crystal display substrate and display device
JPH07128231A (ja) * 1993-11-08 1995-05-19 Matsushita Electric Ind Co Ltd 赤外線式ガスセンサー
FI102570B1 (sv) * 1995-12-29 1998-12-31 Instrumentarium Oy Förfarande och anordning för bestämning av alkoholhalten i en gasblandning
JP3745097B2 (ja) * 1997-10-14 2006-02-15 富士通株式会社 波長のモニタリング及び波長制御のための光デバイス
EP1150106A1 (de) * 2000-04-27 2001-10-31 Krieg, Gunther, Prof.Dr.Ing. Verfahren und Vorrichtung zur präzisen, quantitativen Stoffanalyse in Flüssigkeiten, Gasen und Feststoffen
DE10106079B4 (de) * 2001-02-08 2008-01-03 Deutsches Zentrum für Luft- und Raumfahrt e.V. Vorrichtung und Verfahren zur Durchführung interferometrischer Messungen
US7088441B2 (en) * 2002-09-19 2006-08-08 Mitutoyo Corporation Method and apparatus for measuring wavelength changes in a high-resolution measurement system
SE534082C2 (sv) * 2004-12-29 2011-04-26 Senseair Ab Ett gas detekterande arrangemang

Also Published As

Publication number Publication date
WO2010002326A1 (en) 2010-01-07
CN102132144A (zh) 2011-07-20
SE532551C2 (sv) 2010-02-16
US20110109905A1 (en) 2011-05-12
KR20110043549A (ko) 2011-04-27
JP2011527006A (ja) 2011-10-20
AU2009266458A1 (en) 2010-01-07
CA2729459A1 (en) 2010-01-07
CN102132144B (zh) 2012-12-26
EP2300806A1 (en) 2011-03-30

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