KR910007115A - 수지봉지형 반도체장치와 그 제조방법 - Google Patents
수지봉지형 반도체장치와 그 제조방법 Download PDFInfo
- Publication number
- KR910007115A KR910007115A KR1019900014529A KR900014529A KR910007115A KR 910007115 A KR910007115 A KR 910007115A KR 1019900014529 A KR1019900014529 A KR 1019900014529A KR 900014529 A KR900014529 A KR 900014529A KR 910007115 A KR910007115 A KR 910007115A
- Authority
- KR
- South Korea
- Prior art keywords
- resin
- semiconductor device
- mold
- encapsulated
- lead portion
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title claims description 19
- 238000004519 manufacturing process Methods 0.000 title claims description 4
- 238000000034 method Methods 0.000 claims description 2
- 239000011347 resin Substances 0.000 claims 15
- 229920005989 resin Polymers 0.000 claims 15
- 239000000463 material Substances 0.000 claims 4
- 238000007772 electroless plating Methods 0.000 claims 3
- 239000002184 metal Substances 0.000 claims 3
- 238000009713 electroplating Methods 0.000 claims 2
- 230000002745 absorbent Effects 0.000 claims 1
- 239000002250 absorbent Substances 0.000 claims 1
- 239000011358 absorbing material Substances 0.000 claims 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/04—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/564—Details not otherwise provided for, e.g. protection against moisture
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/565—Moulds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/16—Fillings or auxiliary members in containers or encapsulations, e.g. centering rings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
Abstract
내용 없음
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명에 따른 반도체장치의 제1실시예를 나타내는 대각선을 따르는 단면도.
제2도는 캡의 제조예를 나타낸 평면도.
제3도는 모울드공정시 우측절반부분은 대각선을, 좌측절반부분은 중앙선을 따르는 단면을 나타낸 도면.
Claims (5)
- 결체용 핀(6)에 의해 지지된 다이패드(1)상에 반도체칩(2)을 마운트하고, 리이드부를 측방향으로 돌출시킨 상태에서 상기 반도체칩을 모을드수지(5)에 의해 수지봉지한 수지봉지형 반도체장치에 있어서, 상기 반도체칩의 주위를 상기 모올드수지에 일체로 고착된 무흡습재료(7)에 의해 덮어 준 것을 특징으로 하는 수지봉지형 반도체 장치.
- 결체용 핀(6)에 의해 지지된 다이패드(1)상에 반도체집(1)을 마운트하고, 리이드부를 측방향으로 돌출시킨 상태에서 상기 반도체집을 모울드수지에 의해 수지봉지한 수지봉지형 반도체장치에 있어서, 상기 모울드 수지(5)의 거의 전면을 절연테이프(13)가 내부에 개재된 상태에서 무흡습재료에 의해 덮어 준 것을 특징으로 하는 수지봉지형 반도체 장치.
- 결체용 핀(6)에 의해 지지된 다이패드(1)상에 반도체칩(2)을 마운트하고, 리이드부를 측방향으로 돌출시킨 상태에서 상기 반도체칩을 모울드수지(5)에 으해 수지봉지한 수지봉지형 반도체장치에 있어서, 상기 모울드 수지의 표면에 그 모울드수지와의 밀착성이 양호한 금속막(18)을 상기 리이드부와 접촉되지 않도록 형성하고, 이 금속막의 표면에 금속층(19)을 적층시킨 것을 특징으로 하는 수지봉지형 반도체장치.
- 1쌍의 컵형상 무흡습재료(7)의 내부에 반도체칩(2)을 위치결정해서 장착하고, 내부에 반도체칩이 장착된 무흡습재료를 모울드금형(10, 11)의 공동부내에 배치한 다음, 이 모울드금형의 공동부내에 모울드수지를 주입해서 상기 무흡습재료를 모울드수지에 일체로 고착시킨 것을 특징으로 하는 수지봉지형 반도체 장치의 제조방법.
- 결체용 핀(6)에 의해 지지된 다이패드(1)상에 반도체칩(2)을 마운트하고, 리이드부를 측방향으로 돌출시킨 상태에서 상기 반도체칩을 모울드수지(5)에 의해 수지봉지한 다음, 이 모울드수지의 표면에 무전해도금에 의한 무전해도금층(18)을 상기 리이드부에 접촉되지 않도록 형성한 후, 상기 무전해도금층의 표면에 전해도금에 의한 전해도금층(19)을 형성한 것을 특징으로 하는 수지봉지형 반도체장치의 제조방법.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1-239471 | 1989-09-14 | ||
JP239471 | 1989-09-14 | ||
JP23947189 | 1989-09-14 | ||
JP155729 | 1990-06-14 | ||
JP2-155729 | 1990-06-14 | ||
JP15572990 | 1990-06-14 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR910007115A true KR910007115A (ko) | 1991-04-30 |
KR930010071B1 KR930010071B1 (ko) | 1993-10-14 |
Family
ID=26483656
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019900014529A KR930010071B1 (ko) | 1989-09-14 | 1990-09-14 | 수지봉지형 반도체장치와 그 제조방법 |
Country Status (3)
Country | Link |
---|---|
US (1) | US5223739A (ko) |
JP (1) | JP2530056B2 (ko) |
KR (1) | KR930010071B1 (ko) |
Families Citing this family (43)
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WO1992003035A1 (en) * | 1990-08-01 | 1992-02-20 | Staktek Corporation | Ultra high density integrated circuit packages, method and apparatus |
US5367766A (en) * | 1990-08-01 | 1994-11-29 | Staktek Corporation | Ultra high density integrated circuit packages method |
US5475920A (en) * | 1990-08-01 | 1995-12-19 | Burns; Carmen D. | Method of assembling ultra high density integrated circuit packages |
US5446620A (en) * | 1990-08-01 | 1995-08-29 | Staktek Corporation | Ultra high density integrated circuit packages |
US5377077A (en) * | 1990-08-01 | 1994-12-27 | Staktek Corporation | Ultra high density integrated circuit packages method and apparatus |
JPH05190721A (ja) * | 1992-01-08 | 1993-07-30 | Fujitsu Ltd | 半導体装置及びその製造方法 |
JPH05206354A (ja) * | 1992-01-24 | 1993-08-13 | Mitsubishi Electric Corp | 半導体圧力センサおよびその製造方法 |
JP2670408B2 (ja) * | 1992-10-27 | 1997-10-29 | 株式会社東芝 | 樹脂封止型半導体装置及びその製造方法 |
US6205654B1 (en) | 1992-12-11 | 2001-03-27 | Staktek Group L.P. | Method of manufacturing a surface mount package |
US5484959A (en) * | 1992-12-11 | 1996-01-16 | Staktek Corporation | High density lead-on-package fabrication method and apparatus |
US5644161A (en) * | 1993-03-29 | 1997-07-01 | Staktek Corporation | Ultra-high density warp-resistant memory module |
US5801437A (en) * | 1993-03-29 | 1998-09-01 | Staktek Corporation | Three-dimensional warp-resistant integrated circuit module method and apparatus |
US5369056A (en) * | 1993-03-29 | 1994-11-29 | Staktek Corporation | Warp-resistent ultra-thin integrated circuit package fabrication method |
JPH0766331A (ja) * | 1993-08-02 | 1995-03-10 | Motorola Inc | 半導体デバイス・パッケージの製造方法 |
JPH0786458A (ja) * | 1993-09-09 | 1995-03-31 | Fujitsu Ltd | 半導体装置及びその製造方法 |
US5408126A (en) * | 1993-12-17 | 1995-04-18 | At&T Corp. | Manufacture of semiconductor devices and novel lead frame assembly |
AU2371795A (en) * | 1994-05-17 | 1995-12-05 | Olin Corporation | Electronic packages with improved electrical performance |
US6025642A (en) * | 1995-08-17 | 2000-02-15 | Staktek Corporation | Ultra high density integrated circuit packages |
KR0179803B1 (ko) * | 1995-12-29 | 1999-03-20 | 문정환 | 리드노출형 반도체 패키지 |
DE69620564T2 (de) * | 1996-01-25 | 2003-01-30 | St Microelectronics Srl | Kunststoffkörper eines Leitungshalbleiters zur Oberflächenmontage mit optimierten charakteristischen Abmessungen zur Benutzung von Standard-Transport- und Testhaltern |
US5783857A (en) * | 1996-07-25 | 1998-07-21 | The Whitaker Corporation | Integrated circuit package |
US5945732A (en) * | 1997-03-12 | 1999-08-31 | Staktek Corporation | Apparatus and method of manufacturing a warp resistant thermally conductive integrated circuit package |
US6329705B1 (en) | 1998-05-20 | 2001-12-11 | Micron Technology, Inc. | Leadframes including offsets extending from a major plane thereof, packaged semiconductor devices including same, and method of designing and fabricating such leadframes |
US6064286A (en) * | 1998-07-31 | 2000-05-16 | The Whitaker Corporation | Millimeter wave module with an interconnect from an interior cavity |
US6329220B1 (en) * | 1999-11-23 | 2001-12-11 | Micron Technology, Inc. | Packages for semiconductor die |
US6559537B1 (en) * | 2000-08-31 | 2003-05-06 | Micron Technology, Inc. | Ball grid array packages with thermally conductive containers |
US6608763B1 (en) | 2000-09-15 | 2003-08-19 | Staktek Group L.P. | Stacking system and method |
AUPR244801A0 (en) * | 2001-01-10 | 2001-02-01 | Silverbrook Research Pty Ltd | A method and apparatus (WSM01) |
US6462408B1 (en) | 2001-03-27 | 2002-10-08 | Staktek Group, L.P. | Contact member stacking system and method |
KR100431180B1 (ko) * | 2001-12-07 | 2004-05-12 | 삼성전기주식회사 | 표면 탄성파 필터 패키지 제조방법 |
SG111092A1 (en) | 2002-11-15 | 2005-05-30 | St Microelectronics Pte Ltd | Semiconductor device package and method of manufacture |
US7623349B2 (en) * | 2005-03-07 | 2009-11-24 | Ati Technologies Ulc | Thermal management apparatus and method for a circuit substrate |
JP4695466B2 (ja) * | 2005-09-09 | 2011-06-08 | 富士通株式会社 | 信頼性解析システムおよび信頼性解析方法 |
US8183680B2 (en) * | 2006-05-16 | 2012-05-22 | Broadcom Corporation | No-lead IC packages having integrated heat spreader for electromagnetic interference (EMI) shielding and thermal enhancement |
JP5015705B2 (ja) * | 2007-09-18 | 2012-08-29 | ルネサスエレクトロニクス株式会社 | 層間絶縁膜形成方法、層間絶縁膜、半導体デバイス、および半導体製造装置 |
US7989931B2 (en) * | 2007-09-26 | 2011-08-02 | Stats Chippac Ltd. | Integrated circuit package system with under paddle leadfingers |
US7902644B2 (en) * | 2007-12-07 | 2011-03-08 | Stats Chippac Ltd. | Integrated circuit package system for electromagnetic isolation |
US8507319B2 (en) * | 2007-12-07 | 2013-08-13 | Stats Chippac Ltd. | Integrated circuit package system with shield |
DE102009045911A1 (de) * | 2009-10-22 | 2011-04-28 | Robert Bosch Gmbh | Koppelvorrichtung, Anordnung mit einer Koppelvorrichtung, Verfahren zur Herstellung einer Anordnung mit einer Koppelvorrichtung |
JP5188530B2 (ja) * | 2010-04-01 | 2013-04-24 | 日立オートモティブシステムズ株式会社 | パワーモジュール及びそれを用いた電力変換装置 |
JP5956783B2 (ja) * | 2012-03-02 | 2016-07-27 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
JP6345265B2 (ja) * | 2014-10-29 | 2018-06-20 | 日立オートモティブシステムズ株式会社 | 電子機器及び電子機器の製造方法 |
CN109788626B (zh) * | 2017-11-10 | 2021-10-08 | 广州立景创新科技有限公司 | 具有防水洗结构的模组 |
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US4173712A (en) * | 1978-08-30 | 1979-11-06 | General Ionex Corporation | Electrical circuit component protecting device |
JPS57173948A (en) * | 1981-04-20 | 1982-10-26 | Matsushita Electric Ind Co Ltd | Manufacture of semiconductor device |
JPS57196547A (en) * | 1981-05-28 | 1982-12-02 | Nec Corp | Semiconductor device |
JPS58176956A (ja) * | 1982-04-12 | 1983-10-17 | Hitachi Ltd | 電気素子 |
US4814943A (en) * | 1986-06-04 | 1989-03-21 | Oki Electric Industry Co., Ltd. | Printed circuit devices using thermoplastic resin cover plate |
JPS6397241U (ko) * | 1986-12-12 | 1988-06-23 | ||
JPS63169051A (ja) * | 1987-01-05 | 1988-07-13 | Nec Corp | 半導体装置 |
JPS63250846A (ja) * | 1987-04-08 | 1988-10-18 | Hitachi Ltd | 面付実装用lsiプラスチツクパツケ−ジとその製造方法 |
DE3725338A1 (de) * | 1987-07-30 | 1989-02-09 | Nukem Gmbh | Verkapselung von einem photovoltaischem element |
US4942454A (en) * | 1987-08-05 | 1990-07-17 | Mitsubishi Denki Kabushiki Kaisha | Resin sealed semiconductor device |
US4953002A (en) * | 1988-03-31 | 1990-08-28 | Honeywell Inc. | Semiconductor device housing with magnetic field protection |
JPH0262356A (ja) * | 1988-08-26 | 1990-03-02 | Hitachi Koki Co Ltd | 電子写真式印刷装置の用紙走行制御方法 |
-
1990
- 1990-09-03 JP JP2232697A patent/JP2530056B2/ja not_active Expired - Lifetime
- 1990-09-13 US US07/581,700 patent/US5223739A/en not_active Expired - Lifetime
- 1990-09-14 KR KR1019900014529A patent/KR930010071B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JP2530056B2 (ja) | 1996-09-04 |
KR930010071B1 (ko) | 1993-10-14 |
US5223739A (en) | 1993-06-29 |
JPH04127456A (ja) | 1992-04-28 |
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