KR860004163A - 성막 지향성을 고려한 스팟타링 장치 - Google Patents

성막 지향성을 고려한 스팟타링 장치 Download PDF

Info

Publication number
KR860004163A
KR860004163A KR1019850008419A KR850008419A KR860004163A KR 860004163 A KR860004163 A KR 860004163A KR 1019850008419 A KR1019850008419 A KR 1019850008419A KR 850008419 A KR850008419 A KR 850008419A KR 860004163 A KR860004163 A KR 860004163A
Authority
KR
South Korea
Prior art keywords
target
film
spot
spotting
directivity
Prior art date
Application number
KR1019850008419A
Other languages
English (en)
Other versions
KR900001825B1 (ko
Inventor
마사오 사가다 (외 5)
Original Assignee
미쓰다 가쓰시게
가부시기 가이샤 히다찌 세이사꾸쇼
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP59238358A external-priority patent/JPS61117276A/ja
Priority claimed from JP23835484A external-priority patent/JPH0660390B2/ja
Application filed by 미쓰다 가쓰시게, 가부시기 가이샤 히다찌 세이사꾸쇼 filed Critical 미쓰다 가쓰시게
Publication of KR860004163A publication Critical patent/KR860004163A/ko
Application granted granted Critical
Publication of KR900001825B1 publication Critical patent/KR900001825B1/ko

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411Constructional aspects of the reactor
    • H01J37/3414Targets
    • H01J37/3423Shape
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3402Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
    • H01J37/3405Magnetron sputtering
    • H01J37/3408Planar magnetron sputtering
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/32Processing objects by plasma generation
    • H01J2237/33Processing objects by plasma generation characterised by the type of processing
    • H01J2237/332Coating
    • H01J2237/3322Problems associated with coating
    • H01J2237/3327Coating high aspect ratio workpieces

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Materials Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)

Abstract

내용 없음

Description

성막 지향성을 고려한 스팟타링 장치
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명의 실시예를 도시한 도면.
제3도, 제4도는 성막후의 단차를 설명하기 위한 단면도.

Claims (4)

  1. 스팟타링 현상을 일으키는 프라스마를 발생시키는데 필요한 소정의 부압(負壓)환경을 일으키고, 또한 유지하기 위한 진공배기 수단과, 상기 프라스마를 주로 발생시키기 위한 희석(稀釋)까스를 도입하고 소정의 유량을 유지하기 위한 희석가스 공급수단과, 주로 상기 희석가스를 여기하여, 상기 프라스마를 발생시켜서 상기 스팟타링 현상을 일으키기 위한 전력을 공급하는 고주파 전력공급 수단과, 상기 스팟타링 현상에 의해서, 상기 희석가스의 구성입자에 의해 때려져서 피성막 재료인 스팟타링 입자를 방출하는 타겟트와, 발생한 프라스마를 상기 타겟트의 소정의 위치로 유지하기 위한 자계발생 수단과, 상기 타겟트에 대향하여 배치된 성막대상 기판을 유지하는 기판 유지 공구를 가진 뿌레나 마구네토론 스팟타링 성막장치에 있어서, 상기 성막 대상 기판 401; 제1도, 2;제17도와, 이에 대향하는 상기 타겟트 200;제1도 표면과의 사이에, 그 타겟트에서 때려저 나오는 스팟타링 입자의 일부의 비정(飛程)을 차단하는 벽 201;203;제1도;제2도;제5도에서 제11도까지, 12; 제17도; 제18도; 제19도를 마련한 것을 특징으로 하는 성막 지향성을 고려한 스팟타링장치.
  2. 특허청구의 범위 제1항의 성막 지향성을 고려하는 스팟타링 장치에 있어서, 상기 스팟타링 입자의 일부의 비정을 차단하는 벽은, 상기 타겟트 자체에 형성된 요부의 측벽, 201;203; 제1도; 제2도; 제5도에서 제11도까지, 제15도; 제16도; 제22도인 것을 특징으로 하는 성막 지향성을 고려한 스팟타링장치.
  3. 특허청구의 범위 제2항의 성막지향성을 고려하는 스팟타링장치에 있어서, 상기 타겟트 자체에 형성된 요부의 형상은, 그 요부와, 등가인 다수개의 기둥 a; 제15도, a1',a2'; 제16도의 조합에 의해서 실현되는 것을 특징으로 하는 성막지향성을 고려한 스팟타링장치.
  4. 특허청구의 범위 제1항의 성막 지향성을 고려하는 스팟타링 장치에 있어서, 상기 스팟타링 입자의 일부의 비정을 차단하는 벽은, 상기 성막 대상 기판의 근방에 배치된 후레임 12; 제17도; 제18도; 제19도이고, 상기 타겟트는, 그 외주부에 웰 14; 제17도; 제18도를 가진것을 특징으로 하는 성막 지향성을 고려한 스팟타링 장치.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019850008419A 1984-11-14 1985-11-12 성막 지향성을 고려한 스퍼터링장치 KR900001825B1 (ko)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP59238358A JPS61117276A (ja) 1984-11-14 1984-11-14 スパツタリング用タ−ゲツト
JP23835484A JPH0660390B2 (ja) 1984-11-14 1984-11-14 プレーナマグネトロン方式の微小孔を有する成膜対象基板への成膜方法およびその装置
JP59-238358 1984-11-14
JP59-238354 1984-11-14

Publications (2)

Publication Number Publication Date
KR860004163A true KR860004163A (ko) 1986-06-18
KR900001825B1 KR900001825B1 (ko) 1990-03-24

Family

ID=26533654

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019850008419A KR900001825B1 (ko) 1984-11-14 1985-11-12 성막 지향성을 고려한 스퍼터링장치

Country Status (4)

Country Link
US (1) US4724060A (ko)
EP (1) EP0187226B1 (ko)
KR (1) KR900001825B1 (ko)
DE (1) DE3575811D1 (ko)

Families Citing this family (60)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4824544A (en) * 1987-10-29 1989-04-25 International Business Machines Corporation Large area cathode lift-off sputter deposition device
US5015331A (en) * 1988-08-30 1991-05-14 Matrix Integrated Systems Method of plasma etching with parallel plate reactor having a grid
US5133849A (en) * 1988-12-12 1992-07-28 Ricoh Company, Ltd. Thin film forming apparatus
US4957605A (en) * 1989-04-17 1990-09-18 Materials Research Corporation Method and apparatus for sputter coating stepped wafers
US5635036A (en) * 1990-01-26 1997-06-03 Varian Associates, Inc. Collimated deposition apparatus and method
US6521106B1 (en) * 1990-01-29 2003-02-18 Novellus Systems, Inc. Collimated deposition apparatus
DE69129081T2 (de) * 1990-01-29 1998-07-02 Varian Associates Gerät und Verfahren zur Niederschlagung durch einen Kollimator
US5437778A (en) * 1990-07-10 1995-08-01 Telic Technologies Corporation Slotted cylindrical hollow cathode/magnetron sputtering device
AU8629491A (en) * 1990-08-30 1992-03-30 Materials Research Corporation Pretextured cathode sputtering target and method of preparation thereof and sputtering therewith
CA2061119C (en) * 1991-04-19 1998-02-03 Pei-Ing P. Lee Method of depositing conductors in high aspect ratio apertures
JP2725944B2 (ja) * 1991-04-19 1998-03-11 インターナショナル・ビジネス・マシーンズ・コーポレイション 金属層堆積方法
JPH05160070A (ja) * 1991-05-31 1993-06-25 Texas Instr Inc <Ti> 半導体装置の接点とその製法
US5171412A (en) * 1991-08-23 1992-12-15 Applied Materials, Inc. Material deposition method for integrated circuit manufacturing
US5334302A (en) * 1991-11-15 1994-08-02 Tokyo Electron Limited Magnetron sputtering apparatus and sputtering gun for use in the same
US5223108A (en) * 1991-12-30 1993-06-29 Materials Research Corporation Extended lifetime collimator
US5300813A (en) 1992-02-26 1994-04-05 International Business Machines Corporation Refractory metal capped low resistivity metal conductor lines and vias
US5371042A (en) * 1992-06-16 1994-12-06 Applied Materials, Inc. Method of filling contacts in semiconductor devices
US5367412A (en) * 1992-09-10 1994-11-22 Rohm Co., Ltd. Recording/reproducing circuit and recording/reproducing apparatus having the same circuit
JP3169151B2 (ja) * 1992-10-26 2001-05-21 三菱電機株式会社 薄膜形成装置
US5384281A (en) * 1992-12-29 1995-01-24 International Business Machines Corporation Non-conformal and oxidizable etch stops for submicron features
US5378660A (en) * 1993-02-12 1995-01-03 Applied Materials, Inc. Barrier layers and aluminum contacts
US5358616A (en) * 1993-02-17 1994-10-25 Ward Michael G Filling of vias and contacts employing an aluminum-germanium alloy
EP0634779A1 (en) * 1993-06-11 1995-01-18 Applied Materials, Inc. Collimation chamber with rotatable pedestal
US5362372A (en) * 1993-06-11 1994-11-08 Applied Materials, Inc. Self cleaning collimator
US5415753A (en) * 1993-07-22 1995-05-16 Materials Research Corporation Stationary aperture plate for reactive sputter deposition
US5409587A (en) * 1993-09-16 1995-04-25 Micron Technology, Inc. Sputtering with collinator cleaning within the sputtering chamber
US5472565A (en) * 1993-11-17 1995-12-05 Lam Research Corporation Topology induced plasma enhancement for etched uniformity improvement
US5958193A (en) * 1994-02-01 1999-09-28 Vlsi Technology, Inc. Sputter deposition with mobile collimator
TW278206B (ko) * 1994-03-28 1996-06-11 Materials Research Corp
US5711858A (en) * 1994-04-12 1998-01-27 International Business Machines Corporation Process for depositing a conductive thin film upon an integrated circuit substrate
US5527438A (en) * 1994-12-16 1996-06-18 Applied Materials, Inc. Cylindrical sputtering shield
US5982986A (en) 1995-02-03 1999-11-09 Applied Materials, Inc. Apparatus and method for rotationally aligning and degassing semiconductor substrate within single vacuum chamber
US5885425A (en) * 1995-06-06 1999-03-23 International Business Machines Corporation Method for selective material deposition on one side of raised or recessed features
US5757879A (en) * 1995-06-07 1998-05-26 International Business Machines Corporation Tungsten absorber for x-ray mask
US5725739A (en) * 1996-07-08 1998-03-10 Micron Technology, Inc. Low angle, low energy physical vapor deposition of alloys
JPH1046332A (ja) * 1996-07-30 1998-02-17 Nec Corp 金属薄膜形成装置
US5783282A (en) 1996-10-07 1998-07-21 Micron Technology, Inc. Resputtering to achieve better step coverage of contact holes
US6162297A (en) * 1997-09-05 2000-12-19 Applied Materials, Inc. Embossed semiconductor fabrication parts
US6140236A (en) * 1998-04-21 2000-10-31 Kabushiki Kaisha Toshiba High throughput A1-Cu thin film sputtering process on small contact via for manufacturable beol wiring
DE19819933A1 (de) * 1998-05-05 1999-11-11 Leybold Systems Gmbh Target für eine Kathodenzerstäubungsvorrichtung zur Herstellung dünner Schichten
US6592728B1 (en) * 1998-08-04 2003-07-15 Veeco-Cvc, Inc. Dual collimated deposition apparatus and method of use
US6933508B2 (en) 2002-03-13 2005-08-23 Applied Materials, Inc. Method of surface texturizing
US6812471B2 (en) * 2002-03-13 2004-11-02 Applied Materials, Inc. Method of surface texturizing
WO2006023321A2 (en) * 2004-08-16 2006-03-02 Williams Advanced Materials, Inc. Slotted thin-film sputter deposition targets for ferromagnetic materials
TWI265202B (en) * 2005-03-02 2006-11-01 Asia Optical Co Inc Tool and device for dedicate coating a photochemical film on a substrate
US20060292310A1 (en) * 2005-06-27 2006-12-28 Applied Materials, Inc. Process kit design to reduce particle generation
JP4923450B2 (ja) * 2005-07-01 2012-04-25 富士ゼロックス株式会社 バッチ処理支援装置および方法、プログラム
US20070084720A1 (en) * 2005-07-13 2007-04-19 Akihiro Hosokawa Magnetron sputtering system for large-area substrates having removable anodes
US20070012663A1 (en) * 2005-07-13 2007-01-18 Akihiro Hosokawa Magnetron sputtering system for large-area substrates having removable anodes
US20070012559A1 (en) * 2005-07-13 2007-01-18 Applied Materials, Inc. Method of improving magnetron sputtering of large-area substrates using a removable anode
US20070012558A1 (en) * 2005-07-13 2007-01-18 Applied Materials, Inc. Magnetron sputtering system for large-area substrates
US20070051616A1 (en) * 2005-09-07 2007-03-08 Le Hienminh H Multizone magnetron assembly
US7588668B2 (en) 2005-09-13 2009-09-15 Applied Materials, Inc. Thermally conductive dielectric bonding of sputtering targets using diamond powder filler or thermally conductive ceramic fillers
US20070056843A1 (en) * 2005-09-13 2007-03-15 Applied Materials, Inc. Method of processing a substrate using a large-area magnetron sputtering chamber with individually controlled sputtering zones
US20070056850A1 (en) * 2005-09-13 2007-03-15 Applied Materials, Inc. Large-area magnetron sputtering chamber with individually controlled sputtering zones
US20090166183A1 (en) * 2007-12-28 2009-07-02 Yinshi Liu Method of manufacturing a perpendicular magnetic write head with stepped trailing magnetic shield using collimated sputter deposition
US20090194414A1 (en) * 2008-01-31 2009-08-06 Nolander Ira G Modified sputtering target and deposition components, methods of production and uses thereof
KR101611410B1 (ko) * 2009-04-07 2016-04-11 삼성전자주식회사 그래핀의 제조 방법
US20200135464A1 (en) * 2018-10-30 2020-04-30 Applied Materials, Inc. Methods and apparatus for patterning substrates using asymmetric physical vapor deposition
DE102021104255A1 (de) * 2021-02-23 2022-08-25 Cemecon Ag. Zerstäubungstarget

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4170541A (en) * 1978-08-14 1979-10-09 Varian Associates, Inc. Rotating resonator for large substrate tables in sputtering systems
US4322277A (en) * 1980-11-17 1982-03-30 Rca Corporation Step mask for substrate sputtering
US4391034A (en) * 1980-12-22 1983-07-05 Ibm Corporation Thermally compensated shadow mask
CH649578A5 (de) * 1981-03-27 1985-05-31 Ulvac Corp Hochgeschwindigkeits-kathoden-zerstaeubungsvorrichtung.
DE3112104A1 (de) * 1981-03-27 1982-10-07 Leybold-Heraeus GmbH, 5000 Köln Verfahren und vorrichtung zum herstellen von elektrisch leitfaehigen transparenten oxidschichten
US4410407A (en) * 1981-12-22 1983-10-18 Raytheon Company Sputtering apparatus and methods
US4474659A (en) * 1982-05-28 1984-10-02 Fazal Fazlin Plated-through-hole method
DE3223245C2 (de) * 1982-07-23 1986-05-22 Nihon Shinku Gijutsu K.K., Chigasaki, Kanagawa Ferromagnetische Hochgeschwindigkeits-Kathodenzerstäubungs-Vorrichtung
US4414086A (en) * 1982-11-05 1983-11-08 Varian Associates, Inc. Magnetic targets for use in sputter coating apparatus
US4414087A (en) * 1983-01-31 1983-11-08 Meckel Benjamin B Magnetically-assisted sputtering method for producing vertical recording media
JPS59207631A (ja) * 1983-05-11 1984-11-24 Semiconductor Res Found 光化学を用いたドライプロセス装置
EP0144572B1 (de) * 1983-12-05 1989-10-18 Leybold Aktiengesellschaft Magnetronkatode zum Zerstäuben ferromagnetischer Targets
US4508612A (en) * 1984-03-07 1985-04-02 International Business Machines Corporation Shield for improved magnetron sputter deposition into surface recesses

Also Published As

Publication number Publication date
EP0187226A3 (en) 1987-04-08
US4724060A (en) 1988-02-09
EP0187226A2 (en) 1986-07-16
KR900001825B1 (ko) 1990-03-24
EP0187226B1 (en) 1990-01-31
DE3575811D1 (de) 1990-03-08

Similar Documents

Publication Publication Date Title
KR860004163A (ko) 성막 지향성을 고려한 스팟타링 장치
ATE394789T1 (de) Behandlungsvorrichtungen
JPS5329076A (en) Plasma treating apparatus of semiconductor substrates
KR910005410A (ko) 웨이퍼의 전방표면으로 부터의 재료들의 제거를 방지하면서 반도체 웨이퍼의 후방측면과 단부테두리로 부터 증착부를 제거하기 위한 방법 및 장치
KR970052615A (ko) 고밀도 플라즈마 반응로용 중앙 가스 공급 장치
KR970003434A (ko) 스퍼터링장치
JPS57141930A (en) Device for formation of thin film
ES2069414T3 (es) Dispositivo de flujo de chorro para inyectar gas en metal fundido.
JPS51140619A (en) Vibration member for acoustic convertor
JPS5267353A (en) Electrostatic chuck
FR2357329A1 (fr) Procede de placage par explosion d&#39;un materiau en poudre sur une surface rigide
RU95106611A (ru) Устройство для измерения изменений тяги плазменного ракетного двигателя с замкнутым дрейфом электронов
JPS5756036A (en) Plasma chemical vapor phase reactor
KR960010904A (ko) 플라즈마 처리장치
FR2414843A1 (fr) Dispositif pour produire un jet de plasma
JPS5211088A (en) Method of generating gas at standard concentration
KR970000198B1 (en) Process for anisotropically etching semiconductor material
JPS5330875A (en) Production of semiconductor device
JPS52127761A (en) Gas plasma etching unit
JPS5220762A (en) Gas discharge display panel
GB1062569A (en) High-frequency discharge generator
JPS52102999A (en) Ion source device
JPS53105699A (en) Cold cathod discharging type ion source device
JPS5248847A (en) Safety valve for gas
SU532724A1 (ru) Горелка дл газоплазменной обработки материалов

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
G160 Decision to publish patent application
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 19960321

Year of fee payment: 7

LAPS Lapse due to unpaid annual fee