KR20160140606A - 컨텍트 어셈블리 특히, 고주파 측정 팁 - Google Patents

컨텍트 어셈블리 특히, 고주파 측정 팁 Download PDF

Info

Publication number
KR20160140606A
KR20160140606A KR1020167024063A KR20167024063A KR20160140606A KR 20160140606 A KR20160140606 A KR 20160140606A KR 1020167024063 A KR1020167024063 A KR 1020167024063A KR 20167024063 A KR20167024063 A KR 20167024063A KR 20160140606 A KR20160140606 A KR 20160140606A
Authority
KR
South Korea
Prior art keywords
conductor
contact
impedance
carrier
ground
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
KR1020167024063A
Other languages
English (en)
Korean (ko)
Inventor
로랜드 노이하우저
Original Assignee
로젠버거 호흐프리쿠벤츠테흐닉 게엠베하 운트 코. 카게
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 로젠버거 호흐프리쿠벤츠테흐닉 게엠베하 운트 코. 카게 filed Critical 로젠버거 호흐프리쿠벤츠테흐닉 게엠베하 운트 코. 카게
Publication of KR20160140606A publication Critical patent/KR20160140606A/ko
Ceased legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06766—Input circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
KR1020167024063A 2014-04-01 2015-01-13 컨텍트 어셈블리 특히, 고주파 측정 팁 Ceased KR20160140606A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE202014002841.9U DE202014002841U1 (de) 2014-04-01 2014-04-01 Kontaktieranordnung, insbesondere HF-Messspitze
DE202014002841.9 2014-04-01
PCT/EP2015/000044 WO2015149893A1 (de) 2014-04-01 2015-01-13 Kontaktieranordnung, insbesondere hf-messspitze

Publications (1)

Publication Number Publication Date
KR20160140606A true KR20160140606A (ko) 2016-12-07

Family

ID=51163835

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020167024063A Ceased KR20160140606A (ko) 2014-04-01 2015-01-13 컨텍트 어셈블리 특히, 고주파 측정 팁

Country Status (9)

Country Link
US (1) US9804195B2 (https=)
EP (1) EP3126852B1 (https=)
JP (1) JP2017516084A (https=)
KR (1) KR20160140606A (https=)
CN (1) CN106133531B (https=)
CA (1) CA2940904C (https=)
DE (1) DE202014002841U1 (https=)
TW (1) TWM504245U (https=)
WO (1) WO2015149893A1 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE202014106223U1 (de) * 2014-12-22 2016-03-23 Ingun Prüfmittelbau Gmbh Hochfrequenz-Prüfstift
GB2546794B (en) * 2016-01-29 2020-01-08 Teraview Ltd A transmission line
CN110297110B (zh) * 2018-03-21 2022-02-15 科磊股份有限公司 探针结构、夹具、容置盒、自动化探针替换系统及方法
TWI665448B (zh) * 2018-07-13 2019-07-11 中華精測科技股份有限公司 高頻探針卡裝置及其信號傳輸模組
US11101215B2 (en) * 2018-09-19 2021-08-24 PsiQuantum Corp. Tapered connectors for superconductor circuits
KR102577446B1 (ko) 2019-02-12 2023-09-11 삼성전자주식회사 테스트 보드 및 이의 제조 방법, 테스트 보드를 이용한 소자 검사 장비, 및 테스트 보드를 이용한 반도체 장치의 제조 방법
DE102020102302A1 (de) * 2020-01-30 2021-08-05 Ingun Prüfmittelbau Gmbh Hochfrequenz-Prüfkontaktelement und Prüfstiftvorrichtung
DE102020119282B4 (de) * 2020-07-22 2022-06-09 Md Elektronik Gmbh Kontaktvorrichtung

Family Cites Families (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58136108A (ja) * 1982-02-08 1983-08-13 Nec Corp メアンダ型伝送線路
US4697143A (en) * 1984-04-30 1987-09-29 Cascade Microtech, Inc. Wafer probe
DD278041A3 (de) * 1987-11-06 1990-04-25 Akad Wissenschaften Ddr Anordnung zur Messung kleinster Kapazitätsänderungen
US5005932A (en) * 1989-11-06 1991-04-09 Hughes Aircraft Company Electro-optic modulator
JPH04155261A (ja) * 1990-10-18 1992-05-28 Mitsubishi Electric Corp 超高周波プローブ針
US5457399A (en) * 1992-12-14 1995-10-10 Hughes Aircraft Company Microwave monolithic integrated circuit fabrication, test method and test probes
US5561378A (en) * 1994-07-05 1996-10-01 Motorola, Inc. Circuit probe for measuring a differential circuit
US5506515A (en) * 1994-07-20 1996-04-09 Cascade Microtech, Inc. High-frequency probe tip assembly
US6229327B1 (en) * 1997-05-30 2001-05-08 Gregory G. Boll Broadband impedance matching probe
DE19945178C2 (de) * 1999-09-21 2003-05-28 Rosenberger Hochfrequenztech Meßspitze zur Hochfrequenzmessung und Verfahren zu deren Herstellung
JP3356736B2 (ja) * 1999-11-01 2002-12-16 エヌイーシーワイヤレスネットワークス株式会社 高周波プローブ
JP2001244308A (ja) * 2000-02-25 2001-09-07 Mitsubishi Electric Corp 高周波信号用のプローブ
JP2003087011A (ja) * 2001-06-27 2003-03-20 Murata Mfg Co Ltd 誘電体デュプレクサおよび通信装置
DE10136726A1 (de) * 2001-07-27 2003-04-03 Connexion Rosenberger Gmbh Meßanordnung für Hochfrequenzmessungen mit mehreren Meßsonden und ein Verfahren zur Herstellung derselben
US6930497B2 (en) * 2001-12-19 2005-08-16 Chung Shan Institute Of Science And Technology Armaments Bureau, M.N.D. Flexible multi-layered probe for measuring a signal from an object
DE10217387B4 (de) * 2002-04-18 2018-04-12 Snaptrack, Inc. Elektrisches Anpassungsnetzwerk mit einer Transformationsleitung
US6956445B2 (en) * 2003-02-19 2005-10-18 Electro-Tec Corp. Broadband high-frequency slip ring system
DE202004021093U1 (de) * 2003-12-24 2006-09-28 Cascade Microtech, Inc., Beaverton Aktiver Halbleiterscheibenmessfühler
DE102004059960A1 (de) * 2004-12-13 2006-06-22 Bourns, Inc., Riverside Schaltungsanordnung zur Messung eines elektrischen Stromes
DE202004019636U1 (de) * 2004-12-20 2005-03-03 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Meßspitze für HF-Messung
CN2779421Y (zh) * 2005-01-14 2006-05-10 廊坊市万科石油天然气技术工程有限公司 用于低磁场核磁共振有源发射接收探头
JP2006317156A (ja) * 2005-05-10 2006-11-24 Matsushita Electric Ind Co Ltd ベクトルネットワークアナライザ、ベクトルネットワークアナライザの校正方法、計算機及び標準器基板
JP2007010522A (ja) * 2005-06-30 2007-01-18 Matsushita Electric Ind Co Ltd スルー標準器基板及びライン標準器基板
EP1982432B1 (en) * 2006-01-31 2016-08-10 Telefonaktiebolaget LM Ericsson (publ) A method and a system for cable or subscriber loop investigation performing loop topology identification
JP2007205995A (ja) * 2006-02-03 2007-08-16 Advanced Systems Japan Inc 高周波プローブ
EP1818672B1 (de) * 2006-02-14 2012-08-29 Mettler-Toledo AG Messvorrichtung und Verfahren für den Betrieb der Messvorrichtung
US7612733B2 (en) * 2007-03-12 2009-11-03 The Regents Of The University Of Colorado Transition region for use with an antenna-integrated electron tunneling device and method
US8212580B2 (en) * 2007-04-02 2012-07-03 Google Inc. Scalable wideband probes, fixtures, and sockets for high speed IC testing and interconnects
JP2009014385A (ja) * 2007-07-02 2009-01-22 Si Gijutsu Kenkyusho:Kk 誤差基準値検出装置
US8134380B2 (en) * 2008-11-26 2012-03-13 Taiwan Semiconductor Manufacturing Company, Ltd. Test probe structure
DE202009003966U1 (de) * 2009-03-20 2009-06-04 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Messspitzen
US8928429B2 (en) * 2011-05-17 2015-01-06 City University Of Hong Kong Multiple-way ring cavity power combiner and divider
CN102411074B (zh) * 2011-08-03 2014-10-08 广东威特真空电子制造有限公司 一种高功率波导阻抗变换器
JP5713197B2 (ja) * 2011-09-28 2015-05-07 株式会社Ｗａｖｅ Ｔｅｃｈｎｏｌｏｇｙ バラン
JP5788767B2 (ja) * 2011-11-07 2015-10-07 株式会社日本マイクロニクス プローブブロックとそれを備えるプローブカード並びにプローブ装置
CN102735887B (zh) * 2012-07-16 2014-08-27 电子科技大学 一种数字示波器单端有源探头电路
CN202975125U (zh) * 2012-11-19 2013-06-05 廊坊霸州供电有限公司 接地线辅助验电装置
CN103235190B (zh) * 2013-04-19 2015-10-28 重庆金山科技（集团）有限公司 一种电阻抗测试方法

Also Published As

Publication number Publication date
CA2940904A1 (en) 2015-10-08
EP3126852A1 (de) 2017-02-08
WO2015149893A1 (de) 2015-10-08
CN106133531A (zh) 2016-11-16
CA2940904C (en) 2020-08-18
US20170153274A1 (en) 2017-06-01
EP3126852B1 (de) 2019-11-27
TWM504245U (zh) 2015-07-01
DE202014002841U1 (de) 2014-06-25
CN106133531B (zh) 2020-10-20
JP2017516084A (ja) 2017-06-15
US9804195B2 (en) 2017-10-31

Similar Documents

Publication Publication Date Title
CA2940904C (en) Contacting assembly, in particular an hf measuring tip
KR100865112B1 (ko) 피시험 장치 테스트용 프로브
CN108226656B (zh) 电磁场复合无源探头
JP6876942B2 (ja) 回路基板
TWI447397B (zh) 探針卡
JP2020085695A (ja) プローブ装置、電気検査装置、および電気検査方法
US11204368B2 (en) Inspection device
US9316685B2 (en) Probe card of low power loss
CN109884561B (zh) 磁场检测模块及磁场探头
TW201320111A (zh) 寬距差分對電纜
CN103808992B (zh) 低电源损耗的探针卡结构
Park et al. Design of a broadband electric near-field probe with improved sensitivity using additional tips
KR20080095118A (ko) 전기적 특성 측정 장치
US8183464B2 (en) Substrate pad structure
KR20180108759A (ko) 전송 선
US20110043192A1 (en) Coaxial-cable probe structure
JP2019158652A (ja) 誘電体材料評価装置
HK1228007A1 (en) Contacting assembly, in particular an hf measuring tip
JP7782913B2 (ja) プローブカード
Kellomäki Snap-on buttons in a coaxial-to-microstrip transition
JP5361023B2 (ja) 配線基板の高周波信号伝送特性の測定方法およびそれに用いる配線基板
TWI569019B (zh) 探針卡及探針卡的製造方法
GB2550398A (en) Improved signal probe

Legal Events

Date Code Title Description
PA0105 International application

Patent event date: 20160831

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
A201 Request for examination
A302 Request for accelerated examination
PA0201 Request for examination

Patent event code: PA02012R01D

Patent event date: 20191104

Comment text: Request for Examination of Application

PA0302 Request for accelerated examination

Patent event date: 20191104

Patent event code: PA03022R01D

Comment text: Request for Accelerated Examination

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

Comment text: Notification of reason for refusal

Patent event date: 20191120

Patent event code: PE09021S01D

E601 Decision to refuse application
PE0601 Decision on rejection of patent

Patent event date: 20200219

Comment text: Decision to Refuse Application

Patent event code: PE06012S01D

Patent event date: 20191120

Comment text: Notification of reason for refusal

Patent event code: PE06011S01I