MX2015010805A - Material compuesto usado como un medidor de deformacion. - Google Patents

Material compuesto usado como un medidor de deformacion.

Info

Publication number
MX2015010805A
MX2015010805A MX2015010805A MX2015010805A MX2015010805A MX 2015010805 A MX2015010805 A MX 2015010805A MX 2015010805 A MX2015010805 A MX 2015010805A MX 2015010805 A MX2015010805 A MX 2015010805A MX 2015010805 A MX2015010805 A MX 2015010805A
Authority
MX
Mexico
Prior art keywords
elastomeric polymer
impact
composite material
axis
strain gauge
Prior art date
Application number
MX2015010805A
Other languages
English (en)
Other versions
MX349262B (es
Inventor
Aaron Jake Merrell
David T Fullwood
Anton E Bowden
Taylor D Remington
Original Assignee
Univ Brigham Young
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Brigham Young filed Critical Univ Brigham Young
Publication of MX2015010805A publication Critical patent/MX2015010805A/es
Publication of MX349262B publication Critical patent/MX349262B/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/16—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/16—Measuring force or stress, in general using properties of piezoelectric devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/18—Measuring force or stress, in general using properties of piezo-resistive materials, i.e. materials of which the ohmic resistance varies according to changes in magnitude or direction of force applied to the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
    • G01L5/0052—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes measuring forces due to impact
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00—Piezoelectric or electrostrictive devices
    • H10N30/01—Manufacture or treatment
    • H10N30/09—Forming piezoelectric or electrostrictive materials
    • H10N30/092—Forming composite materials
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00—Piezoelectric or electrostrictive devices
    • H10N30/30—Piezoelectric or electrostrictive devices with mechanical input and electrical output, e.g. functioning as generators or sensors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00—Piezoelectric or electrostrictive devices
    • H10N30/80—Constructional details
    • H10N30/85—Piezoelectric or electrostrictive active materials
    • H10N30/852—Composite materials, e.g. having 1-3 or 2-2 type connectivity
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49117—Conductor or circuit manufacturing

Abstract

En un aspecto general, un aparato comprende un material que incluye una mezcla no en capas de un polímero elastomérico con una pluralidad de huecos; y una pluralidad de agentes de relleno conductores colocados en el polímero elastomérico. El aparato puede producir una respuesta eléctrica a la deformación y, de esta manera, funciona como un medidor de deformación. Los agentes de relleno conductores pueden incluir nanopartículas conductoras y/o estabilizantes conductivos. En otro aspecto general, un método para medir la deformación de comprensión incluye detectar, a lo largo de un primer eje, una respuesta eléctrica general en respuesta a un impacto a un material compuesto uniforme que incluye agentes de relleno conductores y huecos colocados por todo el polímero elastomérico, y determinar una deformación del impacto basado en la respuesta eléctrica. El impacto puede ser a lo largo de un segundo eje diferente del primer eje.
MX2015010805A 2013-03-15 2014-03-14 Material compuesto usado como un medidor de deformacion. MX349262B (es)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201361789730P 2013-03-15 2013-03-15
US201361956394P 2013-06-08 2013-06-08
US201361960489P 2013-09-19 2013-09-19
US201361961970P 2013-10-28 2013-10-28
PCT/US2014/028984 WO2014144532A1 (en) 2013-03-15 2014-03-14 Composite material used as a strain gauge

Publications (2)

Publication Number Publication Date
MX2015010805A true MX2015010805A (es) 2016-02-05
MX349262B MX349262B (es) 2017-07-20

Family

ID=51537728

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2015010805A MX349262B (es) 2013-03-15 2014-03-14 Material compuesto usado como un medidor de deformacion.

Country Status (13)

Country Link
US (3) US10263174B2 (es)
EP (1) EP2973766B1 (es)
JP (2) JP6302041B2 (es)
KR (2) KR20150131241A (es)
CN (1) CN105190923B (es)
AU (1) AU2014229010B2 (es)
BR (1) BR112015022879B8 (es)
CA (1) CA2901848C (es)
IL (1) IL240703B (es)
MX (1) MX349262B (es)
NZ (1) NZ711183A (es)
RU (1) RU2664290C2 (es)
WO (1) WO2014144532A1 (es)

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