MX342037B - Metodo y aparto para determinar la ubicacion de una nterfaz de interes. - Google Patents

Metodo y aparto para determinar la ubicacion de una nterfaz de interes.

Info

Publication number
MX342037B
MX342037B MX2015009853A MX2015009853A MX342037B MX 342037 B MX342037 B MX 342037B MX 2015009853 A MX2015009853 A MX 2015009853A MX 2015009853 A MX2015009853 A MX 2015009853A MX 342037 B MX342037 B MX 342037B
Authority
MX
Mexico
Prior art keywords
location
determining
interest
interface
mathematical model
Prior art date
Application number
MX2015009853A
Other languages
English (en)
Other versions
MX2015009853A (es
Inventor
Lehikoinen Anssi
Voutilainen Arto
Laakkonen Pasi
Original Assignee
Rocsole Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rocsole Ltd filed Critical Rocsole Ltd
Publication of MX2015009853A publication Critical patent/MX2015009853A/es
Publication of MX342037B publication Critical patent/MX342037B/es

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N17/00—Investigating resistance of materials to the weather, to corrosion, or to light
    • G01N17/008—Monitoring fouling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/22—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/22—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
    • G01N27/221—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance by investigating the dielectric properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/22—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
    • G01N27/226—Construction of measuring vessels; Electrodes therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/22—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
    • G01N27/24—Investigating the presence of flaws

Landscapes

  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Biodiversity & Conservation Biology (AREA)
  • Ecology (AREA)
  • Environmental & Geological Engineering (AREA)
  • Environmental Sciences (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)

Abstract

Un método para determinar la ubicación de una interfaz de interés (18, 20), en un dominio de destino (13), entre un volumen libre (14) de un material capaz de fluir y un material sólido (11, 17) que limita dicho volumen libre, el método comprende las etapas de proporcionar un modelo matemático (21) del dominio de destino (13) que determina, para una pluralidad de pares de grupos de electrodos, una magnitud eléctrica característica proporcional a la capacitancia de un condensador formado por un par de grupos de electrodos; recibir las mediciones de la magnitud eléctrica característica para una pluralidad de pares de grupos de electrodos; ajustar el modelo matemático (21) con el fin de reducir las diferencias entre las magnitudes eléctricas características medidas y las definidas por el modelo matemático; y determinar la ubicación de la interfaz de interés (18, 20) en función del modelo matemático ajustado. Según la presente invención, la etapa de ajustar el modelo matemático comprende variar la ubicación de la superficie límite (18) con el fin de tener en cuenta, en la determinación de la ubicación de la interfaz de interés (18, 20), el posible desgaste de la superficie límite.
MX2015009853A 2013-02-01 2013-02-01 Metodo y aparto para determinar la ubicacion de una nterfaz de interes. MX342037B (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/FI2013/050113 WO2014118425A1 (en) 2013-02-01 2013-02-01 Method and apparatus for determining the location of an interface of interest, and computer program

Publications (2)

Publication Number Publication Date
MX2015009853A MX2015009853A (es) 2015-10-05
MX342037B true MX342037B (es) 2016-09-12

Family

ID=51261507

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2015009853A MX342037B (es) 2013-02-01 2013-02-01 Metodo y aparto para determinar la ubicacion de una nterfaz de interes.

Country Status (10)

Country Link
US (1) US10337978B2 (es)
EP (1) EP2951567B1 (es)
CN (1) CN104969064B (es)
AU (1) AU2013376379B2 (es)
BR (1) BR112015018571B1 (es)
CA (1) CA2897144C (es)
ES (1) ES2689104T3 (es)
MX (1) MX342037B (es)
RU (1) RU2635343C2 (es)
WO (1) WO2014118425A1 (es)

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CA2972940C (en) * 2015-01-09 2024-02-20 Rocsole Ltd Method for determining a quantity of interest in a target domain, apparatus, and computer program
US10458940B1 (en) * 2015-06-25 2019-10-29 Atlas Sensors, LLC Non-destructive instrument for detecting polymer inserts within polymer pipes fitted with a locator wire
WO2017103186A1 (en) * 2015-12-18 2017-06-22 Shell Internationale Research Maatschappij B.V. Inspecting a length of pipe, and inspection pig
WO2017203095A1 (en) * 2016-05-26 2017-11-30 Rocsole Ltd Determining an electrical property of interest of materials in a target region
US10281422B2 (en) * 2016-09-12 2019-05-07 Tech4Imaging Llc Displacement current phase tomography for imaging of lossy medium
US11408847B2 (en) 2017-06-13 2022-08-09 Tech4Imaging Llc Extreme-condition sensors for use with electrical capacitance volume tomography and capacitance sensing applications
US10788347B2 (en) 2017-07-19 2020-09-29 United States Of America As Represented By The Secretary Of The Air Force Method for estimating physical characteristics of two materials
WO2019048727A1 (en) 2017-09-06 2019-03-14 Rocsole Ltd ELECTRICAL TOMOGRAPHY OF VERTICAL PROFILING
RU2685559C1 (ru) * 2017-11-23 2019-04-22 Николай Дмитриевич Куликов Электроемкостный преобразователь для определения координат геометрического центра двумерной области (варианты)
CN108982602A (zh) * 2018-06-21 2018-12-11 中国民航大学 航空发动机进气道电容式静电感应监测系统
JP2020064013A (ja) * 2018-10-18 2020-04-23 Ｓｉｍｐｌｅｘ Ｑｕａｎｔｕｍ株式会社 配管、配管システム、及び配管管理方法
CN109557146B (zh) * 2019-01-11 2024-02-13 南京工程学院 一种金刚线断线检测装置及其断线预测方法
NO20190208A1 (en) * 2019-02-14 2020-08-17 Roxar Flow Measurement As Impedance layer estimation
CN110895129A (zh) * 2019-12-23 2020-03-20 东北电力大学 一种基于电容法的非金属管道污垢厚度检测装置及方法
CN111398369B (zh) * 2020-03-26 2022-09-16 青岛理工大学 一种ect传感器结构优化与电磁场分析方法

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Also Published As

Publication number Publication date
CN104969064B (zh) 2017-09-29
US20150355126A1 (en) 2015-12-10
AU2013376379A1 (en) 2015-07-16
CA2897144C (en) 2020-07-28
US10337978B2 (en) 2019-07-02
ES2689104T3 (es) 2018-11-08
BR112015018571A2 (pt) 2017-07-18
WO2014118425A1 (en) 2014-08-07
RU2015136863A (ru) 2017-03-07
AU2013376379B2 (en) 2017-12-14
BR112015018571B1 (pt) 2020-11-10
RU2635343C2 (ru) 2017-11-16
CN104969064A (zh) 2015-10-07
EP2951567A1 (en) 2015-12-09
EP2951567B1 (en) 2018-06-27
EP2951567A4 (en) 2016-11-02
MX2015009853A (es) 2015-10-05
CA2897144A1 (en) 2014-08-07

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