KR940702901A - 사전 선택된 열 팽창 계수값을 갖는 폴리이미드 필름의 제조방법 - Google Patents
사전 선택된 열 팽창 계수값을 갖는 폴리이미드 필름의 제조방법Info
- Publication number
- KR940702901A KR940702901A KR1019940701403A KR19940701403A KR940702901A KR 940702901 A KR940702901 A KR 940702901A KR 1019940701403 A KR1019940701403 A KR 1019940701403A KR 19940701403 A KR19940701403 A KR 19940701403A KR 940702901 A KR940702901 A KR 940702901A
- Authority
- KR
- South Korea
- Prior art keywords
- cte
- curing
- baking
- preselected
- temperature
- Prior art date
Links
- 229920001721 polyimide Polymers 0.000 title claims abstract 17
- 238000004519 manufacturing process Methods 0.000 title claims abstract 3
- 238000010438 heat treatment Methods 0.000 claims abstract 17
- 150000004985 diamines Chemical class 0.000 claims 8
- 150000000000 tetracarboxylic acids Chemical class 0.000 claims 8
- 238000000034 method Methods 0.000 claims 7
- 239000004952 Polyamide Substances 0.000 claims 6
- 229920002647 polyamide Polymers 0.000 claims 6
- 239000004642 Polyimide Substances 0.000 claims 5
- 239000002243 precursor Substances 0.000 claims 5
- 239000011248 coating agent Substances 0.000 claims 4
- 238000000576 coating method Methods 0.000 claims 4
- 239000000758 substrate Substances 0.000 claims 4
- 230000009435 amidation Effects 0.000 claims 2
- 238000007112 amidation reaction Methods 0.000 claims 2
- 238000001035 drying Methods 0.000 claims 2
- 238000010304 firing Methods 0.000 claims 1
- 229920000642 polymer Polymers 0.000 claims 1
- 238000002360 preparation method Methods 0.000 claims 1
- 239000002904 solvent Substances 0.000 claims 1
- 238000010792 warming Methods 0.000 claims 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J5/00—Manufacture of articles or shaped materials containing macromolecular substances
- C08J5/18—Manufacture of films or sheets
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/14—Organic dielectrics
- H01G4/18—Organic dielectrics of synthetic material, e.g. derivatives of cellulose
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/312—Organic layers, e.g. photoresist
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
- H01L23/293—Organic, e.g. plastic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
- H01L23/3737—Organic materials with or without a thermoconductive filler
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49866—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers characterised by the materials
- H01L23/49894—Materials of the insulating layers or coatings
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/0313—Organic insulating material
- H05K1/032—Organic insulating material consisting of one material
- H05K1/0346—Organic insulating material consisting of one material containing N
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J2379/00—Characterised by the use of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen with or without oxygen, or carbon only, not provided for in groups C08J2361/00 - C08J2377/00
- C08J2379/04—Polycondensates having nitrogen-containing heterocyclic rings in the main chain; Polyhydrazides; Polyamide acids or similar polyimide precursors
- C08J2379/08—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02118—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer carbon based polymeric organic or inorganic material, e.g. polyimides, poly cyclobutene or PVC
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02282—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Materials Engineering (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Macromolecular Compounds Obtained By Forming Nitrogen-Containing Linkages In General (AREA)
- Moulding By Coating Moulds (AREA)
- Manufacture Of Macromolecular Shaped Articles (AREA)
- Treatments Of Macromolecular Shaped Articles (AREA)
- Polymers With Sulfur, Phosphorus Or Metals In The Main Chain (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/784.497 | 1991-10-29 | ||
US07/784,497 US5166292A (en) | 1991-10-29 | 1991-10-29 | Process for preparing a polyimide film with a preselected value for CTE |
PCT/US1992/009217 WO1993009167A1 (en) | 1991-10-29 | 1992-10-29 | Process for preparing a polyimide film with a preselected value for cte |
Publications (1)
Publication Number | Publication Date |
---|---|
KR940702901A true KR940702901A (ko) | 1994-09-17 |
Family
ID=25132628
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019940701403A KR940702901A (ko) | 1991-10-29 | 1992-10-29 | 사전 선택된 열 팽창 계수값을 갖는 폴리이미드 필름의 제조방법 |
Country Status (6)
Country | Link |
---|---|
US (1) | US5166292A (ja) |
EP (1) | EP0610425B1 (ja) |
JP (1) | JP2638304B2 (ja) |
KR (1) | KR940702901A (ja) |
DE (1) | DE69216424T2 (ja) |
WO (1) | WO1993009167A1 (ja) |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0474054B1 (en) * | 1990-08-27 | 1995-12-06 | E.I. Du Pont De Nemours And Company | Flexible multi-layer polyimide film laminates and preparation thereof |
US5393864A (en) * | 1993-04-26 | 1995-02-28 | E. I. Du Pont De Nemours And Company | Wet-etchable random polyimide copolymer for multichip module applications |
US5716677A (en) * | 1996-03-21 | 1998-02-10 | Ohio Aerospace Institute | Protective coatings for polyimide composites |
US5753306A (en) * | 1996-09-11 | 1998-05-19 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Method of forming a composite coating with particle materials that are readily dispersed in a sprayable polyimide solution |
US5889139A (en) * | 1997-02-28 | 1999-03-30 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Dimensionally stable ether-containing polyimide copolymers |
US7285321B2 (en) * | 2003-11-12 | 2007-10-23 | E.I. Du Pont De Nemours And Company | Multilayer substrates having at least two dissimilar polyimide layers, useful for electronics-type applications, and compositions relating thereto |
KR20060045208A (ko) * | 2004-11-12 | 2006-05-17 | 삼성테크윈 주식회사 | 반도체 팩키지용 회로기판 및 이의 제조방법 |
CN100344699C (zh) * | 2005-09-27 | 2007-10-24 | 黄堂杰 | 聚酰胺酸组合物及聚酰亚胺/铜箔积层材料 |
KR101227317B1 (ko) * | 2007-07-31 | 2013-01-28 | 코오롱인더스트리 주식회사 | 열안정성이 개선된 폴리이미드 필름 |
WO2009142248A1 (ja) * | 2008-05-20 | 2009-11-26 | 宇部興産株式会社 | 芳香族ポリイミドフィルム、積層体および太陽電池 |
JP5572164B2 (ja) * | 2008-09-26 | 2014-08-13 | ピクシウム ヴィジョン ソシエテ アノニム | 電極アレイおよびその製造方法 |
JP5621768B2 (ja) * | 2009-04-14 | 2014-11-12 | 宇部興産株式会社 | メタライジング用のポリイミドフィルム、これらの製造方法、及び金属積層ポリイミドフィルム |
US20110220179A1 (en) * | 2009-09-17 | 2011-09-15 | E. I. Du Pont De Nemours And Company | Assemblies comprising a thermally and dimensionally stable polyimide film, an electrode and an absorber layer, and methods relating thereto |
TWI409016B (zh) * | 2011-03-09 | 2013-09-11 | Lextar Electronics Corp | 載板結構及其製造方法 |
KR101646283B1 (ko) * | 2011-12-27 | 2016-08-08 | 코오롱인더스트리 주식회사 | 폴리아믹산 용액 |
KR20140083233A (ko) * | 2012-12-26 | 2014-07-04 | 코오롱인더스트리 주식회사 | 폴리아믹산 용액, 이미드화막 및 표시소자 |
JP6152688B2 (ja) * | 2013-04-22 | 2017-06-28 | 宇部興産株式会社 | ポリアミック酸溶液組成物、及びそれを用いたポリイミド膜の製造方法 |
TWI561558B (en) * | 2015-12-09 | 2016-12-11 | Taiflex Scient Co Ltd | Polyimide polymer, polyimide film, and flexible copper-coated laminate |
KR20170115339A (ko) * | 2016-04-07 | 2017-10-17 | 주식회사 엘지화학 | 내열성이 개선된 폴리이미드 필름 및 그 제조방법 |
CN107474251A (zh) * | 2017-08-18 | 2017-12-15 | 南京工业大学 | 一种膜电容器复合介电薄膜的制备方法 |
CN110272549B (zh) * | 2018-03-16 | 2020-09-15 | 北京化工大学 | 制备聚酰亚胺膜的方法 |
TW201943798A (zh) | 2018-04-06 | 2019-11-16 | 美商杜邦股份有限公司 | 供使用於電子裝置之聚合物 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0133533B1 (en) * | 1983-08-01 | 1993-04-21 | Hitachi, Ltd. | Low thermal expansion resin material for a wiring insulating film. |
US4937133A (en) * | 1988-03-28 | 1990-06-26 | Nippon Steel Chemical Co., Ltd. | Flexible base materials for printed circuits |
JPH0760935B2 (ja) * | 1988-03-28 | 1995-06-28 | 新日鐵化学株式会社 | フレキシブルプリント基板の製造法 |
-
1991
- 1991-10-29 US US07/784,497 patent/US5166292A/en not_active Expired - Lifetime
-
1992
- 1992-10-29 WO PCT/US1992/009217 patent/WO1993009167A1/en active IP Right Grant
- 1992-10-29 DE DE69216424T patent/DE69216424T2/de not_active Expired - Lifetime
- 1992-10-29 EP EP92924138A patent/EP0610425B1/en not_active Expired - Lifetime
- 1992-10-29 JP JP5508554A patent/JP2638304B2/ja not_active Expired - Lifetime
- 1992-10-29 KR KR1019940701403A patent/KR940702901A/ko not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
DE69216424T2 (de) | 1997-07-17 |
EP0610425A1 (en) | 1994-08-17 |
DE69216424D1 (de) | 1997-02-13 |
JP2638304B2 (ja) | 1997-08-06 |
JPH07500139A (ja) | 1995-01-05 |
EP0610425B1 (en) | 1997-01-02 |
US5166292A (en) | 1992-11-24 |
WO1993009167A1 (en) | 1993-05-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid |