KR910005549B1 - 현미경의 스테이지 이송용 조미동 공용축 핸들 - Google Patents
현미경의 스테이지 이송용 조미동 공용축 핸들 Download PDFInfo
- Publication number
- KR910005549B1 KR910005549B1 KR1019880013074A KR880013074A KR910005549B1 KR 910005549 B1 KR910005549 B1 KR 910005549B1 KR 1019880013074 A KR1019880013074 A KR 1019880013074A KR 880013074 A KR880013074 A KR 880013074A KR 910005549 B1 KR910005549 B1 KR 910005549B1
- Authority
- KR
- South Korea
- Prior art keywords
- disc
- frictional resistance
- handle
- fine
- cylindrical member
- Prior art date
Links
- 230000033001 locomotion Effects 0.000 claims description 33
- 230000007246 mechanism Effects 0.000 claims description 19
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims 1
- 229910052802 copper Inorganic materials 0.000 claims 1
- 239000010949 copper Substances 0.000 claims 1
- 230000002093 peripheral effect Effects 0.000 description 4
- 239000011347 resin Substances 0.000 description 4
- 229920005989 resin Polymers 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 2
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/24—Base structure
- G02B21/26—Stages; Adjusting means therefor
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T74/00—Machine element or mechanism
- Y10T74/18—Mechanical movements
- Y10T74/18568—Reciprocating or oscillating to or from alternating rotary
- Y10T74/18576—Reciprocating or oscillating to or from alternating rotary including screw and nut
- Y10T74/18752—Manually driven
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T74/00—Machine element or mechanism
- Y10T74/20—Control lever and linkage systems
- Y10T74/20207—Multiple controlling elements for single controlled element
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- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Microscoopes, Condenser (AREA)
- Transmission Devices (AREA)
Abstract
Description
Claims (4)
- 기대에 회전할 수 있도록 지지되고, 또한 스테이지 지지부재에 나사맞춤되어진 그 이송나사축에 회전할 수 있도록 끼워서 장착되어 있어서 일단부에 제1원판이 고정된 통모양의 부재와, 그 통모양의 부재에 회전할 수 있도록 끼워서 장착되어 있어서 전술한 제1원판을 포위하는 외부둘레벽을 가진 미동핸들과, 전술한 제1원판에 장착된 중간기어를 포함하고 있어서 미동핸들과 이송나사축 사이에 끼워진 감속기어기구와, 전술한 통모양의 부재의 타단부와 기대 사이에 끼워져 탄성내리누름부재에 의해 통모양의 부재에 마찰저항을 부여하는 제1마찰저항 부여기구와, 전술한 미동핸들에 회전할 수 있도록 끼워 맞추어지고, 또한 제1원판에 결합된 제2원판과, 그 제2원판의 편심위치에서 장착된 조정핸들을 구비한 것을 특징으로 하는 현미경의 스테이지 조미동 공용축 핸들.
- 제1항에 있어서, 전술한 조동핸들은 두꺼운 원판형상의 부재를 형성되며, 또한 조동핸들은 미동핸들의 회전축 방향으로 돌출된 핀모양의 부재로서 형성되어 있는 것을 특징으로 하는 현미경의 스테이지 이송용 조미동 공용축 핸들.
- 제1항에 있어서, 전술한 제1원판과 미동핸들이 외부둘레벽 내부사이에 끼워진 강성내리부름부재에 의해 제1원판에 마찰저항을 부여하는 제2의 마찰저항 부여기구를 더 구비하고 있는 것을 특징으로 하는 현미경의 스테이지 이송용 조미동 공용축 핸들.
- 제3항에 있어서, 전술한 이송용 나사축을 회전시키는데 필요한 토오크를 T1, 전술한 제1마찰저항 부여기구에 의해 제1원판과 통모양의 부재에 부여된 마찰저항에 대항하여 통모양의 부재를 회전시키는데 필요한 토오크를 T2및 전술한 제2마찰저항 부여기구에 의해 제1원판과 통모양의 부재에 부여된 마찰저항에 대항하여 제1원판과, 통모양의 부재를 회전시키는데 필요한 토오크를 T3로 했을때, 전술한 조미동 공용축 핸들은 하기의 조건을 만족하도록 구성되어 있는 것을 특징으로 하는 현미경의 스테이지 이송용 조미동 공용축 핸들.T1〈T2+T3T2〉T3
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP255614 | 1987-10-09 | ||
JP62255615A JPH07122695B2 (ja) | 1987-10-09 | 1987-10-09 | 顕微鏡のステージ送り用粗微動共軸ハンドル |
JP255615 | 1987-10-09 | ||
JP?62-255615 | 1987-10-09 | ||
JP?62-255614 | 1987-10-09 | ||
JP62255614A JPH0197914A (ja) | 1987-10-09 | 1987-10-09 | 顕微鏡のステージ送り用粗微動共軸ハンドル |
Publications (2)
Publication Number | Publication Date |
---|---|
KR890007089A KR890007089A (ko) | 1989-06-17 |
KR910005549B1 true KR910005549B1 (ko) | 1991-07-31 |
Family
ID=26542314
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019880013074A KR910005549B1 (ko) | 1987-10-09 | 1988-10-07 | 현미경의 스테이지 이송용 조미동 공용축 핸들 |
Country Status (4)
Country | Link |
---|---|
US (1) | US4919001A (ko) |
EP (1) | EP0311096B1 (ko) |
KR (1) | KR910005549B1 (ko) |
DE (1) | DE3879603T2 (ko) |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2727368B2 (ja) * | 1990-01-04 | 1998-03-11 | 株式会社新川 | Xyテーブル |
JP2577170B2 (ja) * | 1992-11-25 | 1997-01-29 | 川崎重工業株式会社 | 回転翼航空機用ピッチリンク及びその自動調整装置 |
JPH07106527B2 (ja) * | 1993-07-05 | 1995-11-15 | 功 庄田 | 複合加工機のテーブル移動装置 |
JPH08313786A (ja) * | 1995-05-17 | 1996-11-29 | Nikon Corp | ハンドル装置 |
DE19528041C1 (de) * | 1995-07-31 | 1997-01-16 | Leica Mikroskopie & Syst | Fokussiertrieb für den Objekttisch eines Mikroskops |
JP3277347B2 (ja) * | 1995-09-07 | 2002-04-22 | 株式会社ナリシゲ | マイクロマニピュレータにおける粗微動一体型スライド機構 |
DE19941090A1 (de) * | 1999-08-30 | 2001-03-29 | Ersa Loettechnik Gmbh | Positioniereinrichtung |
US6578799B1 (en) * | 2001-12-06 | 2003-06-17 | Union Switch & Signal, Inc. | Modular point detector for railroad track signal |
US6891170B1 (en) | 2002-06-17 | 2005-05-10 | Zyvex Corporation | Modular manipulation system for manipulating a sample under study with a microscope |
US6967335B1 (en) | 2002-06-17 | 2005-11-22 | Zyvex Corporation | Manipulation system for manipulating a sample under study with a microscope |
EP1671346A2 (en) * | 2003-09-23 | 2006-06-21 | Zyvex Corporation | Method, system and device for microscopic examination employing fib-prepared sample grasping element |
TW200531420A (en) | 2004-02-20 | 2005-09-16 | Zyvex Corp | Positioning device for microscopic motion |
US7319336B2 (en) * | 2004-02-23 | 2008-01-15 | Zyvex Instruments, Llc | Charged particle beam device probe operation |
JP2005266083A (ja) * | 2004-03-17 | 2005-09-29 | Olympus Corp | 観察装置及び観察方法 |
US7326293B2 (en) * | 2004-03-26 | 2008-02-05 | Zyvex Labs, Llc | Patterned atomic layer epitaxy |
US20060183411A1 (en) * | 2005-02-16 | 2006-08-17 | Robert Moon | Portable skate sharpener |
CN102062186A (zh) * | 2009-11-16 | 2011-05-18 | 林郁忍 | 可粗微调的直线移动机构 |
US20110162468A1 (en) * | 2010-01-06 | 2011-07-07 | Yu-Jen Lin | Coarse/fine adjustment linear displacement mechanism |
US8467126B2 (en) | 2010-05-27 | 2013-06-18 | Valley Precision, Inc. | Stage driver for movable stages |
CN102520508B (zh) * | 2011-11-21 | 2014-01-15 | 宁波市教学仪器有限公司 | 显微镜的快速移动平台 |
JP5962082B2 (ja) * | 2012-03-14 | 2016-08-03 | 日立工機株式会社 | チェーンソー |
WO2016011650A1 (zh) * | 2014-07-24 | 2016-01-28 | 广州微点焊设备有限公司 | 显微镜调焦装置 |
US9244263B1 (en) | 2014-12-03 | 2016-01-26 | Global Surgical Corporation | Microscope head with multiple coaxial mechanical controls |
JP7157306B2 (ja) * | 2018-04-16 | 2022-10-20 | スター精密株式会社 | 工作機械 |
CN111948829B (zh) * | 2020-08-12 | 2022-02-15 | 武汉优光科技有限责任公司 | 一种可调式光纤准直系统 |
CN113702385B (zh) * | 2021-07-28 | 2023-06-30 | 南京工程学院 | 一种角度可调的载物台及其使用方法 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3019705A (en) * | 1957-12-13 | 1962-02-06 | American Optical Corp | Coarse and fine adjustment mechanism for microscopes |
US3355955A (en) * | 1965-10-04 | 1967-12-05 | Sheffield Corp | Positioning device |
JPS4811057B1 (ko) * | 1969-08-26 | 1973-04-10 | ||
DE2344210B2 (de) * | 1972-09-06 | 1976-11-25 | Olympus Optical Co, Ltd., Tokio | Grob/fein-einstellvorrichtung fuer praezisionsgeraete, insbesondere zur scharfeinstellung von mikroskopen |
JPS5214429A (en) * | 1975-07-24 | 1977-02-03 | Nippon Kogaku Kk <Nikon> | Monoaxial coarse-fine adjustor |
JPS5235657A (en) * | 1975-09-13 | 1977-03-18 | Nippon Kogaku Kk <Nikon> | One shaft type device for crude and fine adjustments capable of effect ing moderate adjustment |
US4173902A (en) * | 1975-09-13 | 1979-11-13 | Nippon Kogaku K. K. | Single-axis coarse and fine adjustment device provided with medium adjustment |
JPS5253436A (en) * | 1975-10-28 | 1977-04-30 | Nippon Kogaku Kk <Nikon> | Focusing device for microscopes |
DE3345326A1 (de) * | 1982-12-21 | 1984-06-28 | Bausch & Lomb Inc., Rochester, N.Y. | Monoaxiale grob/fein-einstelleinrichtung fuer optische geraete, insbesondere mikroskope |
-
1988
- 1988-10-07 KR KR1019880013074A patent/KR910005549B1/ko not_active IP Right Cessation
- 1988-10-07 DE DE8888116642T patent/DE3879603T2/de not_active Expired - Fee Related
- 1988-10-07 US US07/254,923 patent/US4919001A/en not_active Expired - Lifetime
- 1988-10-07 EP EP88116642A patent/EP0311096B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
KR890007089A (ko) | 1989-06-17 |
EP0311096A2 (en) | 1989-04-12 |
US4919001A (en) | 1990-04-24 |
DE3879603T2 (de) | 1993-07-01 |
EP0311096B1 (en) | 1993-03-24 |
EP0311096A3 (en) | 1990-01-17 |
DE3879603D1 (de) | 1993-04-29 |
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