KR950014461A - 박막형성방법 - Google Patents

박막형성방법 Download PDF

Info

Publication number
KR950014461A
KR950014461A KR1019940019010A KR19940019010A KR950014461A KR 950014461 A KR950014461 A KR 950014461A KR 1019940019010 A KR1019940019010 A KR 1019940019010A KR 19940019010 A KR19940019010 A KR 19940019010A KR 950014461 A KR950014461 A KR 950014461A
Authority
KR
South Korea
Prior art keywords
gas
substrate
thin film
reaction chamber
passivating
Prior art date
Application number
KR1019940019010A
Other languages
English (en)
Other versions
KR0132375B1 (ko
Inventor
시게루 미즈노
다카노리 요시무라
요시히로 가츠마타
노부유키 다카하시
Original Assignee
니시히라 슌지
니치덴 아네루바 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 니시히라 슌지, 니치덴 아네루바 가부시키가이샤 filed Critical 니시히라 슌지
Publication of KR950014461A publication Critical patent/KR950014461A/ko
Application granted granted Critical
Publication of KR0132375B1 publication Critical patent/KR0132375B1/ko

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/4401Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
    • C23C16/4404Coatings or surface treatment on the inside of the reaction chamber or on parts thereof
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00Semiconductor device manufacturing: process
    • Y10S438/905Cleaning of reaction chamber
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00Semiconductor device manufacturing: process
    • Y10S438/958Passivation layer

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Chemical Vapour Deposition (AREA)
  • Electrodes Of Semiconductors (AREA)

Abstract

화학적 기상성장법에 의한 박막형성에 있어서 생산선을 높혀 양호하며 또한 안정된 성막분포 및 막저항의 재현성을 얻는다.
1 또는 2이상의 기판을 반응실에 도입하여, 이 기판에반응가스를 도입하여 기판의 위에 화학적 기상성장법에 의해 박막을 퇴적시켜서 기판처리를 행하고, 도입된 기판마다에 기판처리를 반복 박막형성방법이며, 반복되는 기판처리의 사이의 비기판 처리시에 예컨대 기판 고정구에 퇴적한 박막의 표면을 부동태로하는 부동태화 가스를 반응실에 도입한다. 부동태화 가스는 예컨대 흡착가스로 구체적으로, 불활성가스와 0.1~10%의 NH3로 된 혼합가스, 또는 불활성가스와 0.1~10%의 SiH2Cl2로부터 이루어진 혼합가스이다. 부동태화 가스로서 산화가스를 사용할 수 있다.

Description

박막형성방법
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명에 관한 박막형성방법장치의 주요부 구조를 도시한 단면 구성도.
제2도는 본 발명에 관한 박막형성방법에 의한 연속성막 처리에서 얻은 성막분포(막저항치와 그이 분포)의 변화를 도시한 그래프.

Claims (11)

1매 또는 2매 이상의 기판을 반응실에 반입하여, 반응실내에 반응가스를 도입하여 화학적 기상성장법에 의해 기판상에 성막처리하여, 그리고 성막처리제의 기판을 반응실에서 반출함으로서 기판처리를 반복하여 행하고, 기판처리의 사이에 기판의 주변부재에 퇴적한 박막의 표면을 부동태로 하기 위해 부동태화 가스를 반응실에 도입하는 것을 특징으로 하는 박막형성방법.
제1항에 있어서, 기판상의 박막의 성막분포가 3%에 달하기 전에 부동태화 가스를 도입하는 것을 특징으로 하는 박막형성방법.
제2항에 있어서, 매엽식에서 기판처리 하는 경우, 처리된 기판이 5매에 달하기전에 부동태화 가스를 도입하는 것을 특징으로 하는 박막형성방법.
제1항에 있어서, 부동태화 가스의 도입은 기판처리가 된 후에 매회 행하는 것을 특징으로 하는 박막형성방법.
제1항에 있어서, 부동태화 가스는 박막의 표면에 흡착하는 가스인 것을 특징으로 하는 박막형성방법.
제5항에 있어서, 흡착가스는 불활성가스와 0.1~10%의 NH3가스와의 혼합가스 또는 불활성가스와 0.1~10%의 SiH2Cl2가스와의 혼합가스인 것을 특징으로 하는 박막형성방법.
제1항에 있어서, 부동태화 가스는 박막의 표면을 산화하는 가스인 것을 특징으로 하는 박막형성방법.
제7항에 있어서, 산화가스는 불활성가스와 대기, 산소, NO, NO2중 어느 하나를 함유하는 혼합가스인 것을 특징으로 하는 박막형성방법.
제6항 또는 제8항에 있어서, 상기 불활성가스의 대신에 N2를 사용하는 것을 특징으로 하는 박막형성방법.
제1항에 있어서, 부동태화 가스의 압력을 0.1 내지 수백 Torr의 범위내로 하는 것을 특징으로 하는 박막형성방법.
제2항에 있어서, 부동태화 가스를 도입할 때, 동시에 반응실내에 있어서, 방전을 발생시키는 것을 특징으로 하는 박막형성방법.
※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019940019010A 1993-11-29 1994-08-01 박막형성방법 KR0132375B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP32319693A JP3590416B2 (ja) 1993-11-29 1993-11-29 薄膜形成方法および薄膜形成装置
JP93-323196 1993-11-29

Publications (2)

Publication Number Publication Date
KR950014461A true KR950014461A (ko) 1995-06-16
KR0132375B1 KR0132375B1 (ko) 1998-04-17

Family

ID=18152128

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019940019010A KR0132375B1 (ko) 1993-11-29 1994-08-01 박막형성방법

Country Status (4)

Country Link
US (1) US5728629A (ko)
JP (1) JP3590416B2 (ko)
KR (1) KR0132375B1 (ko)
TW (1) TW258821B (ko)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1064847A (ja) * 1996-07-16 1998-03-06 Applied Materials Inc タングステン材料の成膜方法、サセプタ及び成膜装置
JP3796030B2 (ja) 1997-11-16 2006-07-12 キヤノンアネルバ株式会社 薄膜作成装置
US5970383A (en) * 1997-12-17 1999-10-19 Advanced Micro Devices Method of manufacturing a semiconductor device with improved control of deposition layer thickness
US6635569B1 (en) * 1998-04-20 2003-10-21 Tokyo Electron Limited Method of passivating and stabilizing a Ti-PECVD process chamber and combined Ti-PECVD/TiN-CVD processing method and apparatus
US6165894A (en) * 1998-07-09 2000-12-26 Advanced Micro Devices, Inc. Method of reliably capping copper interconnects
JP2000212749A (ja) * 1999-01-22 2000-08-02 Ulvac Japan Ltd 薄膜形成装置、及び窒化タングステン薄膜製造方法
US6291347B1 (en) 1999-10-08 2001-09-18 Texas Instruments Incorporated Method and system for constructing semiconductor devices
US6342453B1 (en) * 1999-12-03 2002-01-29 Applied Materials, Inc. Method for CVD process control for enhancing device performance
JP4505915B2 (ja) * 2000-01-13 2010-07-21 東京エレクトロン株式会社 成膜方法
US6666924B1 (en) 2000-03-28 2003-12-23 Asm America Reaction chamber with decreased wall deposition
JP2002129328A (ja) * 2000-10-31 2002-05-09 Applied Materials Inc 気相堆積方法及び装置
JP2002146531A (ja) * 2000-10-31 2002-05-22 Applied Materials Inc 気相堆積方法及び装置
US6468903B2 (en) * 2000-11-15 2002-10-22 Asm International N.V. Pre-treatment of reactor parts for chemical vapor deposition reactors
JP4669605B2 (ja) * 2000-11-20 2011-04-13 東京エレクトロン株式会社 半導体製造装置のクリーニング方法
US6432822B1 (en) * 2001-05-02 2002-08-13 Advanced Micro Devices, Inc. Method of improving electromigration resistance of capped Cu
US6429128B1 (en) * 2001-07-12 2002-08-06 Advanced Micro Devices, Inc. Method of forming nitride capped Cu lines with reduced electromigration along the Cu/nitride interface
US6579730B2 (en) * 2001-07-18 2003-06-17 Applied Materials, Inc. Monitoring process for oxide removal
US6720259B2 (en) * 2001-10-02 2004-04-13 Genus, Inc. Passivation method for improved uniformity and repeatability for atomic layer deposition and chemical vapor deposition
US6825051B2 (en) * 2002-05-17 2004-11-30 Asm America, Inc. Plasma etch resistant coating and process
US6716753B1 (en) 2002-07-29 2004-04-06 Taiwan Semiconductor Manufacturing Company Method for forming a self-passivated copper interconnect structure
WO2004038774A2 (en) * 2002-10-25 2004-05-06 Unaxis Balzers Ltd. Method for producing semi-conducting devices and devices obtained with this method
KR100491396B1 (ko) * 2002-12-03 2005-05-25 삼성전자주식회사 반도체 소자의 피이-테오스(pe-teos)막 형성 방법
KR100771799B1 (ko) * 2003-02-07 2007-10-30 도쿄 엘렉트론 가부시키가이샤 피처리 기판을 처리하는 반도체 처리 방법 및 장치
JP4959333B2 (ja) * 2003-05-09 2012-06-20 エーエスエム アメリカ インコーポレイテッド 化学的不活性化を通じたリアクタ表面のパシベーション
US7914847B2 (en) * 2003-05-09 2011-03-29 Asm America, Inc. Reactor surface passivation through chemical deactivation
US6974781B2 (en) * 2003-10-20 2005-12-13 Asm International N.V. Reactor precoating for reduced stress and uniform CVD
US7767926B2 (en) * 2006-03-29 2010-08-03 Tokyo Electron Limited Method and system for dry development of a multi-layer mask using sidewall passivation and mask passivation
US8791018B2 (en) * 2006-12-19 2014-07-29 Spansion Llc Method of depositing copper using physical vapor deposition
US8293658B2 (en) * 2010-02-17 2012-10-23 Asm America, Inc. Reactive site deactivation against vapor deposition
US9223203B2 (en) 2011-07-08 2015-12-29 Asm International N.V. Microcontact printed films as an activation layer for selective atomic layer deposition

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4851295A (en) * 1984-03-16 1989-07-25 Genus, Inc. Low resistivity tungsten silicon composite film
US4510172A (en) * 1984-05-29 1985-04-09 International Business Machines Corporation Technique for thin insulator growth
US4737474A (en) * 1986-11-17 1988-04-12 Spectrum Cvd, Inc. Silicide to silicon bonding process
US5158644A (en) * 1986-12-19 1992-10-27 Applied Materials, Inc. Reactor chamber self-cleaning process
US5207836A (en) * 1989-08-25 1993-05-04 Applied Materials, Inc. Cleaning process for removal of deposits from the susceptor of a chemical vapor deposition apparatus
JPH03130368A (ja) * 1989-09-22 1991-06-04 Applied Materials Inc 半導体ウェーハプロセス装置の洗浄方法
US5198298A (en) * 1989-10-24 1993-03-30 Advanced Micro Devices, Inc. Etch stop layer using polymers
JPH04345024A (ja) * 1991-05-22 1992-12-01 Fujitsu Ltd 半導体装置の製造方法
JP3326538B2 (ja) * 1991-10-24 2002-09-24 東京エレクトロン株式会社 コールドウォール形成膜処理装置
US5326723A (en) * 1992-09-09 1994-07-05 Intel Corporation Method for improving stability of tungsten chemical vapor deposition
US5434109A (en) * 1993-04-27 1995-07-18 International Business Machines Corporation Oxidation of silicon nitride in semiconductor devices
JPH07176484A (ja) * 1993-06-28 1995-07-14 Applied Materials Inc 窒化アルミニューム面を有するサセプタをサセプタの浄化後珪化タングステンで処理することによって半導体ウエハ上に珪化タングステンを一様に堆積する方法
US5565382A (en) * 1993-10-12 1996-10-15 Applied Materials, Inc. Process for forming tungsten silicide on semiconductor wafer using dichlorosilane gas

Also Published As

Publication number Publication date
JP3590416B2 (ja) 2004-11-17
US5728629A (en) 1998-03-17
KR0132375B1 (ko) 1998-04-17
TW258821B (ko) 1995-10-01
JPH07153704A (ja) 1995-06-16

Similar Documents

Publication Publication Date Title
KR950014461A (ko) 박막형성방법
US9478414B2 (en) Method for hydrophobization of surface of silicon-containing film by ALD
US5207836A (en) Cleaning process for removal of deposits from the susceptor of a chemical vapor deposition apparatus
KR940011741B1 (ko) 화학증착법
KR960026267A (ko) 고융점금속박막의 형성방법
KR910007089A (ko) 반도체 웨이퍼 처리 장치용 세척 방법
KR960012331A (ko) SiH₄를 이용한 반도체 기판 가공 장치 및 방법과 그 제조물
DE3885034D1 (de) Eingangsverteiler und Verfahren zur Steigerung der Gasdissoziation und zur PECVD von dielektrischen Filmen.
WO1999022878A3 (de) Verfahren zur korrosionsfesten beschichtung von metallsubstraten mittels plasmapolymerisation
KR910019113A (ko) 집적 공정 시스템에서 티타늄과 질소함유 가스의 반응에 의해 반도체 웨이퍼상에 질화티타늄을 형성시키는 방법
WO1999066545A8 (en) Process for removing oxide using hydrogen fluoride vapor
KR950000922A (ko) 플라즈마 화학 기상 증착법
KR960034488A (ko) 고온 저항을 개선시키기 위한 티타늄 질화물 층의 처리방법
JP3502504B2 (ja) 酸化ケイ素層の析出方法
EP0418592B1 (en) Cleaning process for removal of deposits from the susceptor of a chemical vapor deposition apparatus
EP0878823A3 (en) Plasma-enhanced chemical vapor deposition apparatus and method M
KR970060376A (ko) 플라즈마 cvd방법. 및 이에 의하여 형성된 금속막을 가지는 반도체장치
KR100232664B1 (ko) 반도체장치의 제조방법 및 반도체 제조장치
JPH02234419A (ja) プラズマ電極
JPS6448425A (en) Forming method of insulating film
US20080230510A1 (en) Method of Processing Substrates
DE69829850D1 (de) Verfahren und zusammensetzungen zum nachätzungsbehandeln von schichtfolgen in der halbleiterherstellung
TW427952B (en) Procedure for drying silicon
KR940010228A (ko) 400℃이상의 온도에서의 반도체 웨이퍼 처리방법
JPH03229886A (ja) 大気圧グロープラズマエッチング方法

Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20041124

Year of fee payment: 8

LAPS Lapse due to unpaid annual fee