KR880014678A - 고체촬상장치 - Google Patents
고체촬상장치 Download PDFInfo
- Publication number
- KR880014678A KR880014678A KR870004874A KR870004874A KR880014678A KR 880014678 A KR880014678 A KR 880014678A KR 870004874 A KR870004874 A KR 870004874A KR 870004874 A KR870004874 A KR 870004874A KR 880014678 A KR880014678 A KR 880014678A
- Authority
- KR
- South Korea
- Prior art keywords
- conductivity type
- voltage
- solid state
- imaging device
- state imaging
- Prior art date
Links
- 238000003384 imaging method Methods 0.000 title claims description 3
- 239000007787 solid Substances 0.000 title claims 3
- 238000009825 accumulation Methods 0.000 claims 3
- 239000000758 substrate Substances 0.000 claims 2
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/148—Charge coupled imagers
- H01L27/14831—Area CCD imagers
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Abstract
내용 없음
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본원 발명에 의한 고체촬상장치의 요부를 나타내는 단면도, 제2도 a 및 제2도 b는 각각 펄스 전압(Øv)과 암신호의 파형을 나타내는 타이밍챠트, 제3도는 펄스 전압(Øv)의 듀티비(T2/T1)와 스미어 레벨과의 관계 및 듀티비(T2/T1)와 암신호 출력과의 관계를 나타내는 그래프.
Claims (3)
- (a) 제1의 도전형 기판과, (b) 이 제1의 도전형 기판의 표면에 형성된 제2의 도전형 전하축적영역과, (c) 이 제2의 도전형 전하축적 영역위에 절연막을 통하여 형성된 전방전극과, (d) 상기 제2의 도전형 전하축적 영역과 상기 절연막과의 계면에 제1의 도전형 전하를 축적하기 위한 제1의 전압 및 상기 제2의 도전형 전하축적 영역 아래의 공핍층을 확대하기 위한 제2의 전압을 교대로 상기 전방전극에 공급하는 수단으로 이루어지는 것을 특징으로 하는 고체촬상장치.
- 제1항에 있어서, 상기 제2전압의 상기 제1전압에 대한 듀티비는 약2 내지 5의 범위인 것을 특징으로 하는 고체촬상장치.
- 제1항에 있어서, 상기 제1전압은 1수평 블랭킹 기간내에 부여되는 것을 특징으로 하는 고체촬상장치※ 참고사항:최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61114375A JPS62269357A (ja) | 1986-05-19 | 1986-05-19 | 固体撮像装置 |
JP86-114375 | 1986-05-19 | ||
JP?????86-114375 | 1986-05-19 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR880014678A true KR880014678A (ko) | 1988-12-24 |
KR960004467B1 KR960004467B1 (ko) | 1996-04-06 |
Family
ID=14636115
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019870004874A KR960004467B1 (ko) | 1986-05-19 | 1987-05-18 | 고체촬상장치 |
Country Status (5)
Country | Link |
---|---|
US (1) | US4794279A (ko) |
EP (1) | EP0247503B1 (ko) |
JP (1) | JPS62269357A (ko) |
KR (1) | KR960004467B1 (ko) |
DE (1) | DE3751102T2 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101385014B1 (ko) * | 2009-10-09 | 2014-04-14 | 고쿠리츠 다이가꾸 호우진 시즈오까 다이가꾸 | 반도체 소자 및 고체 촬상 장치 |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01125074A (ja) * | 1987-11-10 | 1989-05-17 | Fuji Photo Film Co Ltd | 固体撮像装置 |
JPH07112054B2 (ja) * | 1988-03-08 | 1995-11-29 | 株式会社東芝 | 固体撮像装置 |
JPH0766961B2 (ja) * | 1988-10-07 | 1995-07-19 | 三菱電機株式会社 | 固体撮像素子 |
NL8901283A (nl) * | 1989-05-23 | 1990-12-17 | Philips Nv | Ladingsgekoppelde inrichting en beeldopneeminrichting omvattende een dergelijke ladingsgekoppelde inrichting, en camera voorzien van een dergelijke beeldopneeminrichting. |
JPH02309877A (ja) * | 1989-05-25 | 1990-12-25 | Sony Corp | 固体撮像装置 |
US5182623A (en) * | 1989-11-13 | 1993-01-26 | Texas Instruments Incorporated | Charge coupled device/charge super sweep image system and method for making |
US5528643A (en) * | 1989-11-13 | 1996-06-18 | Texas Instruments Incorporated | Charge coupled device/charge super sweep image system and method for making |
JP2738589B2 (ja) * | 1990-09-05 | 1998-04-08 | 三菱電機株式会社 | 固体撮像素子 |
JP2690612B2 (ja) * | 1990-10-05 | 1997-12-10 | キヤノン株式会社 | 光電変換装置 |
US5329149A (en) * | 1990-10-12 | 1994-07-12 | Seiko Instruments Inc. | Image sensor with non-light-transmissive layer having photosensing windows |
JP2500428B2 (ja) * | 1993-04-06 | 1996-05-29 | 日本電気株式会社 | イメ―ジセンサおよびその駆動方法 |
US5757427A (en) * | 1993-04-23 | 1998-05-26 | Hamamatsu Photonics K.K. | Image pick-up apparatus having a charge coupled device with multiple electrodes, a buffer layer located below some of the electrodes |
JPH08264747A (ja) * | 1995-03-16 | 1996-10-11 | Eastman Kodak Co | コンテナ側方オーバーフロードレインインプラントを有する固体画像化器及びその製造方法 |
JP2005348061A (ja) * | 2004-06-02 | 2005-12-15 | Sanyo Electric Co Ltd | 電子カメラ |
DE602004025681D1 (de) * | 2004-06-15 | 2010-04-08 | St Microelectronics Res & Dev | Bildsensor |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5323224A (en) * | 1976-08-16 | 1978-03-03 | Hitachi Ltd | Solid pickup unit |
JPS6157181A (ja) * | 1984-08-28 | 1986-03-24 | Sharp Corp | 固体撮像装置 |
JPH0795827B2 (ja) * | 1985-07-22 | 1995-10-11 | 株式会社ニコン | カメラ駆動装置 |
JPS61219271A (ja) * | 1985-03-25 | 1986-09-29 | Nippon Kogaku Kk <Nikon> | インタ−ライン転送型ccdの駆動方法 |
US4743778A (en) * | 1985-03-25 | 1988-05-10 | Nippon Kogaku K. K. | Solid-state area imaging device having interline transfer CCD |
-
1986
- 1986-05-19 JP JP61114375A patent/JPS62269357A/ja active Pending
-
1987
- 1987-05-18 KR KR1019870004874A patent/KR960004467B1/ko not_active IP Right Cessation
- 1987-05-18 US US07/050,400 patent/US4794279A/en not_active Expired - Lifetime
- 1987-05-19 EP EP87107292A patent/EP0247503B1/en not_active Expired - Lifetime
- 1987-05-19 DE DE3751102T patent/DE3751102T2/de not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101385014B1 (ko) * | 2009-10-09 | 2014-04-14 | 고쿠리츠 다이가꾸 호우진 시즈오까 다이가꾸 | 반도체 소자 및 고체 촬상 장치 |
Also Published As
Publication number | Publication date |
---|---|
US4794279A (en) | 1988-12-27 |
DE3751102T2 (de) | 1995-10-12 |
DE3751102D1 (de) | 1995-04-06 |
EP0247503B1 (en) | 1995-03-01 |
EP0247503A2 (en) | 1987-12-02 |
KR960004467B1 (ko) | 1996-04-06 |
JPS62269357A (ja) | 1987-11-21 |
EP0247503A3 (en) | 1990-04-04 |
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