KR970030761A - 노치가 형성된 전도층을 포함한 패키지 - Google Patents
노치가 형성된 전도층을 포함한 패키지 Download PDFInfo
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- KR970030761A KR970030761A KR1019960057066A KR19960057066A KR970030761A KR 970030761 A KR970030761 A KR 970030761A KR 1019960057066 A KR1019960057066 A KR 1019960057066A KR 19960057066 A KR19960057066 A KR 19960057066A KR 970030761 A KR970030761 A KR 970030761A
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Abstract
기판(1)과, 기판내에 형성된 전도층(2, 3)과, 제 1관통구멍(TH3)을 통하여 전도층에 접속된 내부 리드소자(8) 및 제 2관통구멍(TH1, TH2)을 통하여 전도층에 접속된 외부 리드소자(3, 4)를 포함하는 패키지에서, 노치(9, 10)는 제 1관통구멍과 제 2관통구멍에 근접하여 전도층 내에 형성된다.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
도 3은 본 발명에 따른 패키지의 실시예 1을 나타내는 부분절단 투시도.
Claims (14)
- 기판(1)과, 기판내에 형성된 전도층(2, 3)과, 제 1관통구멍(TH3)을 통하여 전도층에 접속된 내부 리드소자(8)및 제2관통구멍(TH1, TH2)을 통하여 상기 전도층에 접속된 외부 리드소자(3, 4)를 구비하는 패키지에 있어서, 노치(9,10)가 상기 제1관통구멍 및 제2관통구멍에 근접하여 상기 전도층 내에 형성되는 것을 특징으로 하는 패키지.
- 제 1항에 있어서, 상기 노치(9)는 상기 제 1관통구멍과 제 2관통구멍의 바깥쪽에 위치되는 것을 특징으로 하는 패키지.
- 제 2항에 있어서, 상기 노치(10)는 상기 제 1관통구멍과 제 2관통구멍 사이의 상기 전도층의 부분(3a)의 바깥쪽에 위치되는 것을 특징으로 하는 패키지.
- 제 3항에 있어서, 상기 노치는 다른 전도층(11)을 따라 위치되는 것을 특징으로 하는 패키지.
- 제 4항에 있어서, 상기 노치들 사이의 간격은 상기 다른 전도층의 폭의 약 4배인 것을 특징으로 하는 패키지.
- 제 1항에 있어서, 상기 전도층에 접속된 바이패스 콘덴서(12)를 추가로 포함하는 것을 특징으로 하는 패키지.
- 제 6항에 있어서, 노치(12a, 12b)가 상기 바이패스 콘덴서와 상기 전도층의 접속부에 근접하여 상기 전도층내에 제공되는 것을 특징으로 하는 패키지.
- 박막 기판(1)과, 상기 박막 기판내에 형성된 제 1전도층 및 제 2전도층(2, 3)과, 제 1관통구멍을 통하여 상기 제 1전도층에 접속된 제 1내부리드 소자와, 제 1관통구멍(TH3)을 통하여 상기 제 1전도층에 접속된 제 2내부 리드 소자(8)와, 상기 제 3관통구멍(TH1)을 통하여 상기 제 1전도층에 접속된 제 1외부 리드 소자(8) 및 제 4관통구멍(TH2)을 통하여 상기 제 2전도층에 접속된 제 2외부 리드소자(8)를 구비하는 패키지에 있어서, 한쌍의 제 1노치가 상기 제 1관통구멍과 제 3관통구멍에 근접하여 상기 제 1전도층내에 각각 형성되며, 한쌍의 제 2노치(9)가 상기 제 2관통구멍과 제 2관통구멍에 근접하여 상기 제 2전도층내에 각각 형성되는 것을 특징으로 하는 패키지.
- 제 8항에 있어서, 상기 한쌍의 제 1노치는 상기 제 1관통구멍 및 제 3관통구멍의 바깥쪽에 위치되고, 상기 한쌍의 제 2노치는 상기 제 2관통구멍과 제 4관통구멍의 바깥쪽에 위치되는 것을 특징으로 하는 패키지.
- 제 8항에 있어서, 상기 한쌍의 제 1노치는 상기 제 1관통구멍과 제 3관통구멍 사이의 상기 제 1전도층의 부분의 바깥쪽에 위치되고, 상기 한쌍의 제 2노치는 상기 제 2관통구멍과 제 4관통구멍사이의 상기 한쌍의 제 2전도층 부분의 바깥쪽에 위치되는 것을 특징으로 하는 패키지.
- 제 10항에 있어서, 상기 한쌍의 제 1노치는 제 1신호층을 따라 위치되고, 상기 한쌍의 제 2노치는 제 2신호층(11)을 따라 위치되는 것을 특징으로 하는 패키지.
- 제 11항에 있어서, 상기 한쌍의 제 1노치 사이의 간격은 상기 제 1신호층의 폭의 약 4배이며, 상기 한쌍의 제 2노치사이의 간격은 상기 제 2신호층의 폭의 약 4배인 것을 특징으로 하는 패키지.
- 제 8항에 있어서, 제 5관통구멍(TH4)을 통하여 상기 제 1전도층에 접속된 제 1전극과, 제 6관통구멍(TH5)을 통하여 상기 제 2전도층에 접속된 제 2전극을 가진 바이패스 콘덴서(12)를 추가로 구비한 것을 특징으로 하는 패키지.
- 제 13항에 있어서, 노치(12a)가 상기 제 5관통구멍에 근접하여 상기 제 1전도층내에 제공되고, 노치(12b)가 상기 제 6관통구멍에 근접하여 상기 제 2전도층내에 제공되는 것을 특징으로 하는 패키지.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP95-329816 | 1995-11-25 | ||
JP7329816A JP2755239B2 (ja) | 1995-11-25 | 1995-11-25 | 半導体装置用パッケージ |
Publications (2)
Publication Number | Publication Date |
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KR970030761A true KR970030761A (ko) | 1997-06-26 |
KR100232385B1 KR100232385B1 (ko) | 1999-12-01 |
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Application Number | Title | Priority Date | Filing Date |
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KR1019960057066A KR100232385B1 (ko) | 1995-11-25 | 1996-11-25 | 노치가 형성된 전도층을 포함한 패키지 |
Country Status (3)
Country | Link |
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US (1) | US5793098A (ko) |
JP (1) | JP2755239B2 (ko) |
KR (1) | KR100232385B1 (ko) |
Families Citing this family (6)
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JP3926880B2 (ja) * | 1997-03-31 | 2007-06-06 | 富士通株式会社 | 多層プリント板 |
US6106923A (en) * | 1997-05-20 | 2000-08-22 | Fujitsu Limited | Venting hole designs for multilayer conductor-dielectric structures |
JP3794792B2 (ja) * | 1997-07-22 | 2006-07-12 | Tdk株式会社 | 回路基板 |
US6014319A (en) * | 1998-05-21 | 2000-01-11 | International Business Machines Corporation | Multi-part concurrently maintainable electronic circuit card assembly |
ATE389694T1 (de) * | 2003-03-24 | 2008-04-15 | Essilor Int | Thiophosphinverbindungen und verfahren zur herstellung diese erhaltende polymerisierbare zusammensetzungen und ihre verwendung zur herstellung von kontaktlinsen |
US9818682B2 (en) * | 2014-12-03 | 2017-11-14 | International Business Machines Corporation | Laminate substrates having radial cut metallic planes |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3715635A (en) * | 1971-06-25 | 1973-02-06 | Bendix Corp | High frequency matched impedance microcircuit holder |
US4322778A (en) * | 1980-01-25 | 1982-03-30 | International Business Machines Corp. | High performance semiconductor package assembly |
JPS61108160A (ja) * | 1984-11-01 | 1986-05-26 | Nec Corp | コンデンサ内蔵型半導体装置及びその製造方法 |
JPS6366950A (ja) * | 1986-09-08 | 1988-03-25 | Mitsubishi Electric Corp | 半導体装置 |
JPS63232447A (ja) * | 1987-03-20 | 1988-09-28 | Nec Corp | 半導体装置 |
NL8901822A (nl) * | 1989-07-14 | 1991-02-01 | Philips Nv | Geintegreerde schakeling met stroomdetectie. |
US5157477A (en) * | 1990-01-10 | 1992-10-20 | International Business Machines Corporation | Matched impedance vertical conductors in multilevel dielectric laminated wiring |
KR950012657B1 (en) * | 1991-01-22 | 1995-10-19 | Nec Co Ltd | Resin sealed semiconductor integrated circuit |
JP3004083B2 (ja) * | 1991-06-21 | 2000-01-31 | 沖電気工業株式会社 | 半導体装置及びその製造装置 |
JPH05109924A (ja) * | 1991-10-17 | 1993-04-30 | Ngk Spark Plug Co Ltd | 集積回路用パツケージ |
US5264729A (en) * | 1992-07-29 | 1993-11-23 | Lsi Logic Corporation | Semiconductor package having programmable interconnect |
JPH0685154A (ja) * | 1992-09-07 | 1994-03-25 | Hitachi Ltd | 半導体集積回路装置 |
US5461260A (en) * | 1994-08-01 | 1995-10-24 | Motorola Inc. | Semiconductor device interconnect layout structure for reducing premature electromigration failure due to high localized current density |
US5528083A (en) * | 1994-10-04 | 1996-06-18 | Sun Microsystems, Inc. | Thin film chip capacitor for electrical noise reduction in integrated circuits |
-
1995
- 1995-11-25 JP JP7329816A patent/JP2755239B2/ja not_active Expired - Lifetime
-
1996
- 1996-11-22 US US08/755,014 patent/US5793098A/en not_active Expired - Fee Related
- 1996-11-25 KR KR1019960057066A patent/KR100232385B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
US5793098A (en) | 1998-08-11 |
JPH09148487A (ja) | 1997-06-06 |
KR100232385B1 (ko) | 1999-12-01 |
JP2755239B2 (ja) | 1998-05-20 |
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