KR930001392A - 반도체 메모리 장치의 전원 접지선 배선방법 - Google Patents
반도체 메모리 장치의 전원 접지선 배선방법 Download PDFInfo
- Publication number
- KR930001392A KR930001392A KR1019910010194A KR910010194A KR930001392A KR 930001392 A KR930001392 A KR 930001392A KR 1019910010194 A KR1019910010194 A KR 1019910010194A KR 910010194 A KR910010194 A KR 910010194A KR 930001392 A KR930001392 A KR 930001392A
- Authority
- KR
- South Korea
- Prior art keywords
- memory device
- semiconductor memory
- power
- line
- ground line
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
-
- H10W72/00—
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/211—Design considerations for internal polarisation
- H10D89/213—Design considerations for internal polarisation in field-effect devices
-
- H10W20/427—
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Semiconductor Integrated Circuits (AREA)
- Semiconductor Memories (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019910010194A KR930001392A (ko) | 1991-06-19 | 1991-06-19 | 반도체 메모리 장치의 전원 접지선 배선방법 |
| TW081104313A TW245835B (enExample) | 1991-06-19 | 1992-06-02 | |
| ITMI921460A IT1258990B (it) | 1991-06-19 | 1992-06-12 | Dispositivo di memoria a semiconduttore con linee di alimentazione e di massa del terminale di ingresso isolate da quelle del terminale di uscita |
| FR9207335A FR2678109B1 (fr) | 1991-06-19 | 1992-06-17 | Disposition des lignes de source de tension et de masse d'un dispositif de memoire a semiconducteur. |
| DE4219927A DE4219927A1 (de) | 1991-06-19 | 1992-06-17 | Anordnung von spannungsquelle- und erdungsleitungen einer halbleiterspeichereinrichtung |
| GB9212830A GB2256968A (en) | 1991-06-19 | 1992-06-17 | Connections in semiconductor memory devices |
| JP4161159A JPH0719851B2 (ja) | 1991-06-19 | 1992-06-19 | 半導体メモリ装置における電源線及び接地線の配線方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019910010194A KR930001392A (ko) | 1991-06-19 | 1991-06-19 | 반도체 메모리 장치의 전원 접지선 배선방법 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR930001392A true KR930001392A (ko) | 1993-01-16 |
Family
ID=19316015
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019910010194A Abandoned KR930001392A (ko) | 1991-06-19 | 1991-06-19 | 반도체 메모리 장치의 전원 접지선 배선방법 |
Country Status (7)
| Country | Link |
|---|---|
| JP (1) | JPH0719851B2 (enExample) |
| KR (1) | KR930001392A (enExample) |
| DE (1) | DE4219927A1 (enExample) |
| FR (1) | FR2678109B1 (enExample) |
| GB (1) | GB2256968A (enExample) |
| IT (1) | IT1258990B (enExample) |
| TW (1) | TW245835B (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100249166B1 (ko) * | 1997-03-07 | 2000-03-15 | 김영환 | 이에스디(esd) 보호회로 및 그 제조방법 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5780828A (en) * | 1980-11-07 | 1982-05-20 | Hitachi Ltd | Semiconductor integrated circuit device |
| JPS5922357A (ja) * | 1982-07-28 | 1984-02-04 | Toshiba Corp | Cmos形半導体集積回路 |
| JPH0693497B2 (ja) * | 1986-07-30 | 1994-11-16 | 日本電気株式会社 | 相補型mis集積回路 |
| GB2199695B (en) * | 1987-01-06 | 1990-07-25 | Samsung Semiconductor Inc | Dynamic random access memory with selective well biasing |
| DE3855356T2 (de) * | 1987-03-18 | 1997-01-30 | Nippon Electric Co | Vorrichtung mit complementäre integrierte Schaltung mit Mitteln zur Verhinderung einer parasitären Auslösung |
-
1991
- 1991-06-19 KR KR1019910010194A patent/KR930001392A/ko not_active Abandoned
-
1992
- 1992-06-02 TW TW081104313A patent/TW245835B/zh active
- 1992-06-12 IT ITMI921460A patent/IT1258990B/it active IP Right Grant
- 1992-06-17 GB GB9212830A patent/GB2256968A/en not_active Withdrawn
- 1992-06-17 DE DE4219927A patent/DE4219927A1/de not_active Ceased
- 1992-06-17 FR FR9207335A patent/FR2678109B1/fr not_active Expired - Fee Related
- 1992-06-19 JP JP4161159A patent/JPH0719851B2/ja not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100249166B1 (ko) * | 1997-03-07 | 2000-03-15 | 김영환 | 이에스디(esd) 보호회로 및 그 제조방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| IT1258990B (it) | 1996-03-11 |
| DE4219927A1 (de) | 1992-12-24 |
| ITMI921460A1 (it) | 1993-12-12 |
| GB2256968A (en) | 1992-12-23 |
| JPH06112435A (ja) | 1994-04-22 |
| FR2678109B1 (fr) | 1994-01-21 |
| FR2678109A1 (fr) | 1992-12-24 |
| GB9212830D0 (en) | 1992-07-29 |
| TW245835B (enExample) | 1995-04-21 |
| ITMI921460A0 (it) | 1992-06-12 |
| JPH0719851B2 (ja) | 1995-03-06 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A201 | Request for examination | ||
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| PC1902 | Submission of document of abandonment before decision of registration |
St.27 status event code: N-1-6-B10-B11-nap-PC1902 |
|
| SUBM | Surrender of laid-open application requested | ||
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
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| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |