KR980006153A - 반도체 장치 및 그 제조방법 - Google Patents
반도체 장치 및 그 제조방법Info
- Publication number
- KR980006153A KR980006153A KR1019970027149A KR19970027149A KR980006153A KR 980006153 A KR980006153 A KR 980006153A KR 1019970027149 A KR1019970027149 A KR 1019970027149A KR 19970027149 A KR19970027149 A KR 19970027149A KR 980006153 A KR980006153 A KR 980006153A
- Authority
- KR
- South Korea
- Prior art keywords
- electrode
- semiconductor substrate
- semiconductor device
- substrate
- region
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 77
- 238000004519 manufacturing process Methods 0.000 title claims 6
- 239000000758 substrate Substances 0.000 claims abstract 61
- 239000002184 metal Substances 0.000 claims abstract 10
- 238000009792 diffusion process Methods 0.000 claims 5
- 239000000853 adhesive Substances 0.000 claims 3
- 230000001070 adhesive effect Effects 0.000 claims 3
- 239000004840 adhesive resin Substances 0.000 claims 3
- 229920006223 adhesive resin Polymers 0.000 claims 3
- 238000000034 method Methods 0.000 claims 3
- 239000004593 Epoxy Substances 0.000 claims 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims 2
- 239000000919 ceramic Substances 0.000 claims 2
- 239000011521 glass Substances 0.000 claims 2
- 239000011810 insulating material Substances 0.000 claims 2
- 229910052710 silicon Inorganic materials 0.000 claims 2
- 239000010703 silicon Substances 0.000 claims 2
- 229920005989 resin Polymers 0.000 claims 1
- 239000011347 resin Substances 0.000 claims 1
- 238000007789 sealing Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/18—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different subgroups of the same main group of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/60—Attaching or detaching leads or other conductive members, to be used for carrying current to or from the device in operation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/482—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/065—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L25/0657—Stacked arrangements of devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/05001—Internal layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/05001—Internal layers
- H01L2224/0502—Disposition
- H01L2224/05026—Disposition the internal layer being disposed in a recess of the surface
- H01L2224/05027—Disposition the internal layer being disposed in a recess of the surface the internal layer extending out of an opening
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/0556—Disposition
- H01L2224/05571—Disposition the external layer being disposed in a recess of the surface
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/05599—Material
- H01L2224/056—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/05617—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
- H01L2224/05624—Aluminium [Al] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/05599—Material
- H01L2224/056—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/05638—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/05647—Copper [Cu] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45117—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
- H01L2224/45124—Aluminium (Al) as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45144—Gold (Au) as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/8538—Bonding interfaces outside the semiconductor or solid-state body
- H01L2224/85399—Material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
- H01L2225/04—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/06513—Bump or bump-like direct electrical connections between devices, e.g. flip-chip connection, solder bumps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/02—Bonding areas ; Manufacturing methods related thereto
- H01L24/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L24/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L24/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01021—Scandium [Sc]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01078—Platinum [Pt]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/06—Polymers
- H01L2924/078—Adhesive characteristics other than chemical
- H01L2924/07802—Adhesive characteristics other than chemical not being an ohmic electrical conductor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/095—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00 with a principal constituent of the material being a combination of two or more materials provided in the groups H01L2924/013 - H01L2924/0715
- H01L2924/097—Glass-ceramics, e.g. devitrified glass
- H01L2924/09701—Low temperature co-fired ceramic [LTCC]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12042—LASER
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
- H01L2924/13055—Insulated gate bipolar transistor [IGBT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1306—Field-effect transistor [FET]
- H01L2924/13091—Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/1901—Structure
- H01L2924/1904—Component type
- H01L2924/19041—Component type being a capacitor
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Wire Bonding (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Abstract
본 발명의 반도체 장치에서는, 능동 소자가 형성된 반도체 기판의 일부를 전극으로서 활용하고, 표면에 제3전극, 이면에 외부 접속용으로서 제4 전극이 형성된 제2 반도체 기판을 갖기 때문에, 제2 반도체 가판을 외부 접속용 전극으로서 이용함으로써, 종래의 반도체 장치와 같이 외부 전극과 접속하는 금속제의 리드 단자, 보호용의 밀봉 몰드를 필요로 하지 않는 반도체 장치를 제공할 수 있다. 그 결과, 반도체 장치의 외관 치수를 현저하게 소형화로 할 수 있고, 실장 기판 상에 실장할 때의 불필요한 공간을 없앨 수 있어, 실장 기판의 소형화에 크게 기여할 수 있다.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제9도는 본 발명의 제2 실시 형태에 따른 반도체 장치의 단면도.
Claims (22)
- 반도체 장치에 있어서, 능동 소자를 구성하는 확산층이 내부에 형성되고, 표면에는 상기 능동 소자의 제1 전극이 형성되며, 또한 이면에는 상기 능동 소자의 제2 전극이 외부 접속용으로서 형성된 제1 반도체 기판과, 상기 제1 반도체 기판과 연속된 것이 슬릿을 통해 분리되고, 자신을 전극으로서 활용하여 표면에 제3 전극, 이면에 외부 접속용으로서 제4 전극이 형성된 제2 반도체 기판, 및 상기 제1 전극과 상기 제3 전극을 전기적으로 접속하는 접속 수단을 갖는 것을 특징으로 하는 반도체 장치.
- 제1항에 있어서, 상기 제2 전극과 상기 제4 전극의 표면이 동일면으로 되어 형성되는 것을 특징으로 하는 반도체 장치.
- 제1항에 있어서, 상기 제1 반도체 기판과 상기 제2 반도체 기판간의 슬릿은 절연 절착 수지로 고정되는 것을 특징으로 하는 반도체 장치.
- 제1항에 있어서, 상기 접속 수단은, 상기 제1 반도체 기판과 상기 제2 반도체 기판상에 피복된 절연층상에 형성되는 것을 특징으로 하는 반도체 장치.
- 제1항에 있어서, 상기 접속 수단은 금속의 가는 선으로 이루어지는 것을 특징으로 하는 반도체 장치.
- 제1항에 있어서, 상기 슬릿을 구성하는 상기 반도체 기판의 엣지 부분이 테이퍼로 이루어지는 것을 특징으로 하는 반도체 장치.
- 반도체 장치에 있어서, 능동 소자를 구성하는 확산층이 내부에 형성되고, 표면에는 상기 능동 소자의 제1 전극이 형성되며, 또한 이면에는 상기 능동 소자의 제2 전극이 외부 접속용으로서 형성된 제1 반도체 기판과, 상기 제1 반도체 소자의 연속된 것이 슬릿을 통해 분리되고, 자신을 전극으로서 활용하여 표면에 제3 전극, 이면에 외부 접속용으로서 제4 전극이 형성된 제2 반도체 기판, 및 상기 제1 전극과 상기 제3 전극을 전기적으로 접속하는 접속 수단이 그 표면에 형성된 배선 기판을 갖는 것을 특징으로 하는 반도체 장치.
- 제7항에 있어서, 상기 배선 기판은, 실리콘 기판, 유리 에폭시 기판, 세라믹 기판 또는 절연 처리된 금속 기판으로 이루어지는 것을 특징으로 하는 반도체 장치.
- 제7항에 있어서, 상기 제2 전극과 상기 제4 전극의 표면이 동일면으로 되어 형성되는 것을 특징으로 하는 반도체 장치.
- 제7항에 있어서, 상기 제1 반도체 기판과 상기 제2 반도체 기판간의 슬릿은, 절연 접착 수지로 고정되는 것을 특징으로 하는 반도체 장치.
- 제7항에 있어서, 상기 슬릿을 구성하는 상기 반도체 기판의 엣지 부분이 테이퍼로 이루어진 것을 특징으로 하는 반도체 장치.
- 제7항에 있어서, 상기 제1, 제3 전극상에 설치된 제1 금속 범프와, 상기 제1 금속 범프와 대응하여 상기 배선 기판상의 접속 수단에 고착된 제2 금속 범프, 및 상기 제1 금속 범프와 상기 제2 금속 범프 사이를 전기적으로 접속하는 접합층을 갖는 것을 특징으로 하는 반도체 장치.
- 반도체 장치에 있어서, 트랜지스터를 구성하는 확산층이 내부에 형성되고, 표면에는 상기 트랜지스터의 제어 전극 및 전류 유출측(또는 전류 유입측)의 전극이 형성되며, 또한 이면에는 상기 트랜지스터의 전류 유입측(또는 전류 유출측)의 전극이 형성된 제1 반도체 기판과, 상기 제1 반도체 기판과 연속한 것이 슬릿을 통해 분리되고, 자신을 전극으로서 활용하여 표면측에 형성된 제1 전극 및 이면에 형성된 제2 전극이 형성된 제2 반도체 기판과, 상기 제1 반도체 기판과 연속한 것이 슬릿을 통해 분리되고, 자신을 전극으로서 활용하여 표면측에 형성된 제3 전극 및 이면에 형성된 제4 전극이 형성된 제3 반도체 기판과, 상기 제어 전극과 상기 제1 전극, 상기 전류 유출측(전류 유입측)의 전극과 상기 제3 전극을 접속하고, 상기 제1 반도체 기판, 상기 제2 반도체 기판 및 상기 제3 반도체 기판상에 배치된 접속 수단을 갖는 것을 특징으로 하는 반도체 장치.
- 제13항에 있어서, 상기 배선 기판은, 제1 반도체 기판, 제2 반도체 기판 및 제3 반도체 기판상에 배치되고, 실리콘 기판, 유리 애폭시 기판, 세라믹 기판 또는 절연 처리된 금속 기판으로 이루어지는 것을 특징으로 하는 반도체 장치.
- 제13항에 있어서, 상기 전류 유입측(또는 전류 유출측)의 전극, 상기 제2 전극 및 상기 제4 전극의 표면이 동일면으로 이루어져 형성되는 것을 특징으로 하는 반도체 장치.
- 제13항에 있어서, 상기 제1 반도체 기판과 상기 제2 반도체 기판간의 슬릿, 상기 제1 반도체 기판과 상기 제3 반도체 기판간의 슬릿은, 절연 접착 수지로 고정되는 것을 특징으로 하는 반도체 장치.
- 제13항에 있어서, 상기 슬릿을 구성하는 상기 반도체 기판의 앳지 부분이 테이퍼로 이루어진 것을 특징으로 하는 반도체 장치.
- 반도체 장치의 제조 방법에 있어서, 능동 소자를 구성하는 확산층이 내부에 형성되고, 표면에는 상기 능동 소자의 제1 전극이 형성되며, 또한 이면에는 상기 능동 소자의 제2 전극이 외부 접속용으로서 형성된 제1 영역과, 자신을 전극으로서 활용하여 표면에 제3 전극, 이면에 외부 접속용으로서 제4 전극이 형성된 제2 영역을 갖는 반도체 기판을 준비하는 공정과, 상기 반도체 기판상의 접착성 절연 재료로 유지되어 상기 제1 전극과 상기 제3 전극을 전기적으로 접속하는 접속 수단을 형성하는 공정, 및 상기 제1 영역과 상기 제2 영역사이에서, 상기 반도체 기판의 이면으로부터 표면까지 연장되는 슬릿과, 상기 제1 영역과 상기 제2 영역이 일체로 되어 하나의 장치로서 분리되는 슬릿을 형성하는 공정을 갖는 반도체 장치의 제조 방법.
- 제18항에 있어서, 상기 반도체 기판상의 접착성 절연 재료로 유지되어 상기 제1 전극과 상기 제3 전극을 전기적으로 접속하는 접속 수단을 형성하는 공정을, 상기 반도체 기판과 접착 유지된 배선 기판에 설치된 상기 제1 전극과 상기 제3 전극을 전기적으로 접속하는 수단을 형성하는 공정으로 치환하는 것을 특징으로 하는 반도체 장치의 제조 방법.
- 반도체 장치의 제조 방법에 있어서, 트랜지스터를 구성하는 확산층이 내부에 형성되고, 표면에는 상기 트랜지스터의 제어 전극 및 전류 유출측(또는 전류 유입측)의 전극이 형성되며, 또한 이면에는 상기 트랜지스터의 전류 유입측(또는 전류 유출측)의 전극이 형성된 제1 영역과, 자신을 전극으로서 활용하여 표면측에 형성된 제1 전극 및 이면에 형성된 제2 전극이 형성된 제2 영역과, 자신을 전극으로서 활용하여 표면측에 형성된 제3 전극 및 이면측에 형성된 제4 전극이 형성된 제3 영역을 갖는 반도체 기판을 준비하는 공정과, 상기 제어 전극과 상기 제1 전극, 상기 전류 유출측(전류 유입측)의 전극과 상기 제3 전극을 접속하는 배선 패턴을, 상기 제1 반도체 기판, 상기 제2 반도체 기판 및 상기 제3 반도체 기판상의 접착 수지에 의해 유지하는 공정, 및 상기 제1 영역, 상기 제2 영역 및 제3 영역 사이에서, 상기 반도체 기판의 이면으로부터 표면까지 연장되는 슬릿과, 상기 제1 영역, 상기 제2 영역 및 제3 영역이 일체로 되어 상기 반도체 기판으로부터 하나의 트랜지스터 장치로서 분리되는 슬릿을 형성하는 공정을 갖는 것을 특징으로 하는 반도체 장치의 제조 방법.
- 제20항에 있어서, 상기 제어 전극과 상기 제1 전극, 상기 전류 유출측(전류 유입측)의 전극과 상기 제3 전극을 접속하는 배선 패턴을, 상기 제1 반도체 기판, 상기 제2 반도체 기판 및 상기 제3 반도체 기판상의 접착수지에 의해 유지하는 공정을, 상기 배선 패턴을, 상기 제1 반도체 기판, 상기 제2 반도체 기판 및 상기 제3 반도체 기판상에 설치된 배선 기판에 형성하는 공정으로 치환하는 것을 특징으로 하는 반도체 장치의 제조 방법.
- 제18항에 있어서, 상기 슬릿은 다이싱에 의해 형성되는 것을 특징으로 하는 반도체 장치의 제조 방법.
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16600696A JP3717597B2 (ja) | 1996-06-26 | 1996-06-26 | 半導体装置 |
JP96-166006 | 1996-06-26 | ||
JP8170283A JPH1022336A (ja) | 1996-06-28 | 1996-06-28 | 半導体装置の製造方法 |
JP96-170283 | 1996-06-28 | ||
JP96-170282 | 1996-06-28 | ||
JP17028296A JP3609540B2 (ja) | 1996-06-28 | 1996-06-28 | 半導体装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR980006153A true KR980006153A (ko) | 1998-03-30 |
KR100254661B1 KR100254661B1 (ko) | 2000-05-01 |
Family
ID=27322614
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019970027149A KR100254661B1 (ko) | 1996-06-26 | 1997-06-25 | 반도체 장치 및 그 제조 방법 |
Country Status (2)
Country | Link |
---|---|
US (1) | US6075279A (ko) |
KR (1) | KR100254661B1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109690351A (zh) * | 2016-09-23 | 2019-04-26 | 深圳帧观德芯科技有限公司 | 半导体x射线检测器的封装 |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3904058B2 (ja) * | 1998-10-30 | 2007-04-11 | セイコーエプソン株式会社 | 半導体装置及びその製造方法、回路基板並びに電子機器 |
JP2000164800A (ja) * | 1998-11-30 | 2000-06-16 | Mitsubishi Electric Corp | 半導体モジュール |
US6396138B1 (en) * | 2000-02-15 | 2002-05-28 | International Rectifier Corporation | Chip array with two-sided cooling |
US6894397B2 (en) * | 2001-10-03 | 2005-05-17 | International Rectifier Corporation | Plural semiconductor devices in monolithic flip chip |
US7480718B2 (en) * | 2004-06-28 | 2009-01-20 | International Business Machines Corporation | Method for providing single sign-on user names for Web cookies in a multiple user information directory environment |
DE102004041888B4 (de) * | 2004-08-30 | 2007-03-08 | Infineon Technologies Ag | Herstellungsverfahren für eine Halbleitervorrichtung mit gestapelten Halbleiterbauelementen |
JP4400441B2 (ja) * | 2004-12-14 | 2010-01-20 | 三菱電機株式会社 | 半導体装置 |
US7548111B2 (en) * | 2005-01-19 | 2009-06-16 | Micro Mobio Corporation | Miniature dual band power amplifier with reserved pins |
WO2007000697A2 (en) * | 2005-06-29 | 2007-01-04 | Koninklijke Philips Electronics N.V. | Method of manufacturing an assembly and assembly |
KR20100095268A (ko) * | 2009-02-20 | 2010-08-30 | 삼성전자주식회사 | 반도체 패키지 및 그 제조 방법 |
WO2010109572A1 (ja) * | 2009-03-23 | 2010-09-30 | トヨタ自動車株式会社 | 半導体装置 |
EP2887387A1 (en) * | 2013-12-20 | 2015-06-24 | Nxp B.V. | Semiconductor device and associated method |
US20150241477A1 (en) * | 2014-02-27 | 2015-08-27 | Texas Instruments Incorporated | Effective and efficient solution for pin to pad contactor on wide range of smd package tolerances using a reverse funnel design anvil handler mechanism |
US10852321B2 (en) | 2016-08-19 | 2020-12-01 | Delta Design, Inc. | Test handler head having reverse funnel design |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0740609B2 (ja) * | 1985-12-20 | 1995-05-01 | セイコー電子工業株式会社 | 半導体装置の製造方法 |
JPH0821670B2 (ja) * | 1990-02-27 | 1996-03-04 | ローム株式会社 | 合成樹脂封止型電子部品 |
JPH05129473A (ja) * | 1991-11-06 | 1993-05-25 | Sony Corp | 樹脂封止表面実装型半導体装置 |
JP3115155B2 (ja) * | 1993-05-28 | 2000-12-04 | 株式会社東芝 | 半導体装置およびその製造方法 |
JP2792532B2 (ja) * | 1994-09-30 | 1998-09-03 | 日本電気株式会社 | 半導体装置の製造方法及び半導体ウエハー |
US5723907A (en) * | 1996-06-25 | 1998-03-03 | Micron Technology, Inc. | Loc simm |
-
1997
- 1997-06-24 US US08/881,356 patent/US6075279A/en not_active Expired - Lifetime
- 1997-06-25 KR KR1019970027149A patent/KR100254661B1/ko not_active IP Right Cessation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109690351A (zh) * | 2016-09-23 | 2019-04-26 | 深圳帧观德芯科技有限公司 | 半导体x射线检测器的封装 |
CN109690351B (zh) * | 2016-09-23 | 2022-12-09 | 深圳帧观德芯科技有限公司 | 半导体x射线检测器的封装 |
Also Published As
Publication number | Publication date |
---|---|
US6075279A (en) | 2000-06-13 |
KR100254661B1 (ko) | 2000-05-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR980006153A (ko) | 반도체 장치 및 그 제조방법 | |
US6593647B2 (en) | Semiconductor device | |
KR20010109149A (ko) | 면설치형 전자회로유닛 | |
KR930024140A (ko) | 반도체장치 및 그 제조방법 | |
JP3099382B2 (ja) | 小型発振器 | |
KR880005685A (ko) | 혼성집적회로 | |
US20050012165A1 (en) | Semiconductor device | |
JPH07283334A (ja) | 気密封止電子部品 | |
KR100208635B1 (ko) | 표면 실장형 반도체 장치 | |
JPS6227544B2 (ko) | ||
JPH0993077A (ja) | 素子複合搭載回路基板 | |
JPH0637421A (ja) | 混成集積回路 | |
JP3048707B2 (ja) | 混成集積回路 | |
JP2816084B2 (ja) | 半田塗布方法、半導体装置の製造方法およびスキージ | |
JPH05129505A (ja) | 電子回路素子搭載用リードフレーム | |
JP2674073B2 (ja) | 集積回路装置 | |
JPH0364934A (ja) | 樹脂封止型半導体装置 | |
JPH0240936A (ja) | 半導体装置のパッケージ | |
JP3248117B2 (ja) | 半導体装置 | |
JPH04106941A (ja) | 樹脂封止型半導体装置 | |
WO1995010852A1 (en) | Bonding of leads directly over chip active areas | |
JPS62108545A (ja) | プリント基板型パッケ−ジ | |
KR200148753Y1 (ko) | 반도체 패키지 | |
JPH088138Y2 (ja) | 半導体の実装構造 | |
JPH05335480A (ja) | 電力用半導体モジュール |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20080122 Year of fee payment: 9 |
|
LAPS | Lapse due to unpaid annual fee |