KR910000152B1 - 반도체기억장치 - Google Patents
반도체기억장치 Download PDFInfo
- Publication number
- KR910000152B1 KR910000152B1 KR1019870003079A KR870003079A KR910000152B1 KR 910000152 B1 KR910000152 B1 KR 910000152B1 KR 1019870003079 A KR1019870003079 A KR 1019870003079A KR 870003079 A KR870003079 A KR 870003079A KR 910000152 B1 KR910000152 B1 KR 910000152B1
- Authority
- KR
- South Korea
- Prior art keywords
- capacitor
- memory cell
- capacity
- cell
- memory device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4099—Dummy cell treatment; Reference voltage generators
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4091—Sense or sense/refresh amplifiers, or associated sense circuitry, e.g. for coupled bit-line precharging, equalising or isolating
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Dram (AREA)
- Semiconductor Memories (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61074979A JPS62232796A (ja) | 1986-04-01 | 1986-04-01 | 半導体記憶装置 |
| JP74979 | 1986-04-01 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR870010549A KR870010549A (ko) | 1987-11-30 |
| KR910000152B1 true KR910000152B1 (ko) | 1991-01-21 |
Family
ID=13562916
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019870003079A Expired KR910000152B1 (ko) | 1986-04-01 | 1987-04-01 | 반도체기억장치 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US4811290A (enExample) |
| JP (1) | JPS62232796A (enExample) |
| KR (1) | KR910000152B1 (enExample) |
| DE (1) | DE3710821A1 (enExample) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4953130A (en) * | 1988-06-27 | 1990-08-28 | Texas Instruments, Incorporated | Memory circuit with extended valid data output time |
| JP2614514B2 (ja) * | 1989-05-19 | 1997-05-28 | 三菱電機株式会社 | ダイナミック・ランダム・アクセス・メモリ |
| JP3066595B2 (ja) * | 1989-06-20 | 2000-07-17 | 日本テキサス・インスツルメンツ株式会社 | 駆動回路 |
| JP2825135B2 (ja) * | 1990-03-06 | 1998-11-18 | 富士通株式会社 | 半導体記憶装置及びその情報書込読出消去方法 |
| JPH0834058B2 (ja) * | 1990-03-19 | 1996-03-29 | シャープ株式会社 | 半導体メモリ装置 |
| JPH05266663A (ja) * | 1992-03-19 | 1993-10-15 | Fujitsu Ltd | 半導体記憶装置 |
| EP0756285B1 (en) * | 1995-07-28 | 2000-07-05 | STMicroelectronics S.r.l. | Modulated slope signal generation circuit, particularly for latch data sensing arrangements |
| DE69531823T2 (de) * | 1995-07-28 | 2004-07-01 | Stmicroelectronics S.R.L., Agrate Brianza | Asymmetrische Verriegelungsschaltung und diese enthaltende Schmelzsicherungsschatung |
| JPH0955088A (ja) * | 1995-08-11 | 1997-02-25 | Nec Corp | 半導体メモリ |
| EP0798729B1 (en) * | 1996-03-29 | 2004-11-03 | STMicroelectronics S.r.l. | Reference word line and data propagation reproduction circuit, particularly for non-volatile memories provided with hierarchical decoders |
| US5912853A (en) * | 1996-12-03 | 1999-06-15 | Cirrus Logic, Inc. | Precision sense amplifiers and memories, systems and methods using the same |
| US5901092A (en) * | 1997-08-22 | 1999-05-04 | Micron Technology, Inc. | Memory device having pipelined access and method for pipelining data access |
| KR100275107B1 (ko) | 1997-12-30 | 2000-12-15 | 김영환 | 강유전체메모리장치및그구동방법 |
| US9494647B1 (en) * | 2013-12-31 | 2016-11-15 | Gsi Technology, Inc. | Systems and methods involving data inversion devices, circuitry, schemes and/or related aspects |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2623219B2 (de) * | 1976-05-24 | 1978-10-12 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Verfahren zum Betreiben einer Leseverstärkerschaltung für einen dynamischen MOS-Speicher und Anordnung zur Durchführung dieses Verfahrens |
| US4421996A (en) * | 1981-10-09 | 1983-12-20 | Advanced Micro Devices, Inc. | Sense amplification scheme for random access memory |
-
1986
- 1986-04-01 JP JP61074979A patent/JPS62232796A/ja active Pending
-
1987
- 1987-03-30 US US07/031,615 patent/US4811290A/en not_active Expired - Lifetime
- 1987-04-01 DE DE19873710821 patent/DE3710821A1/de active Granted
- 1987-04-01 KR KR1019870003079A patent/KR910000152B1/ko not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| KR870010549A (ko) | 1987-11-30 |
| JPS62232796A (ja) | 1987-10-13 |
| DE3710821C2 (enExample) | 1989-12-28 |
| US4811290A (en) | 1989-03-07 |
| DE3710821A1 (de) | 1987-10-15 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR910000152B1 (ko) | 반도체기억장치 | |
| EP0725402B1 (en) | Semiconductor memory device | |
| KR100201120B1 (ko) | 디-램형 집적 반도체 메모리와 그 시험방법 | |
| EP0128499A2 (en) | MOS memory | |
| US5220527A (en) | Dynamic type semiconductor memory device | |
| KR880004479A (ko) | 다이나믹형 반도체기억장치 | |
| US4791616A (en) | Semiconductor memory device | |
| EP0917151B1 (en) | Semiconductor memory device for reading charges stored in capacitor in memory cell and data reading method therefor | |
| US5323345A (en) | Semiconductor memory device having read/write circuitry | |
| US4831597A (en) | Dynamic random access semiconductor memory wherein the RAS and CAS strobes respectively select the bit line and word line pairs | |
| US4734889A (en) | Semiconductor memory | |
| KR890003373B1 (ko) | 씨모오스 반도체 메모리 장치의 입출력 회로 | |
| KR100264075B1 (ko) | 전하 증폭 비트 라인 센스 앰프 | |
| KR910004733B1 (ko) | 데이타 버스 리셋트 회로를 지닌 반도체 기억장치 | |
| US6198681B1 (en) | Sense amplifier for low voltage memory arrays | |
| JP3308572B2 (ja) | 半導体装置 | |
| US6519175B2 (en) | Ferroelectric memory device | |
| US4807193A (en) | Semiconductor memory device with a detection circuit to detect word line potential | |
| US5365488A (en) | Data reading circuit having a clamping circuit for clamping a pair of data buses to predetermined potentials | |
| US5023842A (en) | Semiconductor memory having improved sense amplifiers | |
| KR0167673B1 (ko) | 오프셋 보상기능을 갖는 비트라인 감지 증폭기 및 그 제어방법 | |
| KR910010518A (ko) | 반도체 메모리 장치 | |
| US20050195638A1 (en) | Integrated semiconductor memory device and method for operating an integrated semiconductor memory device | |
| KR940008139B1 (ko) | 반도체 메모리 장치의 데이타 감지 증폭회로 | |
| JP3141494B2 (ja) | 半導体記憶装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| A201 | Request for examination | ||
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| G160 | Decision to publish patent application | ||
| PG1605 | Publication of application before grant of patent |
St.27 status event code: A-2-2-Q10-Q13-nap-PG1605 |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
St.27 status event code: A-2-4-F10-F11-exm-PR0701 |
|
| PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U11-oth-PR1002 Fee payment year number: 1 |
|
| LAPS | Lapse due to unpaid annual fee | ||
| PC1903 | Unpaid annual fee |
St.27 status event code: A-4-4-U10-U13-oth-PC1903 Not in force date: 19940122 Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE |
|
| PC1903 | Unpaid annual fee |
St.27 status event code: N-4-6-H10-H13-oth-PC1903 Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE Not in force date: 19940122 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |